Class information for: |
Basic class information |
| Class id | #P | Avg. number of references |
Database coverage of references |
|---|---|---|---|
| 17275 | 608 | 18.5 | 41% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Terms with highest relevance score |
| rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|---|
| 1 | MARCH TEST | authKW | 1242963 | 5% | 75% | 33 |
| 2 | MEMORY TESTING | authKW | 1170621 | 9% | 45% | 52 |
| 3 | BUILT IN SELF REPAIR BISR | authKW | 677980 | 3% | 75% | 18 |
| 4 | MEMORY REPAIR | authKW | 606242 | 2% | 93% | 13 |
| 5 | BUILT IN REDUNDANCY ANALYSIS BIRA | authKW | 602657 | 2% | 100% | 12 |
| 6 | CATASTROPHIC FAULT PATTERNS | authKW | 401771 | 1% | 100% | 8 |
| 7 | PATTERN SENSITIVE FAULTS | authKW | 386314 | 2% | 77% | 10 |
| 8 | COUPLING FAULTS | authKW | 321414 | 1% | 80% | 8 |
| 9 | DYNAMIC FAULTS | authKW | 312912 | 1% | 69% | 9 |
| 10 | DEGRADABLE VLSI ARRAY | authKW | 251107 | 1% | 100% | 5 |
Web of Science journal categories |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|
| 1 | Computer Science, Hardware & Architecture | 39784 | 45% | 0% | 276 |
| 2 | Engineering, Electrical & Electronic | 9590 | 72% | 0% | 438 |
| 3 | Computer Science, Software Engineering | 1023 | 10% | 0% | 60 |
| 4 | Computer Science, Theory & Methods | 646 | 10% | 0% | 58 |
| 5 | Computer Science, Interdisciplinary Applications | 559 | 9% | 0% | 53 |
| 6 | Computer Science, Information Systems | 446 | 8% | 0% | 46 |
| 7 | COMPUTER APPLICATIONS & CYBERNETICS | 300 | 1% | 0% | 4 |
| 8 | Engineering, Manufacturing | 113 | 3% | 0% | 16 |
| 9 | Logic | 76 | 1% | 0% | 5 |
| 10 | Telecommunications | 34 | 3% | 0% | 16 |
Address terms |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|
| 1 | PROBE TEST ENGN TEAM | 200886 | 1% | 100% | 4 |
| 2 | SECT COMP ENGN | 160707 | 1% | 80% | 4 |
| 3 | ADV RELIABLE SYST | 133921 | 1% | 67% | 4 |
| 4 | ALGORITHM LANGUAGES | 100443 | 0% | 100% | 2 |
| 5 | EMBEDDED TEST REPAIR PROGRAM | 100443 | 0% | 100% | 2 |
| 6 | VERY LARGE SCALE INTEGRAT COMP AIDED DESIGN | 90396 | 0% | 60% | 3 |
| 7 | HIGH PERFORMANCE EMBEDDED SYST | 60490 | 2% | 12% | 10 |
| 8 | ADV RELAIBLE SYST | 50221 | 0% | 100% | 1 |
| 9 | CAD TEST | 50221 | 0% | 100% | 1 |
| 10 | DATA CLOUD COMP GRP | 50221 | 0% | 100% | 1 |
Journals |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|
| 1 | JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS | 67324 | 6% | 4% | 38 |
| 2 | IEEE DESIGN & TEST OF COMPUTERS | 55460 | 5% | 3% | 33 |
| 3 | IEEE TRANSACTIONS ON COMPUTERS | 41033 | 11% | 1% | 65 |
| 4 | IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS | 21861 | 8% | 1% | 46 |
| 5 | IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS | 17104 | 6% | 1% | 34 |
| 6 | INTEGRATION-THE VLSI JOURNAL | 6135 | 2% | 1% | 11 |
| 7 | IEEE JOURNAL OF SOLID-STATE CIRCUITS | 5446 | 5% | 0% | 30 |
| 8 | IEEE DESIGN & TEST | 5046 | 1% | 3% | 4 |
| 9 | ETRI JOURNAL | 3996 | 2% | 1% | 12 |
| 10 | PROCEEDINGS ANNUAL RELIABILITY AND MAINTAINABILITY SYMPOSIUM | 3914 | 1% | 2% | 5 |
Author Key Words |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
LCSH search | Wikipedia search |
|---|---|---|---|---|---|---|---|
| 1 | MARCH TEST | 1242963 | 5% | 75% | 33 | Search MARCH+TEST | Search MARCH+TEST |
| 2 | MEMORY TESTING | 1170621 | 9% | 45% | 52 | Search MEMORY+TESTING | Search MEMORY+TESTING |
