Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
1145 | 2820 | 19.7 | 53% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
2 | 4 | MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER | 2836879 |
47 | 3 | PHYSICS, APPLIED//JOURNAL OF CRYSTAL GROWTH//PHYSICS, CONDENSED MATTER | 93961 |
603 | 2 | JOURNAL OF CRYSTAL GROWTH//PHYSICS, APPLIED//QUANTUM WELL INTERMIXING | 14085 |
1145 | 1 | EL2//GAAS//SEMI INSULATING GAAS | 2820 |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | EL2 | authKW | 202311 | 1% | 64% | 29 |
2 | GAAS | authKW | 64414 | 5% | 4% | 134 |
3 | SEMI INSULATING GAAS | authKW | 56864 | 1% | 31% | 17 |
4 | CARBON ACCEPTOR | authKW | 43305 | 0% | 100% | 4 |
5 | SEMI INSULATING GALLIUM ARSENIDE | authKW | 43301 | 0% | 67% | 6 |
6 | LOW EPD | authKW | 32479 | 0% | 100% | 3 |
7 | SEMIINSULATING GALLIUM ARSENIDE | authKW | 32479 | 0% | 100% | 3 |
8 | ACTIVATION EFFICIENCY | authKW | 24742 | 0% | 57% | 4 |
9 | VCZ | authKW | 24600 | 0% | 45% | 5 |
10 | GROUP III V EXCEPT NITRIDES | authKW | 24358 | 0% | 75% | 3 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Physics, Applied | 17910 | 51% | 0% | 1442 |
2 | Physics, Condensed Matter | 8819 | 30% | 0% | 854 |
3 | Crystallography | 3293 | 10% | 0% | 275 |
4 | Materials Science, Multidisciplinary | 2337 | 23% | 0% | 637 |
5 | Physics, Multidisciplinary | 1198 | 11% | 0% | 310 |
6 | Engineering, Electrical & Electronic | 397 | 10% | 0% | 269 |
7 | Materials Science, Coatings & Films | 117 | 2% | 0% | 55 |
8 | Nuclear Science & Technology | 94 | 2% | 0% | 70 |
9 | Instruments & Instrumentation | 90 | 3% | 0% | 75 |
10 | Materials Science, Characterization, Testing | 63 | 1% | 0% | 21 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | FHM | 20814 | 0% | 38% | 5 |
2 | KHERSON BRANCH | 16236 | 0% | 50% | 3 |
3 | ADV TECNOL S | 10826 | 0% | 100% | 1 |
4 | AV DIRECTORATE | 10826 | 0% | 100% | 1 |
5 | BLACKETT INTERDISCIPLINARY SEMICOND | 10826 | 0% | 100% | 1 |
6 | CDPCNRSURA 250 | 10826 | 0% | 100% | 1 |
7 | COMPOUND SEMICOND WAFER | 10826 | 0% | 100% | 1 |
8 | DEVICE MAT SECT | 10826 | 0% | 100% | 1 |
9 | DTDCNRSUMR 250 | 10826 | 0% | 100% | 1 |
10 | ECOLE PREPARATOIRE | 10826 | 0% | 100% | 1 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | JOURNAL OF APPLIED PHYSICS | 18564 | 15% | 0% | 430 |
2 | INSTITUTE OF PHYSICS CONFERENCE SERIES | 13290 | 4% | 1% | 110 |
3 | JOURNAL OF CRYSTAL GROWTH | 12489 | 7% | 1% | 191 |
4 | SOVIET PHYSICS SEMICONDUCTORS-USSR | 11997 | 3% | 1% | 79 |
5 | JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS | 7017 | 3% | 1% | 89 |
6 | SEMICONDUCTOR SCIENCE AND TECHNOLOGY | 6000 | 2% | 1% | 67 |
7 | MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY | 5379 | 2% | 1% | 61 |
8 | APPLIED PHYSICS LETTERS | 5095 | 8% | 0% | 234 |
9 | REVUE DE PHYSIQUE APPLIQUEE | 4695 | 1% | 2% | 24 |
10 | CRYSTAL RESEARCH AND TECHNOLOGY | 3758 | 2% | 1% | 48 |
Author Key Words |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | EL2 | 202311 | 1% | 64% | 29 | Search EL2 | Search EL2 |
