Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
3506 | 1431 | 20.8 | 51% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
2 | 4 | MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER | 2836879 |
6 | 3 | PHYSICS, APPLIED//IEEE TRANSACTIONS ON ELECTRON DEVICES//SILICON | 155028 |
3506 | 2 | RAPID THERMAL PROCESSING//RAPID THERMAL PROCESSING RTP//WAFER TEMPERATURE UNIFORMITY | 1431 |
10828 | 1 | EPITAXIAL REACTOR//MOCVD REACTOR//PLANETARY REACTOR | 1032 |
21961 | 1 | RAPID THERMAL PROCESSING//RAPID THERMAL PROCESSING RTP//SILICON NANOELECT | 399 |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | RAPID THERMAL PROCESSING | authKW | 182931 | 3% | 21% | 41 |
2 | RAPID THERMAL PROCESSING RTP | authKW | 167323 | 1% | 39% | 20 |
3 | WAFER TEMPERATURE UNIFORMITY | authKW | 85347 | 0% | 100% | 4 |
4 | SILICON NANOELECT | address | 75855 | 1% | 44% | 8 |
5 | IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING | journal | 72655 | 5% | 5% | 73 |
6 | EPITAXIAL REACTOR | authKW | 64010 | 0% | 100% | 3 |
7 | MOCVD REACTOR | authKW | 64010 | 0% | 100% | 3 |
8 | THERMAL BUDGET CONTROL | authKW | 64010 | 0% | 100% | 3 |
9 | PLANETARY REACTOR | authKW | 56895 | 0% | 67% | 4 |
10 | JOURNAL OF CRYSTAL GROWTH | journal | 50885 | 19% | 1% | 272 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Crystallography | 9083 | 22% | 0% | 312 |
2 | Physics, Applied | 8647 | 50% | 0% | 715 |
3 | Materials Science, Coatings & Films | 5530 | 14% | 0% | 207 |
4 | Materials Science, Multidisciplinary | 3242 | 35% | 0% | 496 |
5 | Electrochemistry | 1641 | 10% | 0% | 137 |
6 | Engineering, Manufacturing | 1554 | 6% | 0% | 85 |
7 | Physics, Condensed Matter | 932 | 15% | 0% | 217 |
8 | Engineering, Electrical & Electronic | 683 | 15% | 0% | 215 |
9 | Thermodynamics | 504 | 5% | 0% | 77 |
10 | Engineering, Chemical | 409 | 8% | 0% | 120 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | SILICON NANOELECT | 75855 | 1% | 44% | 8 |
2 | EPITAXIAL SILICON TECHNOL | 42674 | 0% | 100% | 2 |
3 | OBERFLACHEN ICHTENANALYT | 42674 | 0% | 100% | 2 |
4 | TOURISM DESIGN | 42674 | 0% | 100% | 2 |
5 | FUNDAMENTAL SCI DEF WIDE BAND G SE | 28448 | 0% | 67% | 2 |
6 | RTP PROD BUSINESS UNIT | 28448 | 0% | 67% | 2 |
7 | ISOBE RD | 28067 | 0% | 26% | 5 |
8 | NANOELE SYST INFORMAT TECHNOL | 24000 | 0% | 38% | 3 |
9 | AUTOMOBILE HI TECH | 21337 | 0% | 100% | 1 |
10 | CANMET MET TECHNOL S | 21337 | 0% | 100% | 1 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING | 72655 | 5% | 5% | 73 |
2 | JOURNAL OF CRYSTAL GROWTH | 50885 | 19% | 1% | 272 |
3 | JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 10994 | 9% | 0% | 125 |
4 | JOURNAL DE PHYSIQUE IV | 3947 | 3% | 0% | 44 |
