Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
482 | 15691 | 26.5 | 76% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | ATOMIC FORCE MICROSCOPY | authKW | 227770 | 7% | 10% | 1171 |
2 | ATOMIC FORCE MICROSCOPE | authKW | 134608 | 2% | 22% | 317 |
3 | AFM | authKW | 86287 | 4% | 8% | 575 |
4 | NONCONTACT ATOMIC FORCE MICROSCOPY | authKW | 76174 | 0% | 70% | 56 |
5 | NANOTRIBOLOGY | authKW | 76006 | 1% | 28% | 140 |
6 | PHYSICS, APPLIED | WoSSC | 75426 | 45% | 1% | 7053 |
7 | SCANNING TUNNELING MICROSCOPY | authKW | 73050 | 3% | 9% | 414 |
8 | ULTRAMICROSCOPY | journal | 69617 | 3% | 8% | 449 |
9 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | journal | 68513 | 5% | 5% | 771 |
10 | SCANNING TUNNELING MICROSCOPE | authKW | 66743 | 1% | 32% | 108 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Physics, Applied | 75426 | 45% | 1% | 7053 |
2 | Microscopy | 42869 | 6% | 3% | 903 |
3 | Nanoscience & Nanotechnology | 35564 | 17% | 1% | 2622 |
4 | Physics, Condensed Matter | 19487 | 20% | 0% | 3138 |
5 | Materials Science, Multidisciplinary | 9229 | 20% | 0% | 3088 |
6 | Instruments & Instrumentation | 9090 | 8% | 0% | 1302 |
7 | Materials Science, Coatings & Films | 7764 | 5% | 1% | 863 |
8 | Chemistry, Physical | 5473 | 15% | 0% | 2388 |
9 | Physics, Multidisciplinary | 2961 | 8% | 0% | 1251 |
10 | Engineering, Electrical & Electronic | 2102 | 9% | 0% | 1472 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | FUTURE ENERGY IFES | 34993 | 0% | 100% | 18 |
2 | ENERGY NANOSCI LENS | 27761 | 0% | 71% | 20 |
3 | DISSENY PROGRAMACIO SISTEMES ELECT | 27217 | 0% | 100% | 14 |
4 | BIO AFM FRONTIER | 14273 | 0% | 57% | 13 |
5 | PHYS ELECT CORRELAT MAGNETISM | 13823 | 0% | 89% | 8 |
6 | INSYS | 13561 | 0% | 19% | 36 |
7 | ENERGY NANOSCI | 13171 | 0% | 27% | 25 |
8 | MICROELECT MADRID | 12039 | 0% | 13% | 49 |
9 | BIOELECT NANOBIOENGN GRP | 11664 | 0% | 100% | 6 |
10 | SIC BIO | 11664 | 0% | 100% | 6 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | ULTRAMICROSCOPY | 69617 | 3% | 8% | 449 |
2 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 68513 | 5% | 5% | 771 |
3 | REVIEW OF SCIENTIFIC INSTRUMENTS | 43356 | 5% | 3% | 830 |
4 | NANOTECHNOLOGY | 26967 | 3% | 4% | 405 |
5 | APPLIED PHYSICS LETTERS | 19872 | 7% | 1% | 1099 |
6 | BEILSTEIN JOURNAL OF NANOTECHNOLOGY | 17985 | 1% | 9% | 99 |
7 | TRIBOLOGY LETTERS | 16756 | 1% | 6% | 148 |
8 | SURFACE SCIENCE | 15858 | 3% | 2% | 480 |
9 | JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 9228 | 3% | 1% | 396 |
10 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A | 9058 | 2% | 2% | 263 |
Author Key Words |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | ATOMIC FORCE MICROSCOPY | 227770 | 7% | 10% | 1171 | Search ATOMIC+FORCE+MICROSCOPY | Search ATOMIC+FORCE+MICROSCOPY |
2 | ATOMIC FORCE MICROSCOPE | 134608 | 2% | 22% | 317 | Search ATOMIC+FORCE+MICROSCOPE | Search ATOMIC+FORCE+MICROSCOPE |
