Class information for:
Level 1: ELECTROSTATIC DISCHARGE ESD//SILICON CONTROLLED RECTIFIER SCR//NANOELECT GIGASCALE SYST

Basic class information
Class id #P Avg. number of
references		 Database coverage
of references
10961 1021 16.5 38%


Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
10 4 OPTICS//PHYSICS, PARTICLES & FIELDS//PHYSICS, MULTIDISCIPLINARY 1131262
42 3       IEEE TRANSACTIONS ON ANTENNAS AND PROPAGATION//MICROWAVE AND OPTICAL TECHNOLOGY LETTERS//ENGINEERING, ELECTRICAL & ELECTRONIC 97664
1426 2             IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY//ELECTROSTATIC DISCHARGE ESD//REVERBERATION CHAMBER 7939
10961 1                   ELECTROSTATIC DISCHARGE ESD//SILICON CONTROLLED RECTIFIER SCR//NANOELECT GIGASCALE SYST 1021

Terms with highest relevance score


rank Term termType Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 ELECTROSTATIC DISCHARGE ESD authKW 4079088 23% 59% 233
2 SILICON CONTROLLED RECTIFIER SCR authKW 1904211 7% 86% 74
3 NANOELECT GIGASCALE SYST address 1691431 8% 70% 81
4 ESD PROTECTION authKW 961231 4% 71% 45
5 HOLDING VOLTAGE authKW 868230 3% 97% 30
6 ESD PROTECTION CIRCUIT authKW 628021 2% 100% 21
7 TRIGGER VOLTAGE authKW 543738 2% 91% 20
8 LATCHUP authKW 505389 3% 65% 26
9 ESD authKW 499901 8% 20% 84
10 ELECTROSTATIC DISCHARGE authKW 480050 7% 24% 68

Web of Science journal categories


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 Engineering, Electrical & Electronic 26045 91% 0% 927
2 Physics, Applied 8093 57% 0% 579
3 Nanoscience & Nanotechnology 6427 27% 0% 277
4 Computer Science, Hardware & Architecture 194 3% 0% 28
5 Telecommunications 131 4% 0% 37
6 Physics, Condensed Matter 102 7% 0% 76
7 Engineering, Manufacturing 65 2% 0% 17
8 Engineering, General 12 1% 0% 14
9 Robotics 2 0% 0% 2
10 Computer Science, Interdisciplinary Applications 1 1% 0% 10

Address terms


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 NANOELECT GIGASCALE SYST 1691431 8% 70% 81
2 ESD 306276 3% 39% 26
3 CORP ESD 191394 1% 80% 8
4 ESD PROTECT TECHNOL 119623 0% 100% 4
5 CORP PROC RELIABIL GRP 89717 0% 100% 3
6 ESD ENGN 89717 0% 100% 3
7 SOC TECHNOL 86141 1% 26% 11
8 MIXED SIGNAL DEVICE TECHNOL 67286 0% 75% 3
9 SHRIME 67286 0% 75% 3
10 AE DICI 59812 0% 100% 2

Journals


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 MICROELECTRONICS RELIABILITY 279215 25% 4% 254
2 IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY 202155 8% 8% 85
3 IEEE TRANSACTIONS ON ELECTRON DEVICES 30237 12% 1% 124
4 IEEE ELECTRON DEVICE LETTERS 16214 7% 1% 70
5 JOURNAL OF ELECTROSTATICS 15783 4% 1% 37
6 SOLID-STATE ELECTRONICS 9801 6% 1% 57
7 IEEE JOURNAL OF SOLID-STATE CIRCUITS 6651 4% 1% 43
8 IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY 3448 2% 1% 19
9 JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE 2690 1% 1% 7
10 IEICE TRANSACTIONS ON ELECTRONICS 2604 2% 0% 23

Author Key Words


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class		 LCSH search Wikipedia search
1 ELECTROSTATIC DISCHARGE ESD 4079088 23% 59% 233 Search ELECTROSTATIC+DISCHARGE+ESD Search ELECTROSTATIC+DISCHARGE+ESD
2 SILICON CONTROLLED RECTIFIER SCR 1904211 7% 86% 74 Search SILICON+CONTROLLED+RECTIFIER+SCR Search SILICON+CONTROLLED+RECTIFIER+SCR
3 ESD PROTECTION 961231 4% 71% 45 Search ESD+PROTECTION Search ESD+PROTECTION
4 HOLDING VOLTAGE 868230 3% 97% 30 Search HOLDING+VOLTAGE Search HOLDING+VOLTAGE
5 ESD PROTECTION CIRCUIT 628021 2% 100% 21 Search ESD+PROTECTION+CIRCUIT Search ESD+PROTECTION+CIRCUIT
6 TRIGGER VOLTAGE 543738 2% 91% 20 Search TRIGGER+VOLTAGE Search TRIGGER+VOLTAGE
7 LATCHUP 505389 3% 65% 26 Search LATCHUP Search LATCHUP
8 ESD 499901 8% 20% 84 Search ESD Search ESD
9 ELECTROSTATIC DISCHARGE 480050 7% 24% 68 Search ELECTROSTATIC+DISCHARGE Search ELECTROSTATIC+DISCHARGE
10 POWER RAIL ESD CLAMP CIRCUIT 390767 1% 93% 14 Search POWER+RAIL+ESD+CLAMP+CIRCUIT Search POWER+RAIL+ESD+CLAMP+CIRCUIT

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.


