Class information for:
Level 1: SOFT ERROR//SINGLE EVENT UPSET//SINGLE EVENT TRANSIENT

Basic class information
Class id #P Avg. number of
references		 Database coverage
of references
738 3114 20.3 54%


Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
9 4 COMPUTER SCIENCE, THEORY & METHODS//COMPUTER SCIENCE, ARTIFICIAL INTELLIGENCE//COMPUTER SCIENCE, INFORMATION SYSTEMS 1247339
264 3       COMPUTER SCIENCE, HARDWARE & ARCHITECTURE//IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS//ENGINEERING, ELECTRICAL & ELECTRONIC 44494
752 2             JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS//IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS//SOFT ERROR 12428
738 1                   SOFT ERROR//SINGLE EVENT UPSET//SINGLE EVENT TRANSIENT 3114

Terms with highest relevance score


rank Term termType Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with term
in class
1 SOFT ERROR authKW 2163439 10% 69% 320
2 SINGLE EVENT UPSET authKW 2018827 9% 76% 270
3 SINGLE EVENT TRANSIENT authKW 1653807 6% 89% 190
4 IEEE TRANSACTIONS ON NUCLEAR SCIENCE journal 1517052 51% 10% 1599
5 SINGLE EVENT EFFECTS authKW 1481747 7% 68% 223
6 SINGLE EVENT UPSET SEU authKW 1298892 5% 81% 164
7 SINGLE EVENT TRANSIENT SET authKW 804346 3% 86% 95
8 FAULT INJECTION authKW 797276 4% 62% 131
9 SEU authKW 762567 3% 79% 99
10 SOFT ERROR RATE authKW 569399 2% 88% 66

Web of Science journal categories


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with term
in class
1 Nuclear Science & Technology 120359 57% 1% 1785
2 Engineering, Electrical & Electronic 59925 79% 0% 2468
3 Computer Science, Hardware & Architecture 16901 13% 0% 414
4 Computer Science, Software Engineering 1520 6% 0% 173
5 Instruments & Instrumentation 597 5% 0% 161
6 Physics, Nuclear 483 4% 0% 140
7 Computer Science, Theory & Methods 478 4% 0% 127
8 Nanoscience & Nanotechnology 425 5% 0% 153
9 Physics, Applied 368 10% 0% 313
10 Computer Science, Information Systems 207 3% 0% 85

Address terms


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 SPACE DEF ELECT 531027 2% 83% 65
2 RADIAT EFFECTS GRP 126389 1% 68% 19
3 COMPONENT ENGN GRP 68628 0% 100% 7
4 ISDE 53374 0% 78% 7
5 IES UMR CNRS 5214 44115 0% 75% 6
6 CENT CAD DESIGN SOLUT 40027 0% 58% 7
7 ISR SPACE DATA SYST 3 39216 0% 100% 4
8 MEI TECHNOL INC 39216 0% 100% 4
9 CC 083 29412 0% 100% 3
10 QUALIFICAT GRP 29412 0% 100% 3

Journals


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with term
in class
1 IEEE TRANSACTIONS ON NUCLEAR SCIENCE 1517052 51% 10% 1599
2 IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY 50131 2% 7% 74
3 JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS 47100 2% 7% 72
4 MICROELECTRONICS RELIABILITY 19894 4% 2% 119
5 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS 11025 2% 2% 62
6 IEEE TRANSACTIONS ON COMPUTERS 7664 2% 1% 64
7 IEEE TRANSACTIONS ON DEPENDABLE AND SECURE COMPUTING 3968 0% 3% 14
8 IEEE MICRO 3856 1% 2% 22
9 MICROPROCESSORS AND MICROSYSTEMS 3464 1% 1% 25
10 IEEE TRANSACTIONS ON RELIABILITY 2854 1% 1% 30

Author Key Words


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class		 LCSH search Wikipedia search
1 SOFT ERROR 2163439 10% 69% 320 Search SOFT+ERROR Search SOFT+ERROR
2 SINGLE EVENT UPSET 2018827 9% 76% 270 Search SINGLE+EVENT+UPSET Search SINGLE+EVENT+UPSET
3 SINGLE EVENT TRANSIENT 1653807 6% 89% 190 Search SINGLE+EVENT+TRANSIENT Search SINGLE+EVENT+TRANSIENT
4 SINGLE EVENT EFFECTS 1481747 7% 68% 223 Search SINGLE+EVENT+EFFECTS Search SINGLE+EVENT+EFFECTS
5 SINGLE EVENT UPSET SEU 1298892 5% 81% 164 Search SINGLE+EVENT+UPSET+SEU Search SINGLE+EVENT+UPSET+SEU
6 SINGLE EVENT TRANSIENT SET 804346 3% 86% 95 Search SINGLE+EVENT+TRANSIENT+SET Search SINGLE+EVENT+TRANSIENT+SET
7 FAULT INJECTION 797276 4% 62% 131 Search FAULT+INJECTION Search FAULT+INJECTION
8 SEU 762567 3% 79% 99 Search SEU Search SEU
9 SOFT ERROR RATE 569399 2% 88% 66 Search SOFT+ERROR+RATE Search SOFT+ERROR+RATE
10 SOFT ERROR RATE SER 397052 1% 90% 45 Search SOFT+ERROR+RATE+SER Search SOFT+ERROR+RATE+SER

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.


