Class information for:
Level 1: CRITICAL AREA//IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING//WAFER MAP

Basic class information
Class id #P Avg. number of
references		 Database coverage
of references
14495 766 19.3 38%


Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
9 4 COMPUTER SCIENCE, THEORY & METHODS//COMPUTER SCIENCE, ARTIFICIAL INTELLIGENCE//COMPUTER SCIENCE, INFORMATION SYSTEMS 1247339
264 3       COMPUTER SCIENCE, HARDWARE & ARCHITECTURE//IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS//ENGINEERING, ELECTRICAL & ELECTRONIC 44494
752 2             JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS//IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS//SOFT ERROR 12428
14495 1                   CRITICAL AREA//IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING//WAFER MAP 766

Terms with highest relevance score


rank Term termType Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 CRITICAL AREA authKW 748505 3% 72% 26
2 IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING journal 653021 21% 10% 160
3 WAFER MAP authKW 306626 1% 77% 10
4 YIELD MODEL authKW 292292 3% 33% 22
5 KILL RATIO authKW 244153 1% 88% 7
6 CRITICAL AREA ANALYSIS authKW 166090 1% 83% 5
7 SEMICONDUCTOR YIELD authKW 166090 1% 83% 5
8 WAFER BIN MAP authKW 159448 1% 100% 4
9 DEFECT DENSITY DISTRIBUTION authKW 119586 0% 100% 3
10 DEFECT REDUCT TECHNOL address 119586 0% 100% 3

Web of Science journal categories


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 Engineering, Manufacturing 22060 29% 0% 225
2 Engineering, Electrical & Electronic 10715 68% 0% 521
3 Computer Science, Hardware & Architecture 7281 17% 0% 134
4 Physics, Applied 2140 35% 0% 269
5 Physics, Condensed Matter 1887 27% 0% 208
6 Operations Research & Management Science 1179 9% 0% 71
7 Engineering, Industrial 891 6% 0% 47
8 Computer Science, Artificial Intelligence 689 8% 0% 64
9 Computer Science, Interdisciplinary Applications 642 8% 0% 64
10 Nanoscience & Nanotechnology 447 9% 0% 69

Address terms


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 DEFECT REDUCT TECHNOL 119586 0% 100% 3
2 ADV TEST CHIP 79724 0% 100% 2
3 YIELD ENGN 79724 0% 100% 2
4 ADM OPERAT STRATEG INITIAT 39862 0% 100% 1
5 ADV CHIP TESTING 39862 0% 100% 1
6 ADV DFT TEAM 39862 0% 100% 1
7 ADV SILICON RD 39862 0% 100% 1
8 ADV TECHNOL INVESTMENT CO 39862 0% 100% 1
9 ALFRED P SLOAN MANAGEMENT MANAGEMENT SCI 39862 0% 100% 1
10 ATIC KHALIFA SEMICOND 39862 0% 100% 1

Journals


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING 653021 21% 10% 160
2 IEEE DESIGN & TEST OF COMPUTERS 21363 3% 2% 23
3 IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS 15854 6% 1% 44
4 SOLID STATE TECHNOLOGY 14515 3% 1% 26
5 MICRO 11085 1% 4% 7
6 MICROELECTRONICS RELIABILITY 8712 5% 1% 39
7 JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS 4461 1% 1% 11
8 JOURNAL OF INTELLIGENT MANUFACTURING 4122 2% 1% 13
9 IBM JOURNAL OF RESEARCH AND DEVELOPMENT 3411 2% 1% 13
10 IEEE INTERNATIONAL SOLID STATE CIRCUITS CONFERENCE 3411 0% 3% 3

Author Key Words


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class		 LCSH search Wikipedia search
1 CRITICAL AREA 748505 3% 72% 26 Search CRITICAL+AREA Search CRITICAL+AREA
2 WAFER MAP 306626 1% 77% 10 Search WAFER+MAP Search WAFER+MAP
3 YIELD MODEL 292292 3% 33% 22 Search YIELD+MODEL Search YIELD+MODEL
4 KILL RATIO 244153 1% 88% 7 Search KILL+RATIO Search KILL+RATIO
5 CRITICAL AREA ANALYSIS 166090 1% 83% 5 Search CRITICAL+AREA+ANALYSIS Search CRITICAL+AREA+ANALYSIS
6 SEMICONDUCTOR YIELD 166090 1% 83% 5 Search SEMICONDUCTOR+YIELD Search SEMICONDUCTOR+YIELD
7 WAFER BIN MAP 159448 1% 100% 4 Search WAFER+BIN+MAP Search WAFER+BIN+MAP
8 DEFECT DENSITY DISTRIBUTION 119586 0% 100% 3 Search DEFECT+DENSITY+DISTRIBUTION Search DEFECT+DENSITY+DISTRIBUTION
9 SPATIAL DEFECTS 119586 0% 100% 3 Search SPATIAL+DEFECTS Search SPATIAL+DEFECTS
10 YIELD LEARNING 110381 1% 46% 6 Search YIELD+LEARNING Search YIELD+LEARNING

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.


