Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
5661 | 1592 | 19.6 | 69% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
2 | 4 | MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER | 2836879 |
279 | 3 | SELF ASSEMBLED MONOLAYER//MOLECULAR ELECTRONICS//NANOSCIENCE & NANOTECHNOLOGY | 42929 |
482 | 2 | ATOMIC FORCE MICROSCOPY//ATOMIC FORCE MICROSCOPE//AFM | 15691 |
5661 | 1 | LOCAL TUNNELING BARRIER HEIGHT//LOCAL TUNNELING BARRIER HEIGHT LBH//LOCAL WORK FUNCTION | 1592 |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | LOCAL TUNNELING BARRIER HEIGHT | authKW | 98632 | 0% | 86% | 6 |
2 | LOCAL TUNNELING BARRIER HEIGHT LBH | authKW | 95894 | 0% | 100% | 5 |
3 | LOCAL WORK FUNCTION | authKW | 87668 | 1% | 57% | 8 |
4 | I S CHARACTERISTICS | authKW | 61371 | 0% | 80% | 4 |
5 | ATOMIC CORRUGATION | authKW | 57536 | 0% | 100% | 3 |
6 | REVIEW OF SCIENTIFIC INSTRUMENTS | journal | 50999 | 18% | 1% | 283 |
7 | SCANNING TUNNELING MICROSCOPE | authKW | 50862 | 2% | 9% | 30 |
8 | AIR STM | authKW | 38358 | 0% | 100% | 2 |
9 | BESOCKE STYLE SCANNER | authKW | 38358 | 0% | 100% | 2 |
10 | MICROSCOPIC WORK FUNCTION | authKW | 38358 | 0% | 100% | 2 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Microscopy | 11061 | 9% | 0% | 145 |
2 | Instruments & Instrumentation | 8042 | 23% | 0% | 361 |
3 | Physics, Applied | 7500 | 45% | 0% | 709 |
4 | Physics, Condensed Matter | 2435 | 22% | 0% | 349 |
5 | Materials Science, Coatings & Films | 1945 | 8% | 0% | 133 |
6 | Physics, Multidisciplinary | 534 | 10% | 0% | 159 |
7 | Engineering, General | 270 | 4% | 0% | 58 |
8 | Nanoscience & Nanotechnology | 268 | 5% | 0% | 85 |
9 | Chemistry, Physical | 265 | 12% | 0% | 186 |
10 | Materials Science, Multidisciplinary | 69 | 8% | 0% | 133 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | AIST 2 | 19179 | 0% | 100% | 1 |
2 | ANAL VLSI DEV S IC GRP | 19179 | 0% | 100% | 1 |
3 | BAJAS TEMP FIS MAT CONDENSADA CIENC | 19179 | 0% | 100% | 1 |
4 | CMS LHC | 19179 | 0% | 100% | 1 |
5 | E COAST PL | 19179 | 0% | 100% | 1 |
6 | GRENZ FLACHENFOR VAKUUMPHYS | 19179 | 0% | 100% | 1 |
7 | INTERDISCIPLINARY ADV | 19179 | 0% | 100% | 1 |
8 | SEGAINVEX | 19179 | 0% | 100% | 1 |
9 | TEC 10 | 19179 | 0% | 100% | 1 |
10 | UNIV NANOTECHNOL NANOSCI | 19179 | 0% | 100% | 1 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | REVIEW OF SCIENTIFIC INSTRUMENTS | 50999 | 18% | 1% | 283 |
2 | ULTRAMICROSCOPY | 14435 | 4% | 1% | 65 |
3 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A | 11119 | 6% | 1% | 91 |
