Class information for:
Level 1: CARL EMILY FUCHS MICROELECT//CEFIM//HOT CARRIER LUMINESCENCE

Basic class information
Class id #P Avg. number of
references		 Database coverage
of references
21482 417 16.7 49%


Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
10 4 OPTICS//PHYSICS, PARTICLES & FIELDS//PHYSICS, MULTIDISCIPLINARY 1131262
163 3       PHYSICAL REVIEW A//ENTANGLEMENT//QUANTUM INFORMATION PROCESSING 60613
3069 2             SINGLE PHOTON DETECTOR//SINGLE PHOTON AVALANCHE DIODE SPAD//SINGLE PHOTON AVALANCHE DIODE 2417
21482 1                   CARL EMILY FUCHS MICROELECT//CEFIM//HOT CARRIER LUMINESCENCE 417

Terms with highest relevance score


rank Term termType Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 CARL EMILY FUCHS MICROELECT address 506622 4% 43% 16
2 CEFIM address 292902 1% 100% 4
3 HOT CARRIER LUMINESCENCE authKW 292902 1% 100% 4
4 SEMICONDUCTOR INTEGRATED OPTOELECTRONICS authKW 292902 1% 100% 4
5 SI LED authKW 234320 1% 80% 4
6 SILICON LED authKW 234320 1% 80% 4
7 ELECTRON HOLE PLASMA RECOMBINATION authKW 219676 1% 100% 3
8 EUROPEAN QUAL address 219676 1% 100% 3
9 SI LIGHT EMITTING DEVICES authKW 219676 1% 100% 3
10 PICOSECOND IMAGING CIRCUIT ANALYSIS PICA authKW 164756 1% 75% 3

Web of Science journal categories


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 Physics, Applied 4555 66% 0% 275
2 Engineering, Electrical & Electronic 3719 55% 0% 229
3 Nanoscience & Nanotechnology 2619 27% 0% 113
4 Optics 635 17% 0% 72
5 Physics, Condensed Matter 381 18% 0% 73
6 Materials Science, Multidisciplinary 88 13% 0% 56
7 Materials Science, Coatings & Films 56 3% 0% 13
8 Computer Science, Hardware & Architecture 25 2% 0% 7
9 Instruments & Instrumentation 21 3% 0% 13
10 Architecture 8 0% 0% 1

Address terms


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 CARL EMILY FUCHS MICROELECT 506622 4% 43% 16
2 CEFIM 292902 1% 100% 4
3 EUROPEAN QUAL 219676 1% 100% 3
4 ENS BEN SOUDA 146451 0% 100% 2
5 INNOVAT ELECT SYST 146451 0% 100% 2
6 ELECT QUAL RELIABIL 97633 0% 67% 2
7 INRF 97633 0% 67% 2
8 TELECOMS GRP 97633 0% 67% 2
9 CNES THALES 73225 0% 100% 1
10 CREDENCE DIAGNOST GRP 73225 0% 100% 1

Journals


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 MICROELECTRONICS RELIABILITY 71216 20% 1% 82
2 MONUMENTS HISTORIQUES 3327 0% 5% 1
3 IEEE TRANSACTIONS ON ELECTRON DEVICES 2522 6% 0% 23
4 SOLID-STATE ELECTRONICS 1881 4% 0% 16
5 MICROELECTRONIC ENGINEERING 1603 4% 0% 15
6 IEEE ELECTRON DEVICE LETTERS 1153 3% 0% 12
7 SEMICONDUCTOR SCIENCE AND TECHNOLOGY 1096 3% 0% 11
8 IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING 742 1% 0% 4
9 OPTIK 676 2% 0% 10
10 IEEE DESIGN & TEST OF COMPUTERS 663 1% 0% 3

Author Key Words


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class		 LCSH search Wikipedia search
1 HOT CARRIER LUMINESCENCE 292902 1% 100% 4 Search HOT+CARRIER+LUMINESCENCE Search HOT+CARRIER+LUMINESCENCE
2 SEMICONDUCTOR INTEGRATED OPTOELECTRONICS 292902 1% 100% 4 Search SEMICONDUCTOR+INTEGRATED+OPTOELECTRONICS Search SEMICONDUCTOR+INTEGRATED+OPTOELECTRONICS
3 SI LED 234320 1% 80% 4 Search SI+LED Search SI+LED
4 SILICON LED 234320 1% 80% 4 Search SILICON+LED Search SILICON+LED
5 ELECTRON HOLE PLASMA RECOMBINATION 219676 1% 100% 3 Search ELECTRON+HOLE+PLASMA+RECOMBINATION Search ELECTRON+HOLE+PLASMA+RECOMBINATION
6 SI LIGHT EMITTING DEVICES 219676 1% 100% 3 Search SI+LIGHT+EMITTING+DEVICES Search SI+LIGHT+EMITTING+DEVICES
7 PICOSECOND IMAGING CIRCUIT ANALYSIS PICA 164756 1% 75% 3 Search PICOSECOND+IMAGING+CIRCUIT+ANALYSIS+PICA Search PICOSECOND+IMAGING+CIRCUIT+ANALYSIS+PICA
8 CMOS INTEGRATED CIRCUIT TECHNOLOGY 146451 0% 100% 2 Search CMOS+INTEGRATED+CIRCUIT+TECHNOLOGY Search CMOS+INTEGRATED+CIRCUIT+TECHNOLOGY
9 CMOS INTEGRATED CIRCUITRY 146451 0% 100% 2 Search CMOS+INTEGRATED+CIRCUITRY Search CMOS+INTEGRATED+CIRCUITRY
10 METAL OXIDE SILICON DIODE 146451 0% 100% 2 Search METAL+OXIDE+SILICON+DIODE Search METAL+OXIDE+SILICON+DIODE

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.


