Class information for:
Level 1: OPTIMIZATION OF ANNEALING//SILICON MICROCAVITY//DECREASING OF DEPTH OF P N JUNCTIONS

Basic class information
Class id #P Avg. number of
references		 Database coverage
of references
22936 364 15.8 39%


Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
2 4 MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER 2836879
6 3       PHYSICS, APPLIED//IEEE TRANSACTIONS ON ELECTRON DEVICES//SILICON 155028
648 2             OXYGEN PRECIPITATION//OXYGEN PRECIPITATES//GETTERING 13601
22936 1                   OPTIMIZATION OF ANNEALING//SILICON MICROCAVITY//DECREASING OF DEPTH OF P N JUNCTIONS 364

Terms with highest relevance score


rank Term termType Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 OPTIMIZATION OF ANNEALING authKW 419438 1% 100% 5
2 SILICON MICROCAVITY authKW 335551 1% 100% 4
3 DECREASING OF DEPTH OF P N JUNCTIONS authKW 251663 1% 100% 3
4 OPTIMIZATION OF TECHNOLOGICAL PROCESS authKW 251663 1% 100% 3
5 ARBEITSGRP EPR address 167775 1% 100% 2
6 DECREASING OF MECHANICAL STRESS authKW 167775 1% 100% 2
7 ULTRA SHALLOW DIFFUSION PROFILE authKW 167775 1% 100% 2
8 NIZHNY NOVGOROD address 107852 1% 43% 3
9 A LARGE SCALE POTENTIAL authKW 83888 0% 100% 1
10 ACCOUNTING DRAIN OF DOPANT authKW 83888 0% 100% 1

Web of Science journal categories


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 Physics, Condensed Matter 5724 65% 0% 236
2 Physics, Multidisciplinary 287 14% 0% 52
3 Physics, Applied 185 17% 0% 62
4 Spectroscopy 49 4% 0% 14
5 Materials Science, Multidisciplinary 38 11% 0% 39
6 Nanoscience & Nanotechnology 26 4% 0% 14
7 Optics 11 4% 0% 14
8 Physics, Mathematical 7 2% 0% 7
9 Physics, Fluids & Plasmas 0 1% 0% 3
10 Engineering, Electrical & Electronic -0 3% 0% 10

Address terms


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 ARBEITSGRP EPR 167775 1% 100% 2
2 NIZHNY NOVGOROD 107852 1% 43% 3
3 AO IOFFE PHYS TECH 83888 0% 100% 1
4 IOFFE PHYSICALTECH 83888 0% 100% 1
5 NGO PHYS SUN 83888 0% 100% 1
6 CEF SEMICOND 41943 0% 50% 1
7 PHYS MICROSTRUCTU 20970 0% 25% 1
8 NTK SINGLE CRYSTALS 10484 0% 13% 1
9 AF IOFFE PHYSICOTECH 6708 6% 0% 21
10 MET FOR 5939 1% 2% 3

Journals


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 SOVIET PHYSICS SEMICONDUCTORS-USSR 52404 16% 1% 59
2 SEMICONDUCTORS 40500 16% 1% 57
3 FIZIKA TVERDOGO TELA 8329 9% 0% 33
4 IZVESTIYA AKADEMII NAUK SSSR SERIYA FIZICHESKAYA 3797 4% 0% 15
5 JOURNAL OF COMPUTATIONAL AND THEORETICAL NANOSCIENCE 3781 3% 0% 12
6 NANO 2599 1% 1% 5
7 DEFECT AND DIFFUSION FORUM/JOURNAL 2195 1% 1% 3
8 IZVESTIYA AKADEMII NAUK AZERBAIDZHANSKOI SSR SERIYA FIZIKO-TEKHNICHESKIKH I MATEMATICHESKIKH NAUK 1862 0% 2% 1
9 DEFECT AND DIFFUSION FORUM SERIES 1753 1% 1% 2
10 ZHURNAL EKSPERIMENTALNOI I TEORETICHESKOI FIZIKI 1596 3% 0% 11

