Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
2614 | 3568 | 24.1 | 51% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | ATOM PROBE TOMOGRAPHY | authKW | 467178 | 5% | 28% | 195 |
2 | ATOM PROBE | authKW | 349465 | 3% | 36% | 112 |
3 | FIELD EVAPORATION | authKW | 294448 | 2% | 54% | 64 |
4 | FIELD ION MICROSCOPY | authKW | 187864 | 2% | 35% | 62 |
5 | UMR 6634 | address | 140360 | 2% | 19% | 85 |
6 | ULTRAMICROSCOPY | journal | 111592 | 8% | 5% | 270 |
7 | GRP PHYS MAT | address | 97578 | 2% | 16% | 72 |
8 | SINGLE ATOM TIP | authKW | 88004 | 0% | 86% | 12 |
9 | AUSTRALIAN MICROSCOPY MICROANAL | address | 87408 | 2% | 17% | 60 |
10 | SCANNING ATOM PROBE | authKW | 68450 | 0% | 100% | 8 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Microscopy | 35302 | 11% | 1% | 387 |
2 | Physics, Condensed Matter | 13066 | 33% | 0% | 1162 |
3 | Physics, Applied | 5575 | 27% | 0% | 969 |
4 | Physics, Multidisciplinary | 3176 | 15% | 0% | 537 |
5 | Chemistry, Physical | 2227 | 19% | 0% | 681 |
6 | Materials Science, Coatings & Films | 1761 | 5% | 0% | 196 |
7 | Nanoscience & Nanotechnology | 712 | 6% | 0% | 204 |
8 | Materials Science, Multidisciplinary | 530 | 12% | 0% | 426 |
9 | Instruments & Instrumentation | 480 | 4% | 0% | 160 |
10 | Metallurgy & Metallurgical Engineering | 408 | 5% | 0% | 162 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | UMR 6634 | 140360 | 2% | 19% | 85 |
2 | GRP PHYS MAT | 97578 | 2% | 16% | 72 |
3 | AUSTRALIAN MICROSCOPY MICROANAL | 87408 | 2% | 17% | 60 |
4 | GPM | 58828 | 1% | 20% | 35 |
5 | SUR E MODIFICAT | 55141 | 1% | 15% | 44 |
6 | UMR CNRS 6634 | 43272 | 1% | 19% | 27 |
7 | UFR SCI SITE MADRILLET | 34225 | 0% | 100% | 4 |
8 | ATOM PROBE TOMOG | 31416 | 0% | 28% | 13 |
9 | EMISS ELECT | 28812 | 0% | 42% | 8 |
10 | GRP PHYS MAT UMR CNRS 6634 | 27378 | 0% | 80% | 4 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | ULTRAMICROSCOPY | 111592 | 8% | 5% | 270 |
2 | JOURNAL DE PHYSIQUE | 41849 | 6% | 2% | 216 |
3 | SURFACE SCIENCE | 32005 | 9% | 1% | 319 |
4 | MICROSCOPY AND MICROANALYSIS | 9305 | 1% | 2% | 44 |
5 | SOVIET ELECTROCHEMISTRY | 7045 | 1% | 2% | 43 |
6 | PROGRESS IN SURFACE SCIENCE | 4802 | 1% | 3% | 20 |
7 | PHYSICAL REVIEW B | 4300 | 8% | 0% | 302 |
8 | APPLIED SURFACE SCIENCE | 4114 | 4% | 0% | 133 |
9 | PHYSICS OF LOW-DIMENSIONAL STRUCTURES | 4031 | 1% | 2% | 20 |
10 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 3929 | 2% | 1% | 89 |
Author Key Words |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | ATOM PROBE TOMOGRAPHY | 467178 | 5% | 28% | 195 | Search ATOM+PROBE+TOMOGRAPHY | Search ATOM+PROBE+TOMOGRAPHY |
2 | ATOM PROBE | 349465 | 3% | 36% | 112 | Search ATOM+PROBE | Search ATOM+PROBE |
3 | FIELD EVAPORATION | 294448 | 2% | 54% | 64 | Search FIELD+EVAPORATION | Search FIELD+EVAPORATION |
