Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
16 | 5368 | 23.3 | 65% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
2 | 4 | MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER | 2836879 |
178 | 3 | GAN//PHYSICS, APPLIED//GALLIUM NITRIDE | 57874 |
816 | 2 | LEAD FREE SOLDER//SOLDER//SOLDERING & SURFACE MOUNT TECHNOLOGY | 11969 |
16 | 1 | LEAD FREE SOLDER//SOLDER//PB FREE SOLDER | 5368 |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | LEAD FREE SOLDER | authKW | 3689954 | 16% | 76% | 859 |
2 | SOLDER | authKW | 1596013 | 11% | 50% | 566 |
3 | PB FREE SOLDER | authKW | 1040298 | 4% | 77% | 237 |
4 | SOLDER JOINT | authKW | 738472 | 4% | 59% | 221 |
5 | JOURNAL OF ELECTRONIC MATERIALS | journal | 664325 | 20% | 11% | 1064 |
6 | INTERFACIAL REACTION | authKW | 546956 | 6% | 32% | 300 |
7 | INTERMETALLIC COMPOUNDS | authKW | 524615 | 11% | 16% | 572 |
8 | SN AG CU | authKW | 505561 | 2% | 85% | 105 |
9 | SOLDERING & SURFACE MOUNT TECHNOLOGY | journal | 414527 | 3% | 43% | 168 |
10 | INTERMETALLIC COMPOUND IMC | authKW | 358447 | 1% | 80% | 79 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Materials Science, Multidisciplinary | 68250 | 76% | 0% | 4105 |
2 | Metallurgy & Metallurgical Engineering | 51104 | 33% | 1% | 1762 |
3 | Engineering, Electrical & Electronic | 27096 | 42% | 0% | 2258 |
4 | Physics, Applied | 21837 | 42% | 0% | 2235 |
5 | Engineering, Manufacturing | 6185 | 6% | 0% | 328 |
6 | Nanoscience & Nanotechnology | 5382 | 11% | 0% | 616 |
7 | Physics, Condensed Matter | 983 | 9% | 0% | 494 |
8 | Mining & Mineral Processing | 910 | 1% | 0% | 77 |
9 | Engineering, Mechanical | 482 | 4% | 0% | 213 |
10 | Chemistry, Physical | 422 | 9% | 0% | 494 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | ELECT PACKAGING MAT | 173779 | 1% | 75% | 41 |
2 | ELECT PACKAGING | 117749 | 1% | 35% | 59 |
3 | COMPONENT QUAL TECHNOL GRP | 113986 | 0% | 95% | 21 |
4 | MICROJOINING | 89834 | 1% | 44% | 36 |
5 | MAT SCI ENGN | 61084 | 32% | 1% | 1708 |
6 | 14 | 49776 | 1% | 30% | 29 |
7 | TIANJIN ADV JOINTING TECHNOL | 44398 | 0% | 46% | 17 |
8 | ELECT PROD TECHNOL | 35705 | 0% | 37% | 17 |
9 | ASSEMBLY TEST GLOBAL MAT | 34119 | 0% | 100% | 6 |
10 | KEY STATE NEW DISPLAYS SYST INTEGRAT | 34119 | 0% | 100% | 6 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | JOURNAL OF ELECTRONIC MATERIALS | 664325 | 20% | 11% | 1064 |
2 | SOLDERING & SURFACE MOUNT TECHNOLOGY | 414527 | 3% | 43% | 168 |
3 | JOURNAL OF ELECTRONIC PACKAGING | 94133 | 3% | 12% | 143 |
4 | JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS | 85841 | 7% | 4% | 355 |
5 | MICROELECTRONICS RELIABILITY | 65481 | 5% | 4% | 283 |
6 | IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES | 27699 | 1% | 7% | 75 |
7 | JOURNAL OF ALLOYS AND COMPOUNDS | 20210 | 7% | 1% | 383 |
8 | MATERIALS TRANSACTIONS | 19141 | 3% | 2% | 156 |
9 | JOURNAL OF MATERIALS RESEARCH | 16614 | 3% | 2% | 187 |
10 | IEEE TRANSACTIONS ON ELECTRONICS PACKAGING MANUFACTURING | 15617 | 1% | 8% | 33 |
Author Key Words |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | LEAD FREE SOLDER | 3689954 | 16% | 76% | 859 | Search LEAD+FREE+SOLDER | Search LEAD+FREE+SOLDER |
2 | SOLDER | 1596013 | 11% | 50% | 566 | Search SOLDER | Search SOLDER |
