Class information for:
Level 1: GA AS BI SOLUTION//SOVIET PHYSICS SEMICONDUCTORS-USSR//ABZU

Basic class information

Class id #P Avg. number of
references
Database coverage
of references
14797 750 17.3 43%



Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes

The table includes all classes above and classes immediately below the current class.



Cluster id Level Cluster label #P
2 4 MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER 2836879
47 3       PHYSICS, APPLIED//JOURNAL OF CRYSTAL GROWTH//PHYSICS, CONDENSED MATTER 93961
603 2             JOURNAL OF CRYSTAL GROWTH//PHYSICS, APPLIED//QUANTUM WELL INTERMIXING 14085
14797 1                   GA AS BI SOLUTION//SOVIET PHYSICS SEMICONDUCTORS-USSR//ABZU 750

Terms with highest relevance score



rank Term termType Chi square Shr. of publ. in
class containing
term
Class's shr. of
term's tot. occurrences
#P with
term in
class
1 GA AS BI SOLUTION authKW 81425 0% 100% 2
2 SOVIET PHYSICS SEMICONDUCTORS-USSR journal 51501 11% 2% 84
3 ABZU authKW 40712 0% 100% 1
4 ACCEPTOR ACCEPTOR PAIR EMISSIONS authKW 40712 0% 100% 1
5 ALGAAS GROWTH authKW 40712 0% 100% 1
6 BARBAR TEMPLE authKW 40712 0% 100% 1
7 ELECT MAT COMPONENTS S address 40712 0% 100% 1
8 ELECTRIC FIELD INDUCED DEFECT authKW 40712 0% 100% 1
9 FIRPC authKW 40712 0% 100% 1
10 GA BI SOLUTION authKW 40712 0% 100% 1

Web of Science journal categories



Rank Term Chi square Shr. of publ. in
class containing
term
Class's shr. of
term's tot. occurrences
#P with
term in
class
1 Physics, Applied 3959 47% 0% 352
2 Physics, Condensed Matter 3195 35% 0% 262
3 Crystallography 549 8% 0% 59
4 Materials Science, Multidisciplinary 293 17% 0% 126
5 Physics, Multidisciplinary 228 10% 0% 72
6 Materials Science, Coatings & Films 119 3% 0% 25
7 Engineering, Electrical & Electronic 103 9% 0% 71
8 Optics 40 5% 0% 34
9 Nanoscience & Nanotechnology 28 3% 0% 23
10 Instruments & Instrumentation 17 2% 0% 18

Address terms



Rank Term Chi square Shr. of publ. in
class containing
term
Class's shr. of
term's tot. occurrences
#P with
term in
class
1 ELECT MAT COMPONENTS S 40712 0% 100% 1
2 J AN KAGAMI MEM MAT SCI TECHNOL 40712 0% 100% 1
3 MUP COMP 40712 0% 100% 1
4 SONDER FOR BEREICH 56 BASIS 40712 0% 100% 1
5 TRANSMISS DEVICE S 40712 0% 100% 1
6 WRIGHT ELR SOLID STATE ELE DIRECTORATE 40712 0% 100% 1
7 COMMUN SYST INFORMAT 20355 0% 50% 1
8 ELR SOLID STATE ELE DIRECTORATE 20355 0% 50% 1
9 NORTEL ADV COMPONENTS 20355 0% 50% 1
10 RADIO PHYS ELE 20355 0% 50% 1

Journals



Rank Term Chi square Shr. of publ. in
class containing
term
Class's shr. of
term's tot. occurrences
#P with
term in
class
1 SOVIET PHYSICS SEMICONDUCTORS-USSR 51501 11% 2% 84
2 JOURNAL OF CRYSTAL GROWTH 3483 7% 0% 52
3 JOURNAL OF APPLIED PHYSICS 2751 11% 0% 86
4 INSTITUTE OF PHYSICS CONFERENCE SERIES 2574 3% 0% 25
5 APPLIED PHYSICS LETTERS 2343 11% 0% 81
6 SEMICONDUCTORS 1719 2% 0% 17
7 INTERNATIONAL JOURNAL OF INFRARED AND MILLIMETER WAVES 1649 2% 0% 12
8 SOLID STATE COMMUNICATIONS 1205 4% 0% 28
9 PISMA V ZHURNAL TEKHNICHESKOI FIZIKI 1147 2% 0% 12
10 SEMICONDUCTOR SCIENCE AND TECHNOLOGY 1126 2% 0% 15