Rank Reference # ref. in
cl.		 Shr. of ref. in
cl.		 Citations
1 DODD, PE , MASSENGILL, LW , (2003) BASIC MECHANISMS AND MODELING OF SINGLE-EVENT UPSET IN DIGITAL MICROELECTRONICS.IEEE TRANSACTIONS ON NUCLEAR SCIENCE. VOL. 50. ISSUE 3. P. 583-602 110 92% 422
2 FERLET-CAVROIS, V , MASSENGILL, LW , GOUKER, P , (2013) SINGLE EVENT TRANSIENTS IN DIGITAL CMOS-A REVIEW.IEEE TRANSACTIONS ON NUCLEAR SCIENCE. VOL. 60. ISSUE 3. P. 1767 -1790 92 93% 48
3 REED, RA , WELLER, RA , AKKERMAN, A , BARAK, J , CULPEPPER, W , DUZELLIER, S , FOSTER, C , GAILLARDIN, M , HUBERT, G , JORDAN, T , ET AL (2013) ANTHOLOGY OF THE DEVELOPMENT OF RADIATION TRANSPORT TOOLS AS APPLIED TO SINGLE EVENT EFFECTS.IEEE TRANSACTIONS ON NUCLEAR SCIENCE. VOL. 60. ISSUE 3. P. 1876 -1911 128 63% 13
4 ARTOLA, L , GAILLARDIN, M , HUBERT, G , RAINE, M , PAILLET, P , (2015) MODELING SINGLE EVENT TRANSIENTS IN ADVANCED DEVICES AND ICS.IEEE TRANSACTIONS ON NUCLEAR SCIENCE. VOL. 62. ISSUE 4. P. 1528 -1539 69 99% 4
5 QUINN, HM , BLACK, DA , ROBINSON, WH , BUCHNER, SP , (2013) FAULT SIMULATION AND EMULATION TOOLS TO AUGMENT RADIATION-HARDNESS ASSURANCE TESTING.IEEE TRANSACTIONS ON NUCLEAR SCIENCE. VOL. 60. ISSUE 3. P. 2119 -2142 74 89% 20
6 PETERSEN, EL , KOGA, R , SHOGA, MA , PICKEL, JC , PRICE, WE , (2013) THE SINGLE EVENT REVOLUTION.IEEE TRANSACTIONS ON NUCLEAR SCIENCE. VOL. 60. ISSUE 3. P. 1824-1835 71 97% 2
7 BLACK, JD , DODD, PE , WARREN, KM , (2013) PHYSICS OF MULTIPLE-NODE CHARGE COLLECTION AND IMPACTS ON SINGLE-EVENT CHARACTERIZATION AND SOFT ERROR RATE PREDICTION.IEEE TRANSACTIONS ON NUCLEAR SCIENCE. VOL. 60. ISSUE 3. P. 1836-1851 60 97% 23
8 DODD, PE , (2005) PHYSICS-BASED SIMULATION OF SINGLE-EVENT EFFECTS.IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY. VOL. 5. ISSUE 3. P. 343 -357 79 89% 55
9 TANG, D , HE, CH , LI, YH , ZANG, H , XIONG, C , ZHANG, JX , (2014) SOFT ERROR RELIABILITY IN ADVANCED CMOS TECHNOLOGIES-TRENDS AND CHALLENGES.SCIENCE CHINA-TECHNOLOGICAL SCIENCES. VOL. 57. ISSUE 9. P. 1846 -1857 57 95% 7
10 KARNIK, T , HAZUCHA, P , PATEL, J , (2004) CHARACTERIZATION OF SOFT ERRORS CAUSED BY SINGLE EVENT UPSETS IN CMOS PROCESSES.IEEE TRANSACTIONS ON DEPENDABLE AND SECURE COMPUTING. VOL. 1. ISSUE 2. P. 128 -143 52 98% 195

Classes with closest relation at Level 1


Rank Class id link
1 24801 CONTROL FLOW CHECKING//WATCHDOG PROCESSOR//HYBRID FAULT TOLERANCE TECHNIQUES
2 21194 SINGLE EVENT BURNOUT SEB//SINGLE EVENT GATE RUPTURE SEGR//RREACT GRP
3 21285 SOFT ERROR MAPPING//HIGH ENERGY ION IMPLANTATION//DYNAMIC RANDOM ACCESS MEMORY
4 2169 IEEE TRANSACTIONS ON NUCLEAR SCIENCE//TOTAL IONIZING DOSE//OXIDE TRAPPED CHARGE
5 14880 SIGEHBT//A AMA MICROELECT SCI TECHNOL//MIXED MODE STRESS
6 12205 DISPLACEMENT DAMAGE//NONIONIZING ENERGY LOSS//DISPLACEMENT DAMAGE DOSE
7 18911 SELF CHECKING CIRCUITS//ITERATIVE LOGIC ARRAYS//CONCURRENT ERROR DETECTION
8 24020 DEFECT TOLERANCE//NEUROMORPHIC NETWORKS//CMOL
9 3550 SRAM//PROCESS VARIATION//POWER GATING
10 30690 CHECK DIGITS//CHECK CHARACTER SYSTEM//CHECK DIGIT SYSTEM

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