Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
6514 | 1475 | 24.2 | 83% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
2 | 4 | MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER | 2836879 |
279 | 3 | SELF ASSEMBLED MONOLAYER//MOLECULAR ELECTRONICS//NANOSCIENCE & NANOTECHNOLOGY | 42929 |
482 | 2 | ATOMIC FORCE MICROSCOPY//ATOMIC FORCE MICROSCOPE//AFM | 15691 |
6514 | 1 | LOCAL ANODIC OXIDATION//NANO OXIDATION//AFM LITHOGRAPHY | 1475 |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | LOCAL ANODIC OXIDATION | authKW | 704678 | 3% | 85% | 40 |
2 | NANO OXIDATION | authKW | 298903 | 1% | 76% | 19 |
3 | AFM LITHOGRAPHY | authKW | 274354 | 2% | 51% | 26 |
4 | NANOLITHOGRAPHY | authKW | 251213 | 6% | 13% | 92 |
5 | SCANNING PROBE LITHOGRAPHY | authKW | 190983 | 2% | 34% | 27 |
6 | AFM OXIDATION | authKW | 126787 | 0% | 88% | 7 |
7 | ATOMIC FORCE MICROSCOPE | authKW | 113226 | 6% | 6% | 89 |
8 | DIAMOND TIP | authKW | 104352 | 1% | 46% | 11 |
9 | FRICTION INDUCED SELECTIVE ETCHING | authKW | 103501 | 0% | 100% | 5 |
10 | NANOMACHINING | authKW | 88298 | 1% | 27% | 16 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Physics, Applied | 14021 | 62% | 0% | 911 |
2 | Nanoscience & Nanotechnology | 12570 | 31% | 0% | 463 |
3 | Materials Science, Multidisciplinary | 2881 | 32% | 0% | 479 |
4 | Physics, Condensed Matter | 1818 | 20% | 0% | 294 |
5 | Microscopy | 1358 | 3% | 0% | 50 |
6 | Materials Science, Coatings & Films | 669 | 5% | 0% | 78 |
7 | Engineering, Electrical & Electronic | 668 | 15% | 0% | 217 |
8 | Chemistry, Physical | 536 | 15% | 0% | 228 |
9 | Chemistry, Multidisciplinary | 364 | 13% | 0% | 191 |
10 | Engineering, Manufacturing | 119 | 2% | 0% | 27 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | STATE PRECIS MEASURING TECH RUMENTS | 62101 | 0% | 100% | 3 |
2 | OFF 221 | 41401 | 0% | 100% | 2 |
3 | MICROELECT MADRID | 28399 | 2% | 6% | 23 |
4 | EXPT PHYS FMFI | 27599 | 0% | 67% | 2 |
5 | MECH INTELLECTUAL SYST ENGN | 27587 | 1% | 17% | 8 |
6 | 6 32 | 20700 | 0% | 100% | 1 |
7 | ALIEN INRIA LILLE NORD EUROPE | 20700 | 0% | 100% | 1 |
8 | AT NANOFABRICAT CO | 20700 | 0% | 100% | 1 |
9 | BRIDGESTONE AMER | 20700 | 0% | 100% | 1 |
10 | CENS CRYSTALLOG | 20700 | 0% | 100% | 1 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 16064 | 8% | 1% | 114 |
2 | NANOTECHNOLOGY | 8938 | 5% | 1% | 71 |
3 | APPLIED PHYSICS LETTERS | 5860 | 12% | 0% | 179 |
4 | RECORD-AT&T BELL LABORATORIES | 4138 | 0% | 20% | 1 |
5 | ULTRAMICROSCOPY | 3986 | 2% | 1% | 33 |
6 | JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 2914 | 5% | 0% | 67 |
7 | MICROELECTRONIC ENGINEERING | 2444 | 2% | 0% | 35 |
8 | JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY | 2062 | 3% | 0% | 40 |
9 | SCANNING | 1739 | 1% | 1% | 12 |
10 | NANOSCALE RESEARCH LETTERS | 1348 | 1% | 0% | 17 |
Author Key Words |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | LOCAL ANODIC OXIDATION | 704678 | 3% | 85% | 40 | Search LOCAL+ANODIC+OXIDATION | Search LOCAL+ANODIC+OXIDATION |
