Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
5504 | 1615 | 19.4 | 59% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
2 | 4 | MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER | 2836879 |
178 | 3 | GAN//PHYSICS, APPLIED//GALLIUM NITRIDE | 57874 |
2642 | 2 | THROUGH SILICON VIA TSV//WAFER BONDING//THROUGH SILICON VIA | 3496 |
5504 | 1 | WAFER BONDING//ANODIC BONDING//DIRECT BONDING | 1615 |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | WAFER BONDING | authKW | 903751 | 10% | 31% | 154 |
2 | ANODIC BONDING | authKW | 870623 | 5% | 56% | 82 |
3 | DIRECT BONDING | authKW | 300909 | 2% | 43% | 37 |
4 | SILICON WAFER BONDING | authKW | 287561 | 1% | 89% | 17 |
5 | ROOM TEMPERATURE BONDING | authKW | 218752 | 1% | 64% | 18 |
6 | SURFACE ACTIVATED BONDING | authKW | 201649 | 1% | 67% | 16 |
7 | LOW TEMPERATURE BONDING | authKW | 175430 | 1% | 40% | 23 |
8 | MEMS PACKAGING | authKW | 146667 | 1% | 52% | 15 |
9 | HERMETICITY | authKW | 134422 | 1% | 44% | 16 |
10 | EUTECTIC BONDING | authKW | 118322 | 1% | 48% | 13 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Physics, Applied | 11499 | 54% | 0% | 871 |
2 | Engineering, Electrical & Electronic | 7610 | 41% | 0% | 658 |
3 | Instruments & Instrumentation | 7334 | 22% | 0% | 348 |
4 | Nanoscience & Nanotechnology | 6088 | 21% | 0% | 343 |
5 | Materials Science, Multidisciplinary | 3189 | 33% | 0% | 527 |
6 | Materials Science, Coatings & Films | 2299 | 9% | 0% | 145 |
7 | Electrochemistry | 897 | 7% | 0% | 111 |
8 | Mechanics | 704 | 8% | 0% | 132 |
9 | Engineering, Mechanical | 233 | 5% | 0% | 77 |
10 | Physics, Condensed Matter | 226 | 8% | 0% | 135 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | WAFER BONDING | 75619 | 0% | 67% | 6 |
2 | ADV MICROSYST INTEGRAT PACKAGING | 37811 | 0% | 100% | 2 |
3 | OPTOELECT OKI | 37811 | 0% | 100% | 2 |
4 | MODERN MFG QUAL ENGN | 25206 | 0% | 67% | 2 |
5 | ORION ELECT CO LTD | 25206 | 0% | 67% | 2 |
6 | ZENTRUM MIKROTECHNOL | 25198 | 0% | 22% | 6 |
7 | SP2M NRS | 21265 | 0% | 38% | 3 |
8 | PRECIS ENGN | 19201 | 2% | 3% | 40 |
9 | ADV ELECT COMPONENT SECT | 18906 | 0% | 100% | 1 |
10 | ADV MAT INTER E SCI | 18906 | 0% | 100% | 1 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | JOURNAL OF MICROMECHANICS AND MICROENGINEERING | 39052 | 7% | 2% | 107 |
2 | SENSORS AND ACTUATORS A-PHYSICAL | 35128 | 8% | 1% | 136 |
3 | MICROSYSTEM TECHNOLOGIES-MICRO-AND NANOSYSTEMS-INFORMATION STORAGE AND PROCESSING SYSTEMS | 28421 | 4% | 2% | 71 |
4 | JOURNAL OF MICROELECTROMECHANICAL SYSTEMS | 23724 | 4% | 2% | 58 |
5 | IEEE TRANSACTIONS ON ADVANCED PACKAGING | 16772 | 2% | 3% | 30 |
6 | ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY | 7666 | 1% | 2% | 23 |
7 | PHILIPS JOURNAL OF RESEARCH | 6828 | 1% | 3% | 11 |
8 | JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 6559 | 6% | 0% | 103 |
9 | IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY | 4050 | 1% | 1% | 17 |
10 | SENSORS AND MATERIALS | 2994 | 1% | 1% | 13 |
