Class information for:
Level 1: SELF CHECKING CIRCUITS//ITERATIVE LOGIC ARRAYS//CONCURRENT ERROR DETECTION

Basic class information
Class id #P Avg. number of
references		 Database coverage
of references
18911 531 19.2 28%


Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
9 4 COMPUTER SCIENCE, THEORY & METHODS//COMPUTER SCIENCE, ARTIFICIAL INTELLIGENCE//COMPUTER SCIENCE, INFORMATION SYSTEMS 1247339
264 3       COMPUTER SCIENCE, HARDWARE & ARCHITECTURE//IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS//ENGINEERING, ELECTRICAL & ELECTRONIC 44494
752 2             JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS//IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS//SOFT ERROR 12428
18911 1                   SELF CHECKING CIRCUITS//ITERATIVE LOGIC ARRAYS//CONCURRENT ERROR DETECTION 531

Terms with highest relevance score


rank Term termType Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 SELF CHECKING CIRCUITS authKW 1240013 5% 74% 29
2 ITERATIVE LOGIC ARRAYS authKW 626151 3% 78% 14
3 CONCURRENT ERROR DETECTION authKW 613898 6% 32% 33
4 TOTALLY SELF CHECKING CHECKER authKW 575043 2% 100% 10
5 ON LINE TESTING authKW 450990 4% 39% 20
6 C TESTABILITY authKW 410739 2% 71% 10
7 SELF TESTING CHECKER authKW 345026 1% 100% 6
8 TOTALLY SELF CHECKING CIRCUITS authKW 313076 1% 78% 7
9 CELL FAULT MODEL authKW 287521 1% 100% 5
10 TWO RAIL CODE authKW 287521 1% 100% 5

Web of Science journal categories


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 Computer Science, Hardware & Architecture 34154 45% 0% 239
2 Engineering, Electrical & Electronic 7813 70% 0% 370
3 Computer Science, Theory & Methods 842 11% 0% 61
4 Automation & Control Systems 786 8% 0% 44
5 Computer Science, Interdisciplinary Applications 437 8% 0% 44
6 Computer Science, Software Engineering 331 6% 0% 33
7 Instruments & Instrumentation 307 8% 0% 44
8 Computer Science, Information Systems 89 4% 0% 21
9 COMPUTER APPLICATIONS & CYBERNETICS 84 0% 0% 2
10 Nuclear Science & Technology 63 4% 0% 21

Address terms


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 RELIABLE INTEGRATED SYST GRP 239599 1% 83% 5
2 SATELLITENKOMMUNIKAT GESELL 115009 0% 100% 2
3 EECS ADV COMP ARCHITECTURE 57504 0% 100% 1
4 ENGINE CONTROL UNITS 57504 0% 100% 1
5 FAULT TOLERANCE COMP GRP 57504 0% 100% 1
6 FAULT TOLERANCE GRP 57504 0% 100% 1
7 FAULT TOLERANT GRP 57504 0% 100% 1
8 HIGH RELIABL AVAI IL TECHNOL 57504 0% 100% 1
9 INTEGRATED SYST DESIGN GRP 57504 0% 100% 1
10 JEAN MONNETLAAN 57504 0% 100% 1

Journals


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS 81211 7% 4% 39
2 IEEE TRANSACTIONS ON COMPUTERS 60939 14% 1% 74
3 NUCLEAR SAFETY 48694 4% 4% 19
4 IEE PROCEEDINGS-E COMPUTERS AND DIGITAL TECHNIQUES 33718 3% 3% 18
5 AUTOMATION AND REMOTE CONTROL 23290 7% 1% 39
6 VLSI DESIGN 21813 2% 3% 13
7 IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS 19887 8% 1% 41
8 IEEE DESIGN & TEST OF COMPUTERS 18880 3% 2% 18
9 IEE PROCEEDINGS-COMPUTERS AND DIGITAL TECHNIQUES 10196 2% 2% 11
10 INTERNATIONAL JOURNAL OF ELECTRONICS 8030 5% 1% 26

Author Key Words


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class		 LCSH search Wikipedia search
1 SELF CHECKING CIRCUITS 1240013 5% 74% 29 Search SELF+CHECKING+CIRCUITS Search SELF+CHECKING+CIRCUITS
2 ITERATIVE LOGIC ARRAYS 626151 3% 78% 14 Search ITERATIVE+LOGIC+ARRAYS Search ITERATIVE+LOGIC+ARRAYS
3 CONCURRENT ERROR DETECTION 613898 6% 32% 33 Search CONCURRENT+ERROR+DETECTION Search CONCURRENT+ERROR+DETECTION
4 TOTALLY SELF CHECKING CHECKER 575043 2% 100% 10 Search TOTALLY+SELF+CHECKING+CHECKER Search TOTALLY+SELF+CHECKING+CHECKER
5 ON LINE TESTING 450990 4% 39% 20 Search ON+LINE+TESTING Search ON+LINE+TESTING
6 C TESTABILITY 410739 2% 71% 10 Search C+TESTABILITY Search C+TESTABILITY
7 SELF TESTING CHECKER 345026 1% 100% 6 Search SELF+TESTING+CHECKER Search SELF+TESTING+CHECKER
8 TOTALLY SELF CHECKING CIRCUITS 313076 1% 78% 7 Search TOTALLY+SELF+CHECKING+CIRCUITS Search TOTALLY+SELF+CHECKING+CIRCUITS
9 CELL FAULT MODEL 287521 1% 100% 5 Search CELL+FAULT+MODEL Search CELL+FAULT+MODEL
10 TWO RAIL CODE 287521 1% 100% 5 Search TWO+RAIL+CODE Search TWO+RAIL+CODE

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.


