Class information for:
Level 1: NEGATIVE BIAS TEMPERATURE INSTABILITY NBTI//NEGATIVE BIAS TEMPERATURE INSTABILITY//NBTI

Basic class information
Class id #P Avg. number of
references		 Database coverage
of references
14061 795 23.9 55%


Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
2 4 MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER 2836879
6 3       PHYSICS, APPLIED//IEEE TRANSACTIONS ON ELECTRON DEVICES//SILICON 155028
474 2             FLASH MEMORY//SONOS//NEGATIVE BIAS TEMPERATURE INSTABILITY NBTI 15884
14061 1                   NEGATIVE BIAS TEMPERATURE INSTABILITY NBTI//NEGATIVE BIAS TEMPERATURE INSTABILITY//NBTI 795

Terms with highest relevance score


rank Term termType Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 NEGATIVE BIAS TEMPERATURE INSTABILITY NBTI authKW 3615690 19% 63% 150
2 NEGATIVE BIAS TEMPERATURE INSTABILITY authKW 1265937 5% 80% 41
3 NBTI authKW 880926 10% 29% 80
4 BIAS TEMPERATURE INSTABILITY authKW 836780 4% 68% 32
5 REACTION DIFFUSION R D MODEL authKW 622203 2% 90% 18
6 BIAS TEMPERATURE INSTABILITY BTI authKW 491598 3% 53% 24
7 POSITIVE BIAS TEMPERATURE INSTABILITY PBTI authKW 292005 3% 36% 21
8 CHRISTIAN DOPPLER TCAD address 245807 1% 80% 8
9 HOT CARRIER INJECTION HCI authKW 228103 2% 42% 14
10 HOLE TRAPPING authKW 216618 2% 30% 19

Web of Science journal categories


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 Engineering, Electrical & Electronic 12690 72% 0% 576
2 Physics, Applied 7787 63% 0% 498
3 Computer Science, Hardware & Architecture 4257 13% 0% 105
4 Nanoscience & Nanotechnology 3550 23% 0% 183
5 Computer Science, Software Engineering 77 3% 0% 22
6 Optics 23 4% 0% 30
7 Physics, Multidisciplinary 18 4% 0% 32
8 Computer Science, Theory & Methods 12 2% 0% 14
9 Computer Science, Interdisciplinary Applications 10 2% 0% 13
10 Physics, Condensed Matter 8 4% 0% 32

Address terms


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 CHRISTIAN DOPPLER TCAD 245807 1% 80% 8
2 TU PT 153631 1% 100% 4
3 RDO PT 115224 0% 100% 3
4 DEVICE RELIABIL ELECT CHARACTERIZAT GRP 76816 0% 100% 2
5 RELIABIL GRP 68276 1% 44% 4
6 CHRISTIAN DOPPLER TCAD MICROELECT 55861 1% 36% 4
7 WIDE BANDG SEMICOND MAT DEVICES 43638 1% 23% 5
8 ALLIANCE CROLLES2 38408 0% 100% 1
9 ANALOG ENGN OPERAT ORG 38408 0% 100% 1
10 ANALOG PASS MEMORY 38408 0% 100% 1

Journals


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY 147182 8% 6% 64
2 MICROELECTRONICS RELIABILITY 96758 17% 2% 132
3 IEEE TRANSACTIONS ON ELECTRON DEVICES 28938 13% 1% 107
4 IEEE ELECTRON DEVICE LETTERS 25922 10% 1% 78
5 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS 8228 3% 1% 27
6 ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS 4103 1% 1% 9
7 IEEE DESIGN & TEST 3857 1% 3% 4
8 ACM JOURNAL ON EMERGING TECHNOLOGIES IN COMPUTING SYSTEMS 3669 1% 2% 5
9 JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS 3550 1% 1% 10
10 MICROELECTRONIC ENGINEERING 3367 4% 0% 30

Author Key Words


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class		 LCSH search Wikipedia search
1 NEGATIVE BIAS TEMPERATURE INSTABILITY NBTI 3615690 19% 63% 150 Search NEGATIVE+BIAS+TEMPERATURE+INSTABILITY+NBTI Search NEGATIVE+BIAS+TEMPERATURE+INSTABILITY+NBTI
2 NEGATIVE BIAS TEMPERATURE INSTABILITY 1265937 5% 80% 41 Search NEGATIVE+BIAS+TEMPERATURE+INSTABILITY Search NEGATIVE+BIAS+TEMPERATURE+INSTABILITY
3 NBTI 880926 10% 29% 80 Search NBTI Search NBTI
4 BIAS TEMPERATURE INSTABILITY 836780 4% 68% 32 Search BIAS+TEMPERATURE+INSTABILITY Search BIAS+TEMPERATURE+INSTABILITY
5 REACTION DIFFUSION R D MODEL 622203 2% 90% 18 Search REACTION+DIFFUSION+R+D+MODEL Search REACTION+DIFFUSION+R+D+MODEL
6 BIAS TEMPERATURE INSTABILITY BTI 491598 3% 53% 24 Search BIAS+TEMPERATURE+INSTABILITY+BTI Search BIAS+TEMPERATURE+INSTABILITY+BTI
7 POSITIVE BIAS TEMPERATURE INSTABILITY PBTI 292005 3% 36% 21 Search POSITIVE+BIAS+TEMPERATURE+INSTABILITY+PBTI Search POSITIVE+BIAS+TEMPERATURE+INSTABILITY+PBTI
8 HOT CARRIER INJECTION HCI 228103 2% 42% 14 Search HOT+CARRIER+INJECTION+HCI Search HOT+CARRIER+INJECTION+HCI
9 HOLE TRAPPING 216618 2% 30% 19 Search HOLE+TRAPPING Search HOLE+TRAPPING
10 POSITIVE CHARGES 156826 1% 58% 7 Search POSITIVE+CHARGES Search POSITIVE+CHARGES

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.


