Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
10961 | 1021 | 16.5 | 38% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | ELECTROSTATIC DISCHARGE ESD | authKW | 4079088 | 23% | 59% | 233 |
2 | SILICON CONTROLLED RECTIFIER SCR | authKW | 1904211 | 7% | 86% | 74 |
3 | NANOELECT GIGASCALE SYST | address | 1691431 | 8% | 70% | 81 |
4 | ESD PROTECTION | authKW | 961231 | 4% | 71% | 45 |
5 | HOLDING VOLTAGE | authKW | 868230 | 3% | 97% | 30 |
6 | ESD PROTECTION CIRCUIT | authKW | 628021 | 2% | 100% | 21 |
7 | TRIGGER VOLTAGE | authKW | 543738 | 2% | 91% | 20 |
8 | LATCHUP | authKW | 505389 | 3% | 65% | 26 |
9 | ESD | authKW | 499901 | 8% | 20% | 84 |
10 | ELECTROSTATIC DISCHARGE | authKW | 480050 | 7% | 24% | 68 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Engineering, Electrical & Electronic | 26045 | 91% | 0% | 927 |
2 | Physics, Applied | 8093 | 57% | 0% | 579 |
3 | Nanoscience & Nanotechnology | 6427 | 27% | 0% | 277 |
4 | Computer Science, Hardware & Architecture | 194 | 3% | 0% | 28 |
5 | Telecommunications | 131 | 4% | 0% | 37 |
6 | Physics, Condensed Matter | 102 | 7% | 0% | 76 |
7 | Engineering, Manufacturing | 65 | 2% | 0% | 17 |
8 | Engineering, General | 12 | 1% | 0% | 14 |
9 | Robotics | 2 | 0% | 0% | 2 |
10 | Computer Science, Interdisciplinary Applications | 1 | 1% | 0% | 10 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | NANOELECT GIGASCALE SYST | 1691431 | 8% | 70% | 81 |
2 | ESD | 306276 | 3% | 39% | 26 |
3 | CORP ESD | 191394 | 1% | 80% | 8 |
4 | ESD PROTECT TECHNOL | 119623 | 0% | 100% | 4 |
5 | CORP PROC RELIABIL GRP | 89717 | 0% | 100% | 3 |
6 | ESD ENGN | 89717 | 0% | 100% | 3 |
7 | SOC TECHNOL | 86141 | 1% | 26% | 11 |
8 | MIXED SIGNAL DEVICE TECHNOL | 67286 | 0% | 75% | 3 |
9 | SHRIME | 67286 | 0% | 75% | 3 |
10 | AE DICI | 59812 | 0% | 100% | 2 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | MICROELECTRONICS RELIABILITY | 279215 | 25% | 4% | 254 |
2 | IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY | 202155 | 8% | 8% | 85 |
3 | IEEE TRANSACTIONS ON ELECTRON DEVICES | 30237 | 12% | 1% | 124 |
4 | IEEE ELECTRON DEVICE LETTERS | 16214 | 7% | 1% | 70 |
5 | JOURNAL OF ELECTROSTATICS | 15783 | 4% | 1% | 37 |
6 | SOLID-STATE ELECTRONICS | 9801 | 6% | 1% | 57 |
7 | IEEE JOURNAL OF SOLID-STATE CIRCUITS | 6651 | 4% | 1% | 43 |
8 | IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY | 3448 | 2% | 1% | 19 |
9 | JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE | 2690 | 1% | 1% | 7 |
10 | IEICE TRANSACTIONS ON ELECTRONICS | 2604 | 2% | 0% | 23 |
Author Key Words |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | ELECTROSTATIC DISCHARGE ESD | 4079088 | 23% | 59% | 233 | Search ELECTROSTATIC+DISCHARGE+ESD | Search ELECTROSTATIC+DISCHARGE+ESD |
2 | SILICON CONTROLLED RECTIFIER SCR | 1904211 | 7% | 86% | 74 | Search SILICON+CONTROLLED+RECTIFIER+SCR | Search SILICON+CONTROLLED+RECTIFIER+SCR |
3 | ESD PROTECTION | 961231 | 4% | 71% | 45 | Search ESD+PROTECTION | Search ESD+PROTECTION |