2 | NANO OXIDATION | 298903 | 1% | 76% | 19 | Search NANO+OXIDATION | Search NANO+OXIDATION |
3 | AFM LITHOGRAPHY | 274354 | 2% | 51% | 26 | Search AFM+LITHOGRAPHY | Search AFM+LITHOGRAPHY |
4 | NANOLITHOGRAPHY | 251213 | 6% | 13% | 92 | Search NANOLITHOGRAPHY | Search NANOLITHOGRAPHY |
5 | SCANNING PROBE LITHOGRAPHY | 190983 | 2% | 34% | 27 | Search SCANNING+PROBE+LITHOGRAPHY | Search SCANNING+PROBE+LITHOGRAPHY |
6 | AFM OXIDATION | 126787 | 0% | 88% | 7 | Search AFM+OXIDATION | Search AFM+OXIDATION |
7 | ATOMIC FORCE MICROSCOPE | 113226 | 6% | 6% | 89 | Search ATOMIC+FORCE+MICROSCOPE | Search ATOMIC+FORCE+MICROSCOPE |
8 | DIAMOND TIP | 104352 | 1% | 46% | 11 | Search DIAMOND+TIP | Search DIAMOND+TIP |
9 | FRICTION INDUCED SELECTIVE ETCHING | 103501 | 0% | 100% | 5 | Search FRICTION+INDUCED+SELECTIVE+ETCHING | Search FRICTION+INDUCED+SELECTIVE+ETCHING |
10 | NANOMACHINING | 88298 | 1% | 27% | 16 | Search NANOMACHINING | Search NANOMACHINING |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | XIE, XN , CHUNG, HJ , SOW, CH , WEE, ATS , (2006) NANOSCALE MATERIALS PATTERNING AND ENGINEERING BY ATOMIC FORCE MICROSCOPY NANOLITHOGRAPHY.MATERIALS SCIENCE & ENGINEERING R-REPORTS. VOL. 54. ISSUE 1-2. P. 1 -48 | 121 | 57% | 148 |
2 | YAN, YD , GENG, YQ , HU, ZJ , (2015) RECENT ADVANCES IN AFM TIP-BASED NANOMECHANICAL MACHINING.INTERNATIONAL JOURNAL OF MACHINE TOOLS & MANUFACTURE. VOL. 99. ISSUE . P. 1 -18 | 76 | 72% | 4 |
3 | KLEHN, B , KUNZE, U , (1999) NANOLITHOGRAPHY WITH AN ATOMIC FORCE MICROSCOPE BY MEANS OF VECTOR-SCAN CONTROLLED DYNAMIC PLOWING.JOURNAL OF APPLIED PHYSICS. VOL. 85. ISSUE 7. P. 3897 -3903 | 68 | 89% | 71 |
4 | LIU, H , HOEPPENER, S , SCHUBERT, US , (2016) NANOSCALE MATERIALS PATTERNING BY LOCAL ELECTROCHEMICAL LITHOGRAPHY.ADVANCED ENGINEERING MATERIALS. VOL. 18. ISSUE 6. P. 890 -902 | 65 | 61% | 0 |
5 | CAMBEL, V , SOLTYS, J , (2007) THE INFLUENCE OF SAMPLE CONDUCTIVITY ON LOCAL ANODIC OXIDATION BY THE TIP OF ATOMIC FORCE MICROSCOPE.JOURNAL OF APPLIED PHYSICS. VOL. 102. ISSUE 7. P. - | 42 | 98% | 5 |
6 | YANG, ML , ZHENG, ZK , LIU, YQ , ZHANG, BL , (2006) KINETICS OF ATOMIC FORCE MICROSCOPE-BASED SCANNED PROBE OXIDATION ON AN OCTADECYLATED SILICON(111) SURFACE.JOURNAL OF PHYSICAL CHEMISTRY B. VOL. 110. ISSUE 21. P. 10365-10373 | 55 | 71% | 15 |
7 | TSENG, AA , (2011) REMOVING MATERIAL USING ATOMIC FORCE MICROSCOPY WITH SINGLE- AND MULTIPLE-TIP SOURCES.SMALL. VOL. 7. ISSUE 24. P. 3409 -3427 | 54 | 55% | 28 |
8 | NYFFENEGGER, RM , PENNER, RM , (1997) NANOMETER-SCALE SURFACE MODIFICATION USING THE SCANNING PROBE MICROSCOPE: PROGRESS SINCE 1991.CHEMICAL REVIEWS. VOL. 97. ISSUE 4. P. 1195 -1230 | 105 | 34% | 208 |
9 | YAN, YD , HE, Y , GENG, YQ , HU, ZJ , LI, H , (2016) REVIEW ON AFM TIP-BASED MECHANICAL NANOMACHINING: THE INFLUENCE OF THE INPUT MACHINING PARAMETERS ON THE OUTCOMES.CURRENT NANOSCIENCE. VOL. 12. ISSUE 6. P. 666 -675 | 35 | 78% | 0 |
10 | GARCIA, R , KNOLL, AW , RIEDO, E , (2014) ADVANCED SCANNING PROBE LITHOGRAPHY.NATURE NANOTECHNOLOGY. VOL. 9. ISSUE 8. P. 577 -587 | 44 | 38% | 79 |
Classes with closest relation at Level 1 |