Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
1385 | 8137 | 17.9 | 56% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | POLYCRYSTALLINE SILICON | authKW | 749093 | 4% | 59% | 341 |
2 | POLY SI | authKW | 435295 | 2% | 62% | 186 |
3 | THIN FILM TRANSISTORS | authKW | 285362 | 5% | 20% | 391 |
4 | POLY SI TFT | authKW | 279192 | 1% | 76% | 98 |
5 | LASER CRYSTALLIZATION | authKW | 235304 | 1% | 78% | 80 |
6 | METAL INDUCED CRYSTALLIZATION | authKW | 232391 | 1% | 85% | 73 |
7 | EXCIMER LASER CRYSTALLIZATION | authKW | 211451 | 1% | 92% | 61 |
8 | POLYSILICON | authKW | 188613 | 2% | 33% | 153 |
9 | POLYCRYSTALLINE SILICON POLY SI | authKW | 184622 | 1% | 86% | 57 |
10 | EXCIMER LASER ANNEALING | authKW | 169686 | 1% | 61% | 74 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Physics, Applied | 75318 | 61% | 0% | 4963 |
2 | Materials Science, Coatings & Films | 17852 | 11% | 1% | 897 |
3 | Physics, Condensed Matter | 12120 | 22% | 0% | 1763 |
4 | Materials Science, Multidisciplinary | 10639 | 27% | 0% | 2223 |
5 | Engineering, Electrical & Electronic | 9380 | 22% | 0% | 1764 |
6 | Physics, Multidisciplinary | 883 | 7% | 0% | 530 |
7 | Energy & Fuels | 653 | 4% | 0% | 307 |
8 | Optics | 537 | 5% | 0% | 396 |
9 | Electrochemistry | 486 | 3% | 0% | 221 |
10 | COMPUTER APPLICATIONS & CYBERNETICS | 481 | 0% | 1% | 19 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | JOINT SCI TECHNOL | 60349 | 0% | 62% | 26 |
2 | BASE TECHNOL | 58787 | 0% | 56% | 28 |
3 | SEMICOND ELECT INTEGRAT SCI | 50938 | 0% | 54% | 25 |
4 | GRP MICROELECT | 48373 | 0% | 56% | 23 |
5 | GRP MICROELECT VISUALISAT | 46121 | 0% | 53% | 23 |
6 | LCD PROC TECHNOL | 45715 | 0% | 76% | 16 |
7 | TECHNOL PLATFORM | 38304 | 0% | 33% | 31 |
8 | UP A 6076 | 31243 | 0% | 56% | 15 |
9 | MAT DEVICE PLICAT | 28847 | 0% | 77% | 10 |
10 | ADV DISPLAY | 26937 | 1% | 14% | 50 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | IEEE ELECTRON DEVICE LETTERS | 59715 | 5% | 4% | 380 |
2 | IEEE TRANSACTIONS ON ELECTRON DEVICES | 46208 | 5% | 3% | 435 |
3 | THIN SOLID FILMS | 20928 | 6% | 1% | 456 |
4 | JOURNAL OF APPLIED PHYSICS | 16952 | 9% | 1% | 710 |
5 | SOLID-STATE ELECTRONICS | 14918 | 2% | 2% | 200 |
6 | ELECTRON DEVICE LETTERS | 14344 | 0% | 11% | 34 |
7 | JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 14045 | 4% | 1% | 346 |
8 | APPLIED PHYSICS LETTERS | 12635 | 8% | 1% | 628 |
9 | SOLID STATE PHENOMENA | 10768 | 1% | 4% | 80 |
10 | SOLAR ENERGY MATERIALS AND SOLAR CELLS | 10693 | 2% | 2% | 150 |
Author Key Words |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | POLYCRYSTALLINE SILICON | 749093 | 4% | 59% | 341 | Search POLYCRYSTALLINE+SILICON | Search POLYCRYSTALLINE+SILICON |
2 | POLY SI | 435295 | 2% | 62% | 186 | Search POLY+SI | Search POLY+SI |
3 | THIN FILM TRANSISTORS | 285362 | 5% | 20% | 391 | Search THIN+FILM+TRANSISTORS | Search THIN+FILM+TRANSISTORS |
4 | POLY SI TFT | 279192 | 1% | 76% | 98 | Search POLY+SI+TFT | Search POLY+SI+TFT |
5 | LASER CRYSTALLIZATION | 235304 | 1% | 78% | 80 | Search LASER+CRYSTALLIZATION | Search LASER+CRYSTALLIZATION |
