Class information for:
Level 1: SPE OPHOTOMETRY//BLACK SILICON//SILICON SURFACE MICROSTRUCTURE

Basic class information
Class id #P Avg. number of
references		 Database coverage
of references
24088 324 22.6 60%


Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
2 4 MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER 2836879
47 3       PHYSICS, APPLIED//JOURNAL OF CRYSTAL GROWTH//PHYSICS, CONDENSED MATTER 93961
2384 2             IR LASERS//OPT SENSORS SPECT//SOVIET PHYSICS SEMICONDUCTORS-USSR 4257
24088 1                   SPE OPHOTOMETRY//BLACK SILICON//SILICON SURFACE MICROSTRUCTURE 324

Terms with highest relevance score


rank Term termType Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 SPE OPHOTOMETRY address 243042 2% 37% 7
2 BLACK SILICON authKW 172610 4% 13% 14
3 SILICON SURFACE MICROSTRUCTURE authKW 125658 1% 67% 2
4 EFZN address 106021 1% 38% 3
5 CONICAL MICROSTRUCTURES authKW 94244 0% 100% 1
6 DEEP TRENCH MICROSTRUCTURE authKW 94244 0% 100% 1
7 DEV ENGN COMMANDSCI TECHNOL address 94244 0% 100% 1
8 DOPING SILICON WITH SULFUR authKW 94244 0% 100% 1
9 FDN TECHNOL HELLAS 4 address 94244 0% 100% 1
10 GAS DISCHARGE IMAGING DEVICE authKW 94244 0% 100% 1

Web of Science journal categories


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 Physics, Applied 1833 48% 0% 157
2 Physics, Condensed Matter 1797 40% 0% 128
3 Materials Science, Multidisciplinary 267 23% 0% 73
4 Optics 148 10% 0% 33
5 Physics, Multidisciplinary 98 10% 0% 31
6 Nanoscience & Nanotechnology 52 5% 0% 17
7 Engineering, Electrical & Electronic 30 8% 0% 27
8 Materials Science, Coatings & Films 18 2% 0% 7
9 Instruments & Instrumentation 8 2% 0% 8
10 Nuclear Science & Technology 1 1% 0% 4

Address terms


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 SPE OPHOTOMETRY 243042 2% 37% 7
2 EFZN 106021 1% 38% 3
3 DEV ENGN COMMANDSCI TECHNOL 94244 0% 100% 1
4 FDN TECHNOL HELLAS 4 94244 0% 100% 1
5 JKU 94244 0% 100% 1
6 LASER LIFE 94244 0% 100% 1
7 MINIST EDUCENGN OPT RUMENT SYST 94244 0% 100% 1
8 STATE ELECT THIN FILM INTEGRATED DEV 94244 0% 100% 1
9 STATE ORATCNY ELECT THIN FILMS INTEGRATE 94244 0% 100% 1
10 UMR 76 01 94244 0% 100% 1

Journals


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 SEMICONDUCTORS 5032 6% 0% 19
2 FESTKORPERPROBLEME-ADVANCES IN SOLID STATE PHYICS 2596 1% 1% 2
3 SOVIET PHYSICS SEMICONDUCTORS-USSR 2417 4% 0% 12
4 APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING 1322 4% 0% 14
5 JOURNAL OF APPLIED PHYSICS 1245 12% 0% 38
6 APPLIED PHYSICS REVIEWS 990 0% 1% 1
7 APPLIED PHYSICS EXPRESS 919 2% 0% 6
8 SOLID STATE COMMUNICATIONS 808 5% 0% 15
9 APPLIED PHYSICS LETTERS 637 9% 0% 28
10 JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS 544 2% 0% 7

Author Key Words


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class		 LCSH search Wikipedia search
1 BLACK SILICON 172610 4% 13% 14 Search BLACK+SILICON Search BLACK+SILICON
2 SILICON SURFACE MICROSTRUCTURE 125658 1% 67% 2 Search SILICON+SURFACE+MICROSTRUCTURE Search SILICON+SURFACE+MICROSTRUCTURE
3 CONICAL MICROSTRUCTURES 94244 0% 100% 1 Search CONICAL+MICROSTRUCTURES Search CONICAL+MICROSTRUCTURES
4 DEEP TRENCH MICROSTRUCTURE 94244 0% 100% 1 Search DEEP+TRENCH+MICROSTRUCTURE Search DEEP+TRENCH+MICROSTRUCTURE
5 DOPING SILICON WITH SULFUR 94244 0% 100% 1 Search DOPING+SILICON+WITH+SULFUR Search DOPING+SILICON+WITH+SULFUR
6 GAS DISCHARGE IMAGING DEVICE 94244 0% 100% 1 Search GAS+DISCHARGE+IMAGING+DEVICE Search GAS+DISCHARGE+IMAGING+DEVICE
7 HYPERDOPED SILICON 94244 0% 100% 1 Search HYPERDOPED+SILICON Search HYPERDOPED+SILICON
8 LASER MICRO NANOPROCESSING 94244 0% 100% 1 Search LASER+MICRO+NANOPROCESSING Search LASER+MICRO+NANOPROCESSING
9 LOSS OF SUNLIGHT 94244 0% 100% 1 Search LOSS+OF+SUNLIGHT Search LOSS+OF+SUNLIGHT
10 MCZ NTD SILICON 94244 0% 100% 1 Search MCZ+NTD+SILICON Search MCZ+NTD+SILICON

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.