Rank Reference # ref.
in cl.		 Shr. of ref. in
cl.		 Citations
1 XU, KK , (2016) INTEGRATED SILICON DIRECTLY MODULATED LIGHT SOURCE USING P-WELL IN STANDARD CMOS TECHNOLOGY.IEEE SENSORS JOURNAL. VOL. 16. ISSUE 16. P. 6184 -6191 23 74% 0
2 XU, KK , LIU, HT , YU, Q , WEN, ZY , LI, GNP , (2015) ON THE ELECTRICAL AND OPTICAL CHARACTERISTICS OF REVERSE-BIASED SILICON P-N JUNCTIONS EMBEDDED IN A METAL-OXIDE-SEMICONDUCTOR FIELD-EFFECT-TRANSISTOR DEVICE.JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS. VOL. 17. ISSUE 11-12. P. 1680 -1688 17 94% 0
3 XU, KK , LIU, SY , ZHAO, JM , SUN, WF , LI, G , (2015) ANALYSIS OF SIMULATION OF MULTITERMINAL ELECTRO-OPTIC MODULATOR BASED ON P-N JUNCTION IN REVERSE BIAS.OPTICAL ENGINEERING. VOL. 54. ISSUE 5. P. - 19 83% 0
4 XU, KK , SNYMAN, LW , POLLEUX, JL , OGUDO, KA , VIANA, C , YU, Q , LI, GP , (2016) SILICON LEDS TOWARD HIGH FREQUENCY ON-CHIP LINK.OPTIK. VOL. 127. ISSUE 17. P. 7002 -7020 22 69% 0
5 ZHANG, ZP , XU, KK , YUAN, J , WANG, YX , OGUDO, KA , VIANA, C , POLLEUX, JL , YU, Q , SNYMAN, LW , WANG, YL , ET AL (2016) SILICON LIGHT-EMITTING DEVICE FOR HIGH SPEED ANALOG-TO-DIGITAL CONVERSION.JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS. VOL. 18. ISSUE 9-10. P. 737 -744 14 82% 0
6 XU, KK , ZHANG, ZY , YU, Q , WEN, ZY , (2016) FIELD-EFFECT ELECTROLUMINESCENCE SPECTRA OF REVERSE-BIASED PN JUNCTIONS IN SILICON DEVICE FOR MICRODISPLAY.JOURNAL OF DISPLAY TECHNOLOGY. VOL. 12. ISSUE 2. P. 115 -121 18 62% 0
7 XU, KK , YU, Q , LI, G , (2015) INCREASED EFFICIENCY OF SILICON LIGHT-EMITTING DEVICE IN STANDARD SI-CMOS TECHNOLOGY.IEEE JOURNAL OF QUANTUM ELECTRONICS. VOL. 51. ISSUE 8. P. - 15 71% 0
8 DE LUNA, NC , BAILON, MF , TARUN, AB , (2005) ANALYSIS OF NEAR-IR PHOTON EMISSIONS FROM 50-NM N- AND P-CHANNEL SI MOSFETS.IEEE TRANSACTIONS ON ELECTRON DEVICES. VOL. 52. ISSUE 6. P. 1211-1214 16 84% 7
9 XU, KK , ZHANG, ZY , ZHANG, ZP , (2016) STRUCTURAL AND OPTICAL PROPERTIES OF SILICON METAL-OXIDE-SEMICONDUCTOR LIGHT-EMITTING DEVICES.JOURNAL OF NANOPHOTONICS. VOL. 10. ISSUE 1. P. - 14 74% 0
10 XU, KK , LIU, HT , ZHANG, ZY , (2015) GATE-CONTROLLED DIODE STRUCTURE BASED ELECTRO-OPTICAL INTERFACES IN STANDARD SILICON-CMOS INTEGRATED CIRCUITRY.APPLIED OPTICS. VOL. 54. ISSUE 21. P. 6420 -6424 15 68% 0

Classes with closest relation at Level 1


Rank Class id link
1 8492 SINGLE PHOTON AVALANCHE DIODE SPAD//SINGLE PHOTON AVALANCHE DIODE//AVALANCHE PHOTODIODE
2 4469 HOT CARRIERS//HOT CARRIER DEGRADATION//CHARGE PUMPING
3 13429 INDIRECT BANDGAP SEMICONDUCTOR//D LINES//EBIC
4 23114 LEHRSTUHL HALBLEITERTECH//MOS TUNNEL STRUCTURE//SI MIS TET
5 6739 MHEMT//HEMT//PHEMT
6 21285 SOFT ERROR MAPPING//HIGH ENERGY ION IMPLANTATION//DYNAMIC RANDOM ACCESS MEMORY
7 21494 VOLTAGE CONTRAST//E BEAM INSPECTION//ELECTRON BEAM TESTING
8 21308 BEAM CHANNEL TRANSISTOR//MEMORY DEVICE BUSINESS//IMPURITY ENHANCED OXIDATION
9 12989 ELECTRO OPTIC SAMPLING//ELECTROOPTIC MEASUREMENTS//ELECTROOPTIC PROBING
10 10961 ELECTROSTATIC DISCHARGE ESD//SILICON CONTROLLED RECTIFIER SCR//NANOELECT GIGASCALE SYST

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