Class information for:
Level 1: HOT CARRIERS//HOT CARRIER DEGRADATION//CHARGE PUMPING

Basic class information
Class id #P Avg. number of
references		 Database coverage
of references
4469 1780 16.6 54%


Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
2 4 MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER 2836879
6 3       PHYSICS, APPLIED//IEEE TRANSACTIONS ON ELECTRON DEVICES//SILICON 155028
532 2             IEEE TRANSACTIONS ON ELECTRON DEVICES//MOSFET//FINFET 14860
4469 1                   HOT CARRIERS//HOT CARRIER DEGRADATION//CHARGE PUMPING 1780

Terms with highest relevance score


rank Term termType Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 HOT CARRIERS authKW 387047 6% 21% 110
2 HOT CARRIER DEGRADATION authKW 232641 2% 47% 29
3 CHARGE PUMPING authKW 213797 2% 32% 39
4 IEEE TRANSACTIONS ON ELECTRON DEVICES journal 210390 24% 3% 431
5 HOT CARRIER EFFECT authKW 192467 2% 33% 34
6 CHARGE PUMPING CP authKW 179611 1% 44% 24
7 CHANNEL INITIATED SECONDARY ELECTRON CHISEL authKW 155934 1% 91% 10
8 IEEE ELECTRON DEVICE LETTERS journal 130889 15% 3% 262
9 GIDL authKW 112575 1% 41% 16
10 CHANNEL HOT ELECTRON CHE authKW 106871 1% 69% 9

Web of Science journal categories


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with term
in class
1 Engineering, Electrical & Electronic 32621 77% 0% 1378
2 Physics, Applied 17969 64% 0% 1131
3 Nanoscience & Nanotechnology 2657 14% 0% 245
4 Physics, Condensed Matter 720 12% 0% 222
5 Physics, Multidisciplinary 48 4% 0% 75
6 Optics 39 3% 0% 62
7 Computer Science, Hardware & Architecture 33 1% 0% 19
8 Materials Science, Coatings & Films 16 1% 0% 21
9 COMPUTER APPLICATIONS & CYBERNETICS 5 0% 0% 1
10 Computer Science, Interdisciplinary Applications 1 1% 0% 16

Address terms


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 FLORIDA SOLID STATE ELECT 76404 0% 64% 7
2 EXPLORATORY DEVICE 68612 0% 100% 4
3 PROC DEV IMPLEMENTAT 45739 0% 67% 4
4 PHYS COMPOSANTS SEMICONDUCTEURS 38593 0% 75% 3
5 MICROELECT SEMICOND DEVICE PHYS 34306 0% 100% 2
6 PHYS COMPOSANTS SEMICONDUCT 34306 0% 100% 2
7 RM DEV 34306 0% 100% 2
8 DEVICE 31827 1% 8% 24
9 CHIP DESIGN RELIABIL 28582 0% 33% 5
10 SEMICOND TECHNOL PLICAT GRP 25720 0% 25% 6

Journals


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 IEEE TRANSACTIONS ON ELECTRON DEVICES 210390 24% 3% 431
2 IEEE ELECTRON DEVICE LETTERS 130889 15% 3% 262
3 MICROELECTRONICS RELIABILITY 59439 9% 2% 155
4 SOLID-STATE ELECTRONICS 41742 9% 2% 155
5 IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY 23119 2% 4% 38
6 MICROELECTRONIC ENGINEERING 6206 3% 1% 61
7 ELECTRON DEVICE LETTERS 2040 0% 2% 6
8 JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS 1972 3% 0% 61
9 IEE PROCEEDINGS-I COMMUNICATIONS SPEECH AND VISION 1625 0% 1% 8
10 IEEE JOURNAL OF SOLID-STATE CIRCUITS 1583 2% 0% 28

Author Key Words


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class		 LCSH search Wikipedia search
1 HOT CARRIERS 387047 6% 21% 110 Search HOT+CARRIERS Search HOT+CARRIERS
2 HOT CARRIER DEGRADATION 232641 2% 47% 29 Search HOT+CARRIER+DEGRADATION Search HOT+CARRIER+DEGRADATION
3 CHARGE PUMPING 213797 2% 32% 39 Search CHARGE+PUMPING Search CHARGE+PUMPING
4 HOT CARRIER EFFECT 192467 2% 33% 34 Search HOT+CARRIER+EFFECT Search HOT+CARRIER+EFFECT
5 CHARGE PUMPING CP 179611 1% 44% 24 Search CHARGE+PUMPING+CP Search CHARGE+PUMPING+CP
6 CHANNEL INITIATED SECONDARY ELECTRON CHISEL 155934 1% 91% 10 Search CHANNEL+INITIATED+SECONDARY+ELECTRON+CHISEL Search CHANNEL+INITIATED+SECONDARY+ELECTRON+CHISEL
7 GIDL 112575 1% 41% 16 Search GIDL Search GIDL
8 CHANNEL HOT ELECTRON CHE 106871 1% 69% 9 Search CHANNEL+HOT+ELECTRON+CHE Search CHANNEL+HOT+ELECTRON+CHE
9 HOT CARRIER INDUCED DEGRADATION 103765 1% 55% 11 Search HOT+CARRIER+INDUCED+DEGRADATION Search HOT+CARRIER+INDUCED+DEGRADATION
10 SUBSTRATE CURRENT 86079 1% 31% 16 Search SUBSTRATE+CURRENT Search SUBSTRATE+CURRENT

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.


