Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
6739 | 1449 | 14.1 | 67% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
2 | 4 | MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER | 2836879 |
47 | 3 | PHYSICS, APPLIED//JOURNAL OF CRYSTAL GROWTH//PHYSICS, CONDENSED MATTER | 93961 |
579 | 2 | IEEE TRANSACTIONS ON ELECTRON DEVICES//SOLID-STATE ELECTRONICS//ENGINEERING, ELECTRICAL & ELECTRONIC | 14235 |
6739 | 1 | MHEMT//HEMT//PHEMT | 1449 |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | MHEMT | authKW | 265383 | 2% | 55% | 23 |
2 | HEMT | authKW | 220743 | 6% | 11% | 93 |
3 | PHEMT | authKW | 187367 | 3% | 23% | 39 |
4 | PSEUDOMORPHIC | authKW | 185998 | 1% | 55% | 16 |
5 | HIGH ELECTRON MOBILITY TRANSISTORS | authKW | 183599 | 5% | 12% | 70 |
6 | METAMORPHIC | authKW | 179765 | 2% | 27% | 32 |
7 | GATE VOLTAGE SWING | authKW | 150507 | 1% | 71% | 10 |
8 | INALAS INGAAS | authKW | 145775 | 1% | 43% | 16 |
9 | DOPED CHANNEL FETS | authKW | 129063 | 0% | 88% | 7 |
10 | INGAP INGAAS | authKW | 126430 | 0% | 100% | 6 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Engineering, Electrical & Electronic | 18975 | 66% | 0% | 955 |
2 | Physics, Applied | 8575 | 49% | 0% | 717 |
3 | Physics, Condensed Matter | 1415 | 18% | 0% | 261 |
4 | Nanoscience & Nanotechnology | 1244 | 11% | 0% | 155 |
5 | Materials Science, Coatings & Films | 261 | 4% | 0% | 51 |
6 | Physics, Multidisciplinary | 155 | 6% | 0% | 94 |
7 | Materials Science, Multidisciplinary | 152 | 11% | 0% | 155 |
8 | Electrochemistry | 84 | 3% | 0% | 39 |
9 | Optics | 31 | 3% | 0% | 50 |
10 | Crystallography | 22 | 2% | 0% | 25 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | MILLIMETER WAVE INNOVAT TECHNOL | 102759 | 1% | 24% | 20 |
2 | KANSAI ELECT S | 79663 | 1% | 34% | 11 |
3 | ULTRAFAST SYST GRP | 47410 | 0% | 75% | 3 |
4 | SYST ELECT S | 43175 | 2% | 9% | 22 |
5 | MICROWAVE SPACE MISSION ELECT | 42143 | 0% | 100% | 2 |
6 | TM RD SDN BHD | 42143 | 0% | 100% | 2 |
7 | MICROELECT | 32162 | 11% | 1% | 162 |
8 | HYPERFREQUENCES SEMICOND | 30638 | 1% | 8% | 19 |
9 | DEVICES 3 5 | 28094 | 0% | 67% | 2 |
10 | INTERDIPARTIMENTALE RIC MAT TECNOL INFORMAZ | 28094 | 0% | 67% | 2 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | IEEE ELECTRON DEVICE LETTERS | 64472 | 11% | 2% | 166 |
2 | IEEE TRANSACTIONS ON ELECTRON DEVICES | 29487 | 10% | 1% | 146 |
3 | SOLID-STATE ELECTRONICS | 18811 | 6% | 1% | 94 |
4 | MICROELECTRONICS RELIABILITY | 16582 | 5% | 1% | 74 |
5 | IEEE MICROWAVE AND GUIDED WAVE LETTERS | 15630 | 2% | 3% | 25 |
6 | ELECTRONICS LETTERS | 8292 | 9% | 0% | 125 |
7 | SEMICONDUCTOR SCIENCE AND TECHNOLOGY | 7364 | 4% | 1% | 53 |
8 | IEICE TRANSACTIONS ON ELECTRONICS | 4502 | 2% | 1% | 36 |
9 | INSTITUTE OF PHYSICS CONFERENCE SERIES | 3571 | 3% | 0% | 41 |
10 | JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 3247 | 5% | 0% | 70 |
Author Key Words |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | MHEMT | 265383 | 2% | 55% | 23 | Search MHEMT | Search MHEMT |
2 | HEMT | 220743 | 6% | 11% | 93 | Search HEMT | Search HEMT |
3 | PHEMT | 187367 | 3% | 23% | 39 | Search PHEMT | Search PHEMT |
4 | PSEUDOMORPHIC | 185998 | 1% | 55% | 16 | Search PSEUDOMORPHIC | Search PSEUDOMORPHIC |
