Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
579 | 14235 | 16.0 | 56% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | IEEE TRANSACTIONS ON ELECTRON DEVICES | journal | 198664 | 8% | 8% | 1189 |
2 | SOLID-STATE ELECTRONICS | journal | 142336 | 6% | 8% | 811 |
3 | ENGINEERING, ELECTRICAL & ELECTRONIC | WoSSC | 137380 | 57% | 1% | 8115 |
4 | IMPACT IONIZATION | authKW | 119409 | 1% | 34% | 163 |
5 | IEEE ELECTRON DEVICE LETTERS | journal | 94056 | 4% | 7% | 631 |
6 | PHOTODETECTORS | authKW | 82446 | 2% | 13% | 298 |
7 | ELECTRONICS LETTERS | journal | 80521 | 9% | 3% | 1221 |
8 | PHYSICS, APPLIED | WoSSC | 77525 | 48% | 1% | 6778 |
9 | PHOTODIODE | authKW | 76894 | 1% | 17% | 209 |
10 | AVALANCHE PHOTODIODE | authKW | 64709 | 1% | 23% | 133 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Engineering, Electrical & Electronic | 137380 | 57% | 1% | 8115 |
2 | Physics, Applied | 77525 | 48% | 1% | 6778 |
3 | Physics, Condensed Matter | 14456 | 18% | 0% | 2608 |
4 | Optics | 10516 | 13% | 0% | 1781 |
5 | Telecommunications | 3812 | 5% | 0% | 703 |
6 | Physics, Multidisciplinary | 1164 | 6% | 0% | 841 |
7 | Nanoscience & Nanotechnology | 999 | 4% | 0% | 545 |
8 | Materials Science, Coatings & Films | 950 | 2% | 0% | 333 |
9 | Materials Science, Multidisciplinary | 699 | 9% | 0% | 1226 |
10 | Computer Science, Interdisciplinary Applications | 330 | 2% | 0% | 281 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | PHOTON S | 16662 | 0% | 13% | 59 |
2 | MICROELECT | 15529 | 3% | 2% | 359 |
3 | FESTKORPERPHYS 1 | 14462 | 0% | 75% | 9 |
4 | PHOTON TECHNOL BRANCH | 14017 | 0% | 55% | 12 |
5 | HYPERFREQUENCES SEMICOND | 13078 | 0% | 16% | 39 |
6 | SYST ELECT S | 12370 | 0% | 16% | 37 |
7 | NTT PHOTON S | 11666 | 0% | 9% | 64 |
8 | MILLIMETER WAVE INNOVAT TECHNOL | 11495 | 0% | 26% | 21 |
9 | CNRS UMR 5507 | 10842 | 0% | 56% | 9 |
10 | ADV STUDY RADIOPHYS ELECT | 9641 | 0% | 75% | 6 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | IEEE TRANSACTIONS ON ELECTRON DEVICES | 198664 | 8% | 8% | 1189 |
2 | SOLID-STATE ELECTRONICS | 142336 | 6% | 8% | 811 |
3 | IEEE ELECTRON DEVICE LETTERS | 94056 | 4% | 7% | 631 |
4 | ELECTRONICS LETTERS | 80521 | 9% | 3% | 1221 |
5 | ELECTRON DEVICE LETTERS | 39938 | 1% | 25% | 75 |
6 | SEMICONDUCTOR SCIENCE AND TECHNOLOGY | 28821 | 2% | 4% | 330 |
7 | IEEE PHOTONICS TECHNOLOGY LETTERS | 25691 | 3% | 3% | 446 |
8 | INSTITUTE OF PHYSICS CONFERENCE SERIES | 18151 | 2% | 3% | 291 |
9 | APPLIED PHYSICS LETTERS | 16319 | 7% | 1% | 951 |
10 | VLSI DESIGN | 16100 | 0% | 13% | 58 |
Author Key Words |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | IMPACT IONIZATION | 119409 | 1% | 34% | 163 | Search IMPACT+IONIZATION | Search IMPACT+IONIZATION |
