Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
23322 | 350 | 16.2 | 43% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | BURN IN | authKW | 1663069 | 13% | 41% | 46 |
2 | OPTIMAL BURN IN | authKW | 785189 | 3% | 100% | 9 |
3 | BATHTUB SHAPED FAILURE RATE | authKW | 702090 | 4% | 62% | 13 |
4 | OPTIMAL BURN IN TIME | authKW | 534363 | 2% | 88% | 7 |
5 | BATHTUB FAILURE RATE | authKW | 527812 | 3% | 55% | 11 |
6 | STOCHASTICALLY ORDERED SUBPOPULATIONS | authKW | 448678 | 2% | 86% | 6 |
7 | BATHTUB SHAPED FAILURE RATE FUNCTION | authKW | 436216 | 1% | 100% | 5 |
8 | ENVIRONMENTAL STRESS SCREENING ESS | authKW | 436216 | 1% | 100% | 5 |
9 | GENERAL FAILURE MODEL | authKW | 392591 | 2% | 75% | 6 |
10 | CS MANAGEMENT | address | 388624 | 2% | 64% | 7 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Statistics & Probability | 6111 | 32% | 0% | 113 |
2 | Operations Research & Management Science | 5409 | 28% | 0% | 99 |
3 | Engineering, Industrial | 2943 | 16% | 0% | 56 |
4 | Computer Science, Hardware & Architecture | 2774 | 16% | 0% | 56 |
5 | Computer Science, Software Engineering | 1440 | 15% | 0% | 53 |
6 | Engineering, Electrical & Electronic | 1052 | 33% | 0% | 116 |
7 | Engineering, General | 225 | 7% | 0% | 23 |
8 | Demography | 198 | 2% | 0% | 7 |
9 | Nanoscience & Nanotechnology | 143 | 8% | 0% | 27 |
10 | Mathematics, Interdisciplinary Applications | 116 | 5% | 0% | 16 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | CS MANAGEMENT | 388624 | 2% | 64% | 7 |
2 | BCN ACCESS GRP | 87243 | 0% | 100% | 1 |
3 | DPTO METODOS CUANTITAT ECON | 87243 | 0% | 100% | 1 |
4 | ECON CHANGE AREA | 87243 | 0% | 100% | 1 |
5 | EDF RD MAT ELECT | 87243 | 0% | 100% | 1 |
6 | EQUIPE MIRAUMR UM2 5214 | 87243 | 0% | 100% | 1 |
7 | FIELD QUAL RELIABIL | 87243 | 0% | 100% | 1 |
8 | MFG TECHNOL PROJECTS | 87243 | 0% | 100% | 1 |
9 | MLS BUSINESS | 87243 | 0% | 100% | 1 |
10 | MTODOS CUANTITAT INFORMAT | 87243 | 0% | 100% | 1 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | IEEE TRANSACTIONS ON RELIABILITY | 69059 | 14% | 2% | 49 |
2 | JOURNAL OF APPLIED PROBABILITY | 22627 | 9% | 1% | 30 |
3 | APPLIED STOCHASTIC MODELS IN BUSINESS AND INDUSTRY | 20712 | 4% | 2% | 13 |
4 | PROBABILITY IN THE ENGINEERING AND INFORMATIONAL SCIENCES | 12551 | 3% | 1% | 10 |
5 | JOURNAL OF THE INSTITUTE OF ENVIRONMENTAL SCIENCES | 10902 | 1% | 6% | 2 |
6 | NAVAL RESEARCH LOGISTICS | 9640 | 4% | 1% | 15 |
7 | RELIABILITY ENGINEERING & SYSTEM SAFETY | 9123 | 6% | 1% | 21 |
8 | MICROELECTRONICS RELIABILITY | 7855 | 7% | 0% | 25 |
9 | JOURNAL OF THE IES | 6707 | 1% | 4% | 2 |
10 | MICROELECTRONICS AND RELIABILITY | 6538 | 3% | 1% | 9 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | ULUSOY, SK , MAZZUCHI, TA , PERLSTEIN, D , (2011) BAYESIAN CALCULATION OF OPTIMAL BURN-IN TIME USING THE JOINT CRITERIA OF COST AND DELIVERED RELIABILITY.QUALITY AND RELIABILITY ENGINEERING INTERNATIONAL. VOL. 27. ISSUE 4. P. 569-580 | 21 | 91% | 5 |
2 | CHA, JH , FINKELSTEIN, M , (2010) BURN-IN BY ENVIRONMENTAL SHOCKS FOR TWO ORDERED SUBPOPULATIONS.EUROPEAN JOURNAL OF OPERATIONAL RESEARCH. VOL. 206. ISSUE 1. P. 111 -117 | 19 | 100% | 12 |
3 | CHA, JH , FINKELSTEIN, M , (2010) STOCHASTICALLY ORDERED SUBPOPULATIONS AND OPTIMAL BURN-IN PROCEDURE.IEEE TRANSACTIONS ON RELIABILITY. VOL. 59. ISSUE 4. P. 635 -643 | 20 | 95% | 11 |
4 | KIM, KO , KUO, W , (2009) OPTIMAL BURN-IN FOR MAXIMIZING RELIABILITY OF REPAIRABLE NON-SERIES SYSTEMS.EUROPEAN JOURNAL OF OPERATIONAL RESEARCH. VOL. 193. ISSUE 1. P. 140 -151 | 18 | 86% | 16 |
5 | KIM, KO , KUO, W , (2011) COMPONENT AND SYSTEM BURN-IN FOR REPAIRABLE SYSTEMS.IIE TRANSACTIONS. VOL. 43. ISSUE 11. P. 773-782 | 18 | 82% | 1 |
6 | CHA, JH , YAMAMOTO, H , YUN, WY , (2008) OPTIMAL BURN-IN FOR MINIMIZING TOTAL WARRANTY COST.IEICE TRANSACTIONS ON FUNDAMENTALS OF ELECTRONICS COMMUNICATIONS AND COMPUTER SCIENCES. VOL. E91A. ISSUE 2. P. 633 -641 | 22 | 71% | 8 |
7 | CHA, JH , FINKELSTEIN, M , (2012) SHOCKS AS BURN-IN IN HETEROGENEOUS POPULATIONS.COMMUNICATIONS IN STATISTICS-THEORY AND METHODS. VOL. 41. ISSUE 2. P. 325-340 | 15 | 94% | 2 |
8 | SHAFIEE, M , CHUKOVA, S , YUN, WY , (2014) OPTIMAL BURN-IN AND WARRANTY FOR A PRODUCT WITH POST-WARRANTY FAILURE PENALTY.INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY. VOL. 70. ISSUE 1-4. P. 297-307 | 20 | 65% | 4 |
9 | CHA, JH , FINKELSTEIN, M , (2011) BURN-IN AND THE PERFORMANCE QUALITY MEASURES IN HETEROGENEOUS POPULATIONS.EUROPEAN JOURNAL OF OPERATIONAL RESEARCH. VOL. 210. ISSUE 2. P. 273 -280 | 14 | 93% | 8 |
10 | CHA, JH , (2006) AN EXTENDED MODEL FOR OPTIMAL BURN-IN PROCEDURES.IEEE TRANSACTIONS ON RELIABILITY. VOL. 55. ISSUE 2. P. 189-198 | 20 | 74% | 8 |
Classes with closest relation at Level 1 |