Rank Reference # ref.
in cl.		 Shr. of ref. in
cl.		 Citations
1 GIMPEL, T , GUENTHER, KM , KONTERMANN, S , SCHADE, W , (2014) CURRENT-VOLTAGE CHARACTERISTIC AND SHEET RESISTANCES AFTER ANNEALING OF FEMTOSECOND LASER PROCESSED SULFUR EMITTERS FOR SILICON SOLAR CELLS.APPLIED PHYSICS LETTERS. VOL. 105. ISSUE 5. P. - 24 83% 0
2 HU, SX , HAN, PD , LIANG, P , XING, YP , LOU, SS , (2014) METALLIC CONDUCTION BEHAVIOR IN SELENIUM-HYPERDOPED SILICON.MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING. VOL. 17. ISSUE . P. 134-137 23 82% 1
3 FRANTA, B , PASTOR, D , GANDHI, HH , REKEMEYER, PH , GRADECAK, S , AZIZ, MJ , MAZUR, E , (2015) SIMULTANEOUS HIGH CRYSTALLINITY AND SUB-BANDGAP OPTICAL ABSORPTANCE IN HYPERDOPED BLACK SILICON USING NANOSECOND LASER ANNEALING.JOURNAL OF APPLIED PHYSICS. VOL. 118. ISSUE 22. P. - 29 55% 2
4 HU, SX , HAN, PD , MI, YH , XING, YP , LIANG, P , FAN, YJ , (2013) DEPENDENCE OF THE OPTOELECTRONIC PROPERTIES OF SELENIUM-HYPERDOPED SILICON ON THE ANNEALING TEMPERATURE.MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING. VOL. 16. ISSUE 3. P. 987-991 20 83% 2
5 WANG, KF , LIU, PG , QU, SC , WANG, YX , WANG, ZG , (2015) OPTICAL AND ELECTRICAL PROPERTIES OF TEXTURED SULFUR-HYPERDOPED SILICON: A THERMAL ANNEALING STUDY.JOURNAL OF MATERIALS SCIENCE. VOL. 50. ISSUE 9. P. 3391 -3398 20 80% 0
6 WARRENDER, JM , (2016) LASER HYPERDOPING SILICON FOR ENHANCED INFRARED OPTOELECTRONIC PROPERTIES.APPLIED PHYSICS REVIEWS. VOL. 3. ISSUE 3. P. - 34 43% 0
7 UMEZU, I , WARRENDER, JM , CHARNVANICHBORIKARN, S , KOHNO, A , WILLIAMS, JS , TABBAL, M , PAPAZOGLOU, DG , ZHANG, XC , AZIZ, MJ , (2013) EMERGENCE OF VERY BROAD INFRARED ABSORPTION BAND BY HYPERDOPING OF SILICON WITH CHALCOGENS.JOURNAL OF APPLIED PHYSICS. VOL. 113. ISSUE 21. P. - 18 78% 11
8 DU, LY , WU, ZM , SU, YJ , LI, R , TANG, F , LI, SB , ZHANG, T , JIANG, YD , (2016) SE DOPING OF SILICON WITH SI/SE BILAYER FILMS PREPARED BY FEMTOSECOND-LASER IRRADIATION.MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING. VOL. 54. ISSUE . P. 51 -56 19 73% 0
9 WANG, KF , SHAO, HZ , LIU, K , QU, SC , WANG, YX , WANG, ZG , (2015) POSSIBLE ATOMIC STRUCTURES RESPONSIBLE FOR THE SUB-BANDGAP ABSORPTION OF CHALCOGEN-HYPERDOPED SILICON.APPLIED PHYSICS LETTERS. VOL. 107. ISSUE 11. P. - 16 84% 0
10 DONG, X , LI, N , LIANG, C , SUN, HB , FENG, GJ , ZHU, Z , SHAO, HZ , RONG, XM , ZHAO, L , ZHUANG, J , (2013) STRONG MID-INFRARED ABSORPTION AND HIGH CRYSTALLINITY OF MICROSTRUCTURED SILICON FORMED BY FEMTOSECOND LASER IRRADIATION IN NF3 ATMOSPHERE.APPLIED PHYSICS EXPRESS. VOL. 6. ISSUE 8. P. - 16 84% 2

Classes with closest relation at Level 1


Rank Class id link
1 16032 PHYS MICROSTRUCT//PHOTO THERMAL IONIZATION SPECTROSCOPY//HOT CARRIER INDUCED DEVICE DEGRADATION
2 13364 GAP N//ALGAINP STQW LASER//CENTROTECH
3 9985 INTERMEDIATE BAND//ENERGIA SOLAR//INTERMEDIATE BAND SOLAR CELL
4 4246 GETTERING//DLTS//GETTERING EFFICIENCY
5 1214 FEMTOSECOND LASER//LIPSS//FEMTOSECOND LASER ABLATION
6 2963 METAL ASSISTED CHEMICAL ETCHING//SILICON NANOWIRES//METAL ASSISTED ETCHING
7 36212 SCI PROD ASSOC PHYS SUN//STARODUBTSEV PHYSICOTECH//PHYS SUN PROD ASSOC
8 32877 GREEN MOLDING COMPOUNDS//ADDITIONS OF CERIUM AND TITANIUM OXIDES//ALL RUSSIA EXPERIMENTAL PHYS
9 34053 SILICON GR H COMP SYST//INTEGRAL GEOMETRY PROBLEM//TRANSPORT LIKE EQUATION
10 24342 NEUTRAL IMPURITY//A SUPERLATTICE//AF IOFFE PHYSIKOTECH

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