Author Key Words


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class		 LCSH search Wikipedia search
1 OPTIMIZATION OF ANNEALING 419438 1% 100% 5 Search OPTIMIZATION+OF+ANNEALING Search OPTIMIZATION+OF+ANNEALING
2 SILICON MICROCAVITY 335551 1% 100% 4 Search SILICON+MICROCAVITY Search SILICON+MICROCAVITY
3 DECREASING OF DEPTH OF P N JUNCTIONS 251663 1% 100% 3 Search DECREASING+OF+DEPTH+OF+P+N+JUNCTIONS Search DECREASING+OF+DEPTH+OF+P+N+JUNCTIONS
4 OPTIMIZATION OF TECHNOLOGICAL PROCESS 251663 1% 100% 3 Search OPTIMIZATION+OF+TECHNOLOGICAL+PROCESS Search OPTIMIZATION+OF+TECHNOLOGICAL+PROCESS
5 DECREASING OF MECHANICAL STRESS 167775 1% 100% 2 Search DECREASING+OF+MECHANICAL+STRESS Search DECREASING+OF+MECHANICAL+STRESS
6 ULTRA SHALLOW DIFFUSION PROFILE 167775 1% 100% 2 Search ULTRA+SHALLOW+DIFFUSION+PROFILE Search ULTRA+SHALLOW+DIFFUSION+PROFILE
7 A LARGE SCALE POTENTIAL 83888 0% 100% 1 Search A+LARGE+SCALE+POTENTIAL Search A+LARGE+SCALE+POTENTIAL
8 ACCOUNTING DRAIN OF DOPANT 83888 0% 100% 1 Search ACCOUNTING+DRAIN+OF+DOPANT Search ACCOUNTING+DRAIN+OF+DOPANT
9 ACCOUNTING LOCAL HEATINGS 83888 0% 100% 1 Search ACCOUNTING+LOCAL+HEATINGS Search ACCOUNTING+LOCAL+HEATINGS
10 ALTERNATING APPROACH FOR MODELING 83888 0% 100% 1 Search ALTERNATING+APPROACH+FOR+MODELING Search ALTERNATING+APPROACH+FOR+MODELING

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.