Rank Reference # ref.
in cl.		 Shr. of ref. in
cl.		 Citations
1 KOREN, I , KOREN, Z , (1998) DEFECT TOLERANCE IN VLSI CIRCUITS: TECHNIQUES AND YIELD ANALYSIS.PROCEEDINGS OF THE IEEE. VOL. 86. ISSUE 9. P. 1819 -1836 37 73% 95
2 ZHOU, QA , ZENG, L , ZHOU, SY , (2010) STATISTICAL DETECTION OF DEFECT PATTERNS USING HOUGH TRANSFORM.IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING. VOL. 23. ISSUE 3. P. 370-380 18 86% 2
3 BARON, M , TAKKEN, A , YASHCHIN, E , LANZEROTTI, M , (2008) MODELING AND FORECASTING OF DEFECT-LIMITED YIELD IN SEMICONDUCTOR MANUFACTURING.IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING. VOL. 21. ISSUE 4. P. 614-624 16 100% 4
4 STAPPER, CH , ROSNER, RJ , (1995) INTEGRATED-CIRCUIT YIELD MANAGEMENT AND YIELD ANALYSIS - DEVELOPMENT AND IMPLEMENTATION.IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING. VOL. 8. ISSUE 2. P. 95-102 21 95% 77
5 LIN, JS , (2012) A NOVEL DESIGN OF WAFER YIELD MODEL FOR SEMICONDUCTOR USING A GMDH POLYNOMIAL AND PRINCIPAL COMPONENT ANALYSIS.EXPERT SYSTEMS WITH APPLICATIONS. VOL. 39. ISSUE 8. P. 6665 -6671 13 100% 2
6 WANG, CH , (2009) SEPARATION OF COMPOSITE DEFECT PATTERNS ON WAFER BIN MAP USING SUPPORT VECTOR CLUSTERING.EXPERT SYSTEMS WITH APPLICATIONS. VOL. 36. ISSUE 2. P. 2554-2561 19 70% 12
7 CHOI, G , KIM, SH , HA, C , BAE, SJ , (2012) MULTI-STEP ART1 ALGORITHM FOR RECOGNITION OF DEFECT PATTERNS ON SEMICONDUCTOR WAFERS.INTERNATIONAL JOURNAL OF PRODUCTION RESEARCH. VOL. 50. ISSUE 12. P. 3274-3287 19 63% 4
8 KRUEGER, DC , MONTGOMERY, DC , (2014) MODELING AND ANALYZING SEMICONDUCTOR YIELD WITH GENERALIZED LINEAR MIXED MODELS.APPLIED STOCHASTIC MODELS IN BUSINESS AND INDUSTRY. VOL. 30. ISSUE 6. P. 691 -707 15 75% 1
9 PAPADOPOULOU, E , (2011) NET-AWARE CRITICAL AREA EXTRACTION FOR OPENS IN VLSI CIRCUITS VIA HIGHER-ORDER VORONOI DIAGRAMS.IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS. VOL. 30. ISSUE 5. P. 704-717 15 79% 2
10 CHIEN, CF , HSU, SC , CHEN, YJ , (2013) A SYSTEM FOR ONLINE DETECTION AND CLASSIFICATION OF WAFER BIN MAP DEFECT PATTERNS FOR MANUFACTURING INTELLIGENCE.INTERNATIONAL JOURNAL OF PRODUCTION RESEARCH. VOL. 51. ISSUE 8. P. 2324-2338 15 71% 5

Classes with closest relation at Level 1


Rank Class id link
1 17275 MARCH TEST//MEMORY TESTING//BUILT IN SELF REPAIR BISR
2 13373 WAFER FABRICATION//IND ENGN SYST MANAGEMENT//SEMICONDUCTOR MANUFACTURING
3 23322 BURN IN//OPTIMAL BURN IN//BATHTUB SHAPED FAILURE RATE
4 21792 IEEE TRANSACTIONS ON COMPONENTS HYBRIDS AND MANUFACTURING TECHNOLOGY//MCM TESTING//THERMAL ENGN TECHNOL
5 12204 RUN TO RUN CONTROL//VIRTUAL METROLOGY//IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING
6 8660 JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS//MIXED SIGNAL TEST//ANALOG TEST
7 25434 AMBITUS//CMOS TRANSISTOR NETWORKS//COMP BUSINESS GRP
8 12940 ANALOG PLACEMENT//CIRCUIT SIZING//ANALOG CIRCUIT SYNTHESIS
9 34813 ELECTROSTATIC CHUCK//PIN CHUCK//WAFER FLATNESS
10 36555 MANAGEMENT SCI DECIS MAKING//BRAND SPECTRUM//ANALYTICAL INFORMATION SYSTEM

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