Class information for:
Level 2: SURFACE SCIENCE//SILICON//SCANNING TUNNELING MICROSCOPY

Basic class information
Class id #P Avg. number of
references		 Database coverage
of references
899 11316 27.0 76%


Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
2 4 MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER 2836879
6 3       PHYSICS, APPLIED//IEEE TRANSACTIONS ON ELECTRON DEVICES//SILICON 155028
899 2             SURFACE SCIENCE//SILICON//SCANNING TUNNELING MICROSCOPY 11316
3945 1                   VICINAL SINGLE CRYSTAL SURFACES//STEPPED SINGLE CRYSTAL SURFACES//HIGH INDEX SINGLE CRYSTAL SURFACES 1876
4857 1                   SI110//SURFACE SCIENCE//SI111 7 X 7 1713
4915 1                   GE100//CHEMISORPTION//SURFACE SCIENCE 1704
5225 1                   SI100 SURFACE//SURFACE SCIENCE//SURFACTANT MEDIATED EPITAXY 1654
5401 1                   ATOM WI LAYERS//SI335//SURFACE SCIENCE 1628
6615 1                   HYDROGEN SURFACTANT//MANA SATELLITE//DISILANE 1463
17559 1                   ALKALI METALS//CEA SERV RECH SUR ES IRRADIAT MAT//SURFACE SCIENCE 593
23066 1                   SYNCHROTRON RADIATION STIMULATED ETCHING//ADV SCI TECHNOL IND//VACUUM UV PHOTOSCI 359
24018 1                   PHYSICOCHIM MOLEC ORSAY//SURFACE STRUCTURE AND ROUGHNESS//ADSORBATE SUBSTRATE INTERACTIONS 326

Terms with highest relevance score


rank Term termType Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with term
in class
1 SURFACE SCIENCE journal 502981 20% 8% 2240
2 SILICON authKW 283613 12% 8% 1376
3 SCANNING TUNNELING MICROSCOPY authKW 199897 5% 13% 580
4 PHYSICS, CONDENSED MATTER WoSSC 117160 53% 1% 6006
5 VICINAL SINGLE CRYSTAL SURFACES authKW 109108 1% 45% 90
6 SI111 authKW 107747 1% 40% 101
7 SURFACE STRUCTURE MORPHOLOGY ROUGHNESS AND TOPOGRAPHY authKW 104593 2% 19% 205
8 SI100 authKW 91862 1% 41% 83
9 SURFACE RELAXATION AND RECONSTRUCTION authKW 78751 1% 19% 158
10 ATOM WI LAYERS address 71879 0% 67% 40

Web of Science journal categories


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with term
in class
1 Physics, Condensed Matter 117160 53% 1% 6006
2 Chemistry, Physical 30257 35% 0% 4015
3 Materials Science, Coatings & Films 20661 10% 1% 1143
4 Physics, Applied 17558 27% 0% 3064
5 Physics, Multidisciplinary 4834 11% 0% 1247
6 Nanoscience & Nanotechnology 1968 5% 0% 612
7 Materials Science, Multidisciplinary 1025 10% 0% 1157
8 Physics, Atomic, Molecular & Chemical 728 5% 0% 510
9 Microscopy 613 1% 0% 103
10 Crystallography 228 2% 0% 214

Address terms


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with term
in class
1 ATOM WI LAYERS 71879 0% 67% 40
2 MANA SATELLITE 14225 0% 41% 13
3 VACUUM UV PHOTOSCI 13412 0% 29% 17
4 ISG 3 12642 0% 36% 13
5 NANO HIGH TECH 12272 0% 33% 14
6 CRMC2 11529 0% 12% 35
7 PHYS 10643 18% 0% 2089
8 WAT 10498 0% 22% 18
9 SUR E PHYS NANOSTRUCT GRP 9940 0% 31% 12
10 LASH MILLER CHEM S 9134 0% 10% 34

Journals


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with term
in class
1 SURFACE SCIENCE 502981 20% 8% 2240
2 PHYSICAL REVIEW B 66870 18% 1% 2049
3 JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A 26111 3% 3% 374
4 APPLIED SURFACE SCIENCE 23783 5% 2% 565
5 SURFACE REVIEW AND LETTERS 16107 1% 5% 126
6 PHYSICAL REVIEW LETTERS 11615 6% 1% 663
7 JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B 6593 2% 1% 207
8 JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS 6059 2% 1% 273
9 PHYSICS OF LOW-DIMENSIONAL STRUCTURES 5054 0% 5% 40
10 JOURNAL OF PHYSICS-CONDENSED MATTER 3543 2% 1% 211

