Class information for:
Level 1: GETTERING//DLTS//GETTERING EFFICIENCY

Basic class information
Class id #P Avg. number of
references		 Database coverage
of references
4246 1821 21.4 51%


Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
2 4 MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER 2836879
6 3       PHYSICS, APPLIED//IEEE TRANSACTIONS ON ELECTRON DEVICES//SILICON 155028
648 2             OXYGEN PRECIPITATION//OXYGEN PRECIPITATES//GETTERING 13601
4246 1                   GETTERING//DLTS//GETTERING EFFICIENCY 1821

Terms with highest relevance score


rank Term termType Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 GETTERING authKW 148501 3% 18% 48
2 DLTS authKW 105455 4% 10% 65
3 GETTERING EFFICIENCY authKW 91282 0% 78% 7
4 SI AU authKW 86227 0% 86% 6
5 SUBSTITUTIONAL FE authKW 53652 0% 80% 4
6 FE DEFECTS authKW 50300 0% 100% 3
7 GOLD IN SILICON authKW 50300 0% 100% 3
8 IRON RELATED DEFECTS authKW 50300 0% 100% 3
9 MN AND FE IN SILICON authKW 50300 0% 100% 3
10 PHOTOLUMINESCENCE CU CENTER authKW 50300 0% 100% 3

Web of Science journal categories


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 Physics, Condensed Matter 13301 45% 0% 819
2 Physics, Applied 9164 46% 0% 836
3 Materials Science, Multidisciplinary 1615 23% 0% 423
4 Materials Science, Coatings & Films 1129 6% 0% 111
5 Electrochemistry 624 6% 0% 101
6 Physics, Multidisciplinary 224 7% 0% 124
7 Engineering, Electrical & Electronic 157 8% 0% 148
8 Physics, Nuclear 38 2% 0% 40
9 Nuclear Science & Technology 32 2% 0% 37
10 Physics, Atomic, Molecular & Chemical 13 2% 0% 45

Address terms


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 ICHHPS 34925 0% 42% 5
2 ABT RD CM 16767 0% 100% 1
3 BUSINESS STRATEG TECHNOL 16767 0% 100% 1
4 BUSINESS UNIT POLYSILICON 16767 0% 100% 1
5 CORP FRONT END 16767 0% 100% 1
6 DPT ZT KM6 16767 0% 100% 1
7 ELECT DEVICES MAT CHARACTERIZAT GRP 16767 0% 100% 1
8 EPI BUSINESS UNIT 16767 0% 100% 1
9 FAB MAT OPERAT 16767 0% 100% 1
10 GOI TASK FORCE 16767 0% 100% 1

Journals


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 SOLID STATE PHENOMENA 17482 3% 2% 48
2 PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE 8541 6% 1% 102
3 MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY 7068 3% 1% 56
4 SOVIET PHYSICS SEMICONDUCTORS-USSR 6853 3% 1% 48
5 JOURNAL OF APPLIED PHYSICS 6174 11% 0% 201
6 JOURNAL OF THE ELECTROCHEMICAL SOCIETY 5456 5% 0% 100
7 JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS 3275 4% 0% 79
8 PHYSICA B-CONDENSED MATTER 2948 4% 0% 75
9 APPLIED PHYSICS LETTERS 2599 7% 0% 135
10 PHYSICAL REVIEW B 2537 9% 0% 165

Author Key Words


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class		 LCSH search Wikipedia search
1 GETTERING 148501 3% 18% 48 Search GETTERING Search GETTERING
2 DLTS 105455 4% 10% 65 Search DLTS Search DLTS
3 GETTERING EFFICIENCY 91282 0% 78% 7 Search GETTERING+EFFICIENCY Search GETTERING+EFFICIENCY
4 SI AU 86227 0% 86% 6 Search SI+AU Search SI+AU
5 SUBSTITUTIONAL FE 53652 0% 80% 4 Search SUBSTITUTIONAL+FE Search SUBSTITUTIONAL+FE
6 FE DEFECTS 50300 0% 100% 3 Search FE+DEFECTS Search FE+DEFECTS
7 GOLD IN SILICON 50300 0% 100% 3 Search GOLD+IN+SILICON Search GOLD+IN+SILICON
8 IRON RELATED DEFECTS 50300 0% 100% 3 Search IRON+RELATED+DEFECTS Search IRON+RELATED+DEFECTS
9 MN AND FE IN SILICON 50300 0% 100% 3 Search MN+AND+FE+IN+SILICON Search MN+AND+FE+IN+SILICON
10 PHOTOLUMINESCENCE CU CENTER 50300 0% 100% 3 Search PHOTOLUMINESCENCE+CU+CENTER Search PHOTOLUMINESCENCE+CU+CENTER

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.