6 | METAL INDUCED CRYSTALLIZATION | 232391 | 1% | 85% | 73 | Search METAL+INDUCED+CRYSTALLIZATION | Search METAL+INDUCED+CRYSTALLIZATION |
7 | EXCIMER LASER CRYSTALLIZATION | 211451 | 1% | 92% | 61 | Search EXCIMER+LASER+CRYSTALLIZATION | Search EXCIMER+LASER+CRYSTALLIZATION |
8 | POLYSILICON | 188613 | 2% | 33% | 153 | Search POLYSILICON | Search POLYSILICON |
9 | POLYCRYSTALLINE SILICON POLY SI | 184622 | 1% | 86% | 57 | Search POLYCRYSTALLINE+SILICON+POLY+SI | Search POLYCRYSTALLINE+SILICON+POLY+SI |
10 | EXCIMER LASER ANNEALING | 169686 | 1% | 61% | 74 | Search EXCIMER+LASER+ANNEALING | Search EXCIMER+LASER+ANNEALING |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | OROUJI, AA , KUMAR, MJ , (2006) LEAKAGE CURRENT REDUCTION TECHNIQUES IN POLY-SI TFTS FOR ACTIVE MATRIX LIQUID CRYSTAL DISPLAYS: A COMPREHENSIVE STUDY.IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY. VOL. 6. ISSUE 2. P. 315-325 | 60 | 90% | 20 |
2 | BROTHERTON, SD , (1995) POLYCRYSTALLINE SILICON THIN-FILM TRANSISTORS.SEMICONDUCTOR SCIENCE AND TECHNOLOGY. VOL. 10. ISSUE 6. P. 721 -738 | 70 | 84% | 223 |
3 | TURAN, R , KABACELIK, I , KULAKCI, M , (2015) INVESTIGATION OF SILVER-INDUCED CRYSTALLIZATION OF GERMANIUM THIN FILMS FABRICATED ON DIFFERENT SUBSTRATES.JOURNAL OF CRYSTAL GROWTH. VOL. 419. ISSUE . P. 7 -11 | 52 | 76% | 1 |
4 | ADIKAARI, AADT , SILVA, SRP , (2008) EXCIMER LASER CRYSTALLIZATION AND NANOSTRUCTURING OF AMORPHOUS SILICON FOR PHOTOVOLTAIC APPLICATIONS.NANO. VOL. 3. ISSUE 3. P. 117-126 | 45 | 90% | 4 |
5 | KIMURA, M , YOSHINO, T , HARADA, K , (2010) COMPLETE EXTRACTION OF TRAP DENSITIES IN POLY-SI THIN-FILM TRANSISTORS.IEEE TRANSACTIONS ON ELECTRON DEVICES. VOL. 57. ISSUE 12. P. 3426-3433 | 39 | 93% | 7 |
6 | CULLIS, AG , (1985) TRANSIENT ANNEALING OF SEMICONDUCTORS BY LASER, ELECTRON-BEAM AND RADIANT HEATING TECHNIQUES.REPORTS ON PROGRESS IN PHYSICS. VOL. 48. ISSUE 8. P. 1155 -1233 | 162 | 52% | 38 |
7 | YAMAUCHI, N , REIF, R , (1994) POLYCRYSTALLINE SILICON THIN-FILMS PROCESSED WITH SILICON ION-IMPLANTATION AND SUBSEQUENT SOLID-PHASE CRYSTALLIZATION - THEORY, EXPERIMENTS, AND THIN-FILM-TRANSISTOR APPLICATIONS.JOURNAL OF APPLIED PHYSICS. VOL. 75. ISSUE 7. P. 3235 -3257 | 53 | 87% | 126 |
8 | NUMATA, R , TOKO, K , OYA, N , USAMI, N , SUEMASU, T , (2014) STRUCTURAL CHARACTERIZATION OF POLYCRYSTALLINE GE THIN FILMS ON INSULATORS FORMED BY DIFFUSION-ENHANCED AL-INDUCED LAYER EXCHANGE.JAPANESE JOURNAL OF APPLIED PHYSICS. VOL. 53. ISSUE 4. P. - | 36 | 80% | 2 |
9 | COHIN, Y , GLAS, F , CATTONI, A , BOUCHOULE, S , MAUGUIN, O , LARGEAU, L , PATRIARCHE, G , SONDERGARD, E , HARMAND, JC , (2015) CRYSTALLIZATION OF SI TEMPLATES OF CONTROLLED SHAPE, SIZE, AND ORIENTATION: TOWARD MICRO- AND NANOSUBSTRATES.CRYSTAL GROWTH & DESIGN. VOL. 15. ISSUE 5. P. 2102 -2109 | 33 | 85% | 1 |
10 | BYUN, CW , SON, SW , LEE, YW , JOO, SK , (2012) HIGH PERFORMANCE LOW TEMPERATURE POLYCRYSTALLINE SI THIN-FILM TRANSISTORS FABRICATED BY SILICIDE SEED-INDUCED LATERAL CRYSTALLIZATION.ELECTRONIC MATERIALS LETTERS. VOL. 8. ISSUE 3. P. 251 -258 | 35 | 85% | 2 |
Classes with closest relation at Level 2 |