Class information for:
Level 2: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS//IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS//SOFT ERROR

Basic class information
Class id #P Avg. number of
references		 Database coverage
of references
752 12428 20.0 39%


Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
9 4 COMPUTER SCIENCE, THEORY & METHODS//COMPUTER SCIENCE, ARTIFICIAL INTELLIGENCE//COMPUTER SCIENCE, INFORMATION SYSTEMS 1247339
264 3       COMPUTER SCIENCE, HARDWARE & ARCHITECTURE//IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS//ENGINEERING, ELECTRICAL & ELECTRONIC 44494
752 2             JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS//IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS//SOFT ERROR 12428
738 1                   SOFT ERROR//SINGLE EVENT UPSET//SINGLE EVENT TRANSIENT 3114
1955 1                   TEST DATA COMPRESSION//TRANSITION FAULTS//IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS 2409
8660 1                   JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS//MIXED SIGNAL TEST//ANALOG TEST 1231
14495 1                   CRITICAL AREA//IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING//WAFER MAP 766
14808 1                   ORDERED BINARY DECISION DIAGRAMS//BINARY DECISION DIAGRAMS//BRANCHING PROGRAMS 749
17275 1                   MARCH TEST//MEMORY TESTING//BUILT IN SELF REPAIR BISR 608
17444 1                   REED MULLER EXPANSION//REED MULLER TRANSFORM//AND EXOR 599
17996 1                   STATE ASSIGNMENT//LOGIC SYNTHESIS//LOGIC OPTIMIZATION 571
18911 1                   SELF CHECKING CIRCUITS//ITERATIVE LOGIC ARRAYS//CONCURRENT ERROR DETECTION 531
20981 1                   SOFTWARE BASED SELF TEST//FUNCTIONAL VERIFICATION//POST SILICON VALIDATION 438
21792 1                   IEEE TRANSACTIONS ON COMPONENTS HYBRIDS AND MANUFACTURING TECHNOLOGY//MCM TESTING//THERMAL ENGN TECHNOL 405
24801 1                   CONTROL FLOW CHECKING//WATCHDOG PROCESSOR//HYBRID FAULT TOLERANCE TECHNIQUES 301
25434 1                   AMBITUS//CMOS TRANSISTOR NETWORKS//COMP BUSINESS GRP 281
26171 1                   IBM SYST TECHNOL GRP//IBM JOURNAL OF RESEARCH AND DEVELOPMENT//390 261
30690 1                   CHECK DIGITS//CHECK CHARACTER SYSTEM//CHECK DIGIT SYSTEM 164

Terms with highest relevance score


rank Term termType Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with term
in class
1 JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS journal 1123902 6% 65% 702
2 IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS journal 696000 9% 24% 1173
3 SOFT ERROR authKW 677951 3% 77% 358
4 SINGLE EVENT UPSET authKW 528165 2% 78% 276
5 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE WoSSC 507067 36% 5% 4463
6 SINGLE EVENT TRANSIENT authKW 422866 2% 90% 192
7 IEEE TRANSACTIONS ON NUCLEAR SCIENCE journal 393546 13% 10% 1632
8 SINGLE EVENT EFFECTS authKW 380991 2% 69% 226
9 IEEE DESIGN & TEST OF COMPUTERS journal 357546 3% 38% 379
10 SINGLE EVENT UPSET SEU authKW 353578 1% 84% 171

Web of Science journal categories


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with term
in class
1 Computer Science, Hardware & Architecture 507067 36% 5% 4463
2 Engineering, Electrical & Electronic 182071 70% 1% 8642
3 Nuclear Science & Technology 29615 15% 1% 1846
4 Computer Science, Theory & Methods 22198 12% 1% 1510
5 Computer Science, Software Engineering 21140 10% 1% 1233
6 Computer Science, Interdisciplinary Applications 17743 11% 1% 1329
7 Computer Science, Information Systems 9987 8% 0% 980
8 Engineering, Manufacturing 3066 3% 0% 371
9 Instruments & Instrumentation 1739 5% 0% 566
10 COMPUTER APPLICATIONS & CYBERNETICS 1283 0% 1% 38

Address terms


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with term
in class
1 SPACE DEF ELECT 132959 1% 83% 65
2 IBM SYST TECHNOL GRP 75289 0% 65% 47
3 DIPARTIMENTO AUTOMAT INFORMAT 37006 1% 15% 102
4 COMP AIDED DESIGN TEST GRP 31915 0% 100% 13
5 RADIAT EFFECTS GRP 31640 0% 68% 19
6 TIMA 22201 0% 28% 32
7 INFORMAT LS2 22095 0% 100% 9
8 390 20736 0% 65% 13
9 RELIABLE HIGH PERFORMANCE COMP 20585 0% 37% 23
10 ELECT COMP ENGN 20553 9% 1% 1172

Journals


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with term
in class
1 JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS 1123902 6% 65% 702
2 IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS 696000 9% 24% 1173
3 IEEE TRANSACTIONS ON NUCLEAR SCIENCE 393546 13% 10% 1632
4 IEEE DESIGN & TEST OF COMPUTERS 357546 3% 38% 379
5 IEEE TRANSACTIONS ON COMPUTERS 178461 5% 12% 614
6 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS 111456 3% 12% 393
7 IBM JOURNAL OF RESEARCH AND DEVELOPMENT 107767 2% 15% 294
8 IEE PROCEEDINGS-COMPUTERS AND DIGITAL TECHNIQUES 62601 1% 19% 132
9 IEE PROCEEDINGS-E COMPUTERS AND DIGITAL TECHNIQUES 49801 1% 19% 106
10 IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING 47824 1% 11% 175

Author Key Words


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class		 LCSH search Wikipedia search
1 SOFT ERROR 677951 3% 77% 358 Search SOFT+ERROR Search SOFT+ERROR
2 SINGLE EVENT UPSET 528165 2% 78% 276 Search SINGLE+EVENT+UPSET Search SINGLE+EVENT+UPSET
3 SINGLE EVENT TRANSIENT 422866 2% 90% 192 Search SINGLE+EVENT+TRANSIENT Search SINGLE+EVENT+TRANSIENT
4 SINGLE EVENT EFFECTS 380991 2% 69% 226 Search SINGLE+EVENT+EFFECTS Search SINGLE+EVENT+EFFECTS
5 SINGLE EVENT UPSET SEU 353578 1% 84% 171 Search SINGLE+EVENT+UPSET+SEU Search SINGLE+EVENT+UPSET+SEU
6 DESIGN FOR TESTABILITY 318892 2% 69% 188 Search DESIGN+FOR+TESTABILITY Search DESIGN+FOR+TESTABILITY
7 BUILT IN SELF TEST 312660 1% 70% 182 Search BUILT+IN+SELF+TEST Search BUILT+IN+SELF+TEST
8 FAULT INJECTION 258225 1% 71% 149 Search FAULT+INJECTION Search FAULT+INJECTION
9 BUILT IN SELF TEST BIST 249241 1% 73% 140 Search BUILT+IN+SELF+TEST+BIST Search BUILT+IN+SELF+TEST+BIST
10 TEST GENERATION 237936 1% 61% 160 Search TEST+GENERATION Search TEST+GENERATION

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.


Rank Reference # ref. in
cl.		 Shr. of ref. in
cl.		 Citations
1 DODD, PE , MASSENGILL, LW , (2003) BASIC MECHANISMS AND MODELING OF SINGLE-EVENT UPSET IN DIGITAL MICROELECTRONICS.IEEE TRANSACTIONS ON NUCLEAR SCIENCE. VOL. 50. ISSUE 3. P. 583-602 111 93% 422
2 FERLET-CAVROIS, V , MASSENGILL, LW , GOUKER, P , (2013) SINGLE EVENT TRANSIENTS IN DIGITAL CMOS-A REVIEW.IEEE TRANSACTIONS ON NUCLEAR SCIENCE. VOL. 60. ISSUE 3. P. 1767 -1790 92 93% 48
3 REED, RA , WELLER, RA , AKKERMAN, A , BARAK, J , CULPEPPER, W , DUZELLIER, S , FOSTER, C , GAILLARDIN, M , HUBERT, G , JORDAN, T , ET AL (2013) ANTHOLOGY OF THE DEVELOPMENT OF RADIATION TRANSPORT TOOLS AS APPLIED TO SINGLE EVENT EFFECTS.IEEE TRANSACTIONS ON NUCLEAR SCIENCE. VOL. 60. ISSUE 3. P. 1876 -1911 128 63% 13
4 QUINN, HM , BLACK, DA , ROBINSON, WH , BUCHNER, SP , (2013) FAULT SIMULATION AND EMULATION TOOLS TO AUGMENT RADIATION-HARDNESS ASSURANCE TESTING.IEEE TRANSACTIONS ON NUCLEAR SCIENCE. VOL. 60. ISSUE 3. P. 2119 -2142 76 92% 20
5 ARTOLA, L , GAILLARDIN, M , HUBERT, G , RAINE, M , PAILLET, P , (2015) MODELING SINGLE EVENT TRANSIENTS IN ADVANCED DEVICES AND ICS.IEEE TRANSACTIONS ON NUCLEAR SCIENCE. VOL. 62. ISSUE 4. P. 1528 -1539 69 99% 4
6 PETERSEN, EL , KOGA, R , SHOGA, MA , PICKEL, JC , PRICE, WE , (2013) THE SINGLE EVENT REVOLUTION.IEEE TRANSACTIONS ON NUCLEAR SCIENCE. VOL. 60. ISSUE 3. P. 1824-1835 71 97% 2
7 BLACK, JD , DODD, PE , WARREN, KM , (2013) PHYSICS OF MULTIPLE-NODE CHARGE COLLECTION AND IMPACTS ON SINGLE-EVENT CHARACTERIZATION AND SOFT ERROR RATE PREDICTION.IEEE TRANSACTIONS ON NUCLEAR SCIENCE. VOL. 60. ISSUE 3. P. 1836-1851 60 97% 23
8 DODD, PE , (2005) PHYSICS-BASED SIMULATION OF SINGLE-EVENT EFFECTS.IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY. VOL. 5. ISSUE 3. P. 343 -357 79 89% 55
9 TANG, D , HE, CH , LI, YH , ZANG, H , XIONG, C , ZHANG, JX , (2014) SOFT ERROR RELIABILITY IN ADVANCED CMOS TECHNOLOGIES-TRENDS AND CHALLENGES.SCIENCE CHINA-TECHNOLOGICAL SCIENCES. VOL. 57. ISSUE 9. P. 1846 -1857 57 95% 7
10 KARNIK, T , HAZUCHA, P , PATEL, J , (2004) CHARACTERIZATION OF SOFT ERRORS CAUSED BY SINGLE EVENT UPSETS IN CMOS PROCESSES.IEEE TRANSACTIONS ON DEPENDABLE AND SECURE COMPUTING. VOL. 1. ISSUE 2. P. 128 -143 52 98% 195

Classes with closest relation at Level 2


Rank Class id link
1 470 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE//IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS//NETWORK ON CHIP
2 3199 SYSTOLIC ARRAY//ALGORITHM BASED FAULT TOLERANCE//ALGORITHM TRANSFORMATION
3 3618 QUANTUM DOT CELLULAR AUTOMATA//QUANTUM DOT CELLULAR AUTOMATA QCA//MAJORITY GATE
4 2712 IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS//PHYSICAL DESIGN//FLOORPLANNING
5 4138 SEQUENTIAL FAULT DIAGNOSIS//TEST SEQUENCING PROBLEM//TEST SEQUENCING
6 474 FLASH MEMORY//SONOS//NEGATIVE BIAS TEMPERATURE INSTABILITY NBTI
7 1913 ACM SIGPLAN NOTICES//GARBAGE COLLECTION//REGISTER ALLOCATION
8 3027 SOFTWARE RELIABILITY//SOFTWARE RELIABILITY GROWTH MODEL//RELIABILITY GROWTH
9 1890 CONSTRAINTS//BOUNDED ARITHMETIC//PROOF COMPLEXITY
10 2473 BLOCK CIPHER//STREAM CIPHER//BOOLEAN FUNCTIONS

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