Author Key Words


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with term
in class		 LCSH search Wikipedia search
1 SILICON 283613 12% 8% 1376 Search SILICON Search SILICON
2 SCANNING TUNNELING MICROSCOPY 199897 5% 13% 580 Search SCANNING+TUNNELING+MICROSCOPY Search SCANNING+TUNNELING+MICROSCOPY
3 VICINAL SINGLE CRYSTAL SURFACES 109108 1% 45% 90 Search VICINAL+SINGLE+CRYSTAL+SURFACES Search VICINAL+SINGLE+CRYSTAL+SURFACES
4 SI111 107747 1% 40% 101 Search SI111 Search SI111
5 SURFACE STRUCTURE MORPHOLOGY ROUGHNESS AND TOPOGRAPHY 104593 2% 19% 205 Search SURFACE+STRUCTURE+MORPHOLOGY+ROUGHNESS+AND+TOPOGRAPHY Search SURFACE+STRUCTURE+MORPHOLOGY+ROUGHNESS+AND+TOPOGRAPHY
6 SI100 91862 1% 41% 83 Search SI100 Search SI100
7 SURFACE RELAXATION AND RECONSTRUCTION 78751 1% 19% 158 Search SURFACE+RELAXATION+AND+RECONSTRUCTION Search SURFACE+RELAXATION+AND+RECONSTRUCTION
8 SURFACE DIFFUSION 65060 2% 12% 207 Search SURFACE+DIFFUSION Search SURFACE+DIFFUSION
9 SEMICONDUCTING SURFACES 62850 1% 28% 83 Search SEMICONDUCTING+SURFACES Search SEMICONDUCTING+SURFACES
10 STEPPED SINGLE CRYSTAL SURFACES 61680 1% 31% 74 Search STEPPED+SINGLE+CRYSTAL+SURFACES Search STEPPED+SINGLE+CRYSTAL+SURFACES

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.


Rank Reference # ref. in
cl.		 Shr. of ref. in
cl.		 Citations
1 LEFTWICH, TR , TEPLYAKOV, AV , (2008) CHEMICAL MANIPULATION OF MULTIFUNCTIONAL HYDROCARBONS ON SILICON SURFACES.SURFACE SCIENCE REPORTS. VOL. 63. ISSUE 1. P. 1 -71 325 75% 93
2 WALTENBURG, HN , YATES, JT , (1995) SURFACE-CHEMISTRY OF SILICON.CHEMICAL REVIEWS. VOL. 95. ISSUE 5. P. 1589 -1673 521 44% 385
3 OURA, K , LIFSHITS, VG , SARANIN, AA , ZOTOV, AV , KATAYAMA, M , (1999) HYDROGEN INTERACTION WITH CLEAN AND MODIFIED SILICON SURFACES.SURFACE SCIENCE REPORTS. VOL. 35. ISSUE 1-2. P. 1 -69 244 78% 172
4 JEONG, HC , WILLIAMS, ED , (1999) STEPS ON SURFACES: EXPERIMENT AND THEORY.SURFACE SCIENCE REPORTS. VOL. 34. ISSUE 6-8. P. 171 -294 178 76% 470
5 FILLER, MA , BENT, SF , (2003) THE SURFACE AS MOLECULAR REAGENT: ORGANIC CHEMISTRY AT THE SEMICONDUCTOR INTERFACE.PROGRESS IN SURFACE SCIENCE. VOL. 73. ISSUE 1-3. P. 1-56 167 80% 282
6 RAUSCHER, H , (2001) THE INTERACTION OF SILANES WITH SILICON SINGLE CRYSTAL SURFACES: MICROSCOPIC PROCESSES AND STRUCTURES.SURFACE SCIENCE REPORTS. VOL. 42. ISSUE 6-8. P. 207 -+ 237 74% 49
7 MISBAH, C , PIERRE-LOUIS, O , SAITO, Y , (2010) CRYSTAL SURFACES IN AND OUT OF EQUILIBRIUM: A MODERN VIEW.REVIEWS OF MODERN PHYSICS. VOL. 82. ISSUE 1. P. 981 -1040 115 68% 91
8 BENT, SF , (2002) ATTACHING ORGANIC LAYERS TO SEMICONDUCTOR SURFACES.JOURNAL OF PHYSICAL CHEMISTRY B. VOL. 106. ISSUE 11. P. 2830 -2842 110 89% 167
9 SNIJDERS, PC , WEITERING, HH , (2010) COLLOQUIUM: ELECTRONIC INSTABILITIES IN SELF-ASSEMBLED ATOM WIRES.REVIEWS OF MODERN PHYSICS. VOL. 82. ISSUE 1. P. 307 -329 89 86% 79
10 DURR, M , HOFER, U , (2006) DISSOCIATIVE ADSORPTION OF MOLECULAR HYDROGEN ON SILICON SURFACES.SURFACE SCIENCE REPORTS. VOL. 61. ISSUE 12. P. 465 -526 133 69% 73

Classes with closest relation at Level 2


Rank Class id link
1 3149 CLEANROOM//PHOTORESIST REMOVAL//MINIENVIRONMENT
2 1299 SIGE//STRAINED SI//VIRTUAL SUBSTRATE
3 1210 GALLIUM ARSENIDE//GAAS//REFLECTANCE ANISOTROPY SPECTROSCOPY
4 1251 PHYSICS, CONDENSED MATTER//COMPTON PROFILE//PHYSICAL REVIEW B
5 27 SURFACE SCIENCE//LOW INDEX SINGLE CRYSTAL SURFACES//CHEMISORPTION
6 482 ATOMIC FORCE MICROSCOPY//ATOMIC FORCE MICROSCOPE//AFM
7 746 BETA FESI2//SILICIDES//SERIES RESISTANCE
8 3422 CAF2//EPITAXIAL AL2O3//METAL INSULATOR HETEROSTRUCTURE
9 474 FLASH MEMORY//SONOS//NEGATIVE BIAS TEMPERATURE INSTABILITY NBTI
10 3972 METASTABLE INDUCED ELECTRON SPECTROSCOPY//LIQUID BEAM//METASTABLE INDUCED ELECTRON SPECTROSCOPY MIES

Go to start page