4 | SURFACE SCIENCE | 7717 | 7% | 0% | 105 |
5 | JOURNAL OF MICROSCOPY | 7201 | 2% | 1% | 31 |
6 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 4341 | 4% | 0% | 62 |
7 | IBM JOURNAL OF RESEARCH AND DEVELOPMENT | 3875 | 1% | 1% | 20 |
8 | JOURNAL OF MICROSCOPY-OXFORD | 3286 | 1% | 1% | 21 |
9 | INSTRUMENTS AND EXPERIMENTAL TECHNIQUES | 2726 | 2% | 1% | 24 |
10 | JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES | 1489 | 0% | 1% | 6 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | VANDELEEMPUT, LEC , VANKEMPEN, H , (1992) SCANNING TUNNELING MICROSCOPY.REPORTS ON PROGRESS IN PHYSICS. VOL. 55. ISSUE 8. P. 1165-1240 | 163 | 41% | 36 |
2 | KUK, Y , SILVERMAN, PJ , (1989) SCANNING TUNNELING MICROSCOPE INSTRUMENTATION.REVIEW OF SCIENTIFIC INSTRUMENTS. VOL. 60. ISSUE 2. P. 165-180 | 63 | 59% | 173 |
3 | BINNIG, G , ROHRER, H , (1986) SCANNING TUNNELING MICROSCOPY.IBM JOURNAL OF RESEARCH AND DEVELOPMENT. VOL. 30. ISSUE 4. P. 355 -369 | 47 | 66% | 515 |
4 | WANG, JT , LU, QY , (2012) HOW ARE THE BEHAVIORS OF PIEZOELECTRIC INERTIAL SLIDERS INTERPRETED?.REVIEW OF SCIENTIFIC INSTRUMENTS. VOL. 83. ISSUE 9. P. - | 22 | 81% | 2 |
5 | CHANG, TH , YANG, CH , YANG, MJ , DOTTELLIS, JB , (2001) CRYOGENIC SCANNING TUNNELING MICROSCOPE FOR QUANTUM DOT SPECTROSCOPY.REVIEW OF SCIENTIFIC INSTRUMENTS. VOL. 72. ISSUE 7. P. 2989 -2995 | 39 | 61% | 8 |
6 | ROYCHOWDHURY, A , GUBRUD, MA , DANA, R , ANDERSON, JR , LOBB, CJ , WELLSTOOD, FC , DREYER, M , (2014) A 30 MK, 13.5 T SCANNING TUNNELING MICROSCOPE WITH TWO INDEPENDENT TIPS.REVIEW OF SCIENTIFIC INSTRUMENTS. VOL. 85. ISSUE 4. P. - | 21 | 75% | 2 |
7 | GUPTA, AK , SINHA, RS , SINGH, RK , (2008) COMPACT TWO-DIMENSIONAL COARSE-POSITIONER FOR SCANNING PROBE MICROSCOPES.REVIEW OF SCIENTIFIC INSTRUMENTS. VOL. 79. ISSUE 6. P. - | 18 | 100% | 3 |
8 | KAMLAPURE, A , SARASWAT, G , GANGULI, SC , BAGWE, V , RAYCHAUDHURI, P , PAI, SP , (2013) A 350 MK, 9 T SCANNING TUNNELING MICROSCOPE FOR THE STUDY OF SUPERCONDUCTING THIN FILMS ON INSULATING SUBSTRATES AND SINGLE CRYSTALS.REVIEW OF SCIENTIFIC INSTRUMENTS. VOL. 84. ISSUE 12. P. - | 18 | 82% | 1 |
9 | HANSMA, PK , TERSOFF, J , (1987) SCANNING TUNNELING MICROSCOPY.JOURNAL OF APPLIED PHYSICS. VOL. 61. ISSUE 2. P. R1-R23 | 39 | 57% | 443 |
10 | JOBBINS, MM , AGOSTINO, CJ , MICHEL, JD , GANS, AR , KANDEL, SA , (2013) COMPACT, SINGLE-TUBE SCANNING TUNNELING MICROSCOPE WITH THERMOELECTRIC COOLING.REVIEW OF SCIENTIFIC INSTRUMENTS. VOL. 84. ISSUE 10. P. - | 17 | 85% | 1 |
Classes with closest relation at Level 1 |