Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
2223 | 2318 | 29.1 | 78% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
2 | 4 | MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER | 2836879 |
279 | 3 | SELF ASSEMBLED MONOLAYER//MOLECULAR ELECTRONICS//NANOSCIENCE & NANOTECHNOLOGY | 42929 |
482 | 2 | ATOMIC FORCE MICROSCOPY//ATOMIC FORCE MICROSCOPE//AFM | 15691 |
2223 | 1 | FUTURE ENERGY IFES//ATOMIC FORCE ACOUSTIC MICROSCOPY//TAPPING MODE | 2318 |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | FUTURE ENERGY IFES | address | 237084 | 1% | 100% | 18 |
2 | ATOMIC FORCE ACOUSTIC MICROSCOPY | authKW | 219516 | 1% | 83% | 20 |
3 | TAPPING MODE | authKW | 219140 | 2% | 40% | 42 |
4 | DISSENY PROGRAMACIO SISTEMES ELECT | address | 184399 | 1% | 100% | 14 |
5 | ENERGY NANOSCI LENS | address | 152398 | 1% | 64% | 18 |
6 | ATOMIC FORCE MICROSCOPY | authKW | 133734 | 15% | 3% | 344 |
7 | ULTRASONIC ATOMIC FORCE MICROSCOPY | authKW | 106686 | 0% | 90% | 9 |
8 | MULTIFREQUENCY AFM | authKW | 105371 | 0% | 100% | 8 |
9 | AFM CANTILEVER | authKW | 92185 | 1% | 50% | 14 |
10 | BIMODAL AFM | authKW | 80673 | 0% | 88% | 7 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Physics, Applied | 15416 | 52% | 0% | 1211 |
2 | Microscopy | 10008 | 7% | 0% | 167 |
3 | Instruments & Instrumentation | 8618 | 20% | 0% | 454 |
4 | Nanoscience & Nanotechnology | 7059 | 19% | 0% | 445 |
5 | Materials Science, Multidisciplinary | 2369 | 25% | 0% | 571 |
6 | Engineering, General | 399 | 4% | 0% | 85 |
7 | Chemistry, Physical | 304 | 11% | 0% | 250 |
8 | Physics, Condensed Matter | 267 | 8% | 0% | 181 |
9 | Materials Science, Coatings & Films | 200 | 3% | 0% | 60 |
10 | Engineering, Electrical & Electronic | 192 | 8% | 0% | 186 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | FUTURE ENERGY IFES | 237084 | 1% | 100% | 18 |
2 | DISSENY PROGRAMACIO SISTEMES ELECT | 184399 | 1% | 100% | 14 |
3 | ENERGY NANOSCI LENS | 152398 | 1% | 64% | 18 |
4 | ENERGY NANOSCI | 75701 | 1% | 25% | 23 |
5 | BIO NANO RUMENTAT | 70242 | 0% | 67% | 8 |
6 | DISSENY | 65857 | 0% | 100% | 5 |
7 | PROGRAMACIO SISTEMES ELECT | 65857 | 0% | 100% | 5 |
8 | NANODYNAM SYST | 54879 | 0% | 83% | 5 |
9 | SECT NANOSTRUCT PHYS | 52685 | 0% | 100% | 4 |
10 | BIO AFM FRONTIER | 36640 | 0% | 35% | 8 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | ULTRAMICROSCOPY | 34423 | 5% | 2% | 121 |
2 | REVIEW OF SCIENTIFIC INSTRUMENTS | 32651 | 12% | 1% | 274 |
3 | BEILSTEIN JOURNAL OF NANOTECHNOLOGY | 19023 | 2% | 4% | 39 |
4 | NANOTECHNOLOGY | 16265 | 5% | 1% | 120 |
5 | APPLIED PHYSICS LETTERS | 4881 | 9% | 0% | 207 |
6 | MEASUREMENT SCIENCE AND TECHNOLOGY | 3841 | 2% | 1% | 52 |
7 | ACS SYMPOSIUM SERIES | 2146 | 2% | 0% | 56 |
8 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1743 | 2% | 0% | 48 |
9 | NATURE NANOTECHNOLOGY | 1680 | 1% | 1% | 13 |
10 | LANGMUIR | 1561 | 3% | 0% | 71 |
Author Key Words |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | ATOMIC FORCE ACOUSTIC MICROSCOPY | 219516 | 1% | 83% | 20 | Search ATOMIC+FORCE+ACOUSTIC+MICROSCOPY | Search ATOMIC+FORCE+ACOUSTIC+MICROSCOPY |