Author Key Words



Rank Term Chi square Shr. of publ. in
class containing
term
Class's shr. of
term's tot. occurrences
#P with
term in
class
LCSH search Wikipedia search
1 GA AS BI SOLUTION 81425 0% 100% 2 Search GA+AS+BI+SOLUTION Search GA+AS+BI+SOLUTION
2 ABZU 40712 0% 100% 1 Search ABZU Search ABZU
3 ACCEPTOR ACCEPTOR PAIR EMISSIONS 40712 0% 100% 1 Search ACCEPTOR+ACCEPTOR+PAIR+EMISSIONS Search ACCEPTOR+ACCEPTOR+PAIR+EMISSIONS
4 ALGAAS GROWTH 40712 0% 100% 1 Search ALGAAS+GROWTH Search ALGAAS+GROWTH
5 BARBAR TEMPLE 40712 0% 100% 1 Search BARBAR+TEMPLE Search BARBAR+TEMPLE
6 ELECTRIC FIELD INDUCED DEFECT 40712 0% 100% 1 Search ELECTRIC+FIELD+INDUCED+DEFECT Search ELECTRIC+FIELD+INDUCED+DEFECT
7 FIRPC 40712 0% 100% 1 Search FIRPC Search FIRPC
8 GA BI SOLUTION 40712 0% 100% 1 Search GA+BI+SOLUTION Search GA+BI+SOLUTION
9 GA097MN003AS 40712 0% 100% 1 Search GA097MN003AS Search GA097MN003AS
10 GAAL ALGAAS 40712 0% 100% 1 Search GAAL+ALGAAS Search GAAL+ALGAAS

Core articles

The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.



