Class information for: |
Basic class information |
| Class id | #P | Avg. number of references |
Database coverage of references |
|---|---|---|---|
| 12950 | 870 | 22.7 | 77% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
| Cluster id | Level | Cluster label | #P |
|---|---|---|---|
| 2 | 4 | MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER | 2836879 |
| 279 | 3 | SELF ASSEMBLED MONOLAYER//MOLECULAR ELECTRONICS//NANOSCIENCE & NANOTECHNOLOGY | 42929 |
| 482 | 2 | ATOMIC FORCE MICROSCOPY//ATOMIC FORCE MICROSCOPE//AFM | 15691 |
| 12950 | 1 | CHAIR QUANTUM RADIO PHYS//COBRA INTERUNIV//HYDROGEN TERMINATED SI111 1 X 1 | 870 |
Terms with highest relevance score |
| rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|---|
| 1 | CHAIR QUANTUM RADIO PHYS | address | 78966 | 0% | 75% | 3 |
| 2 | COBRA INTERUNIV | address | 75569 | 2% | 15% | 14 |
| 3 | HYDROGEN TERMINATED SI111 1 X 1 | authKW | 70193 | 0% | 100% | 2 |
| 4 | NEGATIVE DIFFERENCE RESISTANCE | authKW | 70193 | 0% | 100% | 2 |
| 5 | QUANTIZED POINT CONTACT | authKW | 70193 | 0% | 100% | 2 |
| 6 | GAAS110 SURFACE | authKW | 62390 | 0% | 44% | 4 |
| 7 | SHERMAN FAIRCHILD SOLID STATE STUDIES | address | 62390 | 0% | 44% | 4 |
| 8 | COBRA INTER UNIV | address | 53468 | 1% | 19% | 8 |
| 9 | COE 21ST | address | 46794 | 0% | 67% | 2 |
| 10 | SEMICOND INTER E | address | 46794 | 0% | 67% | 2 |
Web of Science journal categories |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|
| 1 | Physics, Applied | 5213 | 50% | 0% | 433 |
| 2 | Physics, Condensed Matter | 2733 | 30% | 0% | 264 |
| 3 | Nanoscience & Nanotechnology | 1281 | 14% | 0% | 119 |
| 4 | Microscopy | 719 | 3% | 0% | 28 |
| 5 | Physics, Multidisciplinary | 462 | 12% | 0% | 105 |
| 6 | Engineering, Electrical & Electronic | 379 | 14% | 0% | 126 |
| 7 | Materials Science, Coatings & Films | 340 | 5% | 0% | 43 |
| 8 | Chemistry, Physical | 97 | 10% | 0% | 89 |
| 9 | Materials Science, Multidisciplinary | 70 | 10% | 0% | 86 |
| 10 | Instruments & Instrumentation | 31 | 3% | 0% | 24 |
Address terms |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|
| 1 | CHAIR QUANTUM RADIO PHYS | 78966 | 0% | 75% | 3 |
| 2 | COBRA INTERUNIV | 75569 | 2% | 15% | 14 |
| 3 | SHERMAN FAIRCHILD SOLID STATE STUDIES | 62390 | 0% | 44% | 4 |
| 4 | COBRA INTER UNIV | 53468 | 1% | 19% | 8 |
| 5 | COE 21ST | 46794 | 0% | 67% | 2 |
| 6 | SEMICOND INTER E | 46794 | 0% | 67% | 2 |
| 7 | RECH AVANCEES MICROONDES ELECT SPATIALE | 43190 | 0% | 31% | 4 |
| 8 | CREAT INITIATIVES ULTRA FAST OPT CHA | 35097 | 0% | 100% | 1 |
| 9 | ERATO PROGRAM MICROPHOTOCONVERS PROJECT SAKYO KU | 35097 | 0% | 100% | 1 |
| 10 | MARCONI OPT COMPONENTS | 35097 | 0% | 100% | 1 |
Journals |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|
| 1 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 14127 | 9% | 0% | 82 |
| 2 | APPLIED PHYSICS LETTERS | 4810 | 14% | 0% | 124 |
| 3 | ULTRAMICROSCOPY | 2483 | 2% | 0% | 20 |
| 4 | PHYSICAL REVIEW B | 2351 | 12% | 0% | 108 |
| 5 | SURFACE SCIENCE | 1453 | 4% | 0% | 34 |
| 6 | PHYSICAL REVIEW LETTERS | 1214 | 7% | 0% | 59 |
| 7 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A | 1165 | 3% | 0% | 22 |
| 8 | PHYSICS OF LOW-DIMENSIONAL STRUCTURES | 660 | 0% | 0% | 4 |
| 9 | JOURNAL OF APPLIED PHYSICS | 574 | 5% | 0% | 44 |
| 10 | APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 548 | 2% | 0% | 15 |
Author Key Words |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
LCSH search | Wikipedia search |
