Class information for:
Level 1: KELVIN PROBE FORCE MICROSCOPY//ELECTROSTATIC FORCE MICROSCOPY//SCI CRYSTAL PHYS

Basic class information
Class id #P Avg. number of
references		 Database coverage
of references
10286 1076 24.8 80%


Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
2 4 MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER 2836879
279 3       SELF ASSEMBLED MONOLAYER//MOLECULAR ELECTRONICS//NANOSCIENCE & NANOTECHNOLOGY 42929
482 2             ATOMIC FORCE MICROSCOPY//ATOMIC FORCE MICROSCOPE//AFM 15691
10286 1                   KELVIN PROBE FORCE MICROSCOPY//ELECTROSTATIC FORCE MICROSCOPY//SCI CRYSTAL PHYS 1076

Terms with highest relevance score


rank Term termType Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 KELVIN PROBE FORCE MICROSCOPY authKW 584240 6% 31% 67
2 ELECTROSTATIC FORCE MICROSCOPY authKW 386243 3% 41% 33
3 SCI CRYSTAL PHYS address 113508 0% 100% 4
4 CHARGE DISSIPATION authKW 100887 1% 44% 8
5 SCANNING MAXWELL STRESS MICROSCOPY SMM authKW 90805 0% 80% 4
6 CONTACT ELECTRIFICATION authKW 86298 2% 18% 17
7 KELVIN FORCE MICROSCOPY authKW 85825 1% 28% 11
8 NANOIMPEDANCE authKW 85131 0% 100% 3
9 SCANNING MAXWELL STRESS MICROSCOPY authKW 85125 1% 50% 6
10 ELECTRIC FORCE MICROSCOPY authKW 79248 1% 31% 9

Web of Science journal categories


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 Physics, Applied 10440 62% 0% 671
2 Nanoscience & Nanotechnology 5845 25% 0% 272
3 Materials Science, Multidisciplinary 1499 28% 0% 302
4 Microscopy 1326 4% 0% 42
5 Physics, Condensed Matter 884 17% 0% 180
6 Materials Science, Coatings & Films 471 5% 0% 56
7 Chemistry, Physical 421 16% 0% 171
8 Instruments & Instrumentation 268 6% 0% 62
9 Engineering, Electrical & Electronic 247 11% 0% 122
10 Chemistry, Multidisciplinary 102 9% 0% 101

Address terms


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 SCI CRYSTAL PHYS 113508 0% 100% 4
2 CNRS UA 17 56754 0% 100% 2
3 CONCEPT SCI RUMENTS 56754 0% 100% 2
4 NANOBIOELEC GRP 56750 0% 50% 4
5 UMR CNRS 5011 42563 0% 50% 3
6 BIOMAT PL CRYSTALLOG 37835 0% 67% 2
7 MECAN FLUIDES IMFT 37835 0% 67% 2
8 TECHNOL MONTPELLIER 36481 0% 43% 3
9 UMR 5011 36475 1% 21% 6
10 ADV FUNCT SINTERED MAT MAT CHARACTERIZAT COMP 28377 0% 100% 1

Journals


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 NANOTECHNOLOGY 8477 5% 1% 59
2 APPLIED PHYSICS LETTERS 4648 13% 0% 136
3 ULTRAMICROSCOPY 3943 3% 1% 28
4 JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B 2036 3% 0% 35
5 BEILSTEIN JOURNAL OF NANOTECHNOLOGY 1715 1% 1% 8
6 MICROELECTRONICS RELIABILITY 1297 2% 0% 18
7 JOURNAL OF APPLIED PHYSICS 1249 7% 0% 71
8 SURFACE AND INTERFACE ANALYSIS 1200 2% 0% 17
9 MICROELECTRONIC ENGINEERING 1199 2% 0% 21
10 JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS 1135 3% 0% 36

Author Key Words


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class		 LCSH search Wikipedia search
1 KELVIN PROBE FORCE MICROSCOPY 584240 6% 31% 67 Search KELVIN+PROBE+FORCE+MICROSCOPY Search KELVIN+PROBE+FORCE+MICROSCOPY
2 ELECTROSTATIC FORCE MICROSCOPY 386243 3% 41% 33 Search ELECTROSTATIC+FORCE+MICROSCOPY Search ELECTROSTATIC+FORCE+MICROSCOPY
3 CHARGE DISSIPATION 100887 1% 44% 8 Search CHARGE+DISSIPATION Search CHARGE+DISSIPATION
4 SCANNING MAXWELL STRESS MICROSCOPY SMM 90805 0% 80% 4 Search SCANNING+MAXWELL+STRESS+MICROSCOPY+SMM Search SCANNING+MAXWELL+STRESS+MICROSCOPY+SMM
5 CONTACT ELECTRIFICATION 86298 2% 18% 17 Search CONTACT+ELECTRIFICATION Search CONTACT+ELECTRIFICATION
6 KELVIN FORCE MICROSCOPY 85825 1% 28% 11 Search KELVIN+FORCE+MICROSCOPY Search KELVIN+FORCE+MICROSCOPY
7 NANOIMPEDANCE 85131 0% 100% 3 Search NANOIMPEDANCE Search NANOIMPEDANCE
8 SCANNING MAXWELL STRESS MICROSCOPY 85125 1% 50% 6 Search SCANNING+MAXWELL+STRESS+MICROSCOPY Search SCANNING+MAXWELL+STRESS+MICROSCOPY
9 ELECTRIC FORCE MICROSCOPY 79248 1% 31% 9 Search ELECTRIC+FORCE+MICROSCOPY Search ELECTRIC+FORCE+MICROSCOPY
10 EFM 67865 1% 15% 16 Search EFM Search EFM

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.


