Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
8930 | 1204 | 18.0 | 43% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
2 | 4 | MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER | 2836879 |
178 | 3 | GAN//PHYSICS, APPLIED//GALLIUM NITRIDE | 57874 |
816 | 2 | LEAD FREE SOLDER//SOLDER//SOLDERING & SURFACE MOUNT TECHNOLOGY | 11969 |
8930 | 1 | UNDERFILL//FLIP CHIP//JOURNAL OF ELECTRONIC PACKAGING | 1204 |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | UNDERFILL | authKW | 1446054 | 8% | 59% | 97 |
2 | FLIP CHIP | authKW | 414378 | 9% | 16% | 103 |
3 | JOURNAL OF ELECTRONIC PACKAGING | journal | 397465 | 12% | 11% | 139 |
4 | FLIP CHIP PACKAGE | authKW | 298336 | 2% | 59% | 20 |
5 | NO FLOW UNDERFILL | authKW | 292381 | 1% | 82% | 14 |
6 | UNDERFILL FLOW | authKW | 236040 | 1% | 85% | 11 |
7 | IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES | journal | 233967 | 9% | 9% | 103 |
8 | WARPAGE | authKW | 202920 | 4% | 19% | 43 |
9 | BUMP PITCH | authKW | 177520 | 1% | 100% | 7 |
10 | LEADFRAME | authKW | 153418 | 1% | 55% | 11 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Engineering, Manufacturing | 14635 | 19% | 0% | 231 |
2 | Engineering, Electrical & Electronic | 9400 | 52% | 0% | 621 |
3 | Materials Science, Multidisciplinary | 4502 | 43% | 0% | 522 |
4 | Nanoscience & Nanotechnology | 3270 | 18% | 0% | 219 |
5 | Engineering, Mechanical | 2516 | 15% | 0% | 185 |
6 | Physics, Applied | 1333 | 23% | 0% | 282 |
7 | Mechanics | 781 | 10% | 0% | 117 |
8 | Materials Science, Composites | 299 | 2% | 0% | 30 |
9 | Metallurgy & Metallurgical Engineering | 294 | 6% | 0% | 74 |
10 | Materials Science, Characterization, Testing | 176 | 2% | 0% | 20 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | ATO INNOVAT | 67624 | 0% | 67% | 4 |
2 | WORLDWIDE MFG GRP | 57058 | 0% | 75% | 3 |
3 | BUSINESS TEAM | 50720 | 0% | 100% | 2 |
4 | LOCTITE ELECT MAT | 50720 | 0% | 100% | 2 |
5 | MAT EQUIPMENT ENGN | 50720 | 0% | 100% | 2 |
6 | NEPZ ZONE | 50720 | 0% | 100% | 2 |
7 | ELECT ASSEMBLY PACKAGING | 45279 | 0% | 36% | 5 |
8 | MECH RELIABIL MICRO MAT | 45080 | 0% | 44% | 4 |
9 | ADV CIRCUIT INTERCONNECT RD | 33812 | 0% | 67% | 2 |
10 | DAIMLERCHRYSLER SIM | 33812 | 0% | 67% | 2 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | JOURNAL OF ELECTRONIC PACKAGING | 397465 | 12% | 11% | 139 |
2 | IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES | 233967 | 9% | 9% | 103 |
3 | MICROELECTRONICS RELIABILITY | 110969 | 14% | 3% | 174 |
4 | IEEE TRANSACTIONS ON ELECTRONICS PACKAGING MANUFACTURING | 97582 | 3% | 10% | 39 |
5 | SOLDERING & SURFACE MOUNT TECHNOLOGY | 94556 | 3% | 10% | 38 |
6 | IEEE TRANSACTIONS ON ADVANCED PACKAGING | 78558 | 5% | 6% | 56 |
7 | IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY PART A | 58769 | 2% | 8% | 30 |
8 | IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY PART B-ADVANCED PACKAGING | 55632 | 2% | 8% | 29 |
9 | IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY | 51151 | 4% | 4% | 52 |
10 | IEEE TRANSACTIONS ON COMPONENTS HYBRIDS AND MANUFACTURING TECHNOLOGY | 15382 | 2% | 2% | 28 |
Author Key Words |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | UNDERFILL | 1446054 | 8% | 59% | 97 | Search UNDERFILL | Search UNDERFILL |
