Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
3053 | 2077 | 15.2 | 61% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | IEEE TRANSACTIONS ON ELECTRON DEVICES | journal | 66887 | 13% | 2% | 263 |
2 | IEEE ELECTRON DEVICE LETTERS | journal | 63279 | 9% | 2% | 197 |
3 | PSEUDOMORPHIC MODFET | authKW | 61248 | 0% | 83% | 5 |
4 | DOUBLE GATE HIGH ELECTRON MOBILITY TRANSISTOR DG HEMT | authKW | 44100 | 0% | 100% | 3 |
5 | PROCESSING APPLICATION | authKW | 44100 | 0% | 100% | 3 |
6 | INALAS INGAAS HETEROSTRUCTURE | authKW | 36745 | 0% | 50% | 5 |
7 | 2 DEG CHARGE DENSITY | authKW | 29400 | 0% | 100% | 2 |
8 | 2 MODE CHANNEL | authKW | 29400 | 0% | 100% | 2 |
9 | ALGAAS GAAS HEMT | authKW | 29400 | 0% | 100% | 2 |
10 | GRADED INGAAS | authKW | 29400 | 0% | 100% | 2 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Engineering, Electrical & Electronic | 18398 | 55% | 0% | 1137 |
2 | Physics, Applied | 10751 | 47% | 0% | 966 |
3 | Physics, Condensed Matter | 3593 | 23% | 0% | 481 |
4 | Physics, Multidisciplinary | 552 | 9% | 0% | 189 |
5 | Nanoscience & Nanotechnology | 305 | 5% | 0% | 105 |
6 | Crystallography | 55 | 2% | 0% | 43 |
7 | Materials Science, Multidisciplinary | 43 | 7% | 0% | 146 |
8 | Telecommunications | 25 | 2% | 0% | 33 |
9 | COMPUTER APPLICATIONS & CYBERNETICS | 19 | 0% | 0% | 2 |
10 | Optics | 13 | 3% | 0% | 54 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | SEMICOND DEVICE | 27555 | 1% | 7% | 26 |
2 | SEMICOND OPTOELECT GRP | 26457 | 0% | 60% | 3 |
3 | DIPT ELECT ELECT AUTOMAT | 14700 | 0% | 100% | 1 |
4 | DTSCIT | 14700 | 0% | 100% | 1 |
5 | ECNU SITP JOINT IMAGING INFORMAT | 14700 | 0% | 100% | 1 |
6 | EDIF ELECT TELECOMUN | 14700 | 0% | 100% | 1 |
7 | EDIL MICROELECT NANOELECT RD EXCELLENCE | 14700 | 0% | 100% | 1 |
8 | ELE ON DEVICES DEVICE TECHNOL BRANCH | 14700 | 0% | 100% | 1 |
9 | ELSYM | 14700 | 0% | 100% | 1 |
10 | ESCUELA TECN SUPER INGENIEROS TELEOMUNICAC | 14700 | 0% | 100% | 1 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | IEEE TRANSACTIONS ON ELECTRON DEVICES | 66887 | 13% | 2% | 263 |
2 | IEEE ELECTRON DEVICE LETTERS | 63279 | 9% | 2% | 197 |
3 | SOLID-STATE ELECTRONICS | 19609 | 6% | 1% | 115 |
4 | INSTITUTE OF PHYSICS CONFERENCE SERIES | 12925 | 4% | 1% | 93 |
5 | ELECTRONICS LETTERS | 12406 | 9% | 0% | 183 |
6 | ELECTRON DEVICE LETTERS | 9545 | 1% | 5% | 14 |
7 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 4859 | 4% | 0% | 75 |
8 | SUPERLATTICES AND MICROSTRUCTURES | 3106 | 2% | 1% | 37 |
