Class information for:
Level 1: SRAM//PROCESS VARIATION//POWER GATING

Basic class information
Class id #P Avg. number of
references		 Database coverage
of references
3550 1961 21.6 46%


Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
9 4 COMPUTER SCIENCE, THEORY & METHODS//COMPUTER SCIENCE, ARTIFICIAL INTELLIGENCE//COMPUTER SCIENCE, INFORMATION SYSTEMS 1247339
264 3       COMPUTER SCIENCE, HARDWARE & ARCHITECTURE//IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS//ENGINEERING, ELECTRICAL & ELECTRONIC 44494
470 2             COMPUTER SCIENCE, HARDWARE & ARCHITECTURE//IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS//NETWORK ON CHIP 15913
3550 1                   SRAM//PROCESS VARIATION//POWER GATING 1961

Terms with highest relevance score


rank Term termType Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 SRAM authKW 1388297 12% 39% 229
2 PROCESS VARIATION authKW 1094625 10% 35% 203
3 POWER GATING authKW 599457 4% 51% 76
4 MTCMOS authKW 455515 2% 91% 32
5 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS journal 411148 15% 9% 299
6 LEAKAGE POWER authKW 391329 3% 47% 54
7 LOW POWER authKW 328070 13% 8% 250
8 STATIC NOISE MARGIN authKW 300790 2% 60% 32
9 SUBTHRESHOLD LEAKAGE authKW 294866 1% 76% 25
10 VOLTAGE SCALING authKW 283094 2% 43% 42

Web of Science journal categories


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with term
in class
1 Computer Science, Hardware & Architecture 110629 42% 1% 827
2 Engineering, Electrical & Electronic 46236 87% 0% 1714
3 Computer Science, Software Engineering 1504 7% 0% 134
4 Computer Science, Interdisciplinary Applications 1181 7% 0% 141
5 Computer Science, Theory & Methods 455 5% 0% 95
6 Computer Science, Information Systems 397 4% 0% 84
7 Nanoscience & Nanotechnology 365 6% 0% 109
8 Physics, Applied 146 9% 0% 171
9 Telecommunications 32 2% 0% 34
10 Engineering, Manufacturing 30 1% 0% 19

Address terms


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 LOW POWER CIRCUITS SYST 46709 0% 100% 3
2 CIRCUIT 45737 1% 24% 12
3 CIRCUITS 38314 0% 31% 8
4 SYST ULSI ENGN 35030 0% 75% 3
5 EMERGING NANOSCALED INTEGRATED CIRCUITS ENICS 31139 0% 100% 2
6 GR H PERFORMANCE GRP 3D 31139 0% 100% 2
7 INTEGRATED CIRCUITS ELECT ICE 31139 0% 100% 2
8 NANOCAD 31139 0% 100% 2
9 INTEGRATED CIRCUITS ELECT 28023 0% 60% 3
10 SOC AIM HI 28023 0% 60% 3

Journals


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS 411148 15% 9% 299
2 IEEE JOURNAL OF SOLID-STATE CIRCUITS 172400 15% 4% 302
3 IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS 59223 7% 3% 136
4 INTEGRATION-THE VLSI JOURNAL 44211 3% 5% 53
5 ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS 32919 2% 5% 40
6 IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS 28867 4% 2% 86
7 IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS 16822 4% 1% 76
8 MICROELECTRONICS JOURNAL 15030 3% 2% 61
9 IEICE TRANSACTIONS ON ELECTRONICS 13376 4% 1% 72
10 IEEE MICRO 12234 2% 3% 31

Author Key Words


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class		 LCSH search Wikipedia search
1 SRAM 1388297 12% 39% 229 Search SRAM Search SRAM
2 PROCESS VARIATION 1094625 10% 35% 203 Search PROCESS+VARIATION Search PROCESS+VARIATION
3 POWER GATING 599457 4% 51% 76 Search POWER+GATING Search POWER+GATING
4 MTCMOS 455515 2% 91% 32 Search MTCMOS Search MTCMOS
5 LEAKAGE POWER 391329 3% 47% 54 Search LEAKAGE+POWER Search LEAKAGE+POWER
6 LOW POWER 328070 13% 8% 250 Search LOW+POWER Search LOW+POWER
7 STATIC NOISE MARGIN 300790 2% 60% 32 Search STATIC+NOISE+MARGIN Search STATIC+NOISE+MARGIN
8 SUBTHRESHOLD LEAKAGE 294866 1% 76% 25 Search SUBTHRESHOLD+LEAKAGE Search SUBTHRESHOLD+LEAKAGE
9 VOLTAGE SCALING 283094 2% 43% 42 Search VOLTAGE+SCALING Search VOLTAGE+SCALING
10 STATIC RANDOM ACCESS MEMORY SRAM 269078 2% 39% 44 Search STATIC+RANDOM+ACCESS+MEMORY+SRAM Search STATIC+RANDOM+ACCESS+MEMORY+SRAM

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.