Rank Reference # ref. in
cl.		 Shr. of ref. in
cl.		 Citations
1 ISTRATOV, AA , HIESLMAIR, H , WEBER, ER , (1999) IRON AND ITS COMPLEXES IN SILICON.APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING. VOL. 69. ISSUE 1. P. 13 -44 192 87% 338
2 STEGER, M , YANG, A , SEKIGUCHI, T , SAEEDI, K , THEWALT, MLW , HENRY, MO , JOHNSTON, K , RIEMANN, H , ABROSIMOV, NV , CHURBANOV, MF , ET AL (2011) PHOTOLUMINESCENCE OF DEEP DEFECTS INVOLVING TRANSITION METALS IN SI: NEW INSIGHTS FROM HIGHLY ENRICHED SI-28.JOURNAL OF APPLIED PHYSICS. VOL. 110. ISSUE 8. P. - 96 83% 15
3 KNACK, S , (2004) COPPER-RELATED DEFECTS IN SILICON.MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING. VOL. 7. ISSUE 3. P. 125 -141 83 80% 14
4 LINDROOS, J , SAVIN, H , (2016) REVIEW OF LIGHT-INDUCED DEGRADATION IN CRYSTALLINE SILICON SOLAR CELLS.SOLAR ENERGY MATERIALS AND SOLAR CELLS. VOL. 147. ISSUE . P. 115 -126 62 56% 6
5 ISTRATOV, AA , WEBER, ER , (1998) ELECTRICAL PROPERTIES AND RECOMBINATION ACTIVITY OF COPPER, NICKEL AND COBALT IN SILICON.APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING. VOL. 66. ISSUE 2. P. 123 -136 98 57% 186
6 ISTRATOV, AA , HIESLMAIR, H , WEBER, ER , (2000) IRON CONTAMINATION IN SILICON TECHNOLOGY.APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING. VOL. 70. ISSUE 5. P. 489 -534 137 33% 192
7 SANATI, M , SZWACKI, NG , ESTREICHER, SK , (2007) INTERSTITIAL FE IN SI AND ITS INTERACTIONS WITH HYDROGEN AND SHALLOW DOPANTS.PHYSICAL REVIEW B. VOL. 76. ISSUE 12. P. - 61 72% 22
8 ISTRATOV, AA , WEBER, ER , (2002) PHYSICS OF COPPER IN SILICON.JOURNAL OF THE ELECTROCHEMICAL SOCIETY. VOL. 149. ISSUE 1. P. G21 -G30 77 52% 221
9 HUY, PT , AMMERLAAN, CAJ , (2002) MAGNETIC RESONANCE INVESTIGATION OF GOLD-DOPED AND GOLD-HYDROGEN-DOPED SILICON.PHYSICAL REVIEW B. VOL. 66. ISSUE 16. P. - 45 98% 6
10 KITAGAWA, H , (2000) DIFFUSION AND ELECTRICAL PROPERTIES OF 3D TRANSITION-METAL IMPURITIES IN SILICON.SOLID STATE PHENOMENA. VOL. 71. ISSUE . P. 51 -72 53 85% 12

Classes with closest relation at Level 1


Rank Class id link
1 24088 SPE OPHOTOMETRY//BLACK SILICON//SILICON SURFACE MICROSTRUCTURE
2 6450 MULTICRYSTALLINE SILICON//PHOTOLUMINESCENCE IMAGING//GETTERING
3 22936 OPTIMIZATION OF ANNEALING//SILICON MICROCAVITY//DECREASING OF DEPTH OF P N JUNCTIONS
4 1673 OXYGEN PRECIPITATION//CZOCHRALSKI SILICON//OXYGEN PRECIPITATES
5 17770 VOLTCOULOMETRY//DLTS RESOLUTION//SEMI INSULATING MATERIALS
6 6817 SOVIET PHYSICS SEMICONDUCTORS-USSR//LIFETIME CONTROL//DLTS
7 31721 GLASS BEAD DESTRUCTION//SOVIET PHYSICS SEMICONDUCTORS-USSR//STATE TORAT
8 13429 INDIRECT BANDGAP SEMICONDUCTOR//D LINES//EBIC
9 5113 HYDROGEN IN SILICON//MULTIVACANCY//HYDROGEN ATOM TREATMENT
10 11988 SMART CUT//ION CUT//GETTERING

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