Rank Reference # ref.
in cl.		 Shr. of ref. in
cl.		 Citations
1 ACOVIC, A , LAROSA, G , SUN, YC , (1996) A REVIEW OF HOT-CARRIER DEGRADATION MECHANISMS IN MOSFETS.MICROELECTRONICS RELIABILITY. VOL. 36. ISSUE 7-8. P. 845-869 64 74% 37
2 TOUHAMI, A , BOUHDADA, A , (2005) IMPACT OF INTERFACE TRAPS ON GATE-INDUCED DRAIN LEAKAGE CURRENT IN N-TYPE METAL OXIDE SEMICONDUCTOR FIELD EFFECT TRANSISTOR.INTERNATIONAL JOURNAL OF ELECTRONICS. VOL. 92. ISSUE 9. P. 539-552 36 75% 2
3 HABAS, P , (1995) MODELING STUDY OF THE EXPERIMENTAL-TECHNIQUES FOR THE CHARACTERIZATION OF MOSFET HOT-CARRIER AGING.MICROELECTRONICS RELIABILITY. VOL. 35. ISSUE 3. P. 481 -510 44 85% 0
4 HABAS, P , (1995) MODELING STUDY OF THE EXPERIMENTAL-TECHNIQUES FOR THE CHARACTERIZATION OF MOSFET HOT-CARRIER AGING.MICROELECTRONICS AND RELIABILITY. VOL. 35. ISSUE 7. P. 1073-1104 42 84% 0
5 ANG, DS , LING, CH , (1999) ON THE TIME-DEPENDENT DEGRADATION OF LDD N-MOSFETS UNDER HOT-CARRIER STRESS.MICROELECTRONICS RELIABILITY. VOL. 39. ISSUE 9. P. 1311-1322 32 91% 4
6 WATANABE, T , HORI, M , SARUWATARI, T , TSUCHIYA, T , ONO, Y , (2015) EVALUATION OF ACCURACY OF CHARGE PUMPING CURRENT IN TIME DOMAIN.IEICE TRANSACTIONS ON ELECTRONICS. VOL. E98C. ISSUE 5. P. 390 -394 23 82% 0
7 VUILLAUME, D , BRAVAIX, A , GOGUENHEIM, D , (1998) HOT-CARRIER INJECTIONS IN SIO2.MICROELECTRONICS RELIABILITY. VOL. 38. ISSUE 1. P. 7 -22 63 46% 9
8 HORI, M , WATANABE, T , TSUCHIYA, T , ONO, Y , (2014) ANALYSIS OF ELECTRON CAPTURE PROCESS IN CHARGE PUMPING SEQUENCE USING TIME DOMAIN MEASUREMENTS.APPLIED PHYSICS LETTERS. VOL. 105. ISSUE 26. P. - 22 81% 0
9 CHEN, JH , WONG, SC , WANG, YH , (2001) DC PULSE HOT-CARRIER-STRESS EFFECTS ON GATE-INDUCED DRAIN LEAKAGE CURRENT IN N-CHANNEL MOSFETS.IEEE TRANSACTIONS ON ELECTRON DEVICES. VOL. 48. ISSUE 12. P. 2746 -2753 28 90% 0
10 WEBER, W , THEWES, R , (1998) EXPERIMENTAL METHODS FOR INVESTIGATING THE DEFECT PROPERTIES OF SIO2 IN METAL OXIDE SEMICONDUCTOR TRANSISTORS.JOURNAL OF THE ELECTROCHEMICAL SOCIETY. VOL. 145. ISSUE 10. P. 3638 -3646 29 91% 2

Classes with closest relation at Level 1


Rank Class id link
1 14061 NEGATIVE BIAS TEMPERATURE INSTABILITY NBTI//NEGATIVE BIAS TEMPERATURE INSTABILITY//NBTI
2 6444 EFFECTIVE CHANNEL LENGTH//IEEE TRANSACTIONS ON ELECTRON DEVICES//LOW TEMPERATURE ELECTRONICS
3 26157 VERTICAL MOSFET//GROOVED GATE MOSFET//FILLET LOCAL OXIDATION FILOX
4 2603 STRESS INDUCED LEAKAGE CURRENT//OXIDE RELIABILITY//SOFT BREAKDOWN
5 21482 CARL EMILY FUCHS MICROELECT//CEFIM//HOT CARRIER LUMINESCENCE
6 24736 1T DRAM//CAPACITORLESS DRAM//CAPACITORLESS
7 19608 SI SIO2//GE INSULATOR STRUCTURE//MICROWAVE TRANSIENT PHOTOCONDUCTIVITY
8 2169 IEEE TRANSACTIONS ON NUCLEAR SCIENCE//TOTAL IONIZING DOSE//OXIDE TRAPPED CHARGE
9 21308 BEAM CHANNEL TRANSISTOR//MEMORY DEVICE BUSINESS//IMPURITY ENHANCED OXIDATION
10 6002 BORON PENETRATION//NITRIDED OXIDE//OXYNITRIDATION

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