5 | HIGH ELECTRON MOBILITY TRANSISTORS | 183599 | 5% | 12% | 70 | Search HIGH+ELECTRON+MOBILITY+TRANSISTORS | Search HIGH+ELECTRON+MOBILITY+TRANSISTORS |
6 | METAMORPHIC | 179765 | 2% | 27% | 32 | Search METAMORPHIC | Search METAMORPHIC |
7 | GATE VOLTAGE SWING | 150507 | 1% | 71% | 10 | Search GATE+VOLTAGE+SWING | Search GATE+VOLTAGE+SWING |
8 | INALAS INGAAS | 145775 | 1% | 43% | 16 | Search INALAS+INGAAS | Search INALAS+INGAAS |
9 | DOPED CHANNEL FETS | 129063 | 0% | 88% | 7 | Search DOPED+CHANNEL+FETS | Search DOPED+CHANNEL+FETS |
10 | INGAP INGAAS | 126430 | 0% | 100% | 6 | Search INGAP+INGAAS | Search INGAP+INGAAS |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | MENEGHESSO, G , ZANONI, E , (2002) FAILURE MODES AND MECHANISMS OF INP-BASED AND METAMORPHIC HIGH ELECTRON MOBILITY TRANSISTORS.MICROELECTRONICS RELIABILITY. VOL. 42. ISSUE 4-5. P. 685 -708 | 37 | 76% | 25 |
2 | AJAYAN, J , NIRMAL, D , (2017) 20-NM ENHANCEMENT-MODE METAMORPHIC GAAS HEMT WITH HIGHLY DOPED INGAAS SOURCE/DRAIN REGIONS FOR HIGH-FREQUENCY APPLICATIONS.INTERNATIONAL JOURNAL OF ELECTRONICS. VOL. 104. ISSUE 3. P. 504 -512 | 23 | 79% | 0 |
3 | CHIU, HC , WU, CH , LIN, CK , CHIEN, FT , (2015) INVESTIGATION OF IMPACT IONIZATION AND FLICKER NOISE PROPERTIES IN INDIUM ALUMINUM ARSENIDE/INDIUM GALLINUM ARSENIDE METAMORPHIC HIGH ELECTRON MOBILITY TRANSISTORS WITH VARIOUS WORK FUNCTION-GATE METALS.MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING. VOL. 30. ISSUE . P. 41 -47 | 19 | 95% | 0 |
4 | CHEN, CC , CHEN, HI , LIU, IP , CHOU, PC , LIOU, JK , TSAI, JH , LIU, WC , (2015) AN ENHANCEMENT-MODE PSEUDOMORPHIC HIGH ELECTRON MOBILITY TRANSISTOR PREPARED BY AN ELECTROLESS PLATING (EP) AND A GATE-SINKING APPROACHES.SOLID-STATE ELECTRONICS. VOL. 105. ISSUE . P. 45 -50 | 20 | 87% | 0 |
5 | SUEMITSU, T , (2007) RECENT ACHIEVEMENTS IN THE RELIABILITY OF INP-BASED HEMTS.THIN SOLID FILMS. VOL. 515. ISSUE 10. P. 4378 -4383 | 23 | 88% | 5 |
6 | XU, D , YANG, XP , KONG, WMT , SEEKELL, P , LOUIE, K , PLEASANT, LMM , MOHNKERN, L , DUGAS, DM , CHU, K , KARIMY, HF , ET AL (2011) GATE-LENGTH SCALING OF ULTRASHORT METAMORPHIC HIGH-ELECTRON MOBILITY TRANSISTORS WITH ASYMMETRICALLY RECESSED GATE CONTACTS FOR MILLIMETER- AND SUBMILLIMETER-WAVE APPLICATIONS.IEEE TRANSACTIONS ON ELECTRON DEVICES. VOL. 58. ISSUE 5. P. 1408-1417 | 20 | 91% | 5 |
7 | AJAYAN, J , NIRMAL, D , (2016) 20-NM T-GATE COMPOSITE CHANNEL ENHANCEMENT-MODE METAMORPHIC HEMT ON GAAS SUBSTRATES FOR FUTURE THZ APPLICATIONS.JOURNAL OF COMPUTATIONAL ELECTRONICS. VOL. 15. ISSUE 4. P. 1291 -1296 | 21 | 78% | 0 |
8 | MENOZZI, R , (2004) OFF-STATE BREAKDOWN OF GAASPHEMTS: REVIEW AND NEW DATA.IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY. VOL. 4. ISSUE 1. P. 54-62 | 26 | 79% | 26 |
9 | LIN, YS , CHEN, BY , (2007) PERFORMANCE OF ALGAAS/INGAAS/GAAS PSEUDOMORPHIC HIGH ELECTRON MOBILITY TRANSISTOR AS A FUNCTION OF TEMPERATURE.JOURNAL OF THE ELECTROCHEMICAL SOCIETY. VOL. 154. ISSUE 5. P. H406-H411 | 25 | 71% | 8 |
10 | LIN, YS , CHEN, BY , HO, CH , (2007) COMPREHENSIVE CHARACTERIZATION OF ALGAAS/INGAAS/GAAS COMPOSITE-CHANNEL HIGH-ELECTRON MOBILITY TRANSISTOR.JOURNAL OF THE ELECTROCHEMICAL SOCIETY. VOL. 154. ISSUE 11. P. H951-H956 | 25 | 69% | 11 |
Classes with closest relation at Level 1 |