2 | PHOTODETECTORS | 82446 | 2% | 13% | 298 | Search PHOTODETECTORS | Search PHOTODETECTORS |
3 | PHOTODIODE | 76894 | 1% | 17% | 209 | Search PHOTODIODE | Search PHOTODIODE |
4 | AVALANCHE PHOTODIODE | 64709 | 1% | 23% | 133 | Search AVALANCHE+PHOTODIODE | Search AVALANCHE+PHOTODIODE |
5 | HEMT | 58204 | 1% | 18% | 150 | Search HEMT | Search HEMT |
6 | GAAS MESFET | 48639 | 0% | 44% | 52 | Search GAAS+MESFET | Search GAAS+MESFET |
7 | HIGH POWER PHOTODIODE | 47475 | 0% | 92% | 24 | Search HIGH+POWER+PHOTODIODE | Search HIGH+POWER+PHOTODIODE |
8 | EXCESS NOISE FACTOR | 45854 | 0% | 63% | 34 | Search EXCESS+NOISE+FACTOR | Search EXCESS+NOISE+FACTOR |
9 | IMPATT DIODE | 44626 | 0% | 77% | 27 | Search IMPATT+DIODE | Search IMPATT+DIODE |
10 | HIGH ELECTRON MOBILITY TRANSISTORS | 43486 | 1% | 19% | 107 | Search HIGH+ELECTRON+MOBILITY+TRANSISTORS | Search HIGH+ELECTRON+MOBILITY+TRANSISTORS |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | CAMPBELL, JC , (2007) RECENT ADVANCES IN TELECOMMUNICATIONS AVALANCHE PHOTODIODES.JOURNAL OF LIGHTWAVE TECHNOLOGY. VOL. 25. ISSUE 1. P. 109 -121 | 79 | 92% | 83 |
2 | BRENNAN, KF , HARALSON, J , (2000) INVITED REVIEW - SUPERLATTICE AND MULTIQUANTUM WELL AVALANCHE PHOTODETECTORS: PHYSICS, CONCEPTS AND PERFORMANCE.SUPERLATTICES AND MICROSTRUCTURES. VOL. 28. ISSUE 2. P. 77 -104 | 105 | 96% | 8 |
3 | CAMPBELL, JC , (2016) RECENT ADVANCES IN AVALANCHE PHOTODIODES.JOURNAL OF LIGHTWAVE TECHNOLOGY. VOL. 34. ISSUE 2. P. 278 -285 | 57 | 86% | 3 |
4 | SHEN, TC , GAO, GB , MORKOC, H , (1992) RECENT DEVELOPMENTS IN OHMIC CONTACTS FOR III-V COMPOUND SEMICONDUCTORS.JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B. VOL. 10. ISSUE 5. P. 2113-2132 | 118 | 86% | 139 |
5 | GRASSER, T , TANG, TW , KOSINA, H , SELBERHERR, S , (2003) A REVIEW OF HYDRODYNAMIC AND ENERGY-TRANSPORT MODELS FOR SEMICONDUCTOR DEVICE SIMULATION.PROCEEDINGS OF THE IEEE. VOL. 91. ISSUE 2. P. 251 -274 | 80 | 84% | 86 |
6 | REES, GJ , DAVID, JPR , (2010) NONLOCAL IMPACT IONIZATION AND AVALANCHE MULTIPLICATION.JOURNAL OF PHYSICS D-APPLIED PHYSICS. VOL. 43. ISSUE 24. P. - | 63 | 95% | 4 |
7 | BELING, A , CAMPBELL, JC , (2009) INP-BASED HIGH-SPEED PHOTODETECTORS.JOURNAL OF LIGHTWAVE TECHNOLOGY. VOL. 27. ISSUE 1-4. P. 343-355 | 63 | 85% | 39 |
8 | IVEY, DG , JIAN, P , (1995) METALLURGY OF OHMIC CONTACTS TO INP.CANADIAN METALLURGICAL QUARTERLY. VOL. 34. ISSUE 2. P. 85-113 | 82 | 92% | 7 |
9 | BLANK, TV , GOL'DBERG, YA , (2007) MECHANISMS OF CURRENT FLOW IN METAL-SEMICONDUCTOR OHMIC CONTACTS.SEMICONDUCTORS. VOL. 41. ISSUE 11. P. 1263 -1292 | 107 | 38% | 71 |
10 | KATO, K , (1999) ULTRAWIDE-BAND/HIGH-FREQUENCY PHOTODETECTORS.IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES. VOL. 47. ISSUE 7. P. 1265 -1281 | 49 | 91% | 216 |
Classes with closest relation at Level 2 |