Class information for:
Level 1: MOIRE INTERFEROMETRY//ELECTRON BEAM MOIRE//GEOMETRIC PHASE ANALYSIS

Basic class information
Class id #P Avg. number of
references		 Database coverage
of references
17895 577 15.7 46%


Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
10 4 OPTICS//PHYSICS, PARTICLES & FIELDS//PHYSICS, MULTIDISCIPLINARY 1131262
217 3       OPTICS//APPLIED OPTICS//OPTICAL ENGINEERING 50829
1780 2             DIGITAL IMAGE CORRELATION//OPTICS AND LASERS IN ENGINEERING//SPECKLE INTERFEROMETRY 6371
17895 1                   MOIRE INTERFEROMETRY//ELECTRON BEAM MOIRE//GEOMETRIC PHASE ANALYSIS 577

Terms with highest relevance score


rank Term termType Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 MOIRE INTERFEROMETRY authKW 606800 9% 23% 50
2 ELECTRON BEAM MOIRE authKW 423358 1% 100% 8
3 GEOMETRIC PHASE ANALYSIS authKW 356493 3% 42% 16
4 NANO MOIRE authKW 264599 1% 100% 5
5 FRINGE MULTIPLICATION authKW 220497 1% 83% 5
6 ELECTRON MOIRE authKW 211679 1% 100% 4
7 MICROSCOPIC MOIRE INTERFEROMETRY authKW 169341 1% 80% 4
8 SEM MOIRE authKW 158759 1% 100% 3
9 SPOT CENTROID authKW 158759 1% 100% 3
10 EXPERIMENTAL MECHANICS journal 113313 13% 3% 76

Web of Science journal categories


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 Materials Science, Characterization, Testing 15587 21% 0% 119
2 Optics 3139 31% 0% 180
3 Mechanics 2518 23% 0% 135
4 Materials Science, Multidisciplinary 770 28% 0% 159
5 Engineering, Mechanical 702 12% 0% 69
6 Instruments & Instrumentation 438 9% 0% 54
7 Engineering, General 221 5% 0% 30
8 Engineering, Manufacturing 138 3% 0% 17
9 Engineering, Electrical & Electronic 119 11% 0% 63
10 Nanoscience & Nanotechnology 115 6% 0% 33

Address terms


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 OPENING VACUUM PHYS 105839 0% 100% 2
2 MA INENWESEN 105835 1% 50% 4
3 AML 83945 6% 5% 33
4 ENG MECH 59531 1% 38% 3
5 853 52920 0% 100% 1
6 AILUN ASSOC IST 52920 0% 100% 1
7 BACHUS WORKS ADV METHODS GRP 52920 0% 100% 1
8 CHINESE MINIST EDUC FAILURE MECH 52920 0% 100% 1
9 COMPOS COATINGS 52920 0% 100% 1
10 CRYSTALLINE SILICON RD 52920 0% 100% 1

Journals


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 EXPERIMENTAL MECHANICS 113313 13% 3% 76
2 OPTICS AND LASERS IN ENGINEERING 61327 11% 2% 63
3 EXPERIMENTAL TECHNIQUES 12871 3% 2% 15
4 JOURNAL OF ELECTRONIC PACKAGING 10965 3% 1% 16
5 OPTICAL ENGINEERING 5779 7% 0% 39
6 STRAIN 4555 1% 1% 8
7 JOURNAL OF STRAIN ANALYSIS FOR ENGINEERING DESIGN 2232 1% 1% 8
8 SOLDERING & SURFACE MOUNT TECHNOLOGY 2180 1% 1% 4
9 MEASUREMENT SCIENCE AND TECHNOLOGY 2077 3% 0% 19
10 JSME INTERNATIONAL JOURNAL SERIES A-MECHANICS AND MATERIAL ENGINEERING 1775 0% 2% 2

Author Key Words


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class		 LCSH search Wikipedia search
1 MOIRE INTERFEROMETRY 606800 9% 23% 50 Search MOIRE+INTERFEROMETRY Search MOIRE+INTERFEROMETRY
2 ELECTRON BEAM MOIRE 423358 1% 100% 8 Search ELECTRON+BEAM+MOIRE Search ELECTRON+BEAM+MOIRE
3 GEOMETRIC PHASE ANALYSIS 356493 3% 42% 16 Search GEOMETRIC+PHASE+ANALYSIS Search GEOMETRIC+PHASE+ANALYSIS
4 NANO MOIRE 264599 1% 100% 5 Search NANO+MOIRE Search NANO+MOIRE
5 FRINGE MULTIPLICATION 220497 1% 83% 5 Search FRINGE+MULTIPLICATION Search FRINGE+MULTIPLICATION
6 ELECTRON MOIRE 211679 1% 100% 4 Search ELECTRON+MOIRE Search ELECTRON+MOIRE
7 MICROSCOPIC MOIRE INTERFEROMETRY 169341 1% 80% 4 Search MICROSCOPIC+MOIRE+INTERFEROMETRY Search MICROSCOPIC+MOIRE+INTERFEROMETRY
8 SEM MOIRE 158759 1% 100% 3 Search SEM+MOIRE Search SEM+MOIRE
9 SPOT CENTROID 158759 1% 100% 3 Search SPOT+CENTROID Search SPOT+CENTROID
10 MOIRE 112343 3% 11% 19 Search MOIRE Search MOIRE

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.


