Class information for:
Level 1: ANAL STRUCT MAT//UNITE RECH PHYS SOLIDE//PHYS MATIERE CONDENSEE NANOSCI LR ES 40 11

Basic class information
Class id #P Avg. number of
references		 Database coverage
of references
27226 234 20.1 46%


Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
2 4 MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER 2836879
589 3       ATOMIC LAYER DEPOSITION//HFO2//HIGH K DIELECTRICS 15224
4119 2             ANAL STRUCT MAT//UNITE RECH PHYS SOLIDE//PHYS MATIERE CONDENSEE NANOSCI LR ES 40 11 560
27226 1                   ANAL STRUCT MAT//UNITE RECH PHYS SOLIDE//PHYS MATIERE CONDENSEE NANOSCI LR ES 40 11 234

Terms with highest relevance score


rank Term termType Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 ANAL STRUCT MAT address 1174437 4% 100% 9
2 UNITE RECH PHYS SOLIDE address 1056991 4% 90% 9
3 PHYS MATIERE CONDENSEE NANOSCI LR ES 40 11 address 391479 1% 100% 3
4 SCI GENIE MAT SIM address 260986 1% 100% 2
5 THIN BICRYSTAL authKW 260986 1% 100% 2
6 TECHNOL SILICIUM address 255756 3% 28% 7
7 MICRO TECHNOL address 146801 1% 38% 3
8 001 SILICON BONDED WAFER authKW 130493 0% 100% 1
9 A12CU INTERMETALLIC COMPOUND authKW 130493 0% 100% 1
10 BLVD ENVIRONM address 130493 0% 100% 1

Web of Science journal categories


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 Metallurgy & Metallurgical Engineering 2746 36% 0% 85
2 Physics, Condensed Matter 1633 44% 0% 103
3 Materials Science, Multidisciplinary 1264 51% 0% 120
4 Physics, Applied 1167 46% 0% 107
5 Microscopy 280 4% 0% 9
6 Crystallography 53 5% 0% 11
7 Materials Science, Coatings & Films 39 3% 0% 8
8 Physics, Multidisciplinary 29 7% 0% 16
9 Nanoscience & Nanotechnology 8 3% 0% 7
10 Mining & Mineral Processing 2 0% 0% 1

Address terms


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 ANAL STRUCT MAT 1174437 4% 100% 9
2 UNITE RECH PHYS SOLIDE 1056991 4% 90% 9
3 PHYS MATIERE CONDENSEE NANOSCI LR ES 40 11 391479 1% 100% 3
4 SCI GENIE MAT SIM 260986 1% 100% 2
5 TECHNOL SILICIUM 255756 3% 28% 7
6 MICRO TECHNOL 146801 1% 38% 3
7 BLVD ENVIRONM 130493 0% 100% 1
8 CEADRFMSP2M 130493 0% 100% 1
9 CEAGRE 130493 0% 100% 1
10 INP GRENOBLEUJF 130493 0% 100% 1

Journals


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES 14371 9% 1% 20
2 COMPTES RENDUS DE L ACADEMIE DES SCIENCES SERIE II FASCICULE B-MECANIQUE PHYSIQUE ASTRONOMIE 5235 2% 1% 5
3 ANNALES DE CHIMIE-SCIENCE DES MATERIAUX 3730 3% 0% 7
4 COMPTES RENDUS PHYSIQUE 3574 3% 0% 6
5 PHILOSOPHICAL MAGAZINE 2645 4% 0% 9
6 ACTA METALLURGICA 2586 3% 0% 7
7 TRANSACTIONS OF THE JAPAN INSTITUTE OF METALS 2493 2% 0% 4
8 PHILOSOPHICAL MAGAZINE LETTERS 2212 3% 0% 7
9 PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE 1442 6% 0% 15
10 JOURNAL OF THE JAPAN INSTITUTE OF METALS 1409 3% 0% 8

Author Key Words


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class		 LCSH search Wikipedia search
1 THIN BICRYSTAL 260986 1% 100% 2 Search THIN+BICRYSTAL Search THIN+BICRYSTAL
2 001 SILICON BONDED WAFER 130493 0% 100% 1 Search 001+SILICON+BONDED+WAFER Search 001+SILICON+BONDED+WAFER
3 A12CU INTERMETALLIC COMPOUND 130493 0% 100% 1 Search A12CU+INTERMETALLIC+COMPOUND Search A12CU+INTERMETALLIC+COMPOUND
4 ELASTIC FIELD SIMULATION 130493 0% 100% 1 Search ELASTIC+FIELD+SIMULATION Search ELASTIC+FIELD+SIMULATION
5 ELECTROMAGNETIC INTERFERENCE EMI SHIELD 130493 0% 100% 1 Search ELECTROMAGNETIC+INTERFERENCE+EMI+SHIELD Search ELECTROMAGNETIC+INTERFERENCE+EMI+SHIELD
6 EPITAXIAL WAFER BONDING 130493 0% 100% 1 Search EPITAXIAL+WAFER+BONDING Search EPITAXIAL+WAFER+BONDING
7 HIGH MOBILITY TWO DIMENSIONAL ELECTRON GAS 130493 0% 100% 1 Search HIGH+MOBILITY+TWO+DIMENSIONAL+ELECTRON+GAS Search HIGH+MOBILITY+TWO+DIMENSIONAL+ELECTRON+GAS
8 METAL INSUTATOR TRANSITION 130493 0% 100% 1 Search METAL+INSUTATOR+TRANSITION Search METAL+INSUTATOR+TRANSITION
9 MOLECULAR BEAM EPITAXY SELECTIVE EPITAXY 130493 0% 100% 1 Search MOLECULAR+BEAM+EPITAXY+SELECTIVE+EPITAXY Search MOLECULAR+BEAM+EPITAXY+SELECTIVE+EPITAXY
10 OXIDE OUT DIFFUSION ANNEALING 130493 0% 100% 1 Search OXIDE+OUT+DIFFUSION+ANNEALING Search OXIDE+OUT+DIFFUSION+ANNEALING

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.


