Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
6822 | 1440 | 30.3 | 84% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
2 | 4 | MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER | 2836879 |
279 | 3 | SELF ASSEMBLED MONOLAYER//MOLECULAR ELECTRONICS//NANOSCIENCE & NANOTECHNOLOGY | 42929 |
482 | 2 | ATOMIC FORCE MICROSCOPY//ATOMIC FORCE MICROSCOPE//AFM | 15691 |
6822 | 1 | NONCONTACT ATOMIC FORCE MICROSCOPY//NC AFM//QUARTZ TUNING FORK | 1440 |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | NONCONTACT ATOMIC FORCE MICROSCOPY | authKW | 689340 | 4% | 64% | 51 |
2 | NC AFM | authKW | 386573 | 2% | 65% | 28 |
3 | QUARTZ TUNING FORK | authKW | 237773 | 2% | 42% | 27 |
4 | QPLUS | authKW | 233238 | 1% | 100% | 11 |
5 | PHYS ELECT CORRELAT MAGNETISM | address | 150778 | 1% | 89% | 8 |
6 | FREQUENCY MODULATION ATOMIC FORCE MICROSCOPY | authKW | 135699 | 1% | 80% | 8 |
7 | NON CONTACT ATOMIC FORCE MICROSCOPE | authKW | 113080 | 1% | 67% | 8 |
8 | NONCONTACT ATOMIC FORCE MICROSCOPY NC AFM | authKW | 113080 | 1% | 67% | 8 |
9 | QPLUS SENSOR | authKW | 106017 | 0% | 100% | 5 |
10 | TIP SURFACE INTERACTION | authKW | 104380 | 1% | 62% | 8 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Physics, Applied | 10292 | 54% | 0% | 778 |
2 | Nanoscience & Nanotechnology | 6492 | 23% | 0% | 333 |
3 | Physics, Condensed Matter | 3687 | 28% | 0% | 398 |
4 | Materials Science, Multidisciplinary | 1649 | 26% | 0% | 372 |
5 | Instruments & Instrumentation | 1343 | 10% | 0% | 148 |
6 | Materials Science, Coatings & Films | 1012 | 6% | 0% | 93 |
7 | Chemistry, Physical | 900 | 19% | 0% | 275 |
8 | Physics, Multidisciplinary | 789 | 12% | 0% | 176 |
9 | Microscopy | 297 | 2% | 0% | 24 |
10 | Chemistry, Multidisciplinary | 111 | 9% | 0% | 127 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | PHYS ELECT CORRELAT MAGNETISM | 150778 | 1% | 89% | 8 |
2 | BIOELECT NANOBIOENGN GRP | 88346 | 0% | 83% | 5 |
3 | SIC BIO | 88346 | 0% | 83% | 5 |
4 | EXPT PL PHYS | 61059 | 3% | 6% | 47 |
5 | GNS CEMES | 42407 | 0% | 100% | 2 |
6 | INNOVAT ABORAT | 36766 | 1% | 14% | 12 |
7 | NANOLIQUID | 33921 | 0% | 40% | 4 |
8 | PETER GRUNBERG PGI 3 | 33301 | 1% | 14% | 11 |
9 | FIS TEOR MAT CONDENSADA | 32646 | 2% | 4% | 35 |
10 | CCMS | 29029 | 1% | 14% | 10 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | BEILSTEIN JOURNAL OF NANOTECHNOLOGY | 27600 | 3% | 4% | 37 |
2 | REVIEW OF SCIENTIFIC INSTRUMENTS | 8864 | 8% | 0% | 113 |
3 | NANOTECHNOLOGY | 7197 | 4% | 1% | 63 |
4 | ACS SYMPOSIUM SERIES | 5862 | 5% | 0% | 72 |
5 | APPLIED SURFACE SCIENCE | 4260 | 6% | 0% | 85 |
6 | PHYSICAL REVIEW B | 3085 | 11% | 0% | 160 |
7 | APPLIED PHYSICS LETTERS | 2625 | 8% | 0% | 120 |
8 | PHYSICAL REVIEW LETTERS | 2480 | 8% | 0% | 108 |
9 | ACS NANO | 2010 | 2% | 0% | 30 |
10 | APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 1622 | 2% | 0% | 33 |
Author Key Words |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | NONCONTACT ATOMIC FORCE MICROSCOPY | 689340 | 4% | 64% | 51 | Search NONCONTACT+ATOMIC+FORCE+MICROSCOPY | Search NONCONTACT+ATOMIC+FORCE+MICROSCOPY |
2 | NC AFM | 386573 | 2% | 65% | 28 | Search NC+AFM | Search NC+AFM |
