Class information for: |
Basic class information |
| Class id | #P | Avg. number of references |
Database coverage of references |
|---|---|---|---|
| 264 | 44494 | 20.1 | 39% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Terms with highest relevance score |
| rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|---|
| 1 | COMPUTER SCIENCE, HARDWARE & ARCHITECTURE | WoSSC | 1309818 | 31% | 14% | 13593 |
| 2 | IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS | journal | 809070 | 5% | 49% | 2396 |
| 3 | ENGINEERING, ELECTRICAL & ELECTRONIC | WoSSC | 636881 | 69% | 3% | 30598 |
| 4 | IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS | journal | 604057 | 4% | 51% | 1730 |
| 5 | JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS | journal | 383516 | 2% | 72% | 777 |
| 6 | IEEE TRANSACTIONS ON COMPUTERS | journal | 299740 | 3% | 29% | 1508 |
| 7 | IEEE DESIGN & TEST OF COMPUTERS | journal | 251300 | 1% | 61% | 602 |
| 8 | SOFT ERROR | authKW | 224188 | 1% | 84% | 390 |
| 9 | NETWORK ON CHIP | authKW | 207457 | 1% | 81% | 376 |
| 10 | SRAM | authKW | 176746 | 1% | 66% | 390 |
Web of Science journal categories |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|
| 1 | Computer Science, Hardware & Architecture | 1309818 | 31% | 14% | 13593 |
| 2 | Engineering, Electrical & Electronic | 636881 | 69% | 3% | 30598 |
| 3 | Computer Science, Theory & Methods | 90829 | 13% | 3% | 5757 |
| 4 | Computer Science, Software Engineering | 66389 | 9% | 3% | 4149 |
| 5 | Computer Science, Information Systems | 31169 | 7% | 2% | 3295 |
| 6 | Computer Science, Interdisciplinary Applications | 24716 | 7% | 1% | 3085 |
| 7 | Automation & Control Systems | 10091 | 3% | 1% | 1556 |
| 8 | Nuclear Science & Technology | 6367 | 4% | 1% | 1897 |
| 9 | Telecommunications | 5225 | 3% | 1% | 1557 |
| 10 | Computer Science, Artificial Intelligence | 2265 | 2% | 1% | 1108 |
Address terms |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|
| 1 | ELECT COMP ENGN | 90795 | 10% | 3% | 4637 |
| 2 | ELECT ENGN | 46940 | 9% | 2% | 4204 |
| 3 | SPACE DEF ELECT | 39363 | 0% | 86% | 67 |
| 4 | COMP ENGN | 28041 | 2% | 5% | 896 |
| 5 | IBM SYST TECHNOL GRP | 25670 | 0% | 72% | 52 |
| 6 | DIPARTIMENTO AUTOMAT INFORMAT | 20714 | 0% | 21% | 145 |
| 7 | TIMA | 18262 | 0% | 49% | 55 |
| 8 | ELECT ENGN COMP SCI | 16572 | 2% | 3% | 957 |
| 9 | COMP SCI | 16383 | 5% | 1% | 2094 |
| 10 | HIGH PERFORMANCE EMBEDDED SYST | 15920 | 0% | 53% | 44 |
Journals |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|
| 1 | IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS | 809070 | 5% | 49% | 2396 |
| 2 | IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS | 604057 | 4% | 51% | 1730 |
| 3 | JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS | 383516 | 2% | 72% | 777 |
| 4 | IEEE TRANSACTIONS ON COMPUTERS | 299740 | 3% | 29% | 1508 |
| 5 | IEEE DESIGN & TEST OF COMPUTERS | 251300 | 1% | 61% | 602 |
| 6 | INTEGRATION-THE VLSI JOURNAL | 146213 | 1% | 47% | 460 |
| 7 | ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS | 143916 | 1% | 53% | 399 |
| 8 | IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS | 142524 | 1% | 34% | 608 |
| 9 | IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS | 130141 | 2% | 22% | 873 |
| 10 | IEEE TRANSACTIONS ON SIGNAL PROCESSING | 124207 | 3% | 14% | 1348 |
Author Key Words |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
LCSH search | Wikipedia search |
|---|---|---|---|---|---|---|---|