Rank Reference # ref.
in cl.		 Shr. of ref. in
cl.		 Citations
1 RAHIMI, A , BENINI, L , GUPTA, RK , (2016) VARIABILITY MITIGATION IN NANOMETER CMOS INTEGRATED SYSTEMS: A SURVEY OF TECHNIQUES FROM CIRCUITS TO SOFTWARE.PROCEEDINGS OF THE IEEE. VOL. 104. ISSUE 7. P. 1410 -1448 41 79% 1
2 ALIOTO, M , (2012) ULTRA-LOW POWER VLSI CIRCUIT DESIGN DEMYSTIFIED AND EXPLAINED: A TUTORIAL.IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS. VOL. 59. ISSUE 1. P. 3 -29 30 94% 73
3 PAL, S , ISLAM, A , (2016) 9-T SRAM CELL FOR RELIABLE ULTRALOW-POWER APPLICATIONS AND SOLVING MULTIBIT SOFT-ERROR ISSUE.IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY. VOL. 16. ISSUE 2. P. 172 -182 32 97% 0
4 TU, MH , LIN, JY , TSAI, MC , LU, CY , LIN, YJ , WANG, MH , HUANG, HS , LEE, KD , SHIH, WC , JOU, SJ , ET AL (2012) A SINGLE-ENDED DISTURB-FREE 9T SUBTHRESHOLD SRAM WITH CROSS-POINT DATA-AWARE WRITE WORD-LINE STRUCTURE, NEGATIVE BIT-LINE, AND ADAPTIVE READ OPERATION TIMING TRACING.IEEE JOURNAL OF SOLID-STATE CIRCUITS. VOL. 47. ISSUE 6. P. 1469 -1482 28 97% 25
5 PAL, S , ISLAM, A , (2016) VARIATION TOLERANT DIFFERENTIAL 8T SRAM CELL FOR ULTRALOW POWER APPLICATIONS.IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS. VOL. 35. ISSUE 4. P. 549 -558 28 97% 0
6 ASYAEI, M , (2015) A NEW LEAKAGE-TOLERANT DOMINO CIRCUIT USING VOLTAGE-COMPARISON FOR WIDE FAN-IN GATES IN DEEP SUB-MICRON TECHNOLOGY.INTEGRATION-THE VLSI JOURNAL. VOL. 51. ISSUE . P. 61 -71 25 96% 2
7 WEN, L , LI, ZT , LI, Y , (2013) SINGLE-ENDED, ROBUST 8T SRAM CELL FOR LOW-VOLTAGE OPERATION.MICROELECTRONICS JOURNAL. VOL. 44. ISSUE 8. P. 718 -728 24 100% 10
8 ZHANG, ZB , KAVOUSIANOS, X , CHAKRABARTY, K , TSIATOUHAS, Y , (2014) STATIC POWER REDUCTION USING VARIATION-TOLERANT AND RECONFIGURABLE MULTI-MODE POWER SWITCHES.IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS. VOL. 22. ISSUE 1. P. 13 -26 23 100% 6
9 JIAO, HL , QIU, YM , KURSUN, V , (2016) VARIABILITY-AWARE 7T SRAM CIRCUIT WITH LOW LEAKAGE HIGH DATA STABILITY SLEEP MODE.INTEGRATION-THE VLSI JOURNAL. VOL. 53. ISSUE . P. 68 -79 25 93% 0
10 JIAO, HL , QIU, YM , KURSUN, V , (2016) LOW POWER AND ROBUST MEMORY CIRCUITS WITH ASYMMETRICAL GROUND GATING.MICROELECTRONICS JOURNAL. VOL. 48. ISSUE . P. 109 -119 23 96% 0

Classes with closest relation at Level 1


Rank Class id link
1 13793 DEVICE MODELLING GRP//RANDOM DOPANT FLUCTUATION//RANDOM DOPANT
2 22822 FLIP FLOP//PULSED LATCH//LEVEL CONVERTER
3 14061 NEGATIVE BIAS TEMPERATURE INSTABILITY NBTI//NEGATIVE BIAS TEMPERATURE INSTABILITY//NBTI
4 12775 IEEE JOURNAL OF SOLID-STATE CIRCUITS//EMBEDDED DRAM//DRAM
5 15984 POWER ESTIMATION//SWITCHING ACTIVITY//BUS ENCODING
6 30713 ADIABATIC CIRCUIT//ADIABATIC LOGIC//ADIABATIC CHARGING
7 5076 BUFFER INSERTION//CLOCK SKEW//IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS
8 17149 SUBSTRATE NOISE//SUBSTRATE COUPLING//POWER SUPPLY NOISE
9 8568 MULTIPLE VALUED LOGIC//FULL ADDER//FIXED WIDTH MULTIPLIER
10 4186 BRANCH PREDICTION//THREAD LEVEL SPECULATION//ACM TRANSACTIONS ON ARCHITECTURE AND CODE OPTIMIZATION

Go to start page