Class information for:
Level 1: ELECTRO OPTIC SAMPLING//ELECTROOPTIC MEASUREMENTS//ELECTROOPTIC PROBING

Basic class information
Class id #P Avg. number of
references		 Database coverage
of references
12989 867 15.5 58%


Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
10 4 OPTICS//PHYSICS, PARTICLES & FIELDS//PHYSICS, MULTIDISCIPLINARY 1131262
681 3       TERAHERTZ//TERAHERTZ TIME DOMAIN SPECTROSCOPY//TERAHERTZ SPECTROSCOPY 8704
1282 2             TERAHERTZ//TERAHERTZ TIME DOMAIN SPECTROSCOPY//TERAHERTZ SPECTROSCOPY 8704
12989 1                   ELECTRO OPTIC SAMPLING//ELECTROOPTIC MEASUREMENTS//ELECTROOPTIC PROBING 867

Terms with highest relevance score


rank Term termType Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 ELECTRO OPTIC SAMPLING authKW 366826 3% 42% 25
2 ELECTROOPTIC MEASUREMENTS authKW 220426 1% 48% 13
3 ELECTROOPTIC PROBING authKW 140872 0% 100% 4
4 ELECTROOPTIC SAMPLING EOS authKW 140872 0% 100% 4
5 ROTATION MAGNETIZATION authKW 112696 0% 80% 4
6 ELECTROOPTIC EO MEASUREMENTS authKW 105654 0% 100% 3
7 NEAR FIELD RADIATION PATTERNS authKW 79239 0% 75% 3
8 ULTRAFAST OPT SCI RADIAT address 79239 0% 75% 3
9 BERUNI PHYS TECH address 70436 0% 100% 2
10 ELECTROMAGNETIC FIELD IMAGING authKW 70436 0% 100% 2

Web of Science journal categories


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 Engineering, Electrical & Electronic 5685 48% 0% 412
2 Physics, Applied 4652 47% 0% 410
3 Optics 4446 30% 0% 263
4 Instruments & Instrumentation 535 9% 0% 74
5 Nanoscience & Nanotechnology 121 5% 0% 43
6 Telecommunications 83 3% 0% 28
7 Spectroscopy 69 3% 0% 27
8 Physics, Condensed Matter 26 5% 0% 45
9 Engineering, General 17 2% 0% 14
10 COMPUTER APPLICATIONS & CYBERNETICS 12 0% 0% 1

Address terms


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 ULTRAFAST OPT SCI RADIAT 79239 0% 75% 3
2 BERUNI PHYS TECH 70436 0% 100% 2
3 SENDAI EMC 45277 0% 43% 3
4 TERAHERTZ MEDIA SYST 43340 0% 31% 4
5 ABT ALLGEMEINE ELEKTRO TECH MICKROELEKT 35218 0% 100% 1
6 CHINA STATE INTEGRATED OPTOELECT 35218 0% 100% 1
7 CNRS URA 0820 35218 0% 100% 1
8 DASSAULT ELE ON 35218 0% 100% 1
9 DETECTOR RADIOMETRY 35218 0% 100% 1
10 FG ALLGEMEINE THEORET ELEKTROTECH 35218 0% 100% 1

Journals


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES 8980 7% 0% 57
2 APPLIED PHYSICS LETTERS 5235 15% 0% 129
3 OPTICAL AND QUANTUM ELECTRONICS 4259 3% 1% 22
4 IEEE JOURNAL OF QUANTUM ELECTRONICS 4197 4% 0% 32
5 PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS 3736 3% 0% 24
6 MICROELECTRONIC ENGINEERING 3511 4% 0% 32
7 IEICE TRANSACTIONS ON ELECTRONICS 2811 3% 0% 22
8 IEEE MICROWAVE AND GUIDED WAVE LETTERS 2667 1% 1% 8
9 ELECTRONICS LETTERS 2096 6% 0% 49
10 OPTOELECTRONICS-DEVICES AND TECHNOLOGIES 1527 0% 2% 2

Author Key Words


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class		 LCSH search Wikipedia search
1 ELECTRO OPTIC SAMPLING 366826 3% 42% 25 Search ELECTRO+OPTIC+SAMPLING Search ELECTRO+OPTIC+SAMPLING
2 ELECTROOPTIC MEASUREMENTS 220426 1% 48% 13 Search ELECTROOPTIC+MEASUREMENTS Search ELECTROOPTIC+MEASUREMENTS
3 ELECTROOPTIC PROBING 140872 0% 100% 4 Search ELECTROOPTIC+PROBING Search ELECTROOPTIC+PROBING
4 ELECTROOPTIC SAMPLING EOS 140872 0% 100% 4 Search ELECTROOPTIC+SAMPLING+EOS Search ELECTROOPTIC+SAMPLING+EOS
5 ROTATION MAGNETIZATION 112696 0% 80% 4 Search ROTATION+MAGNETIZATION Search ROTATION+MAGNETIZATION
6 ELECTROOPTIC EO MEASUREMENTS 105654 0% 100% 3 Search ELECTROOPTIC+EO+MEASUREMENTS Search ELECTROOPTIC+EO+MEASUREMENTS
7 NEAR FIELD RADIATION PATTERNS 79239 0% 75% 3 Search NEAR+FIELD+RADIATION+PATTERNS Search NEAR+FIELD+RADIATION+PATTERNS
8 ELECTROMAGNETIC FIELD IMAGING 70436 0% 100% 2 Search ELECTROMAGNETIC+FIELD+IMAGING Search ELECTROMAGNETIC+FIELD+IMAGING
9 LIVE ELECTROOPTIC IMAGING 70436 0% 100% 2 Search LIVE+ELECTROOPTIC+IMAGING Search LIVE+ELECTROOPTIC+IMAGING
10 PHOTONIC HETERODYNE 70436 0% 100% 2 Search PHOTONIC+HETERODYNE Search PHOTONIC+HETERODYNE

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.