Author Key Words |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | WAFER BONDING | 903751 | 10% | 31% | 154 | Search WAFER+BONDING | Search WAFER+BONDING |
2 | ANODIC BONDING | 870623 | 5% | 56% | 82 | Search ANODIC+BONDING | Search ANODIC+BONDING |
3 | DIRECT BONDING | 300909 | 2% | 43% | 37 | Search DIRECT+BONDING | Search DIRECT+BONDING |
4 | SILICON WAFER BONDING | 287561 | 1% | 89% | 17 | Search SILICON+WAFER+BONDING | Search SILICON+WAFER+BONDING |
5 | ROOM TEMPERATURE BONDING | 218752 | 1% | 64% | 18 | Search ROOM+TEMPERATURE+BONDING | Search ROOM+TEMPERATURE+BONDING |
6 | SURFACE ACTIVATED BONDING | 201649 | 1% | 67% | 16 | Search SURFACE+ACTIVATED+BONDING | Search SURFACE+ACTIVATED+BONDING |
7 | LOW TEMPERATURE BONDING | 175430 | 1% | 40% | 23 | Search LOW+TEMPERATURE+BONDING | Search LOW+TEMPERATURE+BONDING |
8 | MEMS PACKAGING | 146667 | 1% | 52% | 15 | Search MEMS+PACKAGING | Search MEMS+PACKAGING |
9 | HERMETICITY | 134422 | 1% | 44% | 16 | Search HERMETICITY | Search HERMETICITY |
10 | EUTECTIC BONDING | 118322 | 1% | 48% | 13 | Search EUTECTIC+BONDING | Search EUTECTIC+BONDING |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | VALLIN, O , JONSSON, K , LINDBERG, U , (2005) ADHESION QUANTIFICATION METHODS FOR WAFER BONDING.MATERIALS SCIENCE & ENGINEERING R-REPORTS. VOL. 50. ISSUE 4-5. P. 109 -165 | 147 | 79% | 53 |
2 | MASTEIKA, V , KOWAL, J , BRAITHWAITE, NS , ROGERS, T , (2014) A REVIEW OF HYDROPHILIC SILICON WAFER BONDING.ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY. VOL. 3. ISSUE 4. P. Q42 -Q54 | 81 | 94% | 17 |
3 | PLOSSL, A , KRAUTER, G , (1999) WAFER DIRECT BONDING: TAILORING ADHESION BETWEEN BRITTLE MATERIALS.MATERIALS SCIENCE & ENGINEERING R-REPORTS. VOL. 25. ISSUE 1-2. P. 1 -88 | 158 | 63% | 142 |
4 | MIKI, N , (2005) WAFER BONDING TECHNIQUES FOR MEMS.SENSOR LETTERS. VOL. 3. ISSUE 4. P. 263-273 | 75 | 49% | 13 |
5 | KNOWLES, KM , VAN HELVOORT, ATJ , (2006) ANODIC BONDING.INTERNATIONAL MATERIALS REVIEWS. VOL. 51. ISSUE 5. P. 273 -311 | 66 | 50% | 59 |
6 | PASQUARIELLO, D , HJORT, K , (2002) PLASMA-ASSISTED INP-TO-SI LOW TEMPERATURE WAFER BONDING.IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS. VOL. 8. ISSUE 1. P. 118 -131 | 44 | 66% | 117 |
7 | HE, R , FUJINO, M , YAMAUCHI, A , SUGA, T , (2015) NOVEL HYDROPHILIC SIO2 WAFER BONDING USING COMBINED SURFACE-ACTIVATED BONDING TECHNIQUE.JAPANESE JOURNAL OF APPLIED PHYSICS. VOL. 54. ISSUE 3. P. - | 24 | 100% | 0 |
8 | GOSELE, U , TONG, QY , (1998) SEMICONDUCTOR WAFER BONDING.ANNUAL REVIEW OF MATERIALS SCIENCE. VOL. 28. ISSUE . P. 215 -241 | 45 | 65% | 113 |
9 | HOWLADER, MMR , DEEN, MJ , SUGA, T , (2015) NANOBONDING: A KEY TECHNOLOGY FOR EMERGING APPLICATIONS IN HEALTH AND ENVIRONMENTAL SCIENCES.JAPANESE JOURNAL OF APPLIED PHYSICS. VOL. 54. ISSUE 3. P. - | 40 | 52% | 1 |
10 | CHRISTIANSEN, SH , SINGH, R , GOSELE, U , (2006) WAFER DIRECT BONDING: FROM ADVANCE SUBSTRATE ENGINEERING TO FUTURE APPLICATIONS IN MICRO/NANOELECTRONICS.PROCEEDINGS OF THE IEEE. VOL. 94. ISSUE 12. P. 2060 -2106 | 60 | 38% | 85 |
Classes with closest relation at Level 1 |