Class information for:
Level 1: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS//MIXED SIGNAL TEST//ANALOG TEST

Basic class information
Class id #P Avg. number of
references		 Database coverage
of references
8660 1231 19.1 41%


Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
9 4 COMPUTER SCIENCE, THEORY & METHODS//COMPUTER SCIENCE, ARTIFICIAL INTELLIGENCE//COMPUTER SCIENCE, INFORMATION SYSTEMS 1247339
264 3       COMPUTER SCIENCE, HARDWARE & ARCHITECTURE//IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS//ENGINEERING, ELECTRICAL & ELECTRONIC 44494
752 2             JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS//IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS//SOFT ERROR 12428
8660 1                   JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS//MIXED SIGNAL TEST//ANALOG TEST 1231

Terms with highest relevance score


rank Term termType Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS journal 805788 15% 17% 187
2 MIXED SIGNAL TEST authKW 794015 4% 65% 49
3 ANALOG TEST authKW 731469 3% 72% 41
4 I DDQ TESTING authKW 652984 3% 71% 37
5 ANALOG CIRCUITS authKW 538132 9% 19% 116
6 OSCILLATION BASED TEST authKW 471270 2% 100% 19
7 ANALOG FAULT DIAGNOSIS authKW 446467 1% 100% 18
8 ANALOG SYSTEM TESTING authKW 347252 1% 100% 14
9 RF TEST authKW 320034 2% 65% 20
10 LOOPBACK TEST authKW 297644 1% 100% 12

Web of Science journal categories


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with term
in class
1 Engineering, Electrical & Electronic 28527 87% 0% 1067
2 Computer Science, Hardware & Architecture 23096 24% 0% 301
3 Instruments & Instrumentation 1889 13% 0% 159
4 Computer Science, Interdisciplinary Applications 847 8% 0% 94
5 Engineering, General 114 3% 0% 35
6 Nanoscience & Nanotechnology 107 4% 0% 51
7 Computer Science, Software Engineering 102 3% 0% 32
8 Computer Science, Information Systems 84 3% 0% 34
9 Computer Science, Artificial Intelligence 83 3% 0% 34
10 Automation & Control Systems 69 2% 0% 24

Address terms


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 ELECT RUMENTAT DEV GRP 99215 0% 100% 4
2 ELECT ELECT COMP CONTROL ENGN 66678 1% 24% 11
3 MICROELECT COMP SYST 56683 1% 29% 8
4 DELET 56367 0% 45% 5
5 AUTOMAT TEST SYST 49607 0% 100% 2
6 FRENCH COUNCIL CNRS 49607 0% 100% 2
7 GRP INVEST SERV ELECT CONTROL 49607 0% 100% 2
8 HVAL GRP 49607 0% 100% 2
9 MICRO ELECT DESIGN IL 49607 0% 100% 2
10 METROL ELECT SYST 44644 0% 60% 3

Journals


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS 805788 15% 17% 187
2 IEEE DESIGN & TEST OF COMPUTERS 90540 5% 6% 60
3 IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS 36852 7% 2% 85
4 IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT 25167 8% 1% 95
5 ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING 23089 4% 2% 52
6 IEE PROCEEDINGS-CIRCUITS DEVICES AND SYSTEMS 22867 2% 3% 29
7 METROLOGY AND MEASUREMENT SYSTEMS 19049 2% 4% 21
8 IEEE DESIGN & TEST 15581 1% 6% 10
9 INTERNATIONAL JOURNAL OF CIRCUIT THEORY AND APPLICATIONS 14950 3% 2% 31
10 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS 11659 3% 1% 40

Author Key Words


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class		 LCSH search Wikipedia search
1 MIXED SIGNAL TEST 794015 4% 65% 49 Search MIXED+SIGNAL+TEST Search MIXED+SIGNAL+TEST
2 ANALOG TEST 731469 3% 72% 41 Search ANALOG+TEST Search ANALOG+TEST
3 I DDQ TESTING 652984 3% 71% 37 Search I+DDQ+TESTING Search I+DDQ+TESTING
4 ANALOG CIRCUITS 538132 9% 19% 116 Search ANALOG+CIRCUITS Search ANALOG+CIRCUITS
5 OSCILLATION BASED TEST 471270 2% 100% 19 Search OSCILLATION+BASED+TEST Search OSCILLATION+BASED+TEST
6 ANALOG FAULT DIAGNOSIS 446467 1% 100% 18 Search ANALOG+FAULT+DIAGNOSIS Search ANALOG+FAULT+DIAGNOSIS
7 ANALOG SYSTEM TESTING 347252 1% 100% 14 Search ANALOG+SYSTEM+TESTING Search ANALOG+SYSTEM+TESTING
8 RF TEST 320034 2% 65% 20 Search RF+TEST Search RF+TEST
9 LOOPBACK TEST 297644 1% 100% 12 Search LOOPBACK+TEST Search LOOPBACK+TEST
10 ALTERNATE TEST 274747 1% 92% 12 Search ALTERNATE+TEST Search ALTERNATE+TEST

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.