2 | TAPPING MODE | 219140 | 2% | 40% | 42 | Search TAPPING+MODE | Search TAPPING+MODE |
3 | ATOMIC FORCE MICROSCOPY | 133734 | 15% | 3% | 344 | Search ATOMIC+FORCE+MICROSCOPY | Search ATOMIC+FORCE+MICROSCOPY |
4 | ULTRASONIC ATOMIC FORCE MICROSCOPY | 106686 | 0% | 90% | 9 | Search ULTRASONIC+ATOMIC+FORCE+MICROSCOPY | Search ULTRASONIC+ATOMIC+FORCE+MICROSCOPY |
5 | MULTIFREQUENCY AFM | 105371 | 0% | 100% | 8 | Search MULTIFREQUENCY+AFM | Search MULTIFREQUENCY+AFM |
6 | AFM CANTILEVER | 92185 | 1% | 50% | 14 | Search AFM+CANTILEVER | Search AFM+CANTILEVER |
7 | BIMODAL AFM | 80673 | 0% | 88% | 7 | Search BIMODAL+AFM | Search BIMODAL+AFM |
8 | SPRING CONSTANT | 76398 | 1% | 28% | 21 | Search SPRING+CONSTANT | Search SPRING+CONSTANT |
9 | CONTACT RESONANCE | 76199 | 0% | 64% | 9 | Search CONTACT+RESONANCE | Search CONTACT+RESONANCE |
10 | ULTRASONIC FORCE MICROSCOPY | 76199 | 0% | 64% | 9 | Search ULTRASONIC+FORCE+MICROSCOPY | Search ULTRASONIC+FORCE+MICROSCOPY |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | GARCIA, R , HERRUZO, ET , (2012) THE EMERGENCE OF MULTIFREQUENCY FORCE MICROSCOPY.NATURE NANOTECHNOLOGY. VOL. 7. ISSUE 4. P. 217 -226 | 72 | 73% | 190 |
2 | STARK, RW , (2010) BISTABILITY, HIGHER HARMONICS, AND CHAOS IN AFM.MATERIALS TODAY. VOL. 13. ISSUE 9. P. 24-32 | 82 | 90% | 32 |
3 | LABUDA, A , KOCUN, M , LYSY, M , WALSH, T , MEINHOLD, J , PROKSCH, T , MEINHOLD, W , ANDERSON, C , PROKSCH, R , (2016) CALIBRATION OF HIGHER EIGENMODES OF CANTILEVERS.REVIEW OF SCIENTIFIC INSTRUMENTS. VOL. 87. ISSUE 7. P. - | 58 | 89% | 2 |
4 | RAMAN, A , MELCHER, J , TUNG, R , (2008) CANTILEVER DYNAMICS IN ATOMIC FORCE MICROSCOPY.NANO TODAY. VOL. 3. ISSUE 1-2. P. 20 -27 | 76 | 79% | 83 |
5 | PASSERI, D , ROSSI, M , TAMBURRI, E , TERRANOVA, ML , (2013) MECHANICAL CHARACTERIZATION OF POLYMERIC THIN FILMS BY ATOMIC FORCE MICROSCOPY BASED TECHNIQUES.ANALYTICAL AND BIOANALYTICAL CHEMISTRY. VOL. 405. ISSUE 5. P. 1463 -1478 | 84 | 62% | 22 |
6 | GUZMAN, HV , GARCIA, PD , GARCIA, R , (2015) DYNAMIC FORCE MICROSCOPY SIMULATOR (DFORCE): A TOOL FOR PLANNING AND UNDERSTANDING TAPPING AND BIMODAL AFM EXPERIMENTS.BEILSTEIN JOURNAL OF NANOTECHNOLOGY. VOL. 6. ISSUE . P. 369 -379 | 49 | 96% | 4 |
7 | GARCIA, R , PROKSCH, R , (2013) NANOMECHANICAL MAPPING OF SOFT MATTER BY BIMODAL FORCE MICROSCOPY.EUROPEAN POLYMER JOURNAL. VOL. 49. ISSUE 8. P. 1897-1906 | 48 | 79% | 39 |
8 | HERRUZO, ET , PERRINO, AP , GARCIA, R , (2014) FAST NANOMECHANICAL SPECTROSCOPY OF SOFT MATTER.NATURE COMMUNICATIONS. VOL. 5. ISSUE . P. - | 38 | 79% | 59 |
9 | LABUDA, A , KOCUN, M , MEINHOLD, W , WALTERS, D , PROKSCH, R , (2016) GENERALIZED HERTZ MODEL FOR BIMODAL NANOMECHANICAL MAPPING.BEILSTEIN JOURNAL OF NANOTECHNOLOGY. VOL. 7. ISSUE . P. 970 -982 | 49 | 78% | 1 |
10 | HUEY, BD , (2007) AFM AND ACOUSTICS: FAST, QUANTITATIVE NANOMECHANICAL MAPPING.ANNUAL REVIEW OF MATERIALS RESEARCH. VOL. 37. ISSUE . P. 351 -385 | 60 | 78% | 28 |
Classes with closest relation at Level 1 |