5 | SOLID STATE TECHNOLOGY | 2565 | 1% | 1% | 15 |
6 | JOURNAL OF ELECTRONIC MATERIALS | 2485 | 2% | 0% | 34 |
7 | CRYSTAL RESEARCH AND TECHNOLOGY | 2176 | 2% | 0% | 26 |
8 | ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY | 1625 | 1% | 1% | 10 |
9 | CHEMICAL VAPOR DEPOSITION | 1358 | 1% | 1% | 8 |
10 | PROGRESS IN CRYSTAL GROWTH AND CHARACTERIZATION OF MATERIALS | 1186 | 0% | 1% | 6 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | HOLSTEIN, WL , (1992) DESIGN AND MODELING OF CHEMICAL VAPOR-DEPOSITION REACTORS.PROGRESS IN CRYSTAL GROWTH AND CHARACTERIZATION OF MATERIALS. VOL. 24. ISSUE 2. P. 111-211 | 75 | 78% | 28 |
2 | MASI, M , DI STANISLAO, M , VENERONI, A , (2003) FLUID-DYNAMICS DURING VAPOR EPITAXY AND MODELING.PROGRESS IN CRYSTAL GROWTH AND CHARACTERIZATION OF MATERIALS. VOL. 47. ISSUE 2-3. P. 239 -270 | 32 | 94% | 8 |
3 | KLEIJN, CR , DORSMAN, R , KUIJLAARS, KJ , OKKERSE, M , VAN SANTEN, H , (2007) MULTI-SCALE MODELING OF CHEMICAL VAPOR DEPOSITION PROCESSES FOR THIN FILM TECHNOLOGY.JOURNAL OF CRYSTAL GROWTH. VOL. 303. ISSUE 1. P. 362 -380 | 59 | 42% | 32 |
4 | MASI, M , KOMMU, S , (2001) EPITAXIAL GROWTH MODELING.SILICON EPITAXY. VOL. 72. ISSUE . P. 185 -224 | 40 | 77% | 3 |
5 | KLEIJN, CR , (2000) COMPUTATIONAL MODELING OF TRANSPORT PHENOMENA AND DETAILED CHEMISTRY IN CHEMICAL VAPOR DEPOSITION - A BENCHMARK SOLUTION.THIN SOLID FILMS. VOL. 365. ISSUE 2. P. 294 -306 | 37 | 69% | 55 |
6 | ZHANG, Z , FANG, HS , YAO, QX , YAN, H , GAN, ZY , (2016) SPECIES TRANSPORT AND CHEMICAL REACTION IN A MOCVD REACTOR AND THEIR INFLUENCE ON THE GAN GROWTH UNIFORMITY.JOURNAL OF CRYSTAL GROWTH. VOL. 454. ISSUE . P. 87 -95 | 20 | 83% | 0 |
7 | ZHANG, Z , FANG, HS , YAN, H , JIANG, ZM , ZHENG, J , GAN, ZY , (2015) INFLUENCING FACTORS OF GAN GROWTH UNIFORMITY THROUGH ORTHOGONAL TEST ANALYSIS.APPLIED THERMAL ENGINEERING. VOL. 91. ISSUE . P. 53 -61 | 20 | 80% | 3 |
8 | GKINIS, PA , AVIZIOTIS, IG , KORONAKI, ED , GAKIS, GP , BOUDOUVIS, AG , (2017) THE EFFECTS OF FLOW MULTIPLICITY ON GAN DEPOSITION IN A ROTATING DISK CVD REACTOR.JOURNAL OF CRYSTAL GROWTH. VOL. 458. ISSUE . P. 140 -148 | 16 | 100% | 0 |
9 | HABUKA, H , TSUJI, M , (2012) SILICON EPITAXIAL GROWTH RATE AND TRANSPORT PHENOMENA IN A VERTICAL STACKED-TYPE MULTI-WAFER REACTOR.JAPANESE JOURNAL OF APPLIED PHYSICS. VOL. 51. ISSUE 2. P. - | 20 | 87% | 0 |
10 | ABEDI, S , FARHADI, F , BOOZARJOMEHRY, RB , (2013) INTEGRATION OF CFD AND NELDER-MEAD ALGORITHM FOR OPTIMIZATION OF MOCVD PROCESS IN AN ATMOSPHERIC PRESSURE VERTICAL ROTATING DISK REACTOR.INTERNATIONAL COMMUNICATIONS IN HEAT AND MASS TRANSFER. VOL. 43. ISSUE . P. 138-145 | 20 | 80% | 5 |
Classes with closest relation at Level 2 |