Class information for:
Level 1: POLY SI TFT//POLY SI//METAL INDUCED LATERAL CRYSTALLIZATION MILC

Basic class information
Class id #P Avg. number of
references		 Database coverage
of references
1611 2569 16.2 67%


Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
2 4 MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER 2836879
6 3       PHYSICS, APPLIED//IEEE TRANSACTIONS ON ELECTRON DEVICES//SILICON 155028
1385 2             POLYCRYSTALLINE SILICON//POLY SI//THIN FILM TRANSISTORS 8137
1611 1                   POLY SI TFT//POLY SI//METAL INDUCED LATERAL CRYSTALLIZATION MILC 2569

Terms with highest relevance score


rank Term termType Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 POLY SI TFT authKW 729676 3% 69% 89
2 POLY SI authKW 527273 4% 39% 115
3 METAL INDUCED LATERAL CRYSTALLIZATION MILC authKW 467525 2% 91% 43
4 POLYCRYSTALLINE SILICON authKW 423206 6% 25% 144
5 THIN FILM TRANSISTORS authKW 409530 10% 13% 263
6 POLYCRYSTALLINE SILICON POLY SI authKW 397736 2% 71% 47
7 METAL INDUCED LATERAL CRYSTALLIZATION authKW 394918 1% 92% 36
8 THIN FILM TRANSISTOR TFT authKW 389069 5% 24% 137
9 METAL INDUCED CRYSTALLIZATION authKW 373622 2% 60% 52
10 POLYSILICON authKW 292444 4% 23% 107

Web of Science journal categories


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with term
in class
1 Physics, Applied 26397 64% 0% 1646
2 Engineering, Electrical & Electronic 12874 42% 0% 1077
3 Materials Science, Coatings & Films 6856 12% 0% 311
4 Physics, Condensed Matter 2461 18% 0% 459
5 Materials Science, Multidisciplinary 2189 23% 0% 587
6 COMPUTER APPLICATIONS & CYBERNETICS 743 1% 0% 13
7 Electrochemistry 365 4% 0% 98
8 Nanoscience & Nanotechnology 301 5% 0% 119
9 Materials Science, Ceramics 164 2% 0% 50
10 Physics, Multidisciplinary 59 4% 0% 104

Address terms


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 JOINT SCI TECHNOL 149664 1% 55% 23
2 LCD PROC TECHNOL 144867 1% 76% 16
3 BASE TECHNOL 136882 1% 48% 24
4 GRP MICROELECT 127808 1% 51% 21
5 GRP MICROELECT VISUALISAT 99751 1% 44% 19
6 UP A 6076 86258 1% 52% 14
7 MAT DEVICE PLICAT 74043 0% 69% 9
8 NEO POLY INC 71306 0% 100% 6
9 ADV DISPLAY 63250 2% 12% 43
10 ELECT ENGN COMP SCI 50 62539 0% 53% 10

Journals


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 IEEE ELECTRON DEVICE LETTERS 128498 12% 3% 312
2 IEEE TRANSACTIONS ON ELECTRON DEVICES 76080 12% 2% 312
3 SOLID-STATE ELECTRONICS 15810 4% 1% 115
4 JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS 12827 7% 1% 184
5 ELECTROCHEMICAL AND SOLID STATE LETTERS 10943 2% 1% 63
6 THIN SOLID FILMS 8834 6% 0% 166
7 PROCEEDINGS OF THE SID 6089 0% 4% 12
8 JOURNAL OF DISPLAY TECHNOLOGY 4402 1% 2% 22
9 JAPANESE JOURNAL OF APPLIED PHYSICS 4334 3% 0% 77
10 JOURNAL OF THE SOCIETY FOR INFORMATION DISPLAY 4272 1% 2% 22

Author Key Words


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class		 LCSH search Wikipedia search
1 POLY SI TFT 729676 3% 69% 89 Search POLY+SI+TFT Search POLY+SI+TFT
2 POLY SI 527273 4% 39% 115 Search POLY+SI Search POLY+SI
3 METAL INDUCED LATERAL CRYSTALLIZATION MILC 467525 2% 91% 43 Search METAL+INDUCED+LATERAL+CRYSTALLIZATION+MILC Search METAL+INDUCED+LATERAL+CRYSTALLIZATION+MILC
4 POLYCRYSTALLINE SILICON 423206 6% 25% 144 Search POLYCRYSTALLINE+SILICON Search POLYCRYSTALLINE+SILICON
5 THIN FILM TRANSISTORS 409530 10% 13% 263 Search THIN+FILM+TRANSISTORS Search THIN+FILM+TRANSISTORS
6 POLYCRYSTALLINE SILICON POLY SI 397736 2% 71% 47 Search POLYCRYSTALLINE+SILICON+POLY+SI Search POLYCRYSTALLINE+SILICON+POLY+SI
7 METAL INDUCED LATERAL CRYSTALLIZATION 394918 1% 92% 36 Search METAL+INDUCED+LATERAL+CRYSTALLIZATION Search METAL+INDUCED+LATERAL+CRYSTALLIZATION
8 THIN FILM TRANSISTOR TFT 389069 5% 24% 137 Search THIN+FILM+TRANSISTOR+TFT Search THIN+FILM+TRANSISTOR+TFT
9 METAL INDUCED CRYSTALLIZATION 373622 2% 60% 52 Search METAL+INDUCED+CRYSTALLIZATION Search METAL+INDUCED+CRYSTALLIZATION
10 POLYSILICON 292444 4% 23% 107 Search POLYSILICON Search POLYSILICON

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.