2 | FLIP CHIP | 414378 | 9% | 16% | 103 | Search FLIP+CHIP | Search FLIP+CHIP |
3 | FLIP CHIP PACKAGE | 298336 | 2% | 59% | 20 | Search FLIP+CHIP+PACKAGE | Search FLIP+CHIP+PACKAGE |
4 | NO FLOW UNDERFILL | 292381 | 1% | 82% | 14 | Search NO+FLOW+UNDERFILL | Search NO+FLOW+UNDERFILL |
5 | UNDERFILL FLOW | 236040 | 1% | 85% | 11 | Search UNDERFILL+FLOW | Search UNDERFILL+FLOW |
6 | WARPAGE | 202920 | 4% | 19% | 43 | Search WARPAGE | Search WARPAGE |
7 | BUMP PITCH | 177520 | 1% | 100% | 7 | Search BUMP+PITCH | Search BUMP+PITCH |
8 | LEADFRAME | 153418 | 1% | 55% | 11 | Search LEADFRAME | Search LEADFRAME |
9 | EPOXY MOLDING COMPOUND | 133917 | 1% | 41% | 13 | Search EPOXY+MOLDING+COMPOUND | Search EPOXY+MOLDING+COMPOUND |
10 | CASTRO MACOSKO MODEL | 126800 | 0% | 100% | 5 | Search CASTRO+MACOSKO+MODEL | Search CASTRO+MACOSKO+MODEL |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | KHOR, CY , ABDULLAH, MZ , LAU, CS , AZID, IA , (2014) RECENT FLUID-STRUCTURE INTERACTION MODELING CHALLENGES IN IC ENCAPSULATION - A REVIEW.MICROELECTRONICS RELIABILITY. VOL. 54. ISSUE 8. P. 1511 -1526 | 46 | 79% | 0 |
2 | KHOR, CY , ABDULLAH, MZ , LAU, CS , LEONG, WC , AZIZ, MSA , (2014) INFLUENCE OF SOLDER BUMP ARRANGEMENTS ON MOLDED IC ENCAPSULATION.MICROELECTRONICS RELIABILITY. VOL. 54. ISSUE 4. P. 796 -807 | 26 | 90% | 2 |
3 | LAU, CS , KHOR, CY , SOARES, D , TEIXEIRA, JC , ABDULLAH, MZ , (2016) THERMO- MECHANICAL CHALLENGES OF REFLOWED LEAD-FREE SOLDER JOINTS IN SURFACE MOUNT COMPONENTS: A REVIEW.SOLDERING & SURFACE MOUNT TECHNOLOGY. VOL. 28. ISSUE 2. P. 41 -62 | 40 | 47% | 2 |
4 | AZIZ, MSA , ABDULLAH, MZ , KHOR, CY , (2014) INFLUENCE OF PTH OFFSET ANGLE IN WAVE SOLDERING WITH THERMAL-COUPLING METHOD.SOLDERING & SURFACE MOUNT TECHNOLOGY. VOL. 26. ISSUE 3. P. 97 -109 | 21 | 95% | 8 |
5 | YANG, SY , JEON, YD , LEE, SB , PAIK, KW , (2006) SOLDER REFLOW PROCESS INDUCED RESIDUAL WARPAGE MEASUREMENT AND ITS INFLUENCE ON RELIABILITY OF FLIP-CHIP ELECTRONIC PACKAGES.MICROELECTRONICS RELIABILITY. VOL. 46. ISSUE 2-4. P. 512-522 | 30 | 81% | 21 |
6 | KHOR, CY , ABDULLAH, MZ , ANI, FC , (2012) UNDERFILL PROCESS FOR TWO PARALLEL PLATES AND FLIP CHIP PACKAGING.INTERNATIONAL COMMUNICATIONS IN HEAT AND MASS TRANSFER. VOL. 39. ISSUE 8. P. 1205-1212 | 21 | 100% | 0 |
7 | KHOR, CY , ABDULLAH, MZ , (2012) OPTIMIZATION OF IC ENCAPSULATION CONSIDERING FLUID/STRUCTURE INTERACTION USING RESPONSE SURFACE METHODOLOGY.SIMULATION MODELLING PRACTICE AND THEORY. VOL. 29. ISSUE . P. 109 -122 | 24 | 86% | 2 |
8 | KHOR, CY , MUJEEBU, MA , ABDULLAH, MZ , ANI, FC , (2010) FINITE VOLUME BASED CFD SIMULATION OF PRESSURIZED FLIP-CHIP UNDERFILL ENCAPSULATION PROCESS.MICROELECTRONICS RELIABILITY. VOL. 50. ISSUE 1. P. 98 -105 | 24 | 86% | 6 |
9 | KHOR, CY , ABDULLAH, MZ , (2013) ANALYSIS OF FLUID/STRUCTURE INTERACTION: INFLUENCE OF SILICON CHIP THICKNESS IN MOULDED PACKAGING.MICROELECTRONICS RELIABILITY. VOL. 53. ISSUE 2. P. 334-347 | 22 | 88% | 1 |
10 | KANG, S , UME, IC , (2013) TECHNIQUES FOR MEASURING WARPAGE OF CHIP PACKAGES, PWBS, AND PWB ASSEMBLIES.IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY. VOL. 3. ISSUE 9. P. 1533 -1544 | 23 | 77% | 0 |
Classes with closest relation at Level 1 |