| 3 | BUILT IN SELF REPAIR BISR | 677980 | 3% | 75% | 18 | Search BUILT+IN+SELF+REPAIR+BISR | Search BUILT+IN+SELF+REPAIR+BISR |
| 4 | MEMORY REPAIR | 606242 | 2% | 93% | 13 | Search MEMORY+REPAIR | Search MEMORY+REPAIR |
| 5 | BUILT IN REDUNDANCY ANALYSIS BIRA | 602657 | 2% | 100% | 12 | Search BUILT+IN+REDUNDANCY+ANALYSIS+BIRA | Search BUILT+IN+REDUNDANCY+ANALYSIS+BIRA |
| 6 | CATASTROPHIC FAULT PATTERNS | 401771 | 1% | 100% | 8 | Search CATASTROPHIC+FAULT+PATTERNS | Search CATASTROPHIC+FAULT+PATTERNS |
| 7 | PATTERN SENSITIVE FAULTS | 386314 | 2% | 77% | 10 | Search PATTERN+SENSITIVE+FAULTS | Search PATTERN+SENSITIVE+FAULTS |
| 8 | COUPLING FAULTS | 321414 | 1% | 80% | 8 | Search COUPLING+FAULTS | Search COUPLING+FAULTS |
| 9 | DYNAMIC FAULTS | 312912 | 1% | 69% | 9 | Search DYNAMIC+FAULTS | Search DYNAMIC+FAULTS |
| 10 | DEGRADABLE VLSI ARRAY | 251107 | 1% | 100% | 5 | Search DEGRADABLE+VLSI+ARRAY | Search DEGRADABLE+VLSI+ARRAY |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
| Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
|---|---|---|---|---|
| 1 | CHO, K , KANG, W , CHO, H , LEE, C , KANG, S , (2016) A SURVEY OF REPAIR ANALYSIS ALGORITHMS FOR MEMORIES.ACM COMPUTING SURVEYS. VOL. 49. ISSUE 3. P. - | 39 | 68% | 0 |
| 2 | HOU, CS , LI, JF , (2015) HIGH REPAIR-EFFICIENCY BISR SCHEME FOR RAMS BY REUSING BITMAP FOR BIT REDUNDANCY.IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS. VOL. 23. ISSUE 9. P. 1720 -1728 | 23 | 96% | 2 |
| 3 | QIAN, JY , ZHOU, ZD , GU, TL , ZHAO, LZ , CHANG, L , (2016) OPTIMAL RECONFIGURATION OF HIGH-PERFORMANCE VLSI SUBARRAYS WITH NETWORK FLOW.IEEE TRANSACTIONS ON PARALLEL AND DISTRIBUTED SYSTEMS. VOL. 27. ISSUE 12. P. 3575 -3587 | 20 | 91% | 0 |
| 4 | WU, JG , SRIKANTHAN, T , JIANG, GY , WANG, K , (2014) CONSTRUCTING SUB-ARRAYS WITH SHORT INTERCONNECTS FROM DEGRADABLE VLSI ARRAYS.IEEE TRANSACTIONS ON PARALLEL AND DISTRIBUTED SYSTEMS. VOL. 25. ISSUE 4. P. 929 -938 | 19 | 90% | 2 |
| 5 | CHEN, TJ , LI, JF , TSENG, TW , (2012) COST-EFFICIENT BUILT-IN REDUNDANCY ANALYSIS WITH OPTIMAL REPAIR RATE FOR RAMS.IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS. VOL. 31. ISSUE 6. P. 930 -940 | 17 | 94% | 7 |
| 6 | HUANG, CY , CHANG, YR , FANG, KT , (2010) OPTIMAL CUTTING DESIGN AND ANALYSIS FOR FAULT-TOLERANT SCHEME OF REDUNDANT MEMORIES.INTERNATIONAL JOURNAL OF SYSTEMS SCIENCE. VOL. 41. ISSUE 9. P. 1085 -1097 | 18 | 90% | 0 |
| 7 | KANG, W , CHO, H , LEE, J , KANG, S , (2014) A BIRA FOR MEMORIES WITH AN OPTIMAL REPAIR RATE USING SPARE MEMORIES FOR AREA REDUCTION.IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS. VOL. 22. ISSUE 11. P. 2336 -2349 | 16 | 89% | 1 |
| 8 | LI, JF , TSENG, TW , (2011) A LOW-COST BUILT-IN REDUNDANCY-ANALYSIS SCHEME FOR WORD-ORIENTED RAMS WITH 2-D REDUNDANCY.IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS. VOL. 19. ISSUE 11. P. 1983 -1995 | 15 | 100% | 5 |
| 9 | TAKANAMI, I , HORITA, T , (2000) FAULT-TOLERANT PROCESSOR ARRAYS BASED ON THE 11/2-TRACK SWITCHES WITH FLEXIBLE SPARE DISTRIBUTIONS.IEEE TRANSACTIONS ON COMPUTERS. VOL. 49. ISSUE 6. P. 542 -552 | 21 | 91% | 36 |
| 10 | SRIKANTHAN, T , WANG, K , WU, JG , (2009) MINIMIZING INTERCONNECT LENGTH ON RECONFIGURABLE MESHES.FRONTIERS OF COMPUTER SCIENCE IN CHINA. VOL. 3. ISSUE 3. P. 315 -321 | 14 | 100% | 1 |
Classes with closest relation at Level 1 |