Class information for:
Level 1: REFLECTION MASS SPECTROMETRY//ROOT 19X ROOT 19//111B

Basic class information
Class id #P Avg. number of
references		 Database coverage
of references
7568 1353 18.9 71%


Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
2 4 MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER 2836879
47 3       PHYSICS, APPLIED//JOURNAL OF CRYSTAL GROWTH//PHYSICS, CONDENSED MATTER 93961
247 2             GAINNAS//JOURNAL OF CRYSTAL GROWTH//DILUTE NITRIDES 19852
7568 1                   REFLECTION MASS SPECTROMETRY//ROOT 19X ROOT 19//111B 1353

Terms with highest relevance score


rank Term termType Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 REFLECTION MASS SPECTROMETRY authKW 50774 0% 75% 3
2 ROOT 19X ROOT 19 authKW 45134 0% 100% 2
3 111B authKW 33180 0% 29% 5
4 2D ISLAND authKW 30088 0% 67% 2
5 2X2 authKW 30088 0% 67% 2
6 PHYSISORBED MOLECULES authKW 30088 0% 67% 2
7 JOURNAL OF CRYSTAL GROWTH journal 25610 14% 1% 188
8 1 1 1B authKW 22567 0% 100% 1
9 3D ISLAND GROWTH authKW 22567 0% 100% 1
10 ADSORPTION ISLAND authKW 22567 0% 100% 1

Web of Science journal categories


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 Physics, Applied 10987 57% 0% 776
2 Physics, Condensed Matter 6012 36% 0% 482
3 Crystallography 4493 16% 0% 216
4 Materials Science, Coatings & Films 1500 8% 0% 108
5 Materials Science, Multidisciplinary 1188 23% 0% 313
6 Nanoscience & Nanotechnology 611 8% 0% 109
7 Chemistry, Physical 397 14% 0% 193
8 Engineering, Electrical & Electronic 281 11% 0% 148
9 Physics, Multidisciplinary 214 7% 0% 101
10 Microscopy 151 1% 0% 17

Address terms


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 EXPTL PHYS FESTKORPERPHYS ABT 22567 0% 100% 1
2 FERNMELDETECH ZENTRALAMT 22567 0% 100% 1
3 FOR UNGS OPTOELEKTR 22567 0% 100% 1
4 MICROELECT SOLIF STATE ELECT 22567 0% 100% 1
5 NOVAS MAT SEMICOND 22567 0% 100% 1
6 PHYS ASTRON SUPERCOMP 22567 0% 100% 1
7 PHYS EXPTL FESTKORPERPHYS ABT 22567 0% 100% 1
8 PHYS SOLIDE CNRS 22567 0% 100% 1
9 SCI SYST SYST ENGN GRP OHTA KU 22567 0% 100% 1
10 SERV NANOSTRUCT RAYONNEMENT 22567 0% 100% 1

Journals


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 JOURNAL OF CRYSTAL GROWTH 25610 14% 1% 188
2 SURFACE SCIENCE 12347 9% 0% 122
3 JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B 11634 7% 1% 93
4 SUPERLATTICES AND MICROSTRUCTURES 6205 3% 1% 42
5 APPLIED PHYSICS LETTERS 4159 11% 0% 145
6 INSTITUTE OF PHYSICS CONFERENCE SERIES 2035 2% 0% 30
7 PHYSICAL REVIEW B 1585 8% 0% 113
8 JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS 1535 2% 0% 29
9 JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A 1203 2% 0% 28
10 APPLIED SURFACE SCIENCE 1177 3% 0% 44

Author Key Words


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class		 LCSH search Wikipedia search
1 REFLECTION MASS SPECTROMETRY 50774 0% 75% 3 Search REFLECTION+MASS+SPECTROMETRY Search REFLECTION+MASS+SPECTROMETRY
2 ROOT 19X ROOT 19 45134 0% 100% 2 Search ROOT+19X+ROOT+19 Search ROOT+19X+ROOT+19
3 111B 33180 0% 29% 5 Search 111B Search 111B
4 2D ISLAND 30088 0% 67% 2 Search 2D+ISLAND Search 2D+ISLAND
5 2X2 30088 0% 67% 2 Search 2X2 Search 2X2
6 PHYSISORBED MOLECULES 30088 0% 67% 2 Search PHYSISORBED+MOLECULES Search PHYSISORBED+MOLECULES
7 1 1 1B 22567 0% 100% 1 Search 1+1+1B Search 1+1+1B
8 3D ISLAND GROWTH 22567 0% 100% 1 Search 3D+ISLAND+GROWTH Search 3D+ISLAND+GROWTH
9 ADSORPTION ISLAND 22567 0% 100% 1 Search ADSORPTION+ISLAND Search ADSORPTION+ISLAND
10 ALAS GROWTH MODES 22567 0% 100% 1 Search ALAS+GROWTH+MODES Search ALAS+GROWTH+MODES

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.