4 | HOLDING VOLTAGE | 868230 | 3% | 97% | 30 | Search HOLDING+VOLTAGE | Search HOLDING+VOLTAGE |
5 | ESD PROTECTION CIRCUIT | 628021 | 2% | 100% | 21 | Search ESD+PROTECTION+CIRCUIT | Search ESD+PROTECTION+CIRCUIT |
6 | TRIGGER VOLTAGE | 543738 | 2% | 91% | 20 | Search TRIGGER+VOLTAGE | Search TRIGGER+VOLTAGE |
7 | LATCHUP | 505389 | 3% | 65% | 26 | Search LATCHUP | Search LATCHUP |
8 | ESD | 499901 | 8% | 20% | 84 | Search ESD | Search ESD |
9 | ELECTROSTATIC DISCHARGE | 480050 | 7% | 24% | 68 | Search ELECTROSTATIC+DISCHARGE | Search ELECTROSTATIC+DISCHARGE |
10 | POWER RAIL ESD CLAMP CIRCUIT | 390767 | 1% | 93% | 14 | Search POWER+RAIL+ESD+CLAMP+CIRCUIT | Search POWER+RAIL+ESD+CLAMP+CIRCUIT |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | KER, MD , HSU, KC , (2005) OVERVIEW OF ON-CHIP ELECTROSTATIC DISCHARGE PROTECTION DESIGN WITH SCR-BASED DEVICES IN CMOS INTEGRATED CIRCUITS.IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY. VOL. 5. ISSUE 2. P. 235-249 | 23 | 100% | 75 |
2 | LIN, CY , WU, PH , KER, MD , (2016) AREA-EFFICIENT AND LOW-LEAKAGE DIODE STRING FOR ON-CHIP ESD PROTECTION.IEEE TRANSACTIONS ON ELECTRON DEVICES. VOL. 63. ISSUE 2. P. 531 -536 | 14 | 100% | 2 |
3 | POGANY, D , BYCHIKHIN, S , HEER, M , MAMANEE, W , GORNIK, E , (2011) APPLICATION OF TRANSIENT INTERFEROMETRIC MAPPING METHOD FOR ESD AND LATCH-UP ANALYSIS.MICROELECTRONICS RELIABILITY. VOL. 51. ISSUE 9-11. P. 1592-1596 | 25 | 63% | 0 |
4 | ZENG, J , DONG, SR , LIOU, JJ , HAN, Y , ZHONG, L , WANG, WH , (2015) DESIGN AND ANALYSIS OF AN AREA-EFFICIENT HIGH HOLDING VOLTAGE ESD PROTECTION DEVICE.IEEE TRANSACTIONS ON ELECTRON DEVICES. VOL. 62. ISSUE 2. P. 606 -614 | 13 | 100% | 1 |
5 | KER, MD , LIN, KH , (2006) OVERVIEW ON ELECTROSTATIC DISCHARGE PROTECTION DESIGNS FOR MIXED-VOLTAGE I/O INTERFACES: DESIGN CONCEPT AND CIRCUIT IMPLEMENTATIONS.IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS. VOL. 53. ISSUE 2. P. 235-246 | 16 | 89% | 20 |
6 | TAM, WS , KOK, CW , SIU, SL , WONG, H , (2014) SNAPBACK BREAKDOWN ESD DEVICE BASED ON ZENER DIODES ON SILICON-ON-INSULATOR TECHNOLOGY.MICROELECTRONICS RELIABILITY. VOL. 54. ISSUE 6-7. P. 1163-1168 | 14 | 82% | 1 |
7 | MA, JR , QIAO, M , ZHANG, B , (2015) NOVEL SUBSTRATE TRIGGER SCR-LDMOS STACKING STRUCTURE FOR HIGH-VOLTAGE ESD PROTECTION APPLICATION.CHINESE PHYSICS B. VOL. 24. ISSUE 4. P. - | 12 | 92% | 1 |
8 | ALTOLAGUIRRE, FA , KER, MD , (2016) QUAD-SCR DEVICE FOR CROSS-DOMAIN ESD PROTECTION.IEEE TRANSACTIONS ON ELECTRON DEVICES. VOL. 63. ISSUE 8. P. 3177 -3184 | 11 | 100% | 0 |
9 | LIN, CY , CHIU, YL , (2016) DESIGN OF EMBEDDED SCR DEVICE TO IMPROVE ESD ROBUSTNESS OF STACKED-DEVICE OUTPUT DRIVER IN LOW-VOLTAGE CMOS TECHNOLOGY.SOLID-STATE ELECTRONICS. VOL. 124. ISSUE . P. 28 -34 | 14 | 78% | 0 |
10 | VENKATASUBRAMANIAN, R , OERTLE, K , OZEV, S , (2016) RAIL CLAMP WITH DYNAMIC TIME-CONSTANT ADJUSTMENT.IEEE JOURNAL OF SOLID-STATE CIRCUITS. VOL. 51. ISSUE 5. P. 1313 -1324 | 10 | 100% | 1 |
Classes with closest relation at Level 1 |