Rank Reference # ref.
in cl.		 Shr. of ref. in
cl.		 Citations
1 STEVENS, GC , BAIRD, PJ , (2005) NANO- AND MESO-MEASUREMENT METHODS IN THE STUDY OF DIELECTRICS.IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION. VOL. 12. ISSUE 5. P. 979-992 67 64% 6
2 COLLINS, L , OKATAN, MB , LI, Q , KRAVENCHENKO, II , LAVRIK, NV , KALININ, SV , RODRIGUEZ, BJ , JESSE, S , (2015) QUANTITATIVE 3D-KPFM IMAGING WITH SIMULTANEOUS ELECTROSTATIC FORCE AND FORCE GRADIENT DETECTION.NANOTECHNOLOGY. VOL. 26. ISSUE 17. P. - 39 71% 4
3 COLLINS, L , BELIANINOV, A , SOMNATH, S , RODRIGUEZ, BJ , BALKE, N , KALININ, SV , JESSE, S , (2016) MULTIFREQUENCY SPECTRUM ANALYSIS USING FULLY DIGITAL G MODE-KELVIN PROBE FORCE MICROSCOPY.NANOTECHNOLOGY. VOL. 27. ISSUE 10. P. - 35 76% 1
4 MELITZ, W , SHEN, J , KUMMEL, AC , LEE, S , (2011) KELVIN PROBE FORCE MICROSCOPY AND ITS APPLICATION.SURFACE SCIENCE REPORTS. VOL. 66. ISSUE 1. P. 1 -27 40 42% 280
5 ZIEGLER, D , STEMMER, A , (2011) FORCE GRADIENT SENSITIVE DETECTION IN LIFT-MODE KELVIN PROBE FORCE MICROSCOPY.NANOTECHNOLOGY. VOL. 22. ISSUE 7. P. - 39 70% 25
6 GARRETT, JL , MUNDAY, JN , (2016) FAST, HIGH-RESOLUTION SURFACE POTENTIAL MEASUREMENTS IN AIR WITH HETERODYNE KELVIN PROBE FORCE MICROSCOPY.NANOTECHNOLOGY. VOL. 27. ISSUE 24. P. - 38 62% 0
7 RIEDEL, C , ALEGRIA, A , SCHWARTZ, GA , COLMENERO, J , SAENZ, JJ , (2011) NUMERICAL STUDY OF THE LATERAL RESOLUTION IN ELECTROSTATIC FORCE MICROSCOPY FOR DIELECTRIC SAMPLES.NANOTECHNOLOGY. VOL. 22. ISSUE 28. P. - 30 81% 8
8 GOMILA, G , GRAMSE, G , FUMAGALLI, L , (2014) FINITE-SIZE EFFECTS AND ANALYTICAL MODELING OF ELECTROSTATIC FORCE MICROSCOPY APPLIED TO DIELECTRIC FILMS.NANOTECHNOLOGY. VOL. 25. ISSUE 25. P. - 23 88% 10
9 GUO, SL , KALININ, SV , JESSE, S , (2012) OPEN-LOOP BAND EXCITATION KELVIN PROBE FORCE MICROSCOPY.NANOTECHNOLOGY. VOL. 23. ISSUE 12. P. - 45 50% 4
10 COLLINS, L , KILPATRICK, JI , WEBER, SAL , TSELEV, A , VLASSIOUK, IV , IVANOV, IN , JESSE, S , KALININ, SV , RODRIGUEZ, BJ , (2013) OPEN LOOP KELVIN PROBE FORCE MICROSCOPY WITH SINGLE AND MULTI-FREQUENCY EXCITATION.NANOTECHNOLOGY. VOL. 24. ISSUE 47. P. - 32 63% 16

Classes with closest relation at Level 1


Rank Class id link
1 14198 SCANNING CAPACITANCE MICROSCOPY//SSRM//INSYS
2 6822 NONCONTACT ATOMIC FORCE MICROSCOPY//NC AFM//QUARTZ TUNING FORK
3 37132 MICRO WETTABILITY//TISSUE MONOLAYER//LIPOPHILIC PROPERTY
4 25830 CHARGE WRITING//MASKLESS MICROFABRICATION//HGEBIET NANOTECHNOL
5 6720 SCANNING NONLINEAR DIELECTRIC MICROSCOPY//PIEZORESPONSE FORCE MICROSCOPY//FERROELECTRIC DATA STORAGE
6 2223 FUTURE ENERGY IFES//ATOMIC FORCE ACOUSTIC MICROSCOPY//TAPPING MODE
7 20425 MICROWAVE MICROPROBE//MICROWAVE MICROSCOPE//NEAR FIELD MICROWAVE MICROSCOPY
8 18384 AC SURFACE PHOTOVOLTAGE//SCANNING PHOTON MICROSCOPE//VIBRATING CAPACITOR
9 21518 CARBON NANOTUBE TIPS//CARBON NANOTUBE PROBES//CARDIAC BIOPHYS BIOENGN
10 12950 CHAIR QUANTUM RADIO PHYS//COBRA INTERUNIV//HYDROGEN TERMINATED SI111 1 X 1

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