Class information for:
Level 1: VOLTCOULOMETRY//DLTS RESOLUTION//SEMI INSULATING MATERIALS

Basic class information
Class id #P Avg. number of
references		 Database coverage
of references
17770 583 16.4 40%


Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
2 4 MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER 2836879
6 3       PHYSICS, APPLIED//IEEE TRANSACTIONS ON ELECTRON DEVICES//SILICON 155028
648 2             OXYGEN PRECIPITATION//OXYGEN PRECIPITATES//GETTERING 13601
17770 1                   VOLTCOULOMETRY//DLTS RESOLUTION//SEMI INSULATING MATERIALS 583

Terms with highest relevance score


rank Term termType Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 VOLTCOULOMETRY authKW 117842 1% 75% 3
2 DLTS RESOLUTION authKW 104750 0% 100% 2
3 SEMI INSULATING MATERIALS authKW 94273 1% 60% 3
4 EMISSION RATE SPECTRUM authKW 78560 1% 50% 3
5 CAPACITANCE TRANSIENTS authKW 67336 1% 43% 3
6 ALUMINIUM FLORIDE authKW 52375 0% 100% 1
7 ASSOC MAT SENSORS address 52375 0% 100% 1
8 BAND GAP DENSITIES authKW 52375 0% 100% 1
9 CAPTURE CROSS SECTION AND CONDUCTANCE MEASUREMENTS authKW 52375 0% 100% 1
10 CAPTURE TIME CONSTANT authKW 52375 0% 100% 1

Web of Science journal categories


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 Physics, Applied 6143 65% 0% 378
2 Physics, Condensed Matter 2818 37% 0% 216
3 Instruments & Instrumentation 861 13% 0% 74
4 Engineering, Electrical & Electronic 595 21% 0% 120
5 Materials Science, Multidisciplinary 408 21% 0% 123
6 Materials Science, Coatings & Films 88 3% 0% 19
7 Physics, Multidisciplinary 38 5% 0% 32
8 Engineering, General 35 2% 0% 14
9 Electrochemistry 2 1% 0% 7
10 Materials Science, Characterization, Testing 1 0% 0% 2

Address terms


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 ASSOC MAT SENSORS 52375 0% 100% 1
2 EA2654 52375 0% 100% 1
3 ELE OENGN MICROELE 52375 0% 100% 1
4 SCI TECHNOL ELECT MAT 52375 0% 100% 1
5 SYST ELEKTRONICZNYCH 52375 0% 100% 1
6 ZAKLAD POLPRZEWODNIKOW 52375 0% 100% 1
7 EA2654IUT 26187 0% 50% 1
8 ELE ON MICROTECHNOL RUMENTAT 13092 0% 25% 1
9 SYST ELEKT 8054 0% 8% 2
10 UPR 11 5818 0% 11% 1

Journals


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 SOLID-STATE ELECTRONICS 11711 8% 0% 47
2 SOVIET PHYSICS SEMICONDUCTORS-USSR 9583 5% 1% 32
3 PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE 7547 9% 0% 54
4 JOURNAL OF APPLIED PHYSICS 5082 17% 0% 102
5 SEMICONDUCTOR SCIENCE AND TECHNOLOGY 2873 4% 0% 21
6 SEMICONDUCTORS 2493 3% 0% 18
7 REVIEW OF SCIENTIFIC INSTRUMENTS 2207 6% 0% 36
8 REVUE DE PHYSIQUE APPLIQUEE 1938 1% 1% 7
9 JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS 1108 1% 0% 7
10 JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS 948 1% 0% 4

Author Key Words


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class		 LCSH search Wikipedia search
1 VOLTCOULOMETRY 117842 1% 75% 3 Search VOLTCOULOMETRY Search VOLTCOULOMETRY
2 DLTS RESOLUTION 104750 0% 100% 2 Search DLTS+RESOLUTION Search DLTS+RESOLUTION
3 SEMI INSULATING MATERIALS 94273 1% 60% 3 Search SEMI+INSULATING+MATERIALS Search SEMI+INSULATING+MATERIALS
4 EMISSION RATE SPECTRUM 78560 1% 50% 3 Search EMISSION+RATE+SPECTRUM Search EMISSION+RATE+SPECTRUM
5 CAPACITANCE TRANSIENTS 67336 1% 43% 3 Search CAPACITANCE+TRANSIENTS Search CAPACITANCE+TRANSIENTS
6 ALUMINIUM FLORIDE 52375 0% 100% 1 Search ALUMINIUM+FLORIDE Search ALUMINIUM+FLORIDE
7 BAND GAP DENSITIES 52375 0% 100% 1 Search BAND+GAP+DENSITIES Search BAND+GAP+DENSITIES
8 CAPTURE CROSS SECTION AND CONDUCTANCE MEASUREMENTS 52375 0% 100% 1 Search CAPTURE+CROSS+SECTION+AND+CONDUCTANCE+MEASUREMENTS Search CAPTURE+CROSS+SECTION+AND+CONDUCTANCE+MEASUREMENTS
9 CAPTURE TIME CONSTANT 52375 0% 100% 1 Search CAPTURE+TIME+CONSTANT Search CAPTURE+TIME+CONSTANT
10 CHARGE POTENTIAL FEEDBACK EFFECT 52375 0% 100% 1 Search CHARGE+POTENTIAL+FEEDBACK+EFFECT Search CHARGE+POTENTIAL+FEEDBACK+EFFECT

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.


