Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
24750 | 302 | 14.8 | 37% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | DIRECT POWER INJECTION DPI | authKW | 606660 | 2% | 100% | 6 |
2 | AFDELING ESAT MICAS | address | 323550 | 1% | 80% | 4 |
3 | IMMUNITY TO ELECTROMAGNETIC INTERFERENCES | authKW | 303330 | 1% | 100% | 3 |
4 | CAN TRANSCEIVER | authKW | 202220 | 1% | 100% | 2 |
5 | CEA DAM CEG | address | 202220 | 1% | 100% | 2 |
6 | DIRECT POWER INJECTION | authKW | 202220 | 1% | 100% | 2 |
7 | ELECTROMAGNETIC SHIELDING PLYWOOD | authKW | 202220 | 1% | 100% | 2 |
8 | IMMUNITY MODELLING | authKW | 202220 | 1% | 100% | 2 |
9 | SHANGHAI ENGN AUTOMOT ELECT | address | 202220 | 1% | 100% | 2 |
10 | BULK CURRENT INJECTION BCI | authKW | 202216 | 1% | 50% | 4 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Engineering, Electrical & Electronic | 7067 | 87% | 0% | 263 |
2 | Telecommunications | 2968 | 26% | 0% | 80 |
3 | Nanoscience & Nanotechnology | 588 | 16% | 0% | 47 |
4 | Physics, Applied | 216 | 20% | 0% | 59 |
5 | Computer Science, Hardware & Architecture | 53 | 3% | 0% | 8 |
6 | Instruments & Instrumentation | 30 | 4% | 0% | 12 |
7 | Engineering, General | 6 | 2% | 0% | 5 |
8 | Materials Science, Paper & Wood | 6 | 1% | 0% | 2 |
9 | Automation & Control Systems | 6 | 1% | 0% | 4 |
10 | Transportation Science & Technology | 5 | 1% | 0% | 2 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | AFDELING ESAT MICAS | 323550 | 1% | 80% | 4 |
2 | CEA DAM CEG | 202220 | 1% | 100% | 2 |
3 | SHANGHAI ENGN AUTOMOT ELECT | 202220 | 1% | 100% | 2 |
4 | ELN DPT | 134812 | 1% | 67% | 2 |
5 | ADFELING ESAT | 101110 | 0% | 100% | 1 |
6 | ATV MC D IPI EMC | 101110 | 0% | 100% | 1 |
7 | DETECT TECHNOL AUTOMAT | 101110 | 0% | 100% | 1 |
8 | EA 2654 | 101110 | 0% | 100% | 1 |
9 | EMBEDDED SYST IRSEEM | 101110 | 0% | 100% | 1 |
10 | EMC PLATFORM CIRCUITS AUTONOMOUS MOBILE SYST C | 101110 | 0% | 100% | 1 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY | 146425 | 22% | 2% | 67 |
2 | MICROELECTRONICS RELIABILITY | 14946 | 11% | 0% | 32 |
3 | MICROELECTRONICS JOURNAL | 5155 | 5% | 0% | 14 |
4 | JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE | 2977 | 1% | 1% | 4 |
5 | ELECTRONICS LETTERS | 2622 | 11% | 0% | 32 |
6 | IET SCIENCE MEASUREMENT & TECHNOLOGY | 2564 | 1% | 1% | 4 |
7 | INTERNATIONAL JOURNAL OF ELECTRONICS | 2522 | 4% | 0% | 11 |
8 | ACTA POLYTECHNICA HUNGARICA | 2326 | 1% | 1% | 4 |
9 | IEE REVIEW | 1886 | 1% | 1% | 2 |
10 | COMPUTING & CONTROL ENGINEERING JOURNAL | 1540 | 1% | 1% | 2 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | RICHELLI, A , MATIG-A, G , REDOUTE, JM , (2015) DESIGN OF A FOLDED CASCODE OPAMP WITH INCREASED IMMUNITY TO CONDUCTED ELECTROMAGNETIC INTERFERENCE IN 0.18 MU M CMOS.MICROELECTRONICS RELIABILITY. VOL. 55. ISSUE 3-4. P. 654 -661 | 16 | 76% | 1 |
2 | COCCOLI, A , RICHELLI, A , REDOUTE, JM , (2016) EMI SUSCEPTIBILITY OF A DIGITALLY BASED ANALOG AMPLIFIER IN A 180-NM CMOS PROCESS.IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY. VOL. 58. ISSUE 4. P. 1236 -1239 | 10 | 100% | 0 |
3 | RICHELLI, A , (2016) EMI SUSCEPTIBILITY ISSUE IN ANALOG FRONT-END FOR SENSOR APPLICATIONS.JOURNAL OF SENSORS. VOL. . ISSUE . P. - | 16 | 57% | 1 |
4 | FIORI, F , (2014) SUSCEPTIBILITY OF SMART POWER ICS TO RADIO FREQUENCY INTERFERENCE.IEEE TRANSACTIONS ON POWER ELECTRONICS. VOL. 29. ISSUE 6. P. 2787 -2797 | 14 | 67% | 2 |
5 | SU, T , UNGER, M , STEINECKE, T , WEIGEL, R , (2012) DEGRADATION OF THE CONDUCTED RADIO FREQUENCY IMMUNITY OF MICROCONTROLLERS DUE TO ELECTROMAGNETIC RESONANCES IN FOOT-POINT LOOPS.IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY. VOL. 54. ISSUE 4. P. 772-784 | 11 | 85% | 1 |
6 | YU, JJ , AMER, A , SANCHEZ-SINENCIO, E , (2014) ELECTROMAGNETIC INTERFERENCE RESISTING OPERATIONAL AMPLIFIER.IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS. VOL. 61. ISSUE 7. P. 1917 -1927 | 8 | 100% | 4 |
7 | RAMDANI, M , SICARD, E , BOYER, A , BEN DHIA, S , WHALEN, JJ , HUBING, TH , COENEN, M , WADA, O , (2009) THE ELECTROMAGNETIC COMPATIBILITY OF INTEGRATED CIRCUITS-PAST, PRESENT, AND FUTURE.IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY. VOL. 51. ISSUE 1. P. 78-100 | 18 | 41% | 85 |
8 | REDOUTE, JM , STEYAERT, MSJ , (2010) EMI-RESISTANT CMOS DIFFERENTIAL INPUT STAGES.IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS. VOL. 57. ISSUE 2. P. 323-331 | 8 | 100% | 11 |
9 | FIORI, F , (2016) A SENSOR SIGNAL AMPLIFIER RESILIENT TO EMI.IEEE SENSORS JOURNAL. VOL. 16. ISSUE 18. P. 7008 -7015 | 10 | 71% | 0 |
10 | BOYAPATI, S , REDOUTE, JM , BAGHINI, MS , (2016) MODELING AND DESIGN OF EMI-IMMUNE OPAMPS IN 0.18-MU M CMOS TECHNOLOGY.IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY. VOL. 58. ISSUE 5. P. 1609 -1616 | 8 | 89% | 0 |
Classes with closest relation at Level 1 |