Rank Reference # ref.
in cl.		 Shr. of ref. in
cl.		 Citations
1 KER, MD , HSU, KC , (2005) OVERVIEW OF ON-CHIP ELECTROSTATIC DISCHARGE PROTECTION DESIGN WITH SCR-BASED DEVICES IN CMOS INTEGRATED CIRCUITS.IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY. VOL. 5. ISSUE 2. P. 235-249 23 100% 75
2 LIN, CY , WU, PH , KER, MD , (2016) AREA-EFFICIENT AND LOW-LEAKAGE DIODE STRING FOR ON-CHIP ESD PROTECTION.IEEE TRANSACTIONS ON ELECTRON DEVICES. VOL. 63. ISSUE 2. P. 531 -536 14 100% 2
3 POGANY, D , BYCHIKHIN, S , HEER, M , MAMANEE, W , GORNIK, E , (2011) APPLICATION OF TRANSIENT INTERFEROMETRIC MAPPING METHOD FOR ESD AND LATCH-UP ANALYSIS.MICROELECTRONICS RELIABILITY. VOL. 51. ISSUE 9-11. P. 1592-1596 25 63% 0
4 ZENG, J , DONG, SR , LIOU, JJ , HAN, Y , ZHONG, L , WANG, WH , (2015) DESIGN AND ANALYSIS OF AN AREA-EFFICIENT HIGH HOLDING VOLTAGE ESD PROTECTION DEVICE.IEEE TRANSACTIONS ON ELECTRON DEVICES. VOL. 62. ISSUE 2. P. 606 -614 13 100% 1
5 KER, MD , LIN, KH , (2006) OVERVIEW ON ELECTROSTATIC DISCHARGE PROTECTION DESIGNS FOR MIXED-VOLTAGE I/O INTERFACES: DESIGN CONCEPT AND CIRCUIT IMPLEMENTATIONS.IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS. VOL. 53. ISSUE 2. P. 235-246 16 89% 20
6 TAM, WS , KOK, CW , SIU, SL , WONG, H , (2014) SNAPBACK BREAKDOWN ESD DEVICE BASED ON ZENER DIODES ON SILICON-ON-INSULATOR TECHNOLOGY.MICROELECTRONICS RELIABILITY. VOL. 54. ISSUE 6-7. P. 1163-1168 14 82% 1
7 MA, JR , QIAO, M , ZHANG, B , (2015) NOVEL SUBSTRATE TRIGGER SCR-LDMOS STACKING STRUCTURE FOR HIGH-VOLTAGE ESD PROTECTION APPLICATION.CHINESE PHYSICS B. VOL. 24. ISSUE 4. P. - 12 92% 1
8 ALTOLAGUIRRE, FA , KER, MD , (2016) QUAD-SCR DEVICE FOR CROSS-DOMAIN ESD PROTECTION.IEEE TRANSACTIONS ON ELECTRON DEVICES. VOL. 63. ISSUE 8. P. 3177 -3184 11 100% 0
9 LIN, CY , CHIU, YL , (2016) DESIGN OF EMBEDDED SCR DEVICE TO IMPROVE ESD ROBUSTNESS OF STACKED-DEVICE OUTPUT DRIVER IN LOW-VOLTAGE CMOS TECHNOLOGY.SOLID-STATE ELECTRONICS. VOL. 124. ISSUE . P. 28 -34 14 78% 0
10 VENKATASUBRAMANIAN, R , OERTLE, K , OZEV, S , (2016) RAIL CLAMP WITH DYNAMIC TIME-CONSTANT ADJUSTMENT.IEEE JOURNAL OF SOLID-STATE CIRCUITS. VOL. 51. ISSUE 5. P. 1313 -1324 10 100% 1

Classes with closest relation at Level 1


Rank Class id link
1 21285 SOFT ERROR MAPPING//HIGH ENERGY ION IMPLANTATION//DYNAMIC RANDOM ACCESS MEMORY
2 33798 OPT TRANSMISS COMPONENTS//DIEE INFM//TRANSMISS DEVICES RD S
3 22116 ELECTROSTATIC DISCHARGE//KKU SEAGATE COOPERAT//ESD
4 24269 INTENTIONAL ELECTROMAGNETIC INTERFERENCE IEMI//SEMICONDUCTOR BRIDGE//HIGH POWER ELECTROMAGNETIC HPEM
5 4515 LDMOS//SPECIFIC ON RESISTANCE//BREAKDOWN VOLTAGE
6 30345 HORIZONTAL CURRENT BIPOLAR TRANSISTOR HCBT//LATERAL BIPOLAR TRANSISTOR//ABT BAUELEMENTETECHNOL
7 4469 HOT CARRIERS//HOT CARRIER DEGRADATION//CHARGE PUMPING
8 21249 EMITTER TURN OFF THYRISTOR ETO//GATE COMMUTATED THYRISTOR GCT//MAXIMUM CONTROLLABLE CURRENT
9 21482 CARL EMILY FUCHS MICROELECT//CEFIM//HOT CARRIER LUMINESCENCE
10 24750 DIRECT POWER INJECTION DPI//AFDELING ESAT MICAS//IMMUNITY TO ELECTROMAGNETIC INTERFERENCES

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