Class information for:
Level 1: IGBT//INSULATED GATE BIPOLAR TRANSISTOR IGBT//INSULATED GATE BIPOLAR TRANSISTORS

Basic class information
Class id #P Avg. number of
references		 Database coverage
of references
5040 1683 18.5 44%


Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
24 4 ENGINEERING, ELECTRICAL & ELECTRONIC//IEEE TRANSACTIONS ON POWER SYSTEMS//IEEE TRANSACTIONS ON POWER ELECTRONICS 122956
125 3       IEEE TRANSACTIONS ON POWER SYSTEMS//IEEE TRANSACTIONS ON POWER ELECTRONICS//ENGINEERING, ELECTRICAL & ELECTRONIC 67681
273 2             IEEE TRANSACTIONS ON POWER ELECTRONICS//IET POWER ELECTRONICS//IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS 19241
5040 1                   IGBT//INSULATED GATE BIPOLAR TRANSISTOR IGBT//INSULATED GATE BIPOLAR TRANSISTORS 1683

Terms with highest relevance score


rank Term termType Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 IGBT authKW 898263 6% 49% 101
2 INSULATED GATE BIPOLAR TRANSISTOR IGBT authKW 603180 4% 50% 66
3 INSULATED GATE BIPOLAR TRANSISTORS authKW 359894 3% 40% 50
4 INSULATED GATE BIPOLAR TRANSISTORS IGBTS authKW 334823 2% 56% 33
5 IEEE TRANSACTIONS ON POWER ELECTRONICS journal 311742 20% 5% 339
6 POWER SEMICONDUCTOR DEVICES authKW 266623 3% 26% 57
7 POWER MODULE authKW 215126 2% 46% 26
8 SILICON CARBIDE SIC authKW 188461 4% 17% 61
9 MICROELECTRONICS RELIABILITY journal 181408 16% 4% 263
10 SIC MOSFET authKW 174750 1% 57% 17

Web of Science journal categories


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with term
in class
1 Engineering, Electrical & Electronic 40017 88% 0% 1477
2 Nanoscience & Nanotechnology 4857 19% 0% 315
3 Physics, Applied 4845 36% 0% 599
4 Engineering, General 1439 7% 0% 126
5 Automation & Control Systems 194 3% 0% 44
6 Instruments & Instrumentation 173 4% 0% 68
7 Physics, Condensed Matter 167 7% 0% 125
8 Engineering, Manufacturing 20 1% 0% 15
9 Computer Science, Hardware & Architecture 12 1% 0% 13
10 Telecommunications 3 1% 0% 17

Address terms


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 RELIABLE POWER ELECT 111116 0% 88% 7
2 RELIABLE POWER ELECT CORPE 64789 0% 71% 5
3 ELECT ELECT INFORMAT ENG 63489 0% 50% 7
4 POWER IND 58052 0% 80% 4
5 POWER ELECT SYST 57634 2% 8% 40
6 UR03ES05 54425 0% 100% 3
7 ELECT ENERGY CONVERS E2C 54419 0% 50% 6
8 CHAIR POWER ELECT 50471 0% 35% 8
9 ELEKTROPHYS 48375 0% 67% 4
10 DELTA SHANGHAI DESIGN 36283 0% 100% 2

Journals


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 IEEE TRANSACTIONS ON POWER ELECTRONICS 311742 20% 5% 339
2 MICROELECTRONICS RELIABILITY 181408 16% 4% 263
3 IEEE JOURNAL OF EMERGING AND SELECTED TOPICS IN POWER ELECTRONICS 37181 2% 7% 28
4 IEEE TRANSACTIONS ON INDUSTRY APPLICATIONS 31211 7% 2% 111
5 IEEE INDUSTRIAL ELECTRONICS MAGAZINE 17165 1% 8% 12
6 SOLID-STATE ELECTRONICS 16518 6% 1% 95
7 IEEE TRANSACTIONS ON ELECTRON DEVICES 15133 7% 1% 113
8 IET POWER ELECTRONICS 12116 2% 2% 33
9 IEEE ELECTRON DEVICE LETTERS 11543 5% 1% 76
10 IEE PROCEEDINGS-CIRCUITS DEVICES AND SYSTEMS 8751 1% 2% 21

Author Key Words


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class		 LCSH search Wikipedia search
1 IGBT 898263 6% 49% 101 Search IGBT Search IGBT
2 INSULATED GATE BIPOLAR TRANSISTOR IGBT 603180 4% 50% 66 Search INSULATED+GATE+BIPOLAR+TRANSISTOR+IGBT Search INSULATED+GATE+BIPOLAR+TRANSISTOR+IGBT
3 INSULATED GATE BIPOLAR TRANSISTORS 359894 3% 40% 50 Search INSULATED+GATE+BIPOLAR+TRANSISTORS Search INSULATED+GATE+BIPOLAR+TRANSISTORS
4 INSULATED GATE BIPOLAR TRANSISTORS IGBTS 334823 2% 56% 33 Search INSULATED+GATE+BIPOLAR+TRANSISTORS+IGBTS Search INSULATED+GATE+BIPOLAR+TRANSISTORS+IGBTS
5 POWER SEMICONDUCTOR DEVICES 266623 3% 26% 57 Search POWER+SEMICONDUCTOR+DEVICES Search POWER+SEMICONDUCTOR+DEVICES
6 POWER MODULE 215126 2% 46% 26 Search POWER+MODULE Search POWER+MODULE
7 SILICON CARBIDE SIC 188461 4% 17% 61 Search SILICON+CARBIDE+SIC Search SILICON+CARBIDE+SIC
8 SIC MOSFET 174750 1% 57% 17 Search SIC+MOSFET Search SIC+MOSFET
9 DYNAMIC AVALANCHE 156791 1% 79% 11 Search DYNAMIC+AVALANCHE Search DYNAMIC+AVALANCHE
10 IEGT 129006 0% 89% 8 Search IEGT Search IEGT

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.