3 | PB FREE SOLDER | 1040298 | 4% | 77% | 237 | Search PB+FREE+SOLDER | Search PB+FREE+SOLDER |
4 | SOLDER JOINT | 738472 | 4% | 59% | 221 | Search SOLDER+JOINT | Search SOLDER+JOINT |
5 | INTERFACIAL REACTION | 546956 | 6% | 32% | 300 | Search INTERFACIAL+REACTION | Search INTERFACIAL+REACTION |
6 | INTERMETALLIC COMPOUNDS | 524615 | 11% | 16% | 572 | Search INTERMETALLIC+COMPOUNDS | Search INTERMETALLIC+COMPOUNDS |
7 | SN AG CU | 505561 | 2% | 85% | 105 | Search SN+AG+CU | Search SN+AG+CU |
8 | INTERMETALLIC COMPOUND IMC | 358447 | 1% | 80% | 79 | Search INTERMETALLIC+COMPOUND+IMC | Search INTERMETALLIC+COMPOUND+IMC |
9 | ELECTROMIGRATION | 290073 | 4% | 21% | 238 | Search ELECTROMIGRATION | Search ELECTROMIGRATION |
10 | COMPOSITE SOLDER | 280227 | 1% | 93% | 53 | Search COMPOSITE+SOLDER | Search COMPOSITE+SOLDER |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | MU, DK , MCDONALD, SD , READ, J , HUANG, H , NOGITA, K , (2016) CRITICAL PROPERTIES OF CU6SN5 IN ELECTRONIC DEVICES: RECENT PROGRESS AND A REVIEW.CURRENT OPINION IN SOLID STATE & MATERIALS SCIENCE. VOL. 20. ISSUE 2. P. 55 -76 | 172 | 97% | 2 |
2 | ZHANG, L , TU, KN , (2014) STRUCTURE AND PROPERTIES OF LEAD-FREE SOLDERS BEARING MICRO AND NANO PARTICLES.MATERIALS SCIENCE & ENGINEERING R-REPORTS. VOL. 82. ISSUE . P. 1 -32 | 143 | 92% | 38 |
3 | ZHANG, L , HE, CW , GUO, YH , HAN, JG , ZHANG, YW , WANG, XY , (2012) DEVELOPMENT OF SNAG-BASED LEAD FREE SOLDERS IN ELECTRONICS PACKAGING.MICROELECTRONICS RELIABILITY. VOL. 52. ISSUE 3. P. 559 -578 | 142 | 97% | 31 |
4 | KOTADIA, HR , HOWES, PD , MANNAN, SH , (2014) A REVIEW: ON THE DEVELOPMENT OF LOW MELTING TEMPERATURE PB-FREE SOLDERS.MICROELECTRONICS RELIABILITY. VOL. 54. ISSUE 6-7. P. 1253 -1273 | 103 | 95% | 44 |
5 | LIU, S , XUE, SB , XUE, P , LUO, DX , (2015) PRESENT STATUS OF SN-ZN LEAD-FREE SOLDERS BEARING ALLOYING ELEMENTS.JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS. VOL. 26. ISSUE 7. P. 4389 -4411 | 121 | 98% | 5 |
6 | SHNAWAH, DA , SAID, SBM , SABRI, MFM , BADRUDDIN, IA , CHE, FX , (2012) HIGH-RELIABILITY LOW-AG-CONTENT SN-AG-CU SOLDER JOINTS FOR ELECTRONICS APPLICATIONS.JOURNAL OF ELECTRONIC MATERIALS. VOL. 41. ISSUE 9. P. 2631 -2658 | 125 | 95% | 17 |
7 | TAN, AT , TAN, AW , YUSOF, F , (2015) INFLUENCE OF NANOPARTICLE ADDITION ON THE FORMATION AND GROWTH OF INTERMETALLIC COMPOUNDS (IMCS) IN CU/SN-AG-CU/CU SOLDER JOINT DURING DIFFERENT THERMAL CONDITIONS.SCIENCE AND TECHNOLOGY OF ADVANCED MATERIALS. VOL. 16. ISSUE 3. P. - | 110 | 93% | 4 |
8 | WU, J , XUE, SB , WANG, JW , LIU, S , HAN, YL , WANG, LJ , (2016) RECENT PROGRESS OF SN-AG-CU LEAD-FREE SOLDERS BEARING ALLOY ELEMENTS AND NANOPARTICLES IN ELECTRONIC PACKAGING.JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS. VOL. 27. ISSUE 12. P. 12729 -12763 | 117 | 89% | 0 |
9 | ZENG, G , XUE, SB , ZHANG, L , GAO, LL , DAI, W , LUO, JD , (2010) A REVIEW ON THE INTERFACIAL INTERMETALLIC COMPOUNDS BETWEEN SN-AG-CU BASED SOLDERS AND SUBSTRATES.JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS. VOL. 21. ISSUE 5. P. 421 -440 | 103 | 97% | 62 |
10 | CHAN, YC , YANG, D , (2010) FAILURE MECHANISMS OF SOLDER INTERCONNECTS UNDER CURRENT STRESSING IN ADVANCED ELECTRONIC PACKAGES.PROGRESS IN MATERIALS SCIENCE. VOL. 55. ISSUE 5. P. 428 -475 | 92 | 95% | 94 |
Classes with closest relation at Level 1 |