Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
24234 | 319 | 13.9 | 58% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
2 | 4 | MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER | 2836879 |
628 | 3 | SILICON CARBIDE//4H SIC//SIC | 13252 |
671 | 2 | SILICON CARBIDE//4H SIC//SIC | 13252 |
24234 | 1 | MESFET//4H SIC MESFET//SIC MESFET | 319 |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | MESFET | authKW | 2510360 | 34% | 24% | 109 |
2 | 4H SIC MESFET | authKW | 1536861 | 5% | 94% | 17 |
3 | SIC MESFET | authKW | 1042296 | 4% | 78% | 14 |
4 | SOI MESFET | authKW | 478608 | 2% | 100% | 5 |
5 | MAXIMUM OUTPUT POWER DENSITY | authKW | 398838 | 2% | 83% | 5 |
6 | METAL SEMICONDUCTOR FIELD EFFECT TRANSISTOR | authKW | 367640 | 4% | 30% | 13 |
7 | DC TRANSCONDUCTANCE | authKW | 306307 | 1% | 80% | 4 |
8 | DRAIN SATURATION CURRENT | authKW | 306307 | 1% | 80% | 4 |
9 | L GATE | authKW | 287165 | 1% | 100% | 3 |
10 | DRAIN INDUCED BARRIER LOWERING EFFECT | authKW | 215372 | 1% | 75% | 3 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Engineering, Electrical & Electronic | 3414 | 60% | 0% | 191 |
2 | Physics, Applied | 1345 | 42% | 0% | 135 |
3 | Physics, Condensed Matter | 876 | 29% | 0% | 91 |
4 | Materials Science, Characterization, Testing | 486 | 5% | 0% | 16 |
5 | Materials Science, Multidisciplinary | 427 | 28% | 0% | 88 |
6 | Materials Science, Coatings & Films | 210 | 6% | 0% | 20 |
7 | Nanoscience & Nanotechnology | 205 | 9% | 0% | 30 |
8 | Physics, Multidisciplinary | 100 | 10% | 0% | 31 |
9 | Optics | 15 | 4% | 0% | 14 |
10 | Telecommunications | 11 | 2% | 0% | 7 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | EDUC MINIST WIDE BAND G SEMICOND MAT | 191443 | 1% | 100% | 2 |
2 | COMMUN NXP CRISMATLAMIPSUMR 6508 | 95722 | 0% | 100% | 1 |
3 | ENGN TECHNOL EAST GUILAN | 95722 | 0% | 100% | 1 |
4 | MICROELECT FAILURE ANAL | 95722 | 0% | 100% | 1 |
5 | MOTILIAL NEHRU | 95722 | 0% | 100% | 1 |
6 | PHYS COMOPOSANTS SEMICOND | 95722 | 0% | 100% | 1 |
7 | PROGRAM MICROSCI TECHNOL | 95722 | 0% | 100% | 1 |
8 | RADIO CIME | 95722 | 0% | 100% | 1 |
9 | URA 837 | 95722 | 0% | 100% | 1 |
10 | WIDE BAND G SEMICOND MAT DEVICES 373 | 95722 | 0% | 100% | 1 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | MATERIALS SCIENCE FORUM | 12104 | 15% | 0% | 47 |
2 | SOLID-STATE ELECTRONICS | 9937 | 10% | 0% | 32 |
3 | IEEE TRANSACTIONS ON ELECTRON DEVICES | 7704 | 11% | 0% | 35 |
4 | MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING | 5685 | 4% | 0% | 14 |
5 | SUPERLATTICES AND MICROSTRUCTURES | 4336 | 5% | 0% | 17 |
6 | IEEE ELECTRON DEVICE LETTERS | 2703 | 5% | 0% | 16 |
7 | JOURNAL OF COMPUTATIONAL ELECTRONICS | 2282 | 2% | 0% | 5 |
8 | CHINESE PHYSICS B | 1390 | 4% | 0% | 12 |
9 | RECHERCHE AEROSPATIALE | 988 | 1% | 1% | 2 |
10 | MICROELECTRONICS JOURNAL | 616 | 2% | 0% | 5 |
Author Key Words |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | MESFET | 2510360 | 34% | 24% | 109 | Search MESFET | Search MESFET |
2 | 4H SIC MESFET | 1536861 | 5% | 94% | 17 | Search 4H+SIC+MESFET | Search 4H+SIC+MESFET |
3 | SIC MESFET | 1042296 | 4% | 78% | 14 | Search SIC+MESFET | Search SIC+MESFET |
