Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
37143 | 65 | 13.1 | 28% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
2 | 4 | MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER | 2836879 |
47 | 3 | PHYSICS, APPLIED//JOURNAL OF CRYSTAL GROWTH//PHYSICS, CONDENSED MATTER | 93961 |
603 | 2 | JOURNAL OF CRYSTAL GROWTH//PHYSICS, APPLIED//QUANTUM WELL INTERMIXING | 14085 |
37143 | 1 | DAP AND BAND BAND RECOMBINATION//NINSB NPBTE NCDTE ISOTYPE STRUCTURE//NINSB NPBTE NCDTE STRUCTURE | 65 |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | DAP AND BAND BAND RECOMBINATION | authKW | 469780 | 2% | 100% | 1 |
2 | NINSB NPBTE NCDTE ISOTYPE STRUCTURE | authKW | 469780 | 2% | 100% | 1 |
3 | NINSB NPBTE NCDTE STRUCTURE | authKW | 469780 | 2% | 100% | 1 |
4 | PHOTOCURRENT CAPACITANCE METHOD | authKW | 469780 | 2% | 100% | 1 |
5 | SILICIDE BARRIER | authKW | 469780 | 2% | 100% | 1 |
6 | ULTRAVIOLET AND LIGHT BLUE RADIATION | authKW | 469780 | 2% | 100% | 1 |
7 | PV CHARACTERISTICS | authKW | 234889 | 2% | 50% | 1 |
8 | GE SI HETEROJUNCTION | authKW | 78295 | 2% | 17% | 1 |
9 | ELE MAT | address | 24723 | 2% | 5% | 1 |
10 | GAN LED | authKW | 21352 | 2% | 5% | 1 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Physics, Applied | 407 | 51% | 0% | 33 |
2 | Physics, Condensed Matter | 370 | 40% | 0% | 26 |
3 | Physics, Multidisciplinary | 76 | 17% | 0% | 11 |
4 | Materials Science, Coatings & Films | 67 | 8% | 0% | 5 |
5 | Instruments & Instrumentation | 32 | 8% | 0% | 5 |
6 | Spectroscopy | 27 | 6% | 0% | 4 |
7 | Materials Science, Multidisciplinary | 26 | 17% | 0% | 11 |
8 | Engineering, Electrical & Electronic | 25 | 14% | 0% | 9 |
9 | Optics | 8 | 6% | 0% | 4 |
10 | Materials Science, Characterization, Testing | 8 | 2% | 0% | 1 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | ELE MAT | 24723 | 2% | 5% | 1 |
2 | RADIOPHYS ELECT | 3346 | 3% | 0% | 2 |
3 | ELECT ELECT COMP ENGN | 1388 | 5% | 0% | 3 |
4 | SEZ CAGLIARI | 965 | 2% | 0% | 1 |
5 | RADIOENGN ELECT | 517 | 2% | 0% | 1 |
6 | CYBERNET | 260 | 2% | 0% | 1 |
7 | STRUCT | 171 | 2% | 0% | 1 |
8 | PHYS SOLIDES | 127 | 2% | 0% | 1 |
9 | PHYS ENGN | 67 | 2% | 0% | 1 |
10 | ELECT COMP ENGN | 43 | 6% | 0% | 4 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | SOVIET PHYSICS SEMICONDUCTORS-USSR | 5392 | 12% | 0% | 8 |
2 | JOURNAL OF CONTEMPORARY PHYSICS-ARMENIAN ACADEMY OF SCIENCES | 4219 | 3% | 0% | 2 |
3 | SEMICONDUCTORS | 624 | 5% | 0% | 3 |
4 | PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE | 579 | 8% | 0% | 5 |
5 | CHINESE PHYSICS-ENGLISH TR | 565 | 2% | 0% | 1 |
