Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
7126 | 1402 | 18.1 | 60% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
2 | 4 | MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER | 2836879 |
6 | 3 | PHYSICS, APPLIED//IEEE TRANSACTIONS ON ELECTRON DEVICES//SILICON | 155028 |
1299 | 2 | SIGE//STRAINED SI//VIRTUAL SUBSTRATE | 8578 |
7126 | 1 | ATOMIC LAYER DOPING//SELECTIVE EPITAXIAL GROWTH//SI EPITAXIAL GROWTH | 1402 |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | ATOMIC LAYER DOPING | authKW | 340265 | 2% | 63% | 25 |
2 | SELECTIVE EPITAXIAL GROWTH | authKW | 258342 | 2% | 38% | 31 |
3 | SI EPITAXIAL GROWTH | authKW | 133390 | 0% | 88% | 7 |
4 | ELEVATED SOURCE DRAIN | authKW | 131748 | 1% | 55% | 11 |
5 | GERMANIUM SILICON COMPOUNDS | authKW | 112000 | 0% | 86% | 6 |
6 | ELECT INTELLIGENT SYST | address | 104884 | 2% | 15% | 33 |
7 | RPCVD | authKW | 97993 | 1% | 50% | 9 |
8 | SIGE | authKW | 92782 | 5% | 6% | 73 |
9 | ATOMICALLY CONTROLLED PROCESSING | authKW | 87113 | 0% | 100% | 4 |
10 | REDUCED PRESSURE CHEMICAL VAPOUR | authKW | 87113 | 0% | 100% | 4 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Materials Science, Coatings & Films | 18422 | 26% | 0% | 368 |
2 | Physics, Applied | 14025 | 63% | 0% | 887 |
3 | Electrochemistry | 2970 | 13% | 0% | 179 |
4 | Physics, Condensed Matter | 2636 | 24% | 0% | 337 |
5 | Engineering, Electrical & Electronic | 2368 | 26% | 0% | 359 |
6 | Crystallography | 2084 | 11% | 0% | 153 |
7 | Materials Science, Multidisciplinary | 1810 | 27% | 0% | 381 |
8 | Nanoscience & Nanotechnology | 270 | 6% | 0% | 79 |
9 | Physics, Multidisciplinary | 42 | 4% | 0% | 61 |
10 | Chemistry, Physical | 3 | 5% | 0% | 66 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | ELECT INTELLIGENT SYST | 104884 | 2% | 15% | 33 |
2 | NANOELECT SPINTRON | 82949 | 3% | 11% | 36 |
3 | MUSASHINO OFF | 81980 | 1% | 47% | 8 |
4 | ELECT COMMUN | 31787 | 5% | 2% | 77 |
5 | MICROELECT INFORMAT TECHNOL IMIT | 29036 | 0% | 67% | 2 |
6 | INTEGRATED DEVICES CIRCUITS | 28648 | 0% | 26% | 5 |
7 | 300MM DEV PROGRAM | 21778 | 0% | 100% | 1 |
8 | ADV PROC TEAM 3 | 21778 | 0% | 100% | 1 |
9 | ADVANCE TECHOL DEV | 21778 | 0% | 100% | 1 |
10 | ANALOG ICS | 21778 | 0% | 100% | 1 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 22655 | 13% | 1% | 177 |
2 | JOURNAL OF CRYSTAL GROWTH | 8061 | 8% | 0% | 108 |
3 | THIN SOLID FILMS | 6893 | 8% | 0% | 108 |
4 | SOLID STATE TECHNOLOGY | 5654 | 2% | 1% | 22 |
5 | CRYSTAL RESEARCH AND TECHNOLOGY | 4532 | 3% | 1% | 37 |
6 | APPLIED PHYSICS LETTERS | 3834 | 10% | 0% | 142 |
7 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 3599 | 4% | 0% | 53 |
8 | IEEE ELECTRON DEVICE LETTERS | 3254 | 3% | 0% | 37 |
9 | IEEE TRANSACTIONS ON ELECTRON DEVICES | 3231 | 3% | 0% | 48 |
10 | SOLID-STATE ELECTRONICS | 3133 | 3% | 0% | 38 |
Author Key Words |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | ATOMIC LAYER DOPING | 340265 | 2% | 63% | 25 | Search ATOMIC+LAYER+DOPING | Search ATOMIC+LAYER+DOPING |
2 | SELECTIVE EPITAXIAL GROWTH | 258342 | 2% | 38% | 31 | Search SELECTIVE+EPITAXIAL+GROWTH | Search SELECTIVE+EPITAXIAL+GROWTH |