Rank Reference # ref.
in cl.		 Shr. of ref. in
cl.		 Citations
1 IFJU, PG , HAN, B , (2010) RECENT APPLICATIONS OF MOIRE INTERFEROMETRY.EXPERIMENTAL MECHANICS. VOL. 50. ISSUE 8. P. 1129-1147 53 45% 14
2 LANG, FC , ZHAO, YR , XING, YM , LIU, F , HOU, XH , ZHU, J , LI, JJ , YANG, ST , (2016) A NOVEL RASTER-SCANNING METHOD TO FABRICATE ULTRA-FINE CROSS-GRATINGS FOR THE GENERATION OF ELECTRON BEAM MOIRE FRINGE PATTERNS.OPTICS AND LASERS IN ENGINEERING. VOL. 86. ISSUE . P. 281 -290 19 95% 0
3 ZHAO, YR , LEI, ZK , XING, YM , HOU, XH , BAI, PC , (2014) FABRICATING PARAMETERS OPTIMIZATION OF HIGH FREQUENCY GRATING BY MULTI-SCANNING ELECTRON BEAM METHOD.EXPERIMENTAL MECHANICS. VOL. 54. ISSUE 1. P. 45 -55 16 100% 3
4 HAN, B , POST, D , IFJU, P , (2001) MOIRE INTERFEROMETRY FOR ENGINEERING MECHANICS: CURRENT PRACTICES AND FUTURE DEVELOPMENTS.JOURNAL OF STRAIN ANALYSIS FOR ENGINEERING DESIGN. VOL. 36. ISSUE 1. P. 101 -117 29 63% 45
5 WANG, QH , KISHIMOTO, S , TSUDA, H , (2014) FORMATION OF THREE-WAY SCANNING ELECTRON MICROSCOPE MOIRE ON MICRO/NANOSTRUCTURES.SCIENTIFIC WORLD JOURNAL. VOL. . ISSUE . P. - 15 88% 0
6 JOO, J , CHO, S , HAN, B , (2005) CHARACTERIZATION OF FLEXURAL AND THERMO-MECHANICAL BEHAVIOR OF PLASTIC BALL GRID PACKAGE ASSEMBLY USING MOIRE INTERFEROMETRY.MICROELECTRONICS RELIABILITY. VOL. 45. ISSUE 3-4. P. 637-646 16 100% 7
7 HAN, B , (2003) THERMAL STRESSES IN MICROELECTRONICS SUBASSEMBLIES: QUANTITATIVE CHARACTERIZATION USING PHOTOMECHANICS METHODS.JOURNAL OF THERMAL STRESSES. VOL. 26. ISSUE 6. P. 583 -613 19 79% 19
8 WANG, QH , RI, S , TSUDA, H , (2016) DIGITAL SAMPLING MOIRE AS A SUBSTITUTE FOR MICROSCOPE SCANNING MOIRE FOR HIGH-SENSITIVITY AND FULL-FIELD DEFORMATION MEASUREMENT AT MICRON/NANO SCALES.APPLIED OPTICS. VOL. 55. ISSUE 25. P. 6858 -6865 14 78% 0
9 LI, YJ , XIE, HM , CHEN, PW , ZHANG, QM , (2011) THEORETICAL ANALYSIS OF MOIRE FRINGE MULTIPLICATION UNDER A SCANNING ELECTRON MICROSCOPE.MEASUREMENT SCIENCE AND TECHNOLOGY. VOL. 22. ISSUE 2. P. - 13 93% 3
10 LI, CW , LIU, ZW , XIE, HM , WU, D , (2013) NOVEL 3D SEM MOIRE METHOD FOR MICRO HEIGHT MEASUREMENT.OPTICS EXPRESS. VOL. 21. ISSUE 13. P. 15734-15746 15 71% 9

Classes with closest relation at Level 1


Rank Class id link
1 7017 DIGITAL IMAGE CORRELATION//DIGITAL VOLUME CORRELATION//EXPERIMENTAL MECHANICS
2 805 SHEAROGRAPHY//SPECKLE INTERFEROMETRY//PHASE UNWRAPPING
3 23618 DISCRETE CRACK MODELS//OPT FILMS MAT//AEM GRP
4 8930 UNDERFILL//FLIP CHIP//JOURNAL OF ELECTRONIC PACKAGING
5 18269 HOLE DRILLING//HOLE DRILLING METHOD//INCREMENTAL HOLE DRILLING METHOD
6 28550 ENVIRONM TEST TECHNOL//GLASS PLASTICS//OPTICAL HETERODYNE INTERFEROMETER
7 2651 FRINGE PROJECTION//STRUCTURED LIGHT//3D SHAPE MEASUREMENT
8 12428 CONVERGENT BEAM ELECTRON DIFFRACTION//CBED//LATTICE PARAMETER DETERMINATION
9 12874 TALBOT EFFECT//PL OPT COMPLUTENSE GRP//SELF IMAGING
10 11741 CAUSTIC METHOD//METHOD OF CAUSTICS//DYNAMIC CAUSTICS

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