Class information for: |
Basic class information |
| Class id | #P | Avg. number of references |
Database coverage of references |
|---|---|---|---|
| 20981 | 438 | 22.2 | 30% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Terms with highest relevance score |
| rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|---|
| 1 | SOFTWARE BASED SELF TEST | authKW | 853999 | 3% | 88% | 14 |
| 2 | FUNCTIONAL VERIFICATION | authKW | 648486 | 5% | 47% | 20 |
| 3 | POST SILICON VALIDATION | authKW | 627418 | 3% | 60% | 15 |
| 4 | SILICON DEBUG | authKW | 497955 | 2% | 71% | 10 |
| 5 | SOFTWARE BASED SELF TEST SBST | authKW | 488001 | 2% | 100% | 7 |
| 6 | PROCESSOR TESTING | authKW | 379554 | 2% | 78% | 7 |
| 7 | TRACE BUFFER | authKW | 358530 | 1% | 86% | 6 |
| 8 | MICROPROCESSOR TESTING | authKW | 348562 | 2% | 50% | 10 |
| 9 | TRACE COMPRESSION | authKW | 290475 | 1% | 83% | 5 |
| 10 | DESIGN DEBUGGING | authKW | 278858 | 1% | 100% | 4 |
Web of Science journal categories |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|
| 1 | Computer Science, Hardware & Architecture | 53438 | 62% | 0% | 271 |
| 2 | Engineering, Electrical & Electronic | 5340 | 64% | 0% | 279 |
| 3 | Computer Science, Software Engineering | 1841 | 15% | 0% | 67 |
| 4 | Computer Science, Interdisciplinary Applications | 1293 | 15% | 0% | 66 |
| 5 | Computer Science, Theory & Methods | 715 | 12% | 0% | 51 |
| 6 | Computer Science, Information Systems | 222 | 6% | 0% | 28 |
| 7 | Computer Science, Artificial Intelligence | 60 | 4% | 0% | 16 |
| 8 | Automation & Control Systems | 46 | 3% | 0% | 11 |
| 9 | COMPUTER APPLICATIONS & CYBERNETICS | 25 | 0% | 0% | 1 |
| 10 | Mathematics | 17 | 4% | 0% | 19 |
Address terms |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|
| 1 | DIPARTIMENTO INFORMAT AUTOMAT | 139429 | 0% | 100% | 2 |
| 2 | GIRA GRP | 139429 | 0% | 100% | 2 |
| 3 | ANALOG MIXED SIGNALS GRP | 69714 | 0% | 100% | 1 |
| 4 | ARCHITECTURE SYST PLATFORM | 69714 | 0% | 100% | 1 |
| 5 | AREA FIELDBUS CONTROL NETWORK DEV | 69714 | 0% | 100% | 1 |
| 6 | CORE ARCHITECTURE GRP | 69714 | 0% | 100% | 1 |
| 7 | CORP IT IP ARCHITECTURE | 69714 | 0% | 100% | 1 |
| 8 | DA DEP | 69714 | 0% | 100% | 1 |
| 9 | DESIGN FOR DEBUG VALIDAT GRP | 69714 | 0% | 100% | 1 |
| 10 | DESIGN VERIFICAT TEST | 69714 | 0% | 100% | 1 |
Journals |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|
| 1 | IEEE DESIGN & TEST OF COMPUTERS | 91657 | 8% | 4% | 36 |
| 2 | JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS | 88627 | 8% | 3% | 37 |
| 3 | IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS | 50013 | 13% | 1% | 59 |
| 4 | IEEE TRANSACTIONS ON COMPUTERS | 23773 | 10% | 1% | 42 |
| 5 | IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS | 23769 | 8% | 1% | 34 |
| 6 | DESIGN AUTOMATION FOR EMBEDDED SYSTEMS | 20820 | 2% | 3% | 9 |
| 7 | IEEE DESIGN & TEST | 10952 | 1% | 3% | 5 |
| 8 | ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS | 7462 | 2% | 1% | 9 |
| 9 | MICROPROCESSORS AND MICROSYSTEMS | 5732 | 3% | 1% | 12 |
| 10 | MICROPROCESSING AND MICROPROGRAMMING | 3968 | 2% | 1% | 8 |
Author Key Words |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
LCSH search | Wikipedia search |
|---|---|---|---|---|---|---|---|
| 1 | SOFTWARE BASED SELF TEST | 853999 | 3% | 88% | 14 | Search SOFTWARE+BASED+SELF+TEST | Search SOFTWARE+BASED+SELF+TEST |