Rank Reference # ref.
in cl.		 Shr. of ref. in
cl.		 Citations
1 LEE, DJ , KANG, NW , CHOI, JH , KIM, J , WHITAKER, JF , (2011) RECENT ADVANCES IN THE DESIGN OF ELECTRO-OPTIC SENSORS FOR MINIMALLY DESTRUCTIVE MICROWAVE FIELD PROBING.SENSORS. VOL. 11. ISSUE 1. P. 806 -824 26 84% 12
2 MA, Z , MA, HM , YANG, CT , FENG, KM , (2011) MODELING OF TERAHERTZ PULSE GENERATION FROM LT-GAAS ULTRAFAST PHOTOCONDUCTIVE SWITCHES.JOURNAL OF SYSTEMS ENGINEERING AND ELECTRONICS. VOL. 22. ISSUE 3. P. 373 -380 22 76% 1
3 SASAGAWA, K , KANNO, A , TSUCHIYA, M , (2009) REAL-TIME DIGITAL SIGNAL PROCESSING FOR LIVE ELECTRO-OPTIC IMAGING.OPTICS EXPRESS. VOL. 17. ISSUE 18. P. 15641 -15651 16 100% 3
4 AMIN, A , ANTOINE, P , CORNET, A , MALLAT, K , URBAIN, X , (2013) SYNCHRONIZED FABRY-PEROT CAVITY USED FOR ENHANCED SENSITIVITY ELECTRO-OPTIC MEASUREMENTS OF ELECTRIC FIELDS IN THE MICROWAVE RANGE.APPLIED OPTICS. VOL. 52. ISSUE 24. P. 5894-5902 15 94% 0
5 PFEIFER, T , HEILIGER, HM , LOFFLER, T , OHLHOFF, C , MEYER, C , LUPKE, G , ROSKOS, HG , KURZ, H , (1996) OPTOELECTRONIC ON-CHIP CHARACTERIZATION OF ULTRAFAST ELECTRIC DEVICES: MEASUREMENT TECHNIQUES AND APPLICATIONS.IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS. VOL. 2. ISSUE 3. P. 586 -604 36 57% 27
6 WHITAKER, JF , YANG, K , REANO, R , KATEHI, LPB , (2003) ELECTRO-OPTIC PROBING FOR MICROWAVE DIAGNOSTICS.IEICE TRANSACTIONS ON ELECTRONICS. VOL. E86C. ISSUE 7. P. 1328 -1337 19 86% 3
7 LEE, DJ , KWON, JY , KANG, NW , LEE, JG , WHITAKER, JF , (2011) VECTOR-STABILIZED REACTIVE-NEAR-FIELD IMAGING SYSTEM.IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. VOL. 60. ISSUE 7. P. 2702 -2708 14 93% 2
8 FRANKEL, MY , (1996) OPTOELECTRONIC TECHNIQUES FOR ULTRAFAST DEVICE NETWORK ANALYSIS TO 700 GHZ.OPTICAL AND QUANTUM ELECTRONICS. VOL. 28. ISSUE 7. P. 783-800 29 63% 18
9 TSUCHIYA, M , SASAGAWA, K , KANNO, A , SHIOZAWA, T , (2010) LIVE ELECTROOPTIC IMAGING OF W-BAND WAVES.IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES. VOL. 58. ISSUE 11. P. 3011-3021 12 100% 3
10 AUSTON, DH , (1988) ULTRAFAST OPTOELECTRONICS.TOPICS IN APPLIED PHYSICS. VOL. 60. ISSUE . P. 183-233 41 60% 8

Classes with closest relation at Level 1


Rank Class id link
1 24927 PHOTOCONDUCTIVE SEMICONDUCTOR SWITCH//PHOTOCONDUCTIVE SEMICONDUCTOR SWITCHES PCSSS//ULTRAFAST PHOTOELECT TECHNOL
2 5912 PHOTOCONDUCTIVE ANTENNA//SUPERCONDUCTOR PHOTON//PHOTOMIXER
3 20318 FB ET//LEHRSTUHL HOCHFREQUENZTECH OPTOELEKT//OPTICAL CONTROL
4 21494 VOLTAGE CONTRAST//E BEAM INSPECTION//ELECTRON BEAM TESTING
5 23939 ADV SUBSUR E IMAGING//SAMPLING OSCILLOSCOPE//TRANSITION DURATION
6 8583 PHOTORECEIVER//FESTKORPERPHYS 1//MSM PHOTODETECTOR
7 11102 LT GAAS//LOW TEMPERATURE GROWN GAAS//LOW TEMPERATURE GAAS
8 5754 MODE LOCKED LASERS//OPTICAL PULSE GENERATION//GAIN SWITCHING
9 24466 THERMOELECTRIC DETECTOR//LADDER SILICONE SPIN ON GLASS LS SOG//PICOSECOND PHOTOINDUCED ABSORPTION
10 19170 NONLINEAR TRANSMISSION LINE//NONLINEAR TRANSMISSION LINES NLTLS//TRAVELING WAVE FETS

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