Rank Reference # ref.
in cl.		 Shr. of ref. in
cl.		 Citations
1 OROUJI, AA , KUMAR, MJ , (2006) LEAKAGE CURRENT REDUCTION TECHNIQUES IN POLY-SI TFTS FOR ACTIVE MATRIX LIQUID CRYSTAL DISPLAYS: A COMPREHENSIVE STUDY.IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY. VOL. 6. ISSUE 2. P. 315-325 56 84% 20
2 ZHANG, M , ZHOU, W , CHEN, RS , WONG, M , KWOK, HS , (2014) CHARACTERIZATION OF DC-STRESS-INDUCED DEGRADATION IN BRIDGED-GRAIN POLYCRYSTALLINE SILICON THIN-FILM TRANSISTORS.IEEE TRANSACTIONS ON ELECTRON DEVICES. VOL. 61. ISSUE 9. P. 3206 -3212 30 94% 0
3 HE, HY , ZHENG, XR , (2011) ANALYTICAL EXPRESSIONS FOR DOPED POLYCRYSTALLINE SILICON THIN-FILM TRANSISTORS IN ABOVE-THRESHOLD REGIME CONSISTENT WITH PAO-SAH MODEL CONSIDERING TRAPPED CHARGE EFFECT.IEEE TRANSACTIONS ON ELECTRON DEVICES. VOL. 58. ISSUE 12. P. 4324-4332 31 97% 1
4 CHANG, CP , WU, YS , (2010) EFFECT OF CF4 PLASMA ON PROPERTIES AND RELIABILITY OF METAL-INDUCED LATERAL CRYSTALLIZATION SILICON TRANSISTORS.JOURNAL OF THE ELECTROCHEMICAL SOCIETY. VOL. 157. ISSUE 2. P. H192 -H195 31 97% 3
5 BYUN, CW , SON, SW , LEE, YW , JOO, SK , (2012) HIGH PERFORMANCE LOW TEMPERATURE POLYCRYSTALLINE SI THIN-FILM TRANSISTORS FABRICATED BY SILICIDE SEED-INDUCED LATERAL CRYSTALLIZATION.ELECTRONIC MATERIALS LETTERS. VOL. 8. ISSUE 3. P. 251 -258 33 80% 2
6 KIMURA, M , YOSHINO, T , HARADA, K , (2010) COMPLETE EXTRACTION OF TRAP DENSITIES IN POLY-SI THIN-FILM TRANSISTORS.IEEE TRANSACTIONS ON ELECTRON DEVICES. VOL. 57. ISSUE 12. P. 3426-3433 34 81% 7
7 YAMAUCHI, N , REIF, R , (1994) POLYCRYSTALLINE SILICON THIN-FILMS PROCESSED WITH SILICON ION-IMPLANTATION AND SUBSEQUENT SOLID-PHASE CRYSTALLIZATION - THEORY, EXPERIMENTS, AND THIN-FILM-TRANSISTOR APPLICATIONS.JOURNAL OF APPLIED PHYSICS. VOL. 75. ISSUE 7. P. 3235 -3257 48 79% 126
8 BROTHERTON, SD , (1995) POLYCRYSTALLINE SILICON THIN-FILM TRANSISTORS.SEMICONDUCTOR SCIENCE AND TECHNOLOGY. VOL. 10. ISSUE 6. P. 721 -738 52 63% 223
9 CHOI, SH , MO, YG , KIM, HD , HAN, MK , (2012) HOT-CARRIER EFFECTS IN SHORT CHANNEL (L=1.5 MU M) P-TYPE POLYCRYSTALLINE SILICON THIN-FILM TRANSISTORS.JAPANESE JOURNAL OF APPLIED PHYSICS. VOL. 51. ISSUE 2. P. - 27 96% 0
10 HARA, A , KAMO, S , SATO, T , (2014) SELF-ALIGNED FOUR-TERMINAL PLANAR METAL DOUBLE-GATE LOW-TEMPERATURE POLYCRYSTALLINE-SILICON THIN-FILM TRANSISTORS FOR SYSTEM-ON-GLASS.IEICE TRANSACTIONS ON ELECTRONICS. VOL. E97C. ISSUE 11. P. 1048 -1054 33 75% 0

Classes with closest relation at Level 1


Rank Class id link
1 6094 EXCIMER LASER CRYSTALLIZATION//LASER CRYSTALLIZATION//EXCIMER LASER ANNEALING
2 11083 ALUMINUM INDUCED CRYSTALLIZATION//LIQUID PHASE CRYSTALLIZATION//POLYCRYSTALLINE SILICON
3 21911 POLYOXIDE//INTER POLY DIELECTRIC IPD//INTERPOLY OXIDE
4 7419 ACTIVE MATRIX ORGANIC LIGHT EMITTING DIODE AMOLED//PIXEL CIRCUIT//AMOLED
5 10953 REBIC//HEAVILY DOPED POLYSILICON RESISTOR//MELTING SEGREGATION MODEL
6 29679 MEMS POST PROCESSING//AE STZI SENSORTECHNOL ZENTRUM//ALUMINIUM INTERCONNECTS
7 13380 ARCHITECTURE TECH//3 DIMENSIONAL INTEGRATION//ELECTRON DEVICE LETTERS
8 33212 J AN SCI TECHNOL ORG//CYANIDE TREATMENT//DISPLAY TECHNOL DEV GRP
9 356 MICROCRYSTALLINE SILICON//ENERGY UNIT//NANOCRYSTALLINE SILICON
10 8986 IBIEC//AMORPHOUS POCKET//SOLID PHASE EPITAXIAL GROWTH

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