Rank Reference # ref.
in cl.		 Shr. of ref. in
cl.		 Citations
1 YE, BY , YEH, PY , KUO, SY , CHEN, IY , (2009) SCALABLE AND BIJECTIVE CELLS FOR C-TESTABLE ITERATIVE LOGIC ARRAY ARCHITECTURES.IET CIRCUITS DEVICES & SYSTEMS. VOL. 3. ISSUE 4. P. 172 -181 15 100% 0
2 BISWAL, PK , BISWAS, S , (2015) A BINARY DECISION DIAGRAM BASED ON-LINE TESTING OF DIGITAL VLSI CIRCUITS FOR FEEDBACK BRIDGING FAULTS.MICROELECTRONICS JOURNAL. VOL. 46. ISSUE 7. P. 598 -616 15 68% 0
3 TARNICK, S , (2008) CHECKERS FOR T=2KQ-1 WITH Q=2M-1.JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS. VOL. 24. ISSUE 6. P. 509 -527 12 92% 0
4 TARNICK, S , (2004) DESIGN OF EMBEDDED SELF-TESTING CHECKERS FOR T-UED AND BUED CODES.JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS. VOL. 20. ISSUE 5. P. 465 -477 13 87% 1
5 SAPOZHNIKOV, VV , SAPOZHNIKOV, VV , EFANOV, DV , DMITRIEV, VV , (2017) NEW STRUCTURES OF THE CONCURRENT ERROR DETECTION SYSTEMS FOR LOGIC CIRCUITS.AUTOMATION AND REMOTE CONTROL. VOL. 78. ISSUE 2. P. 300 -312 8 100% 0
6 LU, SK , (2003) DELAY FAULT TESTING FOR CMOS ITERATIVE LOGIC ARRAYS WITH A CONSTANT NUMBER OF PATTERNS.IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS. VOL. E86D. ISSUE 12. P. 2659 -2665 12 92% 2
7 KITO, N , HANAI, K , TAKAGI, N , (2010) A C-TESTABLE 4-2 ADDER TREE FOR AN EASILY TESTABLE HIGH-SPEED MULTIPLIER.IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS. VOL. E93D. ISSUE 10. P. 2783-2791 9 100% 0
8 METRA, C , OMANA, M , ROSSI, D , (2005) LOW COST AND HIGH SPEED EMBEDDED TWO-RAIL CODE CHECKER.IEEE TRANSACTIONS ON COMPUTERS. VOL. 54. ISSUE 2. P. 153 -164 10 100% 4
9 YE, BY , YEH, PY , KUO, SY , CHEN, IY , (2009) DESIGN-FOR-TESTABILITY TECHNIQUES FOR CORDIC DESIGN.MICROELECTRONICS JOURNAL. VOL. 40. ISSUE 10. P. 1436-1440 11 79% 1
10 TARNICK, S , (2005) SINGLE- AND DOUBLE-OUTPUT EMBEDDED CHECKER ARCHITECTURES FOR SYSTEMATIC UNORDERED CODES.JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS. VOL. 21. ISSUE 4. P. 391 -404 11 85% 0

Classes with closest relation at Level 1


Rank Class id link
1 1955 TEST DATA COMPRESSION//TRANSITION FAULTS//IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS
2 17996 STATE ASSIGNMENT//LOGIC SYNTHESIS//LOGIC OPTIMIZATION
3 11675 ALGORITHM BASED FAULT TOLERANCE//SYSTOLIC ARRAY//ALGORITHM TRANSFORMATION
4 24801 CONTROL FLOW CHECKING//WATCHDOG PROCESSOR//HYBRID FAULT TOLERANCE TECHNIQUES
5 15188 BALANCED CODES//UNIDIRECTIONAL ERRORS//CONSTRAINED CODES
6 17444 REED MULLER EXPANSION//REED MULLER TRANSFORM//AND EXOR
7 17275 MARCH TEST//MEMORY TESTING//BUILT IN SELF REPAIR BISR
8 20981 SOFTWARE BASED SELF TEST//FUNCTIONAL VERIFICATION//POST SILICON VALIDATION
9 25434 AMBITUS//CMOS TRANSISTOR NETWORKS//COMP BUSINESS GRP
10 22822 FLIP FLOP//PULSED LATCH//LEVEL CONVERTER

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