| 2 | FUNCTIONAL VERIFICATION | 648486 | 5% | 47% | 20 | Search FUNCTIONAL+VERIFICATION | Search FUNCTIONAL+VERIFICATION |
| 3 | POST SILICON VALIDATION | 627418 | 3% | 60% | 15 | Search POST+SILICON+VALIDATION | Search POST+SILICON+VALIDATION |
| 4 | SILICON DEBUG | 497955 | 2% | 71% | 10 | Search SILICON+DEBUG | Search SILICON+DEBUG |
| 5 | SOFTWARE BASED SELF TEST SBST | 488001 | 2% | 100% | 7 | Search SOFTWARE+BASED+SELF+TEST+SBST | Search SOFTWARE+BASED+SELF+TEST+SBST |
| 6 | PROCESSOR TESTING | 379554 | 2% | 78% | 7 | Search PROCESSOR+TESTING | Search PROCESSOR+TESTING |
| 7 | TRACE BUFFER | 358530 | 1% | 86% | 6 | Search TRACE+BUFFER | Search TRACE+BUFFER |
| 8 | MICROPROCESSOR TESTING | 348562 | 2% | 50% | 10 | Search MICROPROCESSOR+TESTING | Search MICROPROCESSOR+TESTING |
| 9 | TRACE COMPRESSION | 290475 | 1% | 83% | 5 | Search TRACE+COMPRESSION | Search TRACE+COMPRESSION |
| 10 | DESIGN DEBUGGING | 278858 | 1% | 100% | 4 | Search DESIGN+DEBUGGING | Search DESIGN+DEBUGGING |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
| Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
|---|---|---|---|---|
| 1 | PSARAKIS, M , GIZOPOULOS, D , SANCHEZ, E , REORDA, MS , (2010) MICROPROCESSOR SOFTWARE-BASED SELF-TESTING.IEEE DESIGN & TEST OF COMPUTERS. VOL. 27. ISSUE 3. P. 4 -18 | 13 | 93% | 62 |
| 2 | BERNARDI, P , CANTORO, R , DE LUCA, S , SANCHEZ, E , SANSONETTI, A , (2016) DEVELOPMENT FLOW FOR ON-LINE CORE SELF-TEST OF AUTOMOTIVE MICROCONTROLLERS.IEEE TRANSACTIONS ON COMPUTERS. VOL. 65. ISSUE 3. P. 744 -754 | 12 | 86% | 1 |
| 3 | RIEFERT, A , CANTORO, R , SAUER, M , REORDA, MS , BECKER, B , (2016) A FLEXIBLE FRAMEWORK FOR THE AUTOMATIC GENERATION OF SBST PROGRAMS.IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS. VOL. 24. ISSUE 10. P. 3055 -3066 | 9 | 90% | 1 |
| 4 | NAHTIGAL, T , PUHAR, P , ZEMVA, A , (2012) A SYSTEMATIC APPROACH TO CONFIGURABLE FUNCTIONAL VERIFICATION OF HW IP BLOCKS AT TRANSACTION LEVEL.COMPUTERS & ELECTRICAL ENGINEERING. VOL. 38. ISSUE 6. P. 1513-1523 | 11 | 79% | 0 |
| 5 | LI, M , DAVOODI, A , (2014) A HYBRID APPROACH FOR FAST AND ACCURATE TRACE SIGNAL SELECTION FOR POST-SILICON DEBUG.IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS. VOL. 33. ISSUE 7. P. 1081 -1094 | 7 | 100% | 3 |
| 6 | FRISCH, S , KRENN, D , (2013) SYLOW P-GROUPS OF POLYNOMIAL PERMUTATIONS ON THE INTEGERS MOD P(N).JOURNAL OF NUMBER THEORY. VOL. 133. ISSUE 12. P. 4188-4199 | 8 | 89% | 0 |
| 7 | GROSSO, M , HOLGUIN, WJP , SANCHEZ, E , REORDA, MS , TONDA, A , MEDINA, JV , (2012) SOFTWARE-BASED TESTING FOR SYSTEM PERIPHERALS.JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS. VOL. 28. ISSUE 2. P. 189 -200 | 8 | 89% | 3 |
| 8 | MIHAJLOVIC, B , ZILIC, Z , GROSS, WJ , (2015) ARCHITECTURE-AWARE REAL-TIME COMPRESSION OF EXECUTION TRACES.ACM TRANSACTIONS ON EMBEDDED COMPUTING SYSTEMS. VOL. 14. ISSUE 4. P. - | 8 | 80% | 1 |
| 9 | OH, H , HAN, T , CHOI, I , KANG, S , (2017) AN ON-CHIP ERROR DETECTION METHOD TO REDUCE THE POST-SILICON DEBUG TIME.IEEE TRANSACTIONS ON COMPUTERS. VOL. 66. ISSUE 1. P. 38 -44 | 6 | 100% | 0 |
| 10 | ZHANG, Y , LI, HW , LI, XW , (2013) AUTOMATIC TEST PROGRAM GENERATION USING EXECUTING-TRACE-BASED CONSTRAINT EXTRACTION FOR EMBEDDED PROCESSORS.IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS. VOL. 21. ISSUE 7. P. 1220-1233 | 7 | 88% | 6 |
Classes with closest relation at Level 1 |