Rank Reference # ref.
in cl.		 Shr. of ref. in
cl.		 Citations
1 OH, H , HAN, B , MCCLUSKEY, P , HAN, C , YOUN, BD , (2015) PHYSICS-OF-FAILURE, CONDITION MONITORING, AND PROGNOSTICS OF INSULATED GATE BIPOLAR TRANSISTOR MODULES: A REVIEW.IEEE TRANSACTIONS ON POWER ELECTRONICS. VOL. 30. ISSUE 5. P. 2413 -2426 67 73% 34
2 PEFTITSIS, D , RABKOWSKI, J , (2016) GATE AND BASE DRIVERS FOR SILICON CARBIDE POWER TRANSISTORS: AN OVERVIEW.IEEE TRANSACTIONS ON POWER ELECTRONICS. VOL. 31. ISSUE 10. P. 7194 -7213 52 69% 0
3 AVENAS, Y , DUPONT, L , BAKER, N , ZARA, H , BARRUEL, F , (2015) CONDITION MONITORING A DECADE OF PROPOSED TECHNIQUES.IEEE INDUSTRIAL ELECTRONICS MAGAZINE. VOL. 9. ISSUE 4. P. 22 -36 29 91% 4
4 YANG, SY , XIANG, DW , BRYANT, A , MAWBY, P , RAN, L , TAVNER, P , (2010) CONDITION MONITORING FOR DEVICE RELIABILITY IN POWER ELECTRONIC CONVERTERS: A REVIEW.IEEE TRANSACTIONS ON POWER ELECTRONICS. VOL. 25. ISSUE 11. P. 2734 -2752 30 71% 167
5 BAKER, N , LISERRE, M , DUPONT, L , AVENAS, Y , (2014) IMPROVED RELIABILITY OF POWER MODULES A REVIEW OF ONLINE JUNCTION TEMPERATURE MEASUREMENT METHODS.IEEE INDUSTRIAL ELECTRONICS MAGAZINE. VOL. 8. ISSUE 3. P. 17 -27 25 96% 9
6 SUBBIAH, A , WASYNCZUK, O , (2016) COMPUTATIONALLY EFFICIENT SIMULATION OF HIGH-FREQUENCY TRANSIENTS IN POWER ELECTRONIC CIRCUITS.IEEE TRANSACTIONS ON POWER ELECTRONICS. VOL. 31. ISSUE 9. P. 6351 -6361 28 82% 1
7 DURAND, C , KLINGLER, M , COUTELLIER, D , NACEUR, H , (2016) POWER CYCLING RELIABILITY OF POWER MODULE: A SURVEY.IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY. VOL. 16. ISSUE 1. P. 80 -97 28 76% 2
8 TANG, YY , MA, H , (2017) DYNAMIC ELECTROTHERMAL MODEL OF PARALLELED IGBT MODULES WITH UNBALANCED STRAY PARAMETERS.IEEE TRANSACTIONS ON POWER ELECTRONICS. VOL. 32. ISSUE 2. P. 1385 -1399 24 96% 0
9 BRYANT, A , YANG, SY , MAWBY, P , XIANG, DW , RAN, L , TAVNER, P , PALMER, PR , (2011) INVESTIGATION INTO IGBT DV/DT DURING TURN-OFF AND ITS TEMPERATURE DEPENDENCE.IEEE TRANSACTIONS ON POWER ELECTRONICS. VOL. 26. ISSUE 10. P. 3019 -3031 24 92% 32
10 CHOI, UM , JORGENSEN, S , BLAABJERG, F , (2016) ADVANCED ACCELERATED POWER CYCLING TEST FOR RELIABILITY INVESTIGATION OF POWER DEVICE MODULES.IEEE TRANSACTIONS ON POWER ELECTRONICS. VOL. 31. ISSUE 12. P. 8371 -8386 24 89% 0

Classes with closest relation at Level 1


Rank Class id link
1 21249 EMITTER TURN OFF THYRISTOR ETO//GATE COMMUTATED THYRISTOR GCT//MAXIMUM CONTROLLABLE CURRENT
2 20590 DIE ATTACH//NANOSILVER PASTE//NANOSCALE SILVER PASTE
3 4515 LDMOS//SPECIFIC ON RESISTANCE//BREAKDOWN VOLTAGE
4 13293 DYNAMIC THERMAL MANAGEMENT//COMPACT THERMAL MODEL//DYNAMIC THERMAL MANAGEMENT DTM
5 5987 4H SIC//CHANNEL MOBILITY//SIO2 SIC INTERFACE
6 16138 REVERSELY SWITCHED DYNISTOR RSD//POWER SEMICONDUCTOR DIODE SWITCHES//POWER SEMICOND DEVICES
7 11720 BEARING CURRENT//SHAFT VOLTAGE//COMMON MODE CM
8 36089 CHARACTERISTIC TESTING METHOD//DIFFUS TEAM//GATE TURN OFF GTO THYRISTORS
9 21267 SOFT SWITCHING INVERTER//SOFT SWITCHING//RESONANT LINK CONVERTER
10 12101 MULTIPHASE MACHINES//MULTIPHASE DRIVES//OPEN CIRCUIT FAULT

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