3 | QUARTZ TUNING FORK | 237773 | 2% | 42% | 27 | Search QUARTZ+TUNING+FORK | Search QUARTZ+TUNING+FORK |
4 | QPLUS | 233238 | 1% | 100% | 11 | Search QPLUS | Search QPLUS |
5 | FREQUENCY MODULATION ATOMIC FORCE MICROSCOPY | 135699 | 1% | 80% | 8 | Search FREQUENCY+MODULATION+ATOMIC+FORCE+MICROSCOPY | Search FREQUENCY+MODULATION+ATOMIC+FORCE+MICROSCOPY |
6 | NON CONTACT ATOMIC FORCE MICROSCOPE | 113080 | 1% | 67% | 8 | Search NON+CONTACT+ATOMIC+FORCE+MICROSCOPE | Search NON+CONTACT+ATOMIC+FORCE+MICROSCOPE |
7 | NONCONTACT ATOMIC FORCE MICROSCOPY NC AFM | 113080 | 1% | 67% | 8 | Search NONCONTACT+ATOMIC+FORCE+MICROSCOPY+NC+AFM | Search NONCONTACT+ATOMIC+FORCE+MICROSCOPY+NC+AFM |
8 | QPLUS SENSOR | 106017 | 0% | 100% | 5 | Search QPLUS+SENSOR | Search QPLUS+SENSOR |
9 | TIP SURFACE INTERACTION | 104380 | 1% | 62% | 8 | Search TIP+SURFACE+INTERACTION | Search TIP+SURFACE+INTERACTION |
10 | SKPM | 103893 | 0% | 70% | 7 | Search SKPM | Search SKPM |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | GIESSIBL, FJ , (2003) ADVANCES IN ATOMIC FORCE MICROSCOPY.REVIEWS OF MODERN PHYSICS. VOL. 75. ISSUE 3. P. 949 -983 | 84 | 65% | 911 |
2 | BARTH, C , FOSTER, AS , HENRY, CR , SHLUGER, AL , (2011) RECENT TRENDS IN SURFACE CHARACTERIZATION AND CHEMISTRY WITH HIGH-RESOLUTION SCANNING FORCE METHODS.ADVANCED MATERIALS. VOL. 23. ISSUE 4. P. 477 -501 | 134 | 41% | 98 |
3 | YUAN, BK , CHEN, PC , ZHANG, J , CHENG, ZH , QIU, XH , WANG, C , (2013) RESEARCH PROGRESS IN ATOMIC RESOLUTION MICROSCOPY.ACTA PHYSICO-CHIMICA SINICA. VOL. 29. ISSUE 7. P. 1370 -1384 | 79 | 75% | 2 |
4 | PAWLAK, R , KAWAI, S , FREMY, S , GLATZEL, T , MEYER, E , (2012) HIGH-RESOLUTION IMAGING OF C-60 MOLECULES USING TUNING-FORK-BASED NON-CONTACT ATOMIC FORCE MICROSCOPY.JOURNAL OF PHYSICS-CONDENSED MATTER. VOL. 24. ISSUE 8. P. - | 68 | 69% | 18 |
5 | LIU, MX , LI, SC , ZHA, ZQ , QIU, XH , (2017) RESEARCH PROGRESS AND APPLICATIONS OF QPLUS NONCONTACT ATOMIC FORCE MICROSCOPY.ACTA PHYSICO-CHIMICA SINICA. VOL. 33. ISSUE 1. P. 183 -197 | 56 | 79% | 0 |
6 | MORITA, S , (2013) ATOMICALLY RESOLVED FORCE MICROSCOPY.JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A. VOL. 31. ISSUE 5. P. - | 77 | 61% | 0 |
7 | JARVIS, SP , (2015) RESOLVING INTRA- AND INTER-MOLECULAR STRUCTURE WITH NON-CONTACT ATOMIC FORCE MICROSCOPY.INTERNATIONAL JOURNAL OF MOLECULAR SCIENCES. VOL. 16. ISSUE 8. P. 19936 -19959 | 58 | 67% | 7 |
8 | BAYKARA, MZ , SCHWENDEMANN, TC , ALTMAN, EI , SCHWARZ, UD , (2010) THREE-DIMENSIONAL ATOMIC FORCE MICROSCOPY - TAKING SURFACE IMAGING TO THE NEXT LEVEL.ADVANCED MATERIALS. VOL. 22. ISSUE 26-27. P. 2838 -2853 | 67 | 65% | 29 |
9 | HAPALA, P , SVEC, M , STETSOVYCH, O , VAN DER HEIJDEN, NJ , ONDRACEK, M , VAN DER LIT, J , MUTOMBO, P , SWART, I , JELINEK, P , (2016) MAPPING THE ELECTROSTATIC FORCE FIELD OF SINGLE MOLECULES FROM HIGH-RESOLUTION SCANNING PROBE IMAGES.NATURE COMMUNICATIONS. VOL. 7. ISSUE . P. - | 44 | 76% | 3 |
10 | GIESSIBL, FJ , PIELMEIER, F , EGUCHI, T , AN, T , HASEGAWA, Y , (2011) COMPARISON OF FORCE SENSORS FOR ATOMIC FORCE MICROSCOPY BASED ON QUARTZ TUNING FORKS AND LENGTH-EXTENSIONAL RESONATORS.PHYSICAL REVIEW B. VOL. 84. ISSUE 12. P. - | 43 | 91% | 42 |
Classes with closest relation at Level 1 |