9 | APPLIED PHYSICS LETTERS | 3087 | 8% | 0% | 157 |
10 | SEMICONDUCTOR SCIENCE AND TECHNOLOGY | 3037 | 2% | 1% | 41 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | DRUMMOND, TJ , MASSELINK, WT , MORKOC, H , (1986) MODULATION-DOPED GAAS/(AL,GA)AS HETEROJUNCTION FIELD-EFFECT TRANSISTORS - MODFETS.PROCEEDINGS OF THE IEEE. VOL. 74. ISSUE 6. P. 773 -822 | 99 | 52% | 72 |
2 | KARMALKAR, S , RAMESH, G , (2000) A SIMPLE YET COMPREHENSIVE UNIFIED PHYSICAL MODEL OF THE 2-D ELECTRON GAS IN DELTA-DOPED AND UNIFORMLY DOPED HIGH ELECTRON MOBILITY TRANSISTORS.IEEE TRANSACTIONS ON ELECTRON DEVICES. VOL. 47. ISSUE 1. P. 11-23 | 24 | 83% | 6 |
3 | ALTINOZ, S , TIRAS, E , BAYRAKLI, A , CELIK, H , CANKURTARAN, M , BALKAN, N , (2000) THE EFFECTS OF SPACER THICKNESS AND TEMPERATURE ON THE TRANSPORT PROPERTIES OF MODULATION-DOPED IN0.53GA0.47AS/IN0.52AL0.48AS HETEROJUNCTIONS.PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE. VOL. 182. ISSUE 2. P. 717-726 | 26 | 74% | 2 |
4 | SALMER, G , ZIMMERMANN, J , FAUQUEMBERGUE, R , (1988) MODELING OF MODFETS.IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES. VOL. 36. ISSUE 7. P. 1124-1140 | 48 | 63% | 10 |
5 | PARK, DH , BRENNAN, KF , (1990) MONTE-CARLO SIMULATION OF 0.35-MU-M GATE-LENGTH GAAS AND INGAAS HEMTS.IEEE TRANSACTIONS ON ELECTRON DEVICES. VOL. 37. ISSUE 3. P. 618-628 | 39 | 68% | 16 |
6 | PARK, DH , BRENNAN, KF , (1989) THEORETICAL-ANALYSIS OF AN AL0.15GA0.85AS/IN0.15GA0.85AS PSEUDOMORPHIC HEMT USING AN ENSEMBLE MONTE-CARLO SIMULATION.IEEE TRANSACTIONS ON ELECTRON DEVICES. VOL. 36. ISSUE 7. P. 1254-1263 | 37 | 74% | 23 |
7 | HUGHES, B , (1992) A TEMPERATURE NOISE MODEL FOR EXTRINSIC FETS.IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES. VOL. 40. ISSUE 9. P. 1821-1832 | 27 | 87% | 25 |
8 | KIZILYALLI, IC , ARTAKI, M , SHAH, NJ , CHANDRA, A , (1993) SCALING PROPERTIES AND SHORT-CHANNEL EFFECTS IN SUBMICROMETER ALGAAS/GAAS MODFETS - A MONTE-CARLO STUDY.IEEE TRANSACTIONS ON ELECTRON DEVICES. VOL. 40. ISSUE 2. P. 234-249 | 26 | 84% | 38 |
9 | LEON, H , GARCIAMOLINER, F , VELASCO, VR , (1995) ELECTRON-PHONON INTERACTION AND LOW-FIELD DRIFT MOBILITY IN A POLAR SEMICONDUCTOR QUANTUM-WELL.THIN SOLID FILMS. VOL. 266. ISSUE 1. P. 38 -47 | 27 | 77% | 1 |
10 | VIJAYAKRISHNA, VJ , VAISHNAV, S , DASGUPTA, N , DASGUPTA, A , (2005) UNIFIED ANALYTICAL MODEL OF HEMTS FOR ANALOGUE AND DIGITAL APPLICATIONS.IEE PROCEEDINGS-CIRCUITS DEVICES AND SYSTEMS. VOL. 152. ISSUE 5. P. 425-432 | 17 | 85% | 4 |
Classes with closest relation at Level 1 |