Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
4515 | 1774 | 14.3 | 47% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
2 | 4 | MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER | 2836879 |
6 | 3 | PHYSICS, APPLIED//IEEE TRANSACTIONS ON ELECTRON DEVICES//SILICON | 155028 |
532 | 2 | IEEE TRANSACTIONS ON ELECTRON DEVICES//MOSFET//FINFET | 14860 |
4515 | 1 | LDMOS//SPECIFIC ON RESISTANCE//BREAKDOWN VOLTAGE | 1774 |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | LDMOS | authKW | 1246816 | 6% | 67% | 108 |
2 | SPECIFIC ON RESISTANCE | authKW | 1134923 | 5% | 79% | 84 |
3 | BREAKDOWN VOLTAGE | authKW | 743901 | 10% | 23% | 184 |
4 | SUPERJUNCTION | authKW | 738688 | 3% | 83% | 52 |
5 | POWER MOSFET | authKW | 624044 | 6% | 35% | 105 |
6 | BREAKDOWN VOLTAGE BV | authKW | 572816 | 2% | 79% | 42 |
7 | ON RESISTANCE | authKW | 370546 | 3% | 45% | 48 |
8 | SUPERJUNCTION SJ | authKW | 350172 | 1% | 88% | 23 |
9 | LATERAL INSULATED GATE BIPOLAR TRANSISTOR LIGBT | authKW | 293491 | 1% | 95% | 18 |
10 | RESURF | authKW | 292236 | 2% | 57% | 30 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Engineering, Electrical & Electronic | 32988 | 78% | 0% | 1383 |
2 | Physics, Applied | 11586 | 52% | 0% | 919 |
3 | Physics, Condensed Matter | 1590 | 17% | 0% | 308 |
4 | Nanoscience & Nanotechnology | 1545 | 11% | 0% | 191 |
5 | Physics, Multidisciplinary | 302 | 8% | 0% | 136 |
6 | Telecommunications | 85 | 2% | 0% | 44 |
7 | Computer Science, Hardware & Architecture | 24 | 1% | 0% | 17 |
8 | Materials Science, Multidisciplinary | 4 | 5% | 0% | 91 |
9 | Computer Science, Interdisciplinary Applications | 1 | 1% | 0% | 16 |
10 | Film, Radio, Television | 1 | 0% | 0% | 1 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | ASIC SYST ENGN | 227966 | 3% | 25% | 53 |
2 | STATE ELECT THIN FILMS INTEGRATED DEVIC | 162935 | 9% | 6% | 157 |
3 | ANALOGUE INTEGRATED CIRCUITS | 87123 | 1% | 56% | 9 |
4 | IUT ROUEN | 68836 | 0% | 50% | 8 |
5 | SAGE ENISO | 61465 | 0% | 71% | 5 |
6 | 24 | 55752 | 1% | 36% | 9 |
7 | EMERGING TECHNOL | 41213 | 2% | 9% | 28 |
8 | MINIST EDUC WIDE BAND G SEMICOND MAT DEVICES | 38426 | 1% | 12% | 18 |
9 | AL LEITH ENGN | 34422 | 0% | 100% | 2 |
10 | CHINA 24 | 34422 | 0% | 100% | 2 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | IEEE TRANSACTIONS ON ELECTRON DEVICES | 192866 | 23% | 3% | 412 |
2 | SOLID-STATE ELECTRONICS | 58450 | 10% | 2% | 183 |
3 | IEEE ELECTRON DEVICE LETTERS | 52600 | 9% | 2% | 166 |
4 | MICROELECTRONICS RELIABILITY | 17859 | 5% | 1% | 85 |
5 | MICROELECTRONICS JOURNAL | 17740 | 4% | 2% | 63 |
6 | IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY | 10023 | 1% | 2% | 25 |
7 | IEE PROCEEDINGS-I COMMUNICATIONS SPEECH AND VISION | 5759 | 1% | 2% | 15 |
8 | SUPERLATTICES AND MICROSTRUCTURES | 5416 | 3% | 1% | 45 |
9 | CHINESE PHYSICS B | 4316 | 3% | 1% | 50 |
10 | IEE PROCEEDINGS-CIRCUITS DEVICES AND SYSTEMS | 4226 | 1% | 2% | 15 |
Author Key Words |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | LDMOS | 1246816 | 6% | 67% | 108 | Search LDMOS | Search LDMOS |
2 | SPECIFIC ON RESISTANCE | 1134923 | 5% | 79% | 84 | Search SPECIFIC+ON+RESISTANCE | Search SPECIFIC+ON+RESISTANCE |
3 | BREAKDOWN VOLTAGE | 743901 | 10% | 23% | 184 | Search BREAKDOWN+VOLTAGE | Search BREAKDOWN+VOLTAGE |
4 | SUPERJUNCTION | 738688 | 3% | 83% | 52 | Search SUPERJUNCTION | Search SUPERJUNCTION |