Rank Reference # ref.
in cl.		 Shr. of ref. in
cl.		 Citations
1 MANIC, I , DANKOVIC, D , PRIJIC, A , PRIJIC, Z , STOJADINOVIC, N , (2014) MEASUREMENT OF NBTI DEGRADATION IN P-CHANNEL POWER VDMOSFETS.INFORMACIJE MIDEM-JOURNAL OF MICROELECTRONICS ELECTRONIC COMPONENTS AND MATERIALS. VOL. 44. ISSUE 4. P. 280 -287 29 88% 0
2 GOEL, N , JOSHI, K , MUKHOPADHYAY, S , NANAWARE, N , MAHAPATRA, S , (2014) A COMPREHENSIVE MODELING FRAMEWORK FOR GATE STACK PROCESS DEPENDENCE OF DC AND AC NBTI IN SION AND HKMG P-MOSFETS.MICROELECTRONICS RELIABILITY. VOL. 54. ISSUE 3. P. 491-519 21 100% 7
3 DANKOVIC, D , STOJADINOVIC, N , PRIJIC, Z , MANIC, I , DAVIDOVIC, V , PRIJIC, A , DJORIC-VELJKOVIC, S , GOLUBOVIC, S , (2015) ANALYSIS OF RECOVERABLE AND PERMANENT COMPONENTS OF THRESHOLD VOLTAGE SHIFT IN NBT STRESSED P-CHANNEL POWER VDMOSFET.CHINESE PHYSICS B. VOL. 24. ISSUE 10. P. - 22 81% 0
4 ANG, DS , WANG, S , DU, GA , HU, YZ , (2008) A CONSISTENT DEEP-LEVEL HOLE TRAPPING MODEL FOR NEGATIVE BIAS TEMPERATURE INSTABILITY.IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY. VOL. 8. ISSUE 1. P. 22 -34 23 85% 25
5 STATHIS, JH , ZAFAR, S , (2006) THE NEGATIVE BIAS TEMPERATURE INSTABILITY IN MOS DEVICES: A REVIEW.MICROELECTRONICS RELIABILITY. VOL. 46. ISSUE 2-4. P. 270 -286 29 57% 178
6 DANKOVIC, D , MANIC, I , PRIJIC, A , DJORIC-VELJKOVIC, S , DAVIDOVIC, V , STOJADINOVIC, N , PRIJIC, Z , GOLUBOVIC, S , (2015) NEGATIVE BIAS TEMPERATURE INSTABILITY IN P-CHANNEL POWER VDMOSFETS: RECOVERABLE VERSUS PERMANENT DEGRADATION.SEMICONDUCTOR SCIENCE AND TECHNOLOGY. VOL. 30. ISSUE 10. P. - 21 81% 0
7 DANKOVIC, D , MANIC, I , DAVIDOVIC, V , PRIJIC, A , MARJANOVIC, M , ILIC, A , PRIJIC, Z , STOJADINOVIC, ND , (2016) ON THE RECOVERABLE AND PERMANENT COMPONENTS OF NBTI IN P-CHANNEL POWER VDMOSFETS.IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY. VOL. 16. ISSUE 4. P. 522 -531 25 66% 0
8 TAHI, H , CHENOUF, A , DJEZZAR, B , BENABDELMOUMENE, A , (2016) ON THE CIRCUIT-LEVEL RELIABILITY DEGRADATION DUE TO AC NBTI STRESS.IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY. VOL. 16. ISSUE 3. P. 290 -297 17 94% 0
9 MA, JG , ZHANG, JF , JI, ZG , BENBAKHTI, B , ZHANG, WD , ZHENG, XF , MITARD, J , KACZER, B , GROESENEKEN, G , HALL, S , ET AL (2014) CHARACTERIZATION OF NEGATIVE-BIAS TEMPERATURE INSTABILITY OF GE MOSFETS WITH GEO2/AL2O3 STACK.IEEE TRANSACTIONS ON ELECTRON DEVICES. VOL. 61. ISSUE 5. P. 1307-1315 25 66% 2
10 ANG, DS , GU, CJ , TUNG, ZY , BOO, AA , GAO, Y , (2014) EVOLUTION OF OXIDE CHARGE TRAPPING UNDER BIAS TEMPERATURE STRESSING.MICROELECTRONICS RELIABILITY. VOL. 54. ISSUE 4. P. 663 -681 27 60% 3

Classes with closest relation at Level 1


Rank Class id link
1 4469 HOT CARRIERS//HOT CARRIER DEGRADATION//CHARGE PUMPING
2 19608 SI SIO2//GE INSULATOR STRUCTURE//MICROWAVE TRANSIENT PHOTOCONDUCTIVITY
3 13793 DEVICE MODELLING GRP//RANDOM DOPANT FLUCTUATION//RANDOM DOPANT
4 3550 SRAM//PROCESS VARIATION//POWER GATING
5 2603 STRESS INDUCED LEAKAGE CURRENT//OXIDE RELIABILITY//SOFT BREAKDOWN
6 2169 IEEE TRANSACTIONS ON NUCLEAR SCIENCE//TOTAL IONIZING DOSE//OXIDE TRAPPED CHARGE
7 6002 BORON PENETRATION//NITRIDED OXIDE//OXYNITRIDATION
8 89 HFO2//HIGH K DIELECTRICS//HIGH K
9 6607 SONOS//FLASH MEMORY//NAND FLASH MEMORY
10 21091 HARDWARE SECURITY//PHYSICAL UNCLONABLE FUNCTION//HARDWARE TROJAN

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