4 | FIELD ION MICROSCOPY | 187864 | 2% | 35% | 62 | Search FIELD+ION+MICROSCOPY | Search FIELD+ION+MICROSCOPY |
5 | SINGLE ATOM TIP | 88004 | 0% | 86% | 12 | Search SINGLE+ATOM+TIP | Search SINGLE+ATOM+TIP |
6 | SCANNING ATOM PROBE | 68450 | 0% | 100% | 8 | Search SCANNING+ATOM+PROBE | Search SCANNING+ATOM+PROBE |
7 | LOCAL ELECTRODE ATOM PROBE | 59894 | 0% | 100% | 7 | Search LOCAL+ELECTRODE+ATOM+PROBE | Search LOCAL+ELECTRODE+ATOM+PROBE |
8 | FACETING | 52335 | 1% | 15% | 42 | Search FACETING | Search FACETING |
9 | LASER ASSISTED FIELD EVAPORATION | 51337 | 0% | 100% | 6 | Search LASER+ASSISTED+FIELD+EVAPORATION | Search LASER+ASSISTED+FIELD+EVAPORATION |
10 | FIELD ION MICROSCOPE | 47048 | 0% | 50% | 11 | Search FIELD+ION+MICROSCOPE | Search FIELD+ION+MICROSCOPE |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | VURPILLOT, F , GAULT, B , GEISER, BP , LARSON, DJ , (2013) RECONSTRUCTING ATOM PROBE DATA: A REVIEW.ULTRAMICROSCOPY. VOL. 132. ISSUE . P. 19 -30 | 76 | 97% | 29 |
2 | KELLY, TF , LARSON, DJ , (2012) ATOM PROBE TOMOGRAPHY 2012.ANNUAL REVIEW OF MATERIALS RESEARCH, VOL 42. VOL. 42. ISSUE . P. 1-31 | 68 | 69% | 94 |
3 | LARSON, DJ , GAULT, B , GEISER, BP , DE GEUSER, F , VURPILLOT, F , (2013) ATOM PROBE TOMOGRAPHY SPATIAL RECONSTRUCTION: STATUS AND DIRECTIONS.CURRENT OPINION IN SOLID STATE & MATERIALS SCIENCE. VOL. 17. ISSUE 5. P. 236 -247 | 56 | 97% | 21 |
4 | CAIRNEY, JM , RAJAN, K , HALEY, D , GAULT, B , BAGOT, PJ , CHOI, PP , FELFER, PJ , RINGER, SP , MARCEAU, RKW , MOODY, MP , (2015) MINING INFORMATION FROM ATOM PROBE DATA.ULTRAMICROSCOPY. VOL. 159. ISSUE . P. 324 -337 | 69 | 70% | 4 |
5 | KHAN, MA , RINGER, SP , ZHENG, RK , (2016) ATOM PROBE TOMOGRAPHY ON SEMICONDUCTOR DEVICES.ADVANCED MATERIALS INTERFACES. VOL. 3. ISSUE 12. P. - | 81 | 63% | 0 |
6 | KELLY, TF , MILLER, MK , (2007) INVITED REVIEW ARTICLE: ATOM PROBE TOMOGRAPHY.REVIEW OF SCIENTIFIC INSTRUMENTS. VOL. 78. ISSUE 3. P. - | 54 | 66% | 340 |
7 | GAULT, B , SAXEY, DW , ASHTON, MW , SINNOTT, SB , CHIARAMONTI, AN , MOODY, MP , SCHREIBER, DK , (2016) BEHAVIOR OF MOLECULES AND MOLECULAR IONS NEAR A FIELD EMITTER.NEW JOURNAL OF PHYSICS. VOL. 18. ISSUE . P. - | 57 | 72% | 1 |
8 | CEGUERRA, AV , BREEN, AJ , STEPHENSON, LT , FELFER, PJ , ARAULLO-PETERS, VJ , LIDDICOAT, PV , CUI, XY , YAO, L , HALEY, D , MOODY, MP , ET AL (2013) THE RISE OF COMPUTATIONAL TECHNIQUES IN ATOM PROBE MICROSCOPY.CURRENT OPINION IN SOLID STATE & MATERIALS SCIENCE. VOL. 17. ISSUE 5. P. 224-235 | 54 | 82% | 5 |
9 | BLAVETTE, D , DUGUAY, S , (2014) ATOM PROBE TOMOGRAPHY IN NANOELECTRONICS.EUROPEAN PHYSICAL JOURNAL-APPLIED PHYSICS. VOL. 68. ISSUE 1. P. - | 42 | 89% | 6 |
10 | GAULT, B , MOODY, MP , CAIRNEY, JM , RINGER, SP , (2012) ATOM PROBE CRYSTALLOGRAPHY.MATERIALS TODAY. VOL. 15. ISSUE 9. P. 378 -386 | 53 | 67% | 29 |
Classes with closest relation at Level 2 |