Class information for:
Level 1: SOVIET PHYSICS SEMICONDUCTORS-USSR//LIFETIME CONTROL//DLTS

Basic class information
Class id #P Avg. number of
references		 Database coverage
of references
6817 1441 18.6 45%


Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
2 4 MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER 2836879
6 3       PHYSICS, APPLIED//IEEE TRANSACTIONS ON ELECTRON DEVICES//SILICON 155028
648 2             OXYGEN PRECIPITATION//OXYGEN PRECIPITATES//GETTERING 13601
6817 1                   SOVIET PHYSICS SEMICONDUCTORS-USSR//LIFETIME CONTROL//DLTS 1441

Terms with highest relevance score


rank Term termType Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 SOVIET PHYSICS SEMICONDUCTORS-USSR journal 249264 18% 5% 256
2 LIFETIME CONTROL authKW 218529 1% 54% 19
3 DLTS authKW 117390 4% 9% 61
4 LAPLACE DLTS authKW 78464 1% 37% 10
5 SOLID STATE PHYS SECT address 73056 2% 10% 34
6 POWER DIODE authKW 69195 1% 23% 14
7 88 K HYDROGEN IMPLANTATION authKW 63566 0% 100% 3
8 RADIATION DEFECTS authKW 53960 2% 11% 24
9 LOCAL LIFETIME CONTROL authKW 48428 0% 57% 4
10 DEGRADATION OF PERFORMANCE authKW 47673 0% 75% 3

Web of Science journal categories


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 Physics, Condensed Matter 17661 58% 0% 829
2 Physics, Applied 3158 32% 0% 454
3 Nuclear Science & Technology 1358 10% 0% 139
4 Materials Science, Multidisciplinary 679 18% 0% 260
5 Instruments & Instrumentation 542 7% 0% 99
6 Physics, Nuclear 529 6% 0% 93
7 Engineering, Electrical & Electronic 291 11% 0% 156
8 Physics, Atomic, Molecular & Chemical 255 7% 0% 94
9 Physics, Multidisciplinary 94 5% 0% 79
10 Physics, Fluids & Plasmas 41 2% 0% 27

Address terms


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 SOLID STATE PHYS SECT 73056 2% 10% 34
2 PHYS PHYS ELECT 43733 1% 26% 8
3 CRMR2 42377 0% 100% 2
4 PHYS PLICAT SEMICOND 31153 0% 29% 5
5 FLEROV NUCL REACT DUBNA 28250 0% 67% 2
6 SCI PRACT MAT 27902 2% 6% 22
7 ELECT MAT DEVICES NANOSTRUCT 24597 0% 19% 6
8 ABT STRUKTURUNTERSUCHUNGEN 21189 0% 100% 1
9 AUTOMOT IND MULTIMARKET POWER MANAGEMENT DR 21189 0% 100% 1
10 CNISM SEZ TORINO PHYS 21189 0% 100% 1

Journals


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 SOVIET PHYSICS SEMICONDUCTORS-USSR 249264 18% 5% 256
2 SEMICONDUCTORS 24834 6% 1% 89
3 SOLID STATE PHENOMENA 6974 2% 1% 27
4 PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE 5825 5% 0% 75
5 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS 4619 6% 0% 84
6 PHYSICA B-CONDENSED MATTER 3082 5% 0% 68
7 RADIATION EFFECTS AND DEFECTS IN SOLIDS 2813 2% 1% 25
8 JOURNAL OF APPLIED PHYSICS 2102 7% 0% 106
9 SEMICONDUCTOR SCIENCE AND TECHNOLOGY 2041 2% 0% 28
10 MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY 1485 2% 0% 23

Author Key Words


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class		 LCSH search Wikipedia search
1 LIFETIME CONTROL 218529 1% 54% 19 Search LIFETIME+CONTROL Search LIFETIME+CONTROL
2 DLTS 117390 4% 9% 61 Search DLTS Search DLTS
3 LAPLACE DLTS 78464 1% 37% 10 Search LAPLACE+DLTS Search LAPLACE+DLTS
4 POWER DIODE 69195 1% 23% 14 Search POWER+DIODE Search POWER+DIODE
5 88 K HYDROGEN IMPLANTATION 63566 0% 100% 3 Search 88+K+HYDROGEN+IMPLANTATION Search 88+K+HYDROGEN+IMPLANTATION
6 RADIATION DEFECTS 53960 2% 11% 24 Search RADIATION+DEFECTS Search RADIATION+DEFECTS
7 LOCAL LIFETIME CONTROL 48428 0% 57% 4 Search LOCAL+LIFETIME+CONTROL Search LOCAL+LIFETIME+CONTROL
8 DEGRADATION OF PERFORMANCE 47673 0% 75% 3 Search DEGRADATION+OF+PERFORMANCE Search DEGRADATION+OF+PERFORMANCE
9 HIGH TEMPERATURE ELECTRON IRRADIATION 47673 0% 75% 3 Search HIGH+TEMPERATURE+ELECTRON+IRRADIATION Search HIGH+TEMPERATURE+ELECTRON+IRRADIATION
10 TRIVACANCY 47673 0% 75% 3 Search TRIVACANCY Search TRIVACANCY

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.