|---|---|---|---|---|---|---|---|
| 1 | HYDROGEN TERMINATED SI111 1 X 1 | 70193 | 0% | 100% | 2 | Search HYDROGEN+TERMINATED+SI111+1+X+1 | Search HYDROGEN+TERMINATED+SI111+1+X+1 |
| 2 | NEGATIVE DIFFERENCE RESISTANCE | 70193 | 0% | 100% | 2 | Search NEGATIVE+DIFFERENCE+RESISTANCE | Search NEGATIVE+DIFFERENCE+RESISTANCE |
| 3 | QUANTIZED POINT CONTACT | 70193 | 0% | 100% | 2 | Search QUANTIZED+POINT+CONTACT | Search QUANTIZED+POINT+CONTACT |
| 4 | GAAS110 SURFACE | 62390 | 0% | 44% | 4 | Search GAAS110+SURFACE | Search GAAS110+SURFACE |
| 5 | AFM METROLOGY | 35097 | 0% | 100% | 1 | Search AFM+METROLOGY | Search AFM+METROLOGY |
| 6 | AFM STS | 35097 | 0% | 100% | 1 | Search AFM+STS | Search AFM+STS |
| 7 | AND PHOTOLUMINESCENCE | 35097 | 0% | 100% | 1 | Search AND+PHOTOLUMINESCENCE | Search AND+PHOTOLUMINESCENCE |
| 8 | CADIUM SELENIDE | 35097 | 0% | 100% | 1 | Search CADIUM+SELENIDE | Search CADIUM+SELENIDE |
| 9 | CHARGED ADATOMS | 35097 | 0% | 100% | 1 | Search CHARGED+ADATOMS | Search CHARGED+ADATOMS |
| 10 | CLEAVED SEMICONDUCTOR TIP | 35097 | 0% | 100% | 1 | Search CLEAVED+SEMICONDUCTOR+TIP | Search CLEAVED+SEMICONDUCTOR+TIP |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
| Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
|---|---|---|---|---|
| 1 | GRAFSTROM, S , (2002) PHOTOASSISTED SCANNING TUNNELING MICROSCOPY.JOURNAL OF APPLIED PHYSICS. VOL. 91. ISSUE 4. P. 1717 -1753 | 166 | 56% | 122 |
| 2 | LAUBSCH, A , URBAN, K , EBERT, P , (2009) THREE- TO TWO-DIMENSIONAL TRANSITION IN ELECTROSTATIC SCREENING OF POINT CHARGES AT SEMICONDUCTOR SURFACES STUDIED BY SCANNING TUNNELING MICROSCOPY.PHYSICAL REVIEW B. VOL. 80. ISSUE 24. P. - | 44 | 98% | 8 |
| 3 | WEIDLICH, PH , DUNIN-BORKOWSKI, RE , EBERT, P , (2011) QUANTITATIVE DETERMINATION OF LOCAL POTENTIAL VALUES IN INHOMOGENEOUSLY DOPED SEMICONDUCTORS BY SCANNING TUNNELING MICROSCOPY.PHYSICAL REVIEW B. VOL. 84. ISSUE 8. P. - | 44 | 80% | 1 |
| 4 | SCHNEDLER, M , PORTZ, V , WEIDLICH, PH , DUNIN-BORKOWSKI, RE , EBERT, P , (2015) QUANTITATIVE DESCRIPTION OF PHOTOEXCITED SCANNING TUNNELING SPECTROSCOPY AND ITS APPLICATION TO THE GAAS(110) SURFACE.PHYSICAL REVIEW B. VOL. 91. ISSUE 23. P. - | 34 | 89% | 1 |
| 5 | EBERT, P , (2002) DEFECTS IN III-V SEMICONDUCTOR SURFACES.APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING. VOL. 75. ISSUE 1. P. 101 -112 | 52 | 72% | 15 |
| 6 | YOKOTA, M , YOSHIDA, S , MERA, Y , TAKEUCHI, O , OIGAWA, H , SHIGEKAWA, H , (2013) BASES FOR TIME-RESOLVED PROBING OF TRANSIENT CARRIER DYNAMICS BY OPTICAL PUMP-PROBE SCANNING TUNNELING MICROSCOPY.NANOSCALE. VOL. 5. ISSUE 19. P. 9170-9175 | 30 | 91% | 1 |
| 7 | KLOTH, P , THIAS, T , BUNJES, O , VON DER HAAR, J , WENDEROTH, M , (2016) A VERSATILE IMPLEMENTATION OF PULSED OPTICAL EXCITATION IN SCANNING TUNNELING MICROSCOPY.REVIEW OF SCIENTIFIC INSTRUMENTS. VOL. 87. ISSUE 12. P. - | 26 | 93% | 0 |
| 8 | YAROTSKI, DA , TAYLOR, AJ , (2004) ULTRAFAST SCANNING TUNNELING MICROSCOPY: PRINCIPLES AND APPLICATIONS.ULTRAFAST DYNAMICAL PROCESSES IN SEMICONDUCTORS. VOL. 92. ISSUE . P. 57-97 | 38 | 78% | 1 |
| 9 | EBERT, P , (2001) ATOMIC STRUCTURE OF POINT DEFECTS IN COMPOUND SEMICONDUCTOR SURFACES.CURRENT OPINION IN SOLID STATE & MATERIALS SCIENCE. VOL. 5. ISSUE 2-3. P. 211 -250 | 71 | 44% | 27 |
| 10 | JAGER, ND , WEBER, ER , (1999) SCANNING TUNNELING MICROSCOPY OF DEFECTS IN SEMICONDUCTORS.IDENTIFICATION OF DEFECTS IN SEMICONDUCTORS. VOL. 51. ISSUE . P. 261-296 | 41 | 72% | 0 |
Classes with closest relation at Level 1 |