Rank Reference # ref.
in cl.
Shr. of ref. in
cl.
Citations
1 MAKITA, Y , (1996) NOVEL FEATURES OF PHOTOLUMINESCENCE SPECTRA FROM ACCEPTOR-DOPED GAAS: FORMATION OF ACCEPTOR-ACCEPTOR PAIR EMISSIONS AND OPTICAL COMPENSATION EFFECT.MATERIALS SCIENCE & ENGINEERING R-REPORTS. VOL. 16. ISSUE 6-8. P. 265-398 63 43% 8
2 CHARBONNEAU, S , THEWALT, MLW , (1990) OPTICAL-PROPERTIES OF SHALLOW DEFECT-RELATED ACCEPTORS IN GAAS GROWN BY MOLECULAR-BEAM EPITAXY.PHYSICAL REVIEW B. VOL. 41. ISSUE 12. P. 8221-8228 23 100% 9
3 SKROMME, BJ , BOSE, SS , LOW, TS , LEPKOWSKI, TR , DEJULE, RY , STILLMAN, GE , HWANG, JCM , (1985) CHARACTERIZATION OF HIGH-PURITY SI-DOPED MOLECULAR-BEAM EPITAXIAL GAAS.JOURNAL OF APPLIED PHYSICS. VOL. 58. ISSUE 12. P. 4685-4702 32 82% 66
4 SZAFRANEK, I , PLANO, MA , MCCOLLUM, MJ , STOCKMAN, SA , JACKSON, SL , CHENG, KY , STILLMAN, GE , (1990) GROWTH-INDUCED SHALLOW ACCEPTOR DEFECT AND RELATED LUMINESCENCE EFFECTS IN MOLECULAR-BEAM EPITAXIAL GAAS.JOURNAL OF APPLIED PHYSICS. VOL. 68. ISSUE 2. P. 741-754 19 86% 8
5 ZEMON, S , LAMBERT, G , (1991) PHOTOLUMINESCENCE SPECTRA IN AN APPLIED MAGNETIC-FIELD FOR EXCITONS BOUND TO IONIZED DONORS IN HIGH-PURITY, EPITAXIAL GAAS.JOURNAL OF APPLIED PHYSICS. VOL. 70. ISSUE 9. P. 4909-4918 15 94% 3
6 NICKOLAENKO, AE , GILINSKY, AM , ZHURAVLEV, KS , SHEGAI, OA , SHAMIRZAEV, TS , BAKAROV, AK , ZHILYAEV, YV , FEDOROV, LM , (2006) PROLONGED DECAY OF FREE-TO-BOUND PHOTOLUMINESCENCE IN DIRECT BAND GAP INGAAS AND ALGAAS ALLOYS: MAGNETIC RESONANCE STUDIES.SEMICONDUCTOR SCIENCE AND TECHNOLOGY. VOL. 21. ISSUE 2. P. 105-111 12 67% 0
7 CHARBONNEAU, S , STEINER, T , THEWALT, MLW , (1990) PHOTOLUMINESCENCE DECAY TIMES OF THE DEFECT-INDUCED BOUND-EXCITON LINES IN GAAS GROWN BY MOLECULAR-BEAM EPITAXY.PHYSICAL REVIEW B. VOL. 41. ISSUE 5. P. 2861-2864 13 100% 6
8 JEGANATHAN, K , SARAVANAN, S , BASKAR, K , KUMAR, J , (1998) ON THE BISMUTH COMPOSITION DEPENDENT CONCENTRATION OF ARSENIC ATOMS DURING LPE GROWTH OF GAAS LAYERS FROM GA-AS-BI SOLUTION.PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE. VOL. 165. ISSUE 2. P. 437 -443 11 85% 3
9 WATKINS, SP , HAACKE, G , (1991) SOURCES OF DONOR IMPURITIES IN UNDOPED GAAS GROWN USING ARSINE AND TRIMETHYLGALLIUM.JOURNAL OF APPLIED PHYSICS. VOL. 69. ISSUE 3. P. 1625 -1630 14 88% 5
10 QURASHI, US , IQBAL, MZ , ANDERSSON, TG , (1996) PHOTOLUMINESCENCE STUDY OF AL DOPING IN GAAS GROWN BY MOLECULAR-BEAM EPITAXY.JOURNAL OF APPLIED PHYSICS. VOL. 80. ISSUE 10. P. 5932-5940 15 65% 3

Classes with closest relation at Level 1



Rank Class id link
1 28325 OVAL DEFECTS//INDIRECT GAP ALGAAS EPILAYERS//SEEIE
2 37143 DAP AND BAND BAND RECOMBINATION//NINSB NPBTE NCDTE ISOTYPE STRUCTURE//NINSB NPBTE NCDTE STRUCTURE
3 1618 JOURNAL OF CRYSTAL GROWTH//TRIMETHYLINDIUM//MOMBE
4 7474 DX CENTERS//DX CENTRES//PERSISTENT PHOTOEFFECTS
5 1145 EL2//GAAS//SEMI INSULATING GAAS
6 25211 ELECTRIC DIPOLE INDUCED SPIN RESONANCE//CYCROTRON RESONANCE//ELECTROMAGNETICALLY
7 22781 DEFECTS IN INP//FIR PC//HEAVILY DOPED N GAAS
8 16032 PHYS MICROSTRUCT//PHOTO THERMAL IONIZATION SPECTROSCOPY//HOT CARRIER INDUCED DEVICE DEGRADATION
9 27235 ODCR//DEFECTS IN HETEROSTRUCTURES//OPTICAL DETECTION OF CYCLOTRON RESONANCE
10 7568 REFLECTION MASS SPECTROMETRY//ROOT 19X ROOT 19//111B

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