Rank Reference # ref.
in cl.		 Shr. of ref. in
cl.		 Citations
1 BONNET, R , LOUBRADOU, M , YOUSSEF, S , ROUVIERE, JL , FOURNEL, F , (2009) ALTERNATE DISSOCIATION OF THE SCREW DISLOCATIONS IN A (001) BURIED SMALL-ANGLE TWIST BOUNDARY IN SILICON.PHILOSOPHICAL MAGAZINE. VOL. 89. ISSUE 5. P. 413 -434 20 80% 0
2 DERARDJA, A , ADAMI, L , BEN YOUSSEF, S , BONNET, R , (2004) ANISOTROPY OF THE ELASTIC RELAXATION OF A BIPERIODIC NETWORK OF BURIED DISLOCATIONS: THEORY AND APPLICATION TO SEMICONDUCTOR BICRYSTALS.ANNALES DE CHIMIE-SCIENCE DES MATERIAUX. VOL. 29. ISSUE 4. P. 123-132 17 100% 1
3 BOUSSAID, A , FNAIECH, M , FOURNEL, F , BONNET, R , (2005) ZIGZAG LINES IN A (001)SI LOW-ANGLE TWIST BOUNDARY.PHILOSOPHICAL MAGAZINE. VOL. 85. ISSUE 11. P. 1111-1122 15 83% 4
4 ROUSSEAU, K , EYMERY, J , FOURNEL, F , MORNIROLI, JP , ROUVIERE, JL , (2005) (001) SILICON SURFACIAL GRAIN BOUNDARIES OBTAINED BY DIRECT WAFER BONDING PROCESS: ACCURATE CONTROL OF THE STRUCTURE BEFORE BONDING.PHILOSOPHICAL MAGAZINE. VOL. 85. ISSUE 21. P. 2415 -2448 11 85% 5
5 OZTURK, H , (2007) FREE SURFACE EFFECT ON DISPLACEMENT AND RELATIVE INTERFACIAL DISPLACEMENT FIELDS OF MISFIT DISLOCATIONS AT THE BICRYSTAL INTERFACE.TRANSACTIONS OF THE INDIAN INSTITUTE OF METALS. VOL. 60. ISSUE 6. P. 577-580 12 71% 0
6 BONNET, R , LOUBRADOU, M , (2002) CRYSTALLINE DEFECTS IN A BCT AL2CU(THETA) SINGLE CRYSTAL OBTAINED BY UNIDIRECTIONAL SOLIDIFICATION ALONG [001].PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE. VOL. 194. ISSUE 1. P. 173-191 10 91% 17
7 BONNET, R , LOUBRADOU, M , (1997) HRPACK: A SOFTWARE DESCRIBING THE ELASTIC FIELDS NEAR DISLOCATIONS AND INTERFACES AT ATOMIC SCALE.ULTRAMICROSCOPY. VOL. 69. ISSUE 4. P. 241-257 16 67% 11
8 BOUSSAID, A , FOURNEL, F , BONNET, R , (2005) TESTS BY TEM CONTRAST SIMULATIONS OF THE ELASTIC FIELD OF A BURIED (001) LOW ANGLE TWIST BOUNDARY IN SILICON.PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS. VOL. 242. ISSUE 15. P. 3091-3098 9 90% 2
9 BONNET, R , (2000) A BIPERIODIC NETWORK OF MISFIT DISLOCATIONS IN A THIN BICRYSTALLINE FOIL.PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE. VOL. 180. ISSUE 2. P. 487 -497 13 68% 4
10 BONNET, R , (2013) TEM IMAGING OF AN INCLINED DISLOCATION IN AN ANISOTROPIC THIN FOIL.PHILOSOPHICAL MAGAZINE. VOL. 93. ISSUE 5. P. 499-510 7 88% 0

Classes with closest relation at Level 1


Rank Class id link
1 16113 IMAGE FORCE//DISCLINATION DIPOLE//ZENER STROH CRACK
2 37216 AU MICROELECTRODE//FUEL CELL SOLID STATE CHEM//HOT STAGE
3 13825 HABIT PLANE//INVARIANT LINE//EDGE TO EDGE MATCHING
4 6582 GRAIN BOUNDARY MIGRATION//GRAIN BOUNDARY DISLOCATIONS//GRAIN BOUNDARIES
5 36877 FINITE LINEAR CHAIN//DISORDERED BINARY ALLOYS//ESCUELA NACL
6 8164 MISFIT DISLOCATION//ULTRAHIGH FREQUENCY SEMICOND ELECT//METAMORPHIC BUFFER
7 18090 GASB QUANTUM DOTS//GASB GAAS//GASB
8 33176 ALPHA FRINGES//BODY TRANSLATION VECTOR//DIFFRACTION CONTRAST IMAGES
9 5504 WAFER BONDING//ANODIC BONDING//DIRECT BONDING
10 12428 CONVERGENT BEAM ELECTRON DIFFRACTION//CBED//LATTICE PARAMETER DETERMINATION

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