3 | AFM | 86287 | 4% | 8% | 575 | Search AFM | Search AFM |
4 | NONCONTACT ATOMIC FORCE MICROSCOPY | 76174 | 0% | 70% | 56 | Search NONCONTACT+ATOMIC+FORCE+MICROSCOPY | Search NONCONTACT+ATOMIC+FORCE+MICROSCOPY |
5 | NANOTRIBOLOGY | 76006 | 1% | 28% | 140 | Search NANOTRIBOLOGY | Search NANOTRIBOLOGY |
6 | SCANNING TUNNELING MICROSCOPY | 73050 | 3% | 9% | 414 | Search SCANNING+TUNNELING+MICROSCOPY | Search SCANNING+TUNNELING+MICROSCOPY |
7 | SCANNING TUNNELING MICROSCOPE | 66743 | 1% | 32% | 108 | Search SCANNING+TUNNELING+MICROSCOPE | Search SCANNING+TUNNELING+MICROSCOPE |
8 | LOCAL ANODIC OXIDATION | 66169 | 0% | 85% | 40 | Search LOCAL+ANODIC+OXIDATION | Search LOCAL+ANODIC+OXIDATION |
9 | TAPPING MODE | 61644 | 0% | 55% | 58 | Search TAPPING+MODE | Search TAPPING+MODE |
10 | KELVIN PROBE FORCE MICROSCOPY | 56973 | 1% | 37% | 80 | Search KELVIN+PROBE+FORCE+MICROSCOPY | Search KELVIN+PROBE+FORCE+MICROSCOPY |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | GARCIA, R , PEREZ, R , (2002) DYNAMIC ATOMIC FORCE MICROSCOPY METHODS.SURFACE SCIENCE REPORTS. VOL. 47. ISSUE 6-8. P. 197 -301 | 167 | 83% | 1021 |
2 | BARTH, C , FOSTER, AS , HENRY, CR , SHLUGER, AL , (2011) RECENT TRENDS IN SURFACE CHARACTERIZATION AND CHEMISTRY WITH HIGH-RESOLUTION SCANNING FORCE METHODS.ADVANCED MATERIALS. VOL. 23. ISSUE 4. P. 477 -501 | 201 | 61% | 98 |
3 | GIESSIBL, FJ , (2003) ADVANCES IN ATOMIC FORCE MICROSCOPY.REVIEWS OF MODERN PHYSICS. VOL. 75. ISSUE 3. P. 949 -983 | 114 | 88% | 911 |
4 | NYFFENEGGER, RM , PENNER, RM , (1997) NANOMETER-SCALE SURFACE MODIFICATION USING THE SCANNING PROBE MICROSCOPE: PROGRESS SINCE 1991.CHEMICAL REVIEWS. VOL. 97. ISSUE 4. P. 1195 -1230 | 233 | 76% | 208 |
5 | VANOSSI, A , MANINI, N , URBAKH, M , ZAPPERI, S , TOSATTI, E , (2013) COLLOQUIUM: MODELING FRICTION: FROM NANOSCALE TO MESOSCALE.REVIEWS OF MODERN PHYSICS. VOL. 85. ISSUE 2. P. 529 -552 | 155 | 58% | 86 |
6 | GARCIA, R , HERRUZO, ET , (2012) THE EMERGENCE OF MULTIFREQUENCY FORCE MICROSCOPY.NATURE NANOTECHNOLOGY. VOL. 7. ISSUE 4. P. 217 -226 | 86 | 87% | 190 |
7 | KRIM, J , (2012) FRICTION AND ENERGY DISSIPATION MECHANISMS IN ADSORBED MOLECULES AND MOLECULARLY THIN FILMS.ADVANCES IN PHYSICS. VOL. 61. ISSUE 3. P. 155 -323 | 206 | 43% | 46 |
8 | DONG, YL , LI, QY , MARTINI, A , (2013) MOLECULAR DYNAMICS SIMULATION OF ATOMIC FRICTION: A REVIEW AND GUIDE.JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A. VOL. 31. ISSUE 3. P. - | 120 | 75% | 22 |
9 | XIE, XN , CHUNG, HJ , SOW, CH , WEE, ATS , (2006) NANOSCALE MATERIALS PATTERNING AND ENGINEERING BY ATOMIC FORCE MICROSCOPY NANOLITHOGRAPHY.MATERIALS SCIENCE & ENGINEERING R-REPORTS. VOL. 54. ISSUE 1-2. P. 1 -48 | 141 | 66% | 148 |
10 | GRAFSTROM, S , (2002) PHOTOASSISTED SCANNING TUNNELING MICROSCOPY.JOURNAL OF APPLIED PHYSICS. VOL. 91. ISSUE 4. P. 1717 -1753 | 182 | 61% | 122 |
Classes with closest relation at Level 2 |