Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
5738 | 1581 | 20.3 | 69% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
2 | 4 | MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER | 2836879 |
6 | 3 | PHYSICS, APPLIED//IEEE TRANSACTIONS ON ELECTRON DEVICES//SILICON | 155028 |
1299 | 2 | SIGE//STRAINED SI//VIRTUAL SUBSTRATE | 8578 |
5738 | 1 | STRAINED SI1 XGEX SI QUANTUM WELLS//SEGREGANT ASSISTED GROWTH//SI BASED NANOSTRUCTURES | 1581 |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | STRAINED SI1 XGEX SI QUANTUM WELLS | authKW | 77249 | 0% | 100% | 4 |
2 | SEGREGANT ASSISTED GROWTH | authKW | 38624 | 0% | 100% | 2 |
3 | SI BASED NANOSTRUCTURES | authKW | 38624 | 0% | 100% | 2 |
4 | SI GE MULTILAYER | authKW | 38624 | 0% | 100% | 2 |
5 | SI SI1 XGEX SUPERLATTICES | authKW | 38624 | 0% | 100% | 2 |
6 | SI SIGE SUPERLATTICE | authKW | 38624 | 0% | 100% | 2 |
7 | VOLTAGE CONTROLLED EMISSION WAVELENGTH SWITCH | authKW | 38624 | 0% | 100% | 2 |
8 | SIGE | authKW | 34066 | 3% | 4% | 47 |
9 | BAND STRUCTURE ENGINEERING | authKW | 33098 | 0% | 29% | 6 |
10 | SIGE ALLOY | authKW | 27821 | 0% | 21% | 7 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Physics, Applied | 12815 | 57% | 0% | 906 |
2 | Physics, Condensed Matter | 9173 | 40% | 0% | 638 |
3 | Materials Science, Coatings & Films | 4624 | 13% | 0% | 200 |
4 | Engineering, Electrical & Electronic | 1507 | 20% | 0% | 316 |
5 | Materials Science, Multidisciplinary | 1391 | 23% | 0% | 366 |
6 | Crystallography | 665 | 6% | 0% | 97 |
7 | Nanoscience & Nanotechnology | 551 | 7% | 0% | 114 |
8 | Physics, Multidisciplinary | 350 | 8% | 0% | 134 |
9 | Microscopy | 125 | 1% | 0% | 17 |
10 | Electrochemistry | 6 | 1% | 0% | 19 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | CEM2 ELE ON MICROOPTOELECT MONTPELLIER | 19312 | 0% | 100% | 1 |
2 | DIPARTIMENTO FIS E ERMI | 19312 | 0% | 100% | 1 |
3 | ENG IV | 19312 | 0% | 100% | 1 |
4 | FB ELEKT | 19312 | 0% | 100% | 1 |
5 | FOR UNGSZENTRUM ICHT IONENFOR | 19312 | 0% | 100% | 1 |
6 | FUKATSU GRP | 19312 | 0% | 100% | 1 |
7 | INFM CONDENSED MATTER THEORY | 19312 | 0% | 100% | 1 |
8 | IST FIS G MARCONI CNR GRP NAZL STRUTTURA MAT | 19312 | 0% | 100% | 1 |
9 | LOSS PREMSTAETTEN | 19312 | 0% | 100% | 1 |
10 | MICTOELECT TECHNOL | 19312 | 0% | 100% | 1 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 8478 | 5% | 1% | 86 |
2 | THIN SOLID FILMS | 7800 | 8% | 0% | 122 |
3 | APPLIED PHYSICS LETTERS | 7054 | 13% | 0% | 203 |
4 | SEMICONDUCTORS AND SEMIMETALS | 5462 | 1% | 2% | 12 |