Rank Reference # ref.
in cl.		 Shr. of ref. in
cl.		 Citations
1 EGELHOFF, WF , JACOB, I , (1989) REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION (RHEED) OSCILLATIONS AT 77-K.PHYSICAL REVIEW LETTERS. VOL. 62. ISSUE 8. P. 921-924 47 82% 247
2 HERMAN, MA , BIMBERG, D , CHRISTEN, J , (1991) HETEROINTERFACES IN QUANTUM-WELLS AND EPITAXIAL-GROWTH PROCESSES - EVALUATION BY LUMINESCENCE TECHNIQUES.JOURNAL OF APPLIED PHYSICS. VOL. 70. ISSUE 2. P. R1-R52 89 38% 244
3 INOUE, N , (1998) ELEMENTARY PRECESSES IN MOLECULAR BEAM EPITAXY STUDIED BY IN SITU SCANNING ELECTRON MICROSCOPY.SURFACE REVIEW AND LETTERS. VOL. 5. ISSUE 3-4. P. 881-897 26 74% 2
4 SHITARA, T , VVEDENSKY, DD , WILBY, MR , ZHANG, J , NEAVE, JH , JOYCE, BA , (1992) STEP-DENSITY VARIATIONS AND REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION INTENSITY OSCILLATIONS DURING EPITAXIAL-GROWTH ON VICINAL GAAS(001).PHYSICAL REVIEW B. VOL. 46. ISSUE 11. P. 6815 -6824 23 77% 177
5 MADHUKAR, A , GHAISAS, SV , (1988) THE NATURE OF MOLECULAR-BEAM EPITAXIAL-GROWTH EXAMINED VIA COMPUTER-SIMULATIONS.CRC CRITICAL REVIEWS IN SOLID STATE AND MATERIALS SCIENCES. VOL. 14. ISSUE 1. P. 1-130 34 64% 133
6 MORET, N , OBERLI, DY , PELUCCHI, E , GOGNEAU, N , RUDRA, A , KAPON, E , (2011) OPTICS, MORPHOLOGY, AND GROWTH KINETICS OF GAAS/ALXGA1-XAS QUANTUM WELLS GROWN ON VICINAL SUBSTRATES BY METALORGANIC VAPOR PHASE EPITAXY.PHYSICAL REVIEW B. VOL. 84. ISSUE 15. P. - 26 45% 0
7 SHIN, B , LEONARD, JP , MCCAMY, JW , AZIZ, MJ , (2007) ON THE PHASE SHIFT OF REFLECTION HIGH ENERGY ELECTRON DIFFRACTION INTENSITY OSCILLATIONS DURING GE(001) HOMOEPITAXY BY MOLECULAR BEAM EPITAXY.JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A. VOL. 25. ISSUE 2. P. 221-224 15 79% 7
8 NYBERG, GL , KIEF, MT , EGELHOFF, WF , (1993) SPOT-PROFILE-ANALYZING LEED STUDY OF THE EPITAXIAL-GROWTH OF FE, CO, AND CU ON CU(100).PHYSICAL REVIEW B. VOL. 48. ISSUE 19. P. 14509 -14519 35 51% 48
9 DAWERITZ, L , PLOOG, K , (1994) CONTRIBUTION OF REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION TO NANOMETER TAILORING OF SURFACES AND INTERFACES BY MOLECULAR-BEAM EPITAXY.SEMICONDUCTOR SCIENCE AND TECHNOLOGY. VOL. 9. ISSUE 2. P. 123-136 36 48% 20
10 FOXON, CT , (1989) CURRENT UNDERSTANDING OF GROWTH MECHANISMS IN III-V MBE.JOURNAL OF CRYSTAL GROWTH. VOL. 95. ISSUE 1-4. P. 11-16 24 92% 9

Classes with closest relation at Level 1


Rank Class id link
1 13201 IN DESORPTION//ISOVALENT DELTA LAYERS//ULTRATHIN INAS LAYERS
2 13904 ULTRAMICROSCOPY//PLAN VIEW IMAGING OF SURFACES//REFLECTION HIGH ENERGY ELECTRON DIFFRACTION RHEED
3 4033 REFLECTANCE ANISOTROPY SPECTROSCOPY//REFLECTANCE DIFFERENCE SPECTROSCOPY//REFLECTION ANISOTROPY SPECTROSCOPY
4 28325 OVAL DEFECTS//INDIRECT GAP ALGAAS EPILAYERS//SEEIE
5 26048 BELOW GAP EXCITATION//OPT PL SCI TECH INGN//PHOTON RECYCLING
6 16019 INASP INP//INASP//FDN CPQD
7 3336 QUANTUM WIRE//QUANTUM WIRE LASER//SELECTIVE MBE GROWTH
8 35110 OBLIQUE INCIDENCE REFLECTIVITY DIFFERENCE OIRD//OBLIQUE INCIDENCE REFLECTIVITY DIFFERENCE//SERIES PHOTODETECTOR FREQUENCY CIRCUIT SYSTEM
9 3945 VICINAL SINGLE CRYSTAL SURFACES//STEPPED SINGLE CRYSTAL SURFACES//HIGH INDEX SINGLE CRYSTAL SURFACES
10 10313 LATERAL P N JUNCTION//411A GAAS SUBSTRATES//SUPER FLAT INTERFACES

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