3 | SI EPITAXIAL GROWTH | 133390 | 0% | 88% | 7 | Search SI+EPITAXIAL+GROWTH | Search SI+EPITAXIAL+GROWTH |
4 | ELEVATED SOURCE DRAIN | 131748 | 1% | 55% | 11 | Search ELEVATED+SOURCE+DRAIN | Search ELEVATED+SOURCE+DRAIN |
5 | GERMANIUM SILICON COMPOUNDS | 112000 | 0% | 86% | 6 | Search GERMANIUM+SILICON+COMPOUNDS | Search GERMANIUM+SILICON+COMPOUNDS |
6 | RPCVD | 97993 | 1% | 50% | 9 | Search RPCVD | Search RPCVD |
7 | SIGE | 92782 | 5% | 6% | 73 | Search SIGE | Search SIGE |
8 | ATOMICALLY CONTROLLED PROCESSING | 87113 | 0% | 100% | 4 | Search ATOMICALLY+CONTROLLED+PROCESSING | Search ATOMICALLY+CONTROLLED+PROCESSING |
9 | REDUCED PRESSURE CHEMICAL VAPOUR | 87113 | 0% | 100% | 4 | Search REDUCED+PRESSURE+CHEMICAL+VAPOUR | Search REDUCED+PRESSURE+CHEMICAL+VAPOUR |
10 | SIH4 | 87089 | 1% | 25% | 16 | Search SIH4 | Search SIH4 |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | GOULDING, MR , (1993) THE SELECTIVE EPITAXIAL-GROWTH OF SILICON.MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY. VOL. 17. ISSUE 1-3. P. 47-67 | 69 | 72% | 55 |
2 | RADAMSON, HH , KOLAHDOUZ, M , (2015) SELECTIVE EPITAXY GROWTH OF SI1-XGEX LAYERS FOR MOSFETS AND FINFETS.JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS. VOL. 26. ISSUE 7. P. 4584 -4603 | 37 | 73% | 1 |
3 | MUROTA, J , SAKURABA, M , TILLACK, B , (2006) ATOMICALLY CONTROLLED PROCESSING FOR GROUP IV SEMICONDUCTORS BY CHEMICAL VAPOR DEPOSITION.JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS. VOL. 45. ISSUE 9A. P. 6767-6785 | 45 | 65% | 24 |
4 | MUROTA, J , SAKURABA, M , TILLACK, B , (2011) ATOMICALLY CONTROLLED PROCESSING IN SILICON-BASED CVD EPITAXIAL GROWTH.JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY. VOL. 11. ISSUE 9. P. 8348-8353 | 25 | 86% | 0 |
5 | KOLAHDOUZ, M , MARESCA, L , GHANDI, R , KHATIBI, A , RADAMSON, HH , (2011) KINETIC MODEL OF SIGE SELECTIVE EPITAXIAL GROWTH USING RPCVD TECHNIQUE.JOURNAL OF THE ELECTROCHEMICAL SOCIETY. VOL. 158. ISSUE 4. P. H457 -H464 | 23 | 79% | 4 |
6 | HARTMANN, JM , LOUP, V , ROLLAND, G , HOLLIGER, P , LAUGIER, F , VANNUFFEL, C , SEMERIA, MN , (2002) SIGE GROWTH KINETICS AND DOPING IN REDUCED PRESSURE-CHEMICAL VAPOR DEPOSITION.JOURNAL OF CRYSTAL GROWTH. VOL. 236. ISSUE 1-3. P. 10-20 | 31 | 69% | 45 |
7 | HARTMANN, JM , CHAMPAY, F , LOUP, V , ROLLAND, G , SEMERIA, MN , (2002) EFFECT OF HCL ON THE SIGE GROWTH KINETICS IN REDUCED PRESSURE-CHEMICAL VAPOR DEPOSITION.JOURNAL OF CRYSTAL GROWTH. VOL. 241. ISSUE 1-2. P. 93-100 | 26 | 79% | 15 |
8 | GOULDING, MR , (1991) THE SELECTIVE EPITAXIAL-GROWTH OF SILICON.JOURNAL DE PHYSIQUE IV. VOL. 1. ISSUE C2. P. 745 -778 | 39 | 80% | 7 |
9 | HARTMANN, JM , LOUP, V , ROLLAND, G , SEMERIA, MN , (2003) EFFECTS OF TEMPERATURE AND HCL FLOW ON THE SIGE GROWTH KINETICS IN REDUCED PRESSURE-CHEMICAL VAPOR DEPOSITION.JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B. VOL. 21. ISSUE 6. P. 2524-2529 | 26 | 74% | 13 |
10 | YASUTAKE, K , KAKIUCHI, H , OHMI, H , INAGAKI, K , OSHIKANE, Y , NAKANO, M , (2011) AN ATOMICALLY CONTROLLED SI FILM FORMATION PROCESS AT LOW TEMPERATURES USING ATMOSPHERIC-PRESSURE VHF PLASMA.JOURNAL OF PHYSICS-CONDENSED MATTER. VOL. 23. ISSUE 39. P. - | 36 | 42% | 3 |
Classes with closest relation at Level 1 |