4 | SOI MESFET | 478608 | 2% | 100% | 5 | Search SOI+MESFET | Search SOI+MESFET |
5 | MAXIMUM OUTPUT POWER DENSITY | 398838 | 2% | 83% | 5 | Search MAXIMUM+OUTPUT+POWER+DENSITY | Search MAXIMUM+OUTPUT+POWER+DENSITY |
6 | METAL SEMICONDUCTOR FIELD EFFECT TRANSISTOR | 367640 | 4% | 30% | 13 | Search METAL+SEMICONDUCTOR+FIELD+EFFECT+TRANSISTOR | Search METAL+SEMICONDUCTOR+FIELD+EFFECT+TRANSISTOR |
7 | DC TRANSCONDUCTANCE | 306307 | 1% | 80% | 4 | Search DC+TRANSCONDUCTANCE | Search DC+TRANSCONDUCTANCE |
8 | DRAIN SATURATION CURRENT | 306307 | 1% | 80% | 4 | Search DRAIN+SATURATION+CURRENT | Search DRAIN+SATURATION+CURRENT |
9 | L GATE | 287165 | 1% | 100% | 3 | Search L+GATE | Search L+GATE |
10 | DRAIN INDUCED BARRIER LOWERING EFFECT | 215372 | 1% | 75% | 3 | Search DRAIN+INDUCED+BARRIER+LOWERING+EFFECT | Search DRAIN+INDUCED+BARRIER+LOWERING+EFFECT |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | OROUJI, AA , ROUSTAIE, Z , RAMEZANI, Z , (2016) NOVEL 4H-SIC MESFET WITH MODIFIED DEPLETION REGION BY DUAL WELL FOR HIGH-CURRENT APPLICATIONS.JOURNAL OF COMPUTATIONAL ELECTRONICS. VOL. 15. ISSUE 3. P. 1077 -1084 | 16 | 89% | 0 |
2 | SONG, K , CHAI, CC , YANG, YT , CHEN, B , ZHANG, XJ , MA, ZY , (2012) EFFECTS OF GATE-BUFFER COMBINED WITH A P-TYPE SPACER STRUCTURE ON SILICON CARBIDE METAL-SEMICONDUCTOR FIELD-EFFECT TRANSISTORS.CHINESE PHYSICS B. VOL. 21. ISSUE 1. P. - | 19 | 73% | 0 |
3 | NOORBAKHSH, SM , ELAHIPANAH, H , (2012) IMPROVED 4H-SIC MESFET WITH DOUBLE SOURCE FIELD PLATE STRUCTURES.SUPERLATTICES AND MICROSTRUCTURES. VOL. 51. ISSUE 5. P. 553 -562 | 15 | 88% | 5 |
4 | JIA, HJ , LUO, YH , ZHANG, H , XING, D , MA, PM , (2017) A NOVEL 4H-SIC MESFET WITH SERPENTINE CHANNEL FOR HIGH POWER AND HIGH FREQUENCY APPLICATIONS.SUPERLATTICES AND MICROSTRUCTURES. VOL. 101. ISSUE . P. 315 -322 | 13 | 93% | 0 |
5 | RAZAVI, SM , ZAHIRI, SH , HOSSEINI, SE , (2013) A NOVEL 4H-SIC MESFET WITH RECESSED GATE AND CHANNEL.SUPERLATTICES AND MICROSTRUCTURES. VOL. 60. ISSUE . P. 516-523 | 15 | 79% | 11 |
6 | OROUJI, AA , RAMEZANI, Z , HEYDARI, AA , (2014) A NOVEL HIGH-PERFORMANCE SOI MESFET BY STOPPING THE DEPLETION REGION EXTENSION.SUPERLATTICES AND MICROSTRUCTURES. VOL. 75. ISSUE . P. 195 -207 | 15 | 75% | 0 |
7 | RAMEZANI, Z , OROUJI, AA , AGHAREZAEI, H , (2016) A NOVEL SYMMETRICAL 4H-SIC MESFET: AN EFFECTIVE WAY TO IMPROVE THE BREAKDOWN VOLTAGE.JOURNAL OF COMPUTATIONAL ELECTRONICS. VOL. 15. ISSUE 1. P. 163 -171 | 13 | 76% | 1 |
8 | OROUJI, AA , KHAYATIAN, A , KESHAVARZI, P , (2016) A NOVEL HIGH-PERFORMANCE HIGH-FREQUENCY SOI MESFET BY THE DAMPED ELECTRIC FIELD.PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES. VOL. 80. ISSUE . P. 8 -13 | 11 | 92% | 0 |
9 | JIA, HJ , ZHANG, H , LUO, YH , YANG, ZH , (2015) IMPROVED MULTI-RECESSED 4H-SIC MESFETS WITH DOUBLE-RECESSED P-BUFFER LAYER.MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING. VOL. 40. ISSUE . P. 650 -654 | 11 | 92% | 0 |
10 | DENG, XC , SUN, H , RAO, CY , ZHANG, B , (2013) HIGH-POWER SIC MESFET USING A DUAL P-BUFFER LAYER FOR AN S-BAND POWER AMPLIFIER.CHINESE PHYSICS B. VOL. 22. ISSUE 1. P. - | 10 | 100% | 2 |
Classes with closest relation at Level 1 |