Rank Reference # ref.
in cl.		 Shr. of ref. in
cl.		 Citations
1 LONDOS, CA , SGOUROU, EN , HALL, D , CHRONEOS, A , (2014) VACANCY-OXYGEN DEFECTS IN SILICON: THE IMPACT OF ISOVALENT DOPING.JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS. VOL. 25. ISSUE 6. P. 2395 -2410 59 38% 6
2 LONDOS, CA , SGOUROU, EN , TIMERKAEVA, D , CHRONEOS, A , POCHET, P , EMTSEV, VV , (2013) IMPACT OF ISOVALENT DOPING ON RADIATION DEFECTS IN SILICON.JOURNAL OF APPLIED PHYSICS. VOL. 114. ISSUE 11. P. - 32 70% 1
3 ANGELETOS, T , SGOUROU, EN , CHRONEOS, A , LONDOS, CA , (2015) ENGINEERING VO, CIOI AND CICS DEFECTS IN IRRADIATED SI THROUGH GE AND PB DOPING.JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS. VOL. 26. ISSUE 4. P. 2248 -2256 28 74% 0
4 ANGELETOS, T , CHRONEOS, A , LONDOS, CA , (2016) INFRARED STUDIES OF THE EVOLUTION OF THE CIOI(SI-I) DEFECT IN IRRADIATED SI UPON ISOTHERMAL ANNEALS.JOURNAL OF APPLIED PHYSICS. VOL. 119. ISSUE 12. P. - 25 78% 0
5 CHRONEOS, A , SGOUROU, EN , LONDOS, CA , SCHWINGENSCHLOGL, U , (2015) OXYGEN DEFECT PROCESSES IN SILICON AND SILICON GERMANIUM.APPLIED PHYSICS REVIEWS. VOL. 2. ISSUE 2. P. - 54 34% 5
6 CHRISTOPOULOS, SRG , PARFITT, DC , SGOUROU, EN , LONDOS, CA , VOVK, RV , CHRONEOS, A , (2016) RELATIVE CONCENTRATIONS OF CARBON RELATED DEFECTS IN SILICON.JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS. VOL. 27. ISSUE 11. P. 11268 -11272 28 62% 0
7 LONDOS, CA , SGOUROU, EN , CHRONEOS, A , (2013) IMPACT OF ISOVALENT DEFECT ENGINEERING STRATEGIES ON CARBON-RELATED CLUSTERS IN SILICON.JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS. VOL. 24. ISSUE 5. P. 1696-1701 22 81% 1
8 PELLEGRINO, P , LEVEQUE, P , LALITA, J , HALLEN, A , JAGADISH, C , SVENSSON, BG , (2001) ANNEALING KINETICS OF VACANCY-RELATED DEFECTS IN LOW-DOSE MEV SELF-ION-IMPLANTED N-TYPE SILICON.PHYSICAL REVIEW B. VOL. 64. ISSUE 19. P. - 33 69% 55
9 LONDOS, CA , SGOUROU, EN , CHRONEOS, A , (2014) OXYGEN-VACANCY DEFECTS IN ELECTRON-IRRADIATED SI: THE ROLE OF CARBON IN THEIR BEHAVIOR.JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS. VOL. 25. ISSUE 2. P. 914-921 26 65% 0
10 CHRONEOS, A , LONDOS, CA , SGOUROU, EN , (2011) EFFECT OF TIN DOPING ON OXYGEN- AND CARBON-RELATED DEFECTS IN CZOCHRALSKI SILICON.JOURNAL OF APPLIED PHYSICS. VOL. 110. ISSUE 9. P. - 29 55% 8

Classes with closest relation at Level 1


Rank Class id link
1 14069 GERMANIUM//L DLTS//CNR IMM MATIS
2 1673 OXYGEN PRECIPITATION//CZOCHRALSKI SILICON//OXYGEN PRECIPITATES
3 4246 GETTERING//DLTS//GETTERING EFFICIENCY
4 5113 HYDROGEN IN SILICON//MULTIVACANCY//HYDROGEN ATOM TREATMENT
5 17770 VOLTCOULOMETRY//DLTS RESOLUTION//SEMI INSULATING MATERIALS
6 12205 DISPLACEMENT DAMAGE//NONIONIZING ENERGY LOSS//DISPLACEMENT DAMAGE DOSE
7 37353 OPTICAL ANALOG SIGNAL TRANSMISSION//COOLED LEDS//GALVANICALLY ISOLATED AMPLIFIER
8 1926 RADIATION HARDNESS//SILICON DETECTORS//NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
9 771 TRANSIENT ENHANCED DIFFUSION//SHALLOW JUNCTION//SWAMP
10 22936 OPTIMIZATION OF ANNEALING//SILICON MICROCAVITY//DECREASING OF DEPTH OF P N JUNCTIONS

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