6 | SOLAR CELLS | 491 | 2% | 0% | 1 |
7 | SOLID-STATE ELECTRONICS | 425 | 5% | 0% | 3 |
8 | INDUSTRIAL LABORATORY | 364 | 2% | 0% | 1 |
9 | REVUE DE PHYSIQUE APPLIQUEE | 355 | 2% | 0% | 1 |
10 | USPEKHI FIZICHESKIKH NAUK | 327 | 2% | 0% | 1 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | WEE, D , PARISH, G , NENER, BD , (2012) THE INFLUENCE OF THE FRANZ-KELDYSH EFFECT ON THE ELECTRON DIFFUSION LENGTH IN P-TYPE GAN DETERMINED USING THE SPECTRAL PHOTOCURRENT TECHNIQUE.JOURNAL OF APPLIED PHYSICS. VOL. 112. ISSUE 4. P. - | 5 | 71% | 0 |
2 | AVJYAN, KE , VARDANYAN, GH , GRIGORYAN, RP , KHACHATRYAN, AM , (2008) PHOTOELECTRIC PROPERTIES OF NINSB-NPBTE-NCDTE ISOTYPE STRUCTURE PREPARED BY VACUUM PULSED-LASER DEPOSITION TECHNIQUE.JOURNAL OF CONTEMPORARY PHYSICS-ARMENIAN ACADEMY OF SCIENCES. VOL. 43. ISSUE 3. P. 139-141 | 2 | 100% | 0 |
3 | CHAMPNESS, CH , (2007) DIFFUSION LENGTH VARIATION IN PHOTOVOLTAIC CELLS WITH BRIDGMAN-GROWN CUINSE2 SUBSTRATES.THIN SOLID FILMS. VOL. 515. ISSUE 15. P. 6200 -6203 | 2 | 100% | 2 |
4 | KHUDAVERDYAN, S , DOKHOLYAN, J , KHUDAVERDYAN, A , GRIGORYAN, K , (2007) SPECTROPHOTOMETRIC FILTERLESS PHOTO-DETECTOR.JOURNAL OF PHYSICS D-APPLIED PHYSICS. VOL. 40. ISSUE 24. P. 7669-7674 | 4 | 50% | 0 |
5 | KHUDAVERDYAN, SK , DOKHOLYAN, JG , KOCHARYAN, AA , KECHIYANTZ, AM , KHUDAVERDYAN, DS , (2005) ON FUNCTIONAL POTENTIALITY OF PHOTODIODE STRUCTURES WITH A HIGH-RESISTANCE LAYER.SOLID-STATE ELECTRONICS. VOL. 49. ISSUE 4. P. 634-639 | 2 | 100% | 4 |
6 | KHUDAVERDYAN, S , KOCHARYAN, A , DOKHOLYAN, J , (2005) PHOTORECEIVER STRUCTURES WITH EXTENDED FUNCTIONAL POTENTIALITY ON THE CDTE BASE.JOURNAL OF PHYSICS D-APPLIED PHYSICS. VOL. 38. ISSUE 2. P. 272-275 | 2 | 100% | 2 |
7 | CHAMPNESS, CH , CHAN, CH , (1993) PHOTOCURRENT CAPACITANCE METHOD OF DIFFUSION LENGTH MEASUREMENT.SOLAR ENERGY MATERIALS AND SOLAR CELLS. VOL. 30. ISSUE 1. P. 65-75 | 3 | 100% | 1 |
8 | CHAMPNESS, CH , (2003) DIFFUSION LENGTH ESTIMATION IN CUINSE2-BASED CELLS BY THE PHOTOCURRENT-CAPACITANCE METHOD.THIN SOLID FILMS. VOL. 431. ISSUE . P. 172-175 | 2 | 100% | 4 |
9 | BAIMBETOV, FB , DZHUMAMUKHAMBETOV, NG , (1998) EFFECT OF LASER-INDUCED DEFECTS ON LUMINESCENCE IN INP CRYSTALS.SEMICONDUCTORS. VOL. 32. ISSUE 11. P. 1187-1189 | 2 | 100% | 0 |
10 | SUKEGAWA, T , TAKEUCHI, S , HASEGAWA, S , UENO, H , TANAKA, A , (1988) MEASUREMENT OF OPTICAL-ABSORPTION COEFFICIENT AND MINORITY-CARRIER DIFFUSION LENGTH IN GAAS1-XPX SCHOTTKY-BARRIER PHOTODIODES.APPLIED SURFACE SCIENCE. VOL. 33-4. ISSUE . P. 1044-1050 | 3 | 100% | 1 |
Classes with closest relation at Level 1 |