Rank Reference # ref.
in cl.		 Shr. of ref. in
cl.		 Citations
1 BAGRAEV, NT , GETS, DS , DANILOVSKY, EY , KLYACHKIN, LE , MALYARENKO, AM , (2013) ON THE ELECTRICALLY DETECTED CYCLOTRON RESONANCE OF HOLES IN SILICON NANOSTRUCTURES.SEMICONDUCTORS. VOL. 47. ISSUE 4. P. 525-531 13 68% 0
2 PANKRATOV, EL , (2009) LOCAL DOPING AND OPTIMAL ANNEALING OF A MESH MULTILAYER STRUCTURE TO DECREASE THE SPATIAL DIMENSIONS OF INTEGRATED P-N-JUNCTIONS.NANO. VOL. 4. ISSUE 5. P. 303-323 9 90% 0
3 PANKRATOV, EL , (2010) OPTIMIZATION OF ANNEALING FOR DECREASING OF DEPTH OF SYSTEM OF SERIAL P-N-JUNCTIONS IN A HETEROSTRUCTURE.JOURNAL OF COMPUTATIONAL AND THEORETICAL NANOSCIENCE. VOL. 7. ISSUE 6. P. 1011-1020 8 80% 0
4 PANKRATOV, EL , (2008) REDISTRIBUTION OF INFUSED AND IMPLANTED DOPANTS IN A MULTILAYER STRUCTURE DURING ANNEALING OF DOPANT AND RADIATION DEFECTS FOR THE PRODUCTION OF A SYSTEM OF P-N JUNCTIONS (RETRACTED ARTICLE. SEE VOL. 42, PG. NIL_413, 2009).SEMICONDUCTOR SCIENCE AND TECHNOLOGY. VOL. 23. ISSUE 9. P. - 8 80% 0
5 PANKRATOV, EL , (2011) APPLICATION OF POROUS LAYERS AND OPTIMIZATION OF ANNEALING OF DOPANT AND RADIATION DEFECTS TO INCREASE SHARPNESS OF P-N-JUNCTIONS IN A BIPOLAR HETEROTRANSISTORS.JOURNAL OF NANOELECTRONICS AND OPTOELECTRONICS. VOL. 6. ISSUE 2. P. 188-206 8 73% 0
6 BAGRAEV, NT , KUZMIN, RV , GURIN, AS , KLYACHKIN, LE , MALYARENKO, AM , MASHKOV, VA , (2014) OPTICALLY DETECTED CYCLOTRON RESONANCE IN HEAVILY BORON-DOPED SILICON NANOSTRUCTURES ON N-SI (100).SEMICONDUCTORS. VOL. 48. ISSUE 12. P. 1605 -1612 9 56% 0
7 KLYACHKIN, LE , KOUDRYAVTSEV, AA , MALYARENKO, AM , ROMANOV, VV , BAGRAEV, NT , (2009) SUPERCONDUCTING PROPERTIES OF SILICON NANOSTRUCTURES.SEMICONDUCTORS. VOL. 43. ISSUE 11. P. 1441 -1454 14 40% 5
8 PANKRATOV, EL , (2012) DECREASING OF DEPTH OF P-N-JUNCTION IN A SEMICONDUCTOR HETEROSTRUCTURE BY SERIAL RADIATION PROCESSING AND MICROWAVE ANNEALING.JOURNAL OF COMPUTATIONAL AND THEORETICAL NANOSCIENCE. VOL. 9. ISSUE 1. P. 41-49 6 86% 2
9 PANKRATOV, EL , (2010) DECREASING OF DEPTH OF IMPLANTED-JUNCTION RECTIFIER IN SEMICONDUCTOR HETEROSTRUCTURE BY OPTIMIZED LASER ANNEALING.JOURNAL OF COMPUTATIONAL AND THEORETICAL NANOSCIENCE. VOL. 7. ISSUE 1. P. 289-295 8 67% 0
10 PANKRATOV, EL , (2011) APPLICATION OF RADIATION PROCESSING OF MATERIALS TO INCREASE SHARPNESS OF P-N-JUNCTION IN A SEMICONDUCTOR HETEROSTRUCTURE.JOURNAL OF COMPUTATIONAL AND THEORETICAL NANOSCIENCE. VOL. 8. ISSUE 9. P. 1888-1894 6 86% 0

Classes with closest relation at Level 1


Rank Class id link
1 4246 GETTERING//DLTS//GETTERING EFFICIENCY
2 13429 INDIRECT BANDGAP SEMICONDUCTOR//D LINES//EBIC
3 20471 ELECTRICALLY DETECTED MAGNETIC RESONANCE//EDMR//SPIN DEPENDENT RECOMBINATION
4 32752 AS10GE15TE75 PELLETS//ELECTRICAL FIELD RECORDING//IONIZATION IN ELECTRIC FIELD
5 26589 D LATTICE DYNAMICS//EDNR ELECTRICALLY DETECTED MAGNETIC RESONANCE//GAALNP
6 6817 SOVIET PHYSICS SEMICONDUCTORS-USSR//LIFETIME CONTROL//DLTS
7 17770 VOLTCOULOMETRY//DLTS RESOLUTION//SEMI INSULATING MATERIALS
8 20032 MAGNETOPLASTIC EFFECT//MAGNETO PLASTICITY EFFECT//IMPURITY DEFECT COMPOSITION
9 30088 THERMOGRADIENT EFFECT//HETERO EPITAXIAL STRUCTURE//NANO HILLS
10 23366 BISTABLE CENTERS//CDF2 IN//DIRECT IMAGE TRANSMISSION

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