2 | GAAS | 64414 | 5% | 4% | 134 | Search GAAS | Search GAAS |
3 | SEMI INSULATING GAAS | 56864 | 1% | 31% | 17 | Search SEMI+INSULATING+GAAS | Search SEMI+INSULATING+GAAS |
4 | CARBON ACCEPTOR | 43305 | 0% | 100% | 4 | Search CARBON+ACCEPTOR | Search CARBON+ACCEPTOR |
5 | SEMI INSULATING GALLIUM ARSENIDE | 43301 | 0% | 67% | 6 | Search SEMI+INSULATING+GALLIUM+ARSENIDE | Search SEMI+INSULATING+GALLIUM+ARSENIDE |
6 | LOW EPD | 32479 | 0% | 100% | 3 | Search LOW+EPD | Search LOW+EPD |
7 | SEMIINSULATING GALLIUM ARSENIDE | 32479 | 0% | 100% | 3 | Search SEMIINSULATING+GALLIUM+ARSENIDE | Search SEMIINSULATING+GALLIUM+ARSENIDE |
8 | ACTIVATION EFFICIENCY | 24742 | 0% | 57% | 4 | Search ACTIVATION+EFFICIENCY | Search ACTIVATION+EFFICIENCY |
9 | VCZ | 24600 | 0% | 45% | 5 | Search VCZ | Search VCZ |
10 | GROUP III V EXCEPT NITRIDES | 24358 | 0% | 75% | 3 | Search GROUP+III+V+EXCEPT+NITRIDES | Search GROUP+III+V+EXCEPT+NITRIDES |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | BOURGOIN, JC , VONBARDELEBEN, HJ , STIEVENARD, D , (1988) NATIVE DEFECTS IN GALLIUM-ARSENIDE.JOURNAL OF APPLIED PHYSICS. VOL. 64. ISSUE 9. P. R65-R91 | 138 | 86% | 223 |
2 | MANASREH, MO , FISCHER, DW , MITCHEL, WC , (1989) THE EL2 DEFECT IN GAAS - SOME RECENT DEVELOPMENTS.PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS. VOL. 154. ISSUE 1. P. 11-41 | 108 | 96% | 61 |
3 | KAMINSKA, M , WEBER, ER , (1993) EL2 DEFECT IN GAAS.IMPERFECTIONS IN III/V MATERIALS. VOL. 38. ISSUE . P. 59-89 | 91 | 99% | 36 |
4 | TRAUTMAN, P , BARANOWSKI, JM , (1995) STRUCTURE AND METASTABILITY OF THE EL2 DEFECT IN GAAS.INTERNATIONAL JOURNAL OF MODERN PHYSICS B. VOL. 9. ISSUE 11. P. 1263-1312 | 81 | 93% | 9 |
5 | KOSCHNICK, FK , SPAETH, JM , (1999) STRUCTURAL ANALYSIS OF INTRINSIC DEFECTS IN GAAS AND A1(X)GAL(1-X)AS BY MAGNETOOPTICALLY DETECTED MAGNETIC RESONANCE SPECTROSCOPY.PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS. VOL. 216. ISSUE 2. P. 817 -907 | 66 | 83% | 15 |
6 | TRAUTMAN, P , BAJ, M , BARANOWSKI, JM , (1998) HYDROSTATIC PRESSURE AND UNIAXIAL STRESS IN INVESTIGATIONS OF THE EL2 DEFECT IN GAAS.HIGH PRESSURE IN SEMICONDUCTOR PHYSICS I. VOL. 54. ISSUE . P. 427-455 | 46 | 100% | 0 |
7 | MANASREH, MO , FISCHER, DW , (1989) INFRARED-ABSORPTION PROPERTIES OF THE EL2 AND THE ISOLATED ASGA DEFECTS IN NEUTRON-TRANSMUTATION-DOPED GAAS - GENERATION OF AN EL2-LIKE DEFECT.PHYSICAL REVIEW B. VOL. 39. ISSUE 5. P. 3239-3249 | 56 | 98% | 21 |
8 | SCHULTZ, PA , VON LILIENFELD, OA , (2009) SIMPLE INTRINSIC DEFECTS IN GALLIUM ARSENIDE.MODELLING AND SIMULATION IN MATERIALS SCIENCE AND ENGINEERING. VOL. 17. ISSUE 8. P. - | 46 | 56% | 29 |
9 | MITCHEL, WC , JIMENEZ, J , (1994) PHOTOCURRENT TRANSIENTS IN SEMIINSULATING GAAS, EFFECTS OF EL2 AND OTHER DEFECTS.JOURNAL OF APPLIED PHYSICS. VOL. 75. ISSUE 6. P. 3060-3070 | 44 | 100% | 16 |
10 | PAVLOVIC, M , DESNICA, UV , GLADIC, J , (2000) COMPLETE SET OF DEEP TRAPS IN SEMI-INSULATING GAAS.JOURNAL OF APPLIED PHYSICS. VOL. 88. ISSUE 8. P. 4563-4570 | 34 | 97% | 16 |
Classes with closest relation at Level 1 |