5 | JOURNAL OF CRYSTAL GROWTH | 5143 | 6% | 0% | 92 |
6 | PHYSICAL REVIEW B | 3360 | 11% | 0% | 175 |
7 | SOLID-STATE ELECTRONICS | 3231 | 3% | 0% | 41 |
8 | JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 3147 | 1% | 1% | 12 |
9 | SEMICONDUCTOR SCIENCE AND TECHNOLOGY | 3087 | 2% | 0% | 36 |
10 | SUPERLATTICES AND MICROSTRUCTURES | 3060 | 2% | 1% | 32 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | JAIN, SC , WILLIS, JR , BULLOUGH, R , (1990) A REVIEW OF THEORETICAL AND EXPERIMENTAL WORK ON THE STRUCTURE OF GEXSI1-X STRAINED LAYERS AND SUPERLATTICES, WITH EXTENSIVE BIBLIOGRAPHY.ADVANCES IN PHYSICS. VOL. 39. ISSUE 2. P. 127-190 | 156 | 57% | 110 |
2 | ABSTREITER, G , (1998) BAND GAPS AND LIGHT EMISSION IN SI/SIGE ATOMIC LAYER STRUCTURES.LIGHT EMISSION IN SILICON: FROM PHYSICS TO DEVICES. VOL. 49. ISSUE . P. 37-76 | 64 | 74% | 10 |
3 | CERDEIRA, F , (1999) OPTICAL PROPERTIES.GERMANIUM SILICON: PHYSICS AND MATERIALS. VOL. 56. ISSUE . P. 225 -292 | 61 | 74% | 2 |
4 | ZI, J , ZHANG, KM , XIE, XD , (1997) VIBRATIONAL PROPERTIES OF SI/GE SUPERLATTICES.PROGRESS IN SURFACE SCIENCE. VOL. 54. ISSUE 1. P. 69 -113 | 50 | 77% | 13 |
5 | VIRGILIO, M , PIZZI, G , GROSSO, G , (2011) OPTICAL GAIN IN SHORT PERIOD SI/GE SUPERLATTICES ON [001]-SIGE SUBSTRATES.JOURNAL OF APPLIED PHYSICS. VOL. 110. ISSUE 8. P. - | 33 | 65% | 6 |
6 | MENCZIGAR, U , BRUNNER, J , FRIESS, E , GAIL, M , ABSTREITER, G , KIBBEL, H , PRESTING, H , KASPER, E , (1992) PHOTOLUMINESCENCE STUDIES OF SI/SI1-XGEX QUANTUM-WELLS AND SIMGEN SUPERLATTICES.THIN SOLID FILMS. VOL. 222. ISSUE 1-2. P. 227-233 | 38 | 100% | 17 |
7 | LOCKWOOD, DJ , BARIBEAU, JM , JACKMAN, TE , AEBI, P , TYLISZCZAK, T , HITCHCOCK, AP , HEADRICK, RL , (1993) INFLUENCE OF ANNEALING ON THE INTERFACE STRUCTURE AND STRAIN RELIEF IN SI/GE HETEROSTRUCTURES ON (100) SI.SCANNING MICROSCOPY. VOL. 7. ISSUE 2. P. 457 -471 | 42 | 76% | 2 |
8 | TANG, YS , TORRES, CMS , WHALL, TE , PARKER, EHC , PRESTING, H , KIBBEL, H , (1995) OPTICAL-PROPERTIES OF SI-SI1-XGEX AND SI-GE NANOSTRUCTURES.JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS. VOL. 6. ISSUE 5. P. 356-362 | 32 | 91% | 3 |
9 | SHAW, MJ , JAROS, M , (1999) FUNDAMENTAL PHYSICS OF STRAINED LAYER GESI: QUO VADIS?.GERMANIUM SILICON: PHYSICS AND MATERIALS. VOL. 56. ISSUE . P. 169 -223 | 34 | 71% | 1 |
10 | JEONG, MS , CHA, OH , HUANG, XL , KIM, JY , SUH, EK , LEE, HJ , (2000) PHOTOELECTRIC TRANSIENT PROCESS IN SI1-XGEX/SI SUPERLATTICES.SEMICONDUCTOR SCIENCE AND TECHNOLOGY. VOL. 15. ISSUE 2. P. 130-134 | 26 | 90% | 0 |
Classes with closest relation at Level 1 |