Rank Reference # ref.
in cl.		 Shr. of ref. in
cl.		 Citations
1 YANG, CL , YANG, J , LIU, Z , TIAN, SL , (2014) COMPLEX FIELD FAULT MODELING-BASED OPTIMAL FREQUENCY SELECTION IN LINEAR ANALOG CIRCUIT FAULT DIAGNOSIS.IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. VOL. 63. ISSUE 4. P. 813 -825 25 96% 6
2 PENG, MF , TSE, CK , SHEN, M , XIE, K , (2013) FAULT DIAGNOSIS OF ANALOG CIRCUITS USING SYSTEMATIC TESTS BASED ON DATA FUSION.CIRCUITS SYSTEMS AND SIGNAL PROCESSING. VOL. 32. ISSUE 2. P. 525-539 27 90% 4
3 FONTANA, G , LUCHETTA, A , MANETTI, S , PICCIRILLI, MC , (2016) A TESTABILITY MEASURE FOR DC-EXCITED PERIODICALLY SWITCHED NETWORKS WITH APPLICATIONS TO DC-DC CONVERTERS.IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. VOL. 65. ISSUE 10. P. 2321 -2341 22 100% 0
4 TADEUSIEWICZ, M , HALGAS, S , (2011) MULTIPLE SOFT FAULT DIAGNOSIS OF NONLINEAR DC CIRCUITS CONSIDERING COMPONENT TOLERANCES.METROLOGY AND MEASUREMENT SYSTEMS. VOL. 18. ISSUE 3. P. 349 -360 21 100% 7
5 MILOR, LS , (1998) A TUTORIAL INTRODUCTION TO RESEARCH ON ANALOG AND MIXED-SIGNAL CIRCUIT TESTING.IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS. VOL. 45. ISSUE 10. P. 1389 -1407 32 80% 130
6 TIAN, SL , YANG, CL , CHEN, F , LIU, Z , (2014) CIRCLE EQUATION-BASED FAULT MODELING METHOD FOR LINEAR ANALOG CIRCUITS.IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. VOL. 63. ISSUE 9. P. 2145 -2159 19 100% 3
7 TANG, XF , XU, AQ , NIU, SC , (2017) KKCV-GA-BASED METHOD FOR OPTIMAL ANALOG TEST POINT SELECTION.IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. VOL. 66. ISSUE 1. P. 24 -32 23 79% 0
8 HONG, HC , (2012) A STATIC LINEAR BEHAVIOR ANALOG FAULT MODEL FOR SWITCHED-CAPACITOR CIRCUITS.IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS. VOL. 31. ISSUE 4. P. 597 -609 23 85% 6
9 LEI, HJ , QIN, KY , (2015) A GENERAL METHOD FOR ANALOG TEST POINT SELECTION USING MULTI-FREQUENCY ANALYSIS.ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING. VOL. 84. ISSUE 2. P. 185 -200 18 100% 2
10 LUO, H , LU, W , WANG, YR , WANG, L , ZHAO, XL , (2016) A NOVEL APPROACH FOR ANALOG FAULT DIAGNOSIS BASED ON STOCHASTIC SIGNAL ANALYSIS AND IMPROVED GHMM.MEASUREMENT. VOL. 81. ISSUE . P. 26 -35 19 86% 1

Classes with closest relation at Level 1


Rank Class id link
1 24009 SWITCHED CURRENT CIRCUITS//SWITCHED CURRENT//SWITCHED CURRENT FILTERS
2 12940 ANALOG PLACEMENT//CIRCUIT SIZING//ANALOG CIRCUIT SYNTHESIS
3 10450 FREQUENCY ESTIMATION//ADC TESTING//NONCOHERENT SAMPLING
4 31163 SEQUENTIAL FAULT DIAGNOSIS//TEST SEQUENCING PROBLEM//TEST SEQUENCING
5 14495 CRITICAL AREA//IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING//WAFER MAP
6 1955 TEST DATA COMPRESSION//TRANSITION FAULTS//IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS
7 25434 AMBITUS//CMOS TRANSISTOR NETWORKS//COMP BUSINESS GRP
8 18911 SELF CHECKING CIRCUITS//ITERATIVE LOGIC ARRAYS//CONCURRENT ERROR DETECTION
9 34621 CONSTANT FAULTS//PRICED INFORMATION//READ ONCE CONTACT NETWORKS
10 16952 DIGITAL TO ANALOG CONVERTER DAC//CURRENT STEERING//DIRECT DIGITAL FREQUENCY SYNTHESIZER

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