5 | POWER MOSFET | 624044 | 6% | 35% | 105 | Search POWER+MOSFET | Search POWER+MOSFET |
6 | BREAKDOWN VOLTAGE BV | 572816 | 2% | 79% | 42 | Search BREAKDOWN+VOLTAGE+BV | Search BREAKDOWN+VOLTAGE+BV |
7 | ON RESISTANCE | 370546 | 3% | 45% | 48 | Search ON+RESISTANCE | Search ON+RESISTANCE |
8 | SUPERJUNCTION SJ | 350172 | 1% | 88% | 23 | Search SUPERJUNCTION+SJ | Search SUPERJUNCTION+SJ |
9 | LATERAL INSULATED GATE BIPOLAR TRANSISTOR LIGBT | 293491 | 1% | 95% | 18 | Search LATERAL+INSULATED+GATE+BIPOLAR+TRANSISTOR+LIGBT | Search LATERAL+INSULATED+GATE+BIPOLAR+TRANSISTOR+LIGBT |
10 | RESURF | 292236 | 2% | 57% | 30 | Search RESURF | Search RESURF |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | MAHABADI, SEJ , (2016) UPPER DRIFT REGION DOUBLE STEP PARTIAL SOI LDMOSFET: A NOVEL DEVICE FOR ENHANCING BREAKDOWN VOLTAGE AND OUTPUT CHARACTERISTICS.SUPERLATTICES AND MICROSTRUCTURES. VOL. 89. ISSUE . P. 345 -354 | 25 | 89% | 12 |
2 | MAHABADI, SEJ , RAJABI, S , LOIACONO, J , (2015) A NOVEL PARTIAL SOI LDMOSFET WITH PERIODIC BURIED OXIDE FOR BREAKDOWN VOLTAGE AND SELF HEATING EFFECT ENHANCEMENT.SUPERLATTICES AND MICROSTRUCTURES. VOL. 85. ISSUE . P. 872 -879 | 23 | 96% | 10 |
3 | YAO, JF , GUO, YF , LI, M , HUANG, XF , LIN, H , JI, XC , XU, Y , (2015) ANALYTICAL MODEL FOR SILICON-ON-INSULATOR LATERAL HIGH-VOLTAGE DEVICES USING VARIATION OF LATERAL THICKNESS TECHNIQUE.JAPANESE JOURNAL OF APPLIED PHYSICS. VOL. 54. ISSUE 2. P. - | 21 | 100% | 4 |
4 | HU, SD , LUO, J , JIANG, YY , CHENG, K , CHEN, YH , JIN, JJ , WANG, JA , ZHOU, JL , TANG, F , ZHOU, XC , ET AL (2016) IMPROVING BREAKDOWN, CONDUCTIVE, AND THERMAL PERFORMANCES FOR SOI HIGH VOLTAGE LDMOS USING A PARTIAL COMPOUND BURIED LAYER.SOLID-STATE ELECTRONICS. VOL. 117. ISSUE . P. 146 -151 | 23 | 96% | 0 |
5 | ZHANG, WT , ZHANG, B , QIAO, M , LI, ZH , LUO, XR , LI, ZJ , (2017) OPTIMIZATION AND NEW STRUCTURE OF SUPERJUNCTION WITH ISOLATOR LAYER.IEEE TRANSACTIONS ON ELECTRON DEVICES. VOL. 64. ISSUE 1. P. 217 -223 | 21 | 100% | 0 |
6 | HU, Y , WANG, H , DU, CX , MA, MM , CHAN, MS , HE, J , WANG, GF , (2016) A HIGH-VOLTAGE (> 600 V) N-ISLAND LDMOS WITH STEP-DOPED DRIFT REGION IN PARTIAL SOI TECHNOLOGY.IEEE TRANSACTIONS ON ELECTRON DEVICES. VOL. 63. ISSUE 5. P. 1969 -1976 | 23 | 92% | 0 |
7 | ELAHIPANAH, H , OROUJI, AA , (2010) A 1300-V 0.34-OMEGA . CM(2) PARTIAL SOI LDMOSFET WITH NOVEL DUAL CHARGE ACCUMULATION LAYERS.IEEE TRANSACTIONS ON ELECTRON DEVICES. VOL. 57. ISSUE 8. P. 1959 -1965 | 21 | 100% | 13 |
8 | CHEN, YH , HU, SD , CHENG, K , JIANG, YY , LUO, J , WANG, JA , TANG, F , ZHOU, XC , ZHOU, JL , GAN, P , (2016) A NOVEL LOW SPECIFIC ON-RESISTANCE DOUBLE-GATE LDMOS WITH MULTIPLE BURIED P-LAYERS IN THE DRIFT REGION BASED ON THE SILICON-ON-INSULATOR SUBSTRATE.SUPERLATTICES AND MICROSTRUCTURES. VOL. 89. ISSUE . P. 59 -67 | 17 | 100% | 1 |
9 | ZHANG, J , GUO, YF , SUN, YB , YANG, KM , LIN, H , XIA, XJ , ZHANG, CC , (2016) A NEW PHYSICAL INSIGHT OF RESURF EFFECTS BASED ON GRADUAL CHARGE APPOINTMENT CONCEPT FOR BULK SILICON LATERAL POWER DEVICES.SUPERLATTICES AND MICROSTRUCTURES. VOL. 92. ISSUE . P. 111 -123 | 18 | 100% | 0 |
10 | HU, SD , WU, XH , ZHU, Z , JIN, JJ , CHEN, YH , (2014) PARTIAL-SOI HIGH VOLTAGE LATERALLY DOUBLE-DIFFUSED MOS WITH A PARTIALLY BURIED N(+)-LAYER.CHINESE PHYSICS B. VOL. 23. ISSUE 6. P. - | 18 | 100% | 1 |
Classes with closest relation at Level 1 |