Rank Reference # ref.
in cl.		 Shr. of ref. in
cl.		 Citations
1 ISTRATOV, AA , VYVENKO, OF , (1999) EXPONENTIAL ANALYSIS IN PHYSICAL PHENOMENA.REVIEW OF SCIENTIFIC INSTRUMENTS. VOL. 70. ISSUE 2. P. 1233 -1257 44 29% 283
2 DOOLITTLE, WA , ROHATGI, A , (1992) A NOVEL COMPUTER-BASED PSEUDOLOGARITHMIC CAPACITANCE CONDUCTANCE DLTS SYSTEM SPECIFICALLY DESIGNED FOR TRANSIENT ANALYSIS.REVIEW OF SCIENTIFIC INSTRUMENTS. VOL. 63. ISSUE 12. P. 5733-5741 24 83% 10
3 ISTRATOV, AA , VYVENKO, OF , HIESLMAIR, H , WEBER, ER , (1998) CRITICAL ANALYSIS OF WEIGHTING FUNCTIONS FOR THE DEEP LEVEL TRANSIENT SPECTROSCOPY OF SEMICONDUCTORS.MEASUREMENT SCIENCE AND TECHNOLOGY. VOL. 9. ISSUE 3. P. 477 -484 17 89% 14
4 DOOLITTLE, WA , ROHATGI, A , (1994) COMPARISON OF COVARIANCE LINEAR PREDICTIVE MODELING TO THE MODULATION FUNCTION-METHOD FOR USE IN DEEP-LEVEL TRANSIENT SPECTROSCOPY.JOURNAL OF APPLIED PHYSICS. VOL. 75. ISSUE 9. P. 4560-4569 16 100% 11
5 DMOWSKI, K , VUILLAUME, D , LEPLEY, B , (1996) A MODIFIED METHOD OF SIDE DATA ANALYSIS OF DEEP LEVEL TRANSIENT SPECTROSCOPY SPECTRA.JOURNAL OF APPLIED PHYSICS. VOL. 79. ISSUE 3. P. 1468-1475 16 94% 0
6 TOMOKAGE, H , UETA, T , FURUTA, H , MIYAMOTO, T , (1995) DETERMINATION OF FREE-CARRIER-ENHANCED EMISSION RATE OF CARRIERS IN DEPLETION-EDGE REGION BY CONSTANT CAPACITANCE TECHNIQUE.JOURNAL OF APPLIED PHYSICS. VOL. 77. ISSUE 5. P. 2041-2045 14 93% 0
7 DMOWSKI, K , VUILLAUME, D , LEPLEY, B , LOSSON, E , BATH, A , (1995) INTERFACE STATE MEASUREMENTS BY THE DLS-82E LOCK-IN SPECTROMETER.REVIEW OF SCIENTIFIC INSTRUMENTS. VOL. 66. ISSUE 8. P. 4283-4288 25 51% 3
8 DOOLITTLE, WA , ROHATGI, A , (1994) A NEW FIGURE OF MERIT AND METHODOLOGY FOR QUANTITATIVELY DETERMINING DEFECT RESOLUTION CAPABILITIES IN DEEP-LEVEL TRANSIENT SPECTROSCOPY ANALYSIS.JOURNAL OF APPLIED PHYSICS. VOL. 75. ISSUE 9. P. 4570-4575 17 77% 9
9 KOLEV, PV , DEEN, MJ , ALBERDING, N , (1998) AVERAGING AND RECORDING OF DIGITAL DEEP-LEVEL TRANSIENT SPECTROSCOPY TRANSIENT SIGNALS.REVIEW OF SCIENTIFIC INSTRUMENTS. VOL. 69. ISSUE 6. P. 2464 -2474 13 87% 4
10 ISTRATOV, AA , HIESLMAIR, H , FLINK, C , WEBER, ER , (1998) DETERMINATION OF PARAMETERS OF DEEP LEVEL DEFECTS FROM NUMERICAL FIT OF DEEP LEVEL TRANSIENT SPECTROSCOPY SPECTRA: ANALYSIS OF ACCURACY AND SENSITIVITY TO NOISE.REVIEW OF SCIENTIFIC INSTRUMENTS. VOL. 69. ISSUE 1. P. 244-250 15 75% 3

Classes with closest relation at Level 1


Rank Class id link
1 7474 DX CENTERS//DX CENTRES//PERSISTENT PHOTOEFFECTS
2 20489 PN JUNCTION LEAKAGE//IRRADIATED P N JUNCTION LEAKAGE//JUNCTION SHAPE
3 19608 SI SIO2//GE INSULATOR STRUCTURE//MICROWAVE TRANSIENT PHOTOCONDUCTIVITY
4 32868 DIELECTRIC COMPUTATION//HEINRICH PLETT STR 40//ITUTE OF NANOSTRUCTURE TECHNOL AND ANALYT INA
5 1145 EL2//GAAS//SEMI INSULATING GAAS
6 4246 GETTERING//DLTS//GETTERING EFFICIENCY
7 6817 SOVIET PHYSICS SEMICONDUCTORS-USSR//LIFETIME CONTROL//DLTS
8 24686 LOW TEMPERATURE SILICON OXIDATION//DIRECTIONAL OXIDATION//HIGH RATE SILICON OXIDATION
9 29799 SOVIET PHYSICS SEMICONDUCTORS-USSR//UKRAINSKII FIZICHESKII ZHURNAL//NUCL INVEST
10 10794 CONDUCTANCE TRANSIENTS//INDIUM PHOSPHIDE100//INSULATOR DAMAGE

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