| 1 | SOFT ERROR | 224188 | 1% | 84% | 390 | Search SOFT+ERROR | Search SOFT+ERROR |
| 2 | NETWORK ON CHIP | 207457 | 1% | 81% | 376 | Search NETWORK+ON+CHIP | Search NETWORK+ON+CHIP |
| 3 | SRAM | 176746 | 1% | 66% | 390 | Search SRAM | Search SRAM |
| 4 | HIGH LEVEL SYNTHESIS | 171837 | 1% | 78% | 321 | Search HIGH+LEVEL+SYNTHESIS | Search HIGH+LEVEL+SYNTHESIS |
| 5 | SINGLE EVENT UPSET | 156899 | 1% | 81% | 285 | Search SINGLE+EVENT+UPSET | Search SINGLE+EVENT+UPSET |
| 6 | LOW POWER | 150775 | 2% | 27% | 811 | Search LOW+POWER | Search LOW+POWER |
| 7 | SINGLE EVENT TRANSIENT | 125330 | 0% | 93% | 198 | Search SINGLE+EVENT+TRANSIENT | Search SINGLE+EVENT+TRANSIENT |
| 8 | COMPUTER ARITHMETIC | 124756 | 1% | 74% | 248 | Search COMPUTER+ARITHMETIC | Search COMPUTER+ARITHMETIC |
| 9 | DESIGN FOR TESTABILITY | 109795 | 0% | 77% | 209 | Search DESIGN+FOR+TESTABILITY | Search DESIGN+FOR+TESTABILITY |
| 10 | SINGLE EVENT EFFECTS | 107035 | 1% | 69% | 227 | Search SINGLE+EVENT+EFFECTS | Search SINGLE+EVENT+EFFECTS |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
| Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
|---|---|---|---|---|
| 1 | DODD, PE , MASSENGILL, LW , (2003) BASIC MECHANISMS AND MODELING OF SINGLE-EVENT UPSET IN DIGITAL MICROELECTRONICS.IEEE TRANSACTIONS ON NUCLEAR SCIENCE. VOL. 50. ISSUE 3. P. 583-602 | 111 | 93% | 422 |
| 2 | FERLET-CAVROIS, V , MASSENGILL, LW , GOUKER, P , (2013) SINGLE EVENT TRANSIENTS IN DIGITAL CMOS-A REVIEW.IEEE TRANSACTIONS ON NUCLEAR SCIENCE. VOL. 60. ISSUE 3. P. 1767 -1790 | 92 | 93% | 48 |
| 3 | REED, RA , WELLER, RA , AKKERMAN, A , BARAK, J , CULPEPPER, W , DUZELLIER, S , FOSTER, C , GAILLARDIN, M , HUBERT, G , JORDAN, T , ET AL (2013) ANTHOLOGY OF THE DEVELOPMENT OF RADIATION TRANSPORT TOOLS AS APPLIED TO SINGLE EVENT EFFECTS.IEEE TRANSACTIONS ON NUCLEAR SCIENCE. VOL. 60. ISSUE 3. P. 1876 -1911 | 128 | 63% | 13 |
| 4 | QUINN, HM , BLACK, DA , ROBINSON, WH , BUCHNER, SP , (2013) FAULT SIMULATION AND EMULATION TOOLS TO AUGMENT RADIATION-HARDNESS ASSURANCE TESTING.IEEE TRANSACTIONS ON NUCLEAR SCIENCE. VOL. 60. ISSUE 3. P. 2119 -2142 | 77 | 93% | 20 |
| 5 | ARTOLA, L , GAILLARDIN, M , HUBERT, G , RAINE, M , PAILLET, P , (2015) MODELING SINGLE EVENT TRANSIENTS IN ADVANCED DEVICES AND ICS.IEEE TRANSACTIONS ON NUCLEAR SCIENCE. VOL. 62. ISSUE 4. P. 1528 -1539 | 69 | 99% | 4 |
| 6 | PETERSEN, EL , KOGA, R , SHOGA, MA , PICKEL, JC , PRICE, WE , (2013) THE SINGLE EVENT REVOLUTION.IEEE TRANSACTIONS ON NUCLEAR SCIENCE. VOL. 60. ISSUE 3. P. 1824-1835 | 71 | 97% | 2 |
| 7 | JOZWIAK, L , NEDJAH, N , FIGUEROA, M , (2010) MODERN DEVELOPMENT METHODS AND TOOLS FOR EMBEDDED RECONFIGURABLE SYSTEMS: A SURVEY.INTEGRATION-THE VLSI JOURNAL. VOL. 43. ISSUE 1. P. 1 -33 | 82 | 86% | 12 |
| 8 | BLACK, JD , DODD, PE , WARREN, KM , (2013) PHYSICS OF MULTIPLE-NODE CHARGE COLLECTION AND IMPACTS ON SINGLE-EVENT CHARACTERIZATION AND SOFT ERROR RATE PREDICTION.IEEE TRANSACTIONS ON NUCLEAR SCIENCE. VOL. 60. ISSUE 3. P. 1836-1851 | 60 | 97% | 23 |
| 9 | TANG, D , HE, CH , LI, YH , ZANG, H , XIONG, C , ZHANG, JX , (2014) SOFT ERROR RELIABILITY IN ADVANCED CMOS TECHNOLOGIES-TRENDS AND CHALLENGES.SCIENCE CHINA-TECHNOLOGICAL SCIENCES. VOL. 57. ISSUE 9. P. 1846 -1857 | 60 | 100% | 7 |
| 10 | DODD, PE , (2005) PHYSICS-BASED SIMULATION OF SINGLE-EVENT EFFECTS.IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY. VOL. 5. ISSUE 3. P. 343 